Agilent 5100 ICP-OES · • Stability better than 1.3% for all elements during a 12 hour period...
Transcript of Agilent 5100 ICP-OES · • Stability better than 1.3% for all elements during a 12 hour period...
Agilent 5100 ICP-OES
Dual View ICP-OES Minus the Wait
Steve Wall, Agilent Technologies
July 30, 2014
Agilent Confidential
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24 Years of Agilent ICP-OES Innovation
1991
1998-2000 2006
1995
High resolution radial sequential ICP-AES
Liberty
Liberty Series II
710/720/730 Worlds fastest simultaneous ICP-OES. Patented CCD
Introducing increased throughput via SVS2
Axial and Radial models available. Vacuum and gas purge optics.
#1 selling ICP-OES. Vista Chip CCD detector
Agilent 5100 SVDV ICP-OES
• Lowest Cost of Ownership • Enhanced Performance • Simple Operation
2014
Vista PRO & MPX
High QE PMT detector. >8000 Agilent ICP-OES instruments sold
Introducing the Agilent 5100 ICP-OES SVDV
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Dual View Minus the wait Agenda
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Highest throughput with highest performance
• What is the 5100 ICP-OES?
• How does the 5100 work?
• Key benefits
• Analytical performance and applications
Agilent 5100 Synchronous Vertical Dual View ICP-OES
Dual View Minus the wait Agenda
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Highest throughput with highest performance
• What is the 5100 ICP-OES?
• How does the 5100 work?
• Key benefits
• Analytical performance and applications
Agilent 5100 Synchronous Vertical Dual View ICP-OES
Concept
Make ICP-OES easier to use, cheaper to run and maintain, without compromising analytical speed or performance.
• New software and sample introduction components
• New high specification hardware platform
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What is the 5100 Synchronous Vertical Dual View (SVDV) ICP-OES?
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Vista Chip II CCD
High Speed Pump
What is the 5100 Synchronous Vertical Dual View (SVDV) ICP-OES?
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Mode Selector
DSC
What is the 5100 Synchronous Vertical Dual View (SVDV) ICP-OES?
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Services
Vertical Torch
SSRF
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Highest throughput with highest performance
• What is the 5100 ICP-OES?
• How does the 5100 work?
• Key benefits
• Analytical performance and applications
Agilent 5100 Synchronous Vertical Dual View ICP-OES
How does the 5100 work?
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Cool Cone Interface
Snout
How does the 5100 SVDV with DSC technology work? Patented DSC technology for ICP-OES provides DV without compromise. • Single reading of the plasma for both radial and axial.
• Vertical torch gives high matrix capability
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Dichroic Spectral
Combiner (DSC)
To detector
Mirror
DSC Hole
Vertical torch
5100 SVDV Pre-optics 5100 SVDV Mode Selector
Future Proof Your Lab 5100 SVDV ICP-OES is 4 instruments in 1
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2. Radial Mode 3. Axial Mode 1. Synchronous VDV Mode
4. Conventional Simultaneous Dual View Mode
+
RAD AX
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Highest throughput with highest performance
• What is the 5100 ICP-OES?
• How does the 5100 work?
• Key benefits
• Analytical performance and applications
Agilent 5100 Synchronous Vertical Dual View ICP-OES
Benefits of the 5100
• Fastest sample throughput of difficult samples
• Low gas consumption
Lowest cost of ownership
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Benefits of the 5100
• Fastest sample throughput of difficult samples
• Low gas consumption
Lowest cost of ownership
• Analytical performance
• System robustness and reliability
Enhanced Performance
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Benefits of the 5100
• Fastest sample throughput of difficult samples
• Low gas consumption
Lowest cost of ownership
• Analytical performance
• System robustness and reliability
Enhanced Performance
• Software • Hardware
Simple Operation
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1. Lowest cost of ownership • High throughput facilitates low Ar consumption per sample
- (a) DSC. (b) VistaChip II. (c) 80 rpm pump. (d) SVS 2+ • 50% Lower power and 50% lower exhaust requirements. • 27MHz Solid State RF • Robust vertical torch • Increased self maintainability
SVDV Vendor
A Vendor
B
USEPA 200.7 (min) 0.97 2.3 2.3
Ar L/sample 20 38 43
Valve/No Valve Valve Valve Valve 05
101520253035404550
5100 SVDV Vendor A Vendor B
Ar/sample
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2. Enhanced Performance Long Term Stability
• 4Hr Long Term Stability with complex matrix • 25% NaCl spiked with 250 ppb multi-element solution • <2.4% RSD
0%
20%
40%
60%
80%
100%
120%
140%
0:00:00 0:28:48 0:57:36 1:26:24 1:55:12 2:24:00 2:52:48 3:21:36 3:50:24 4:19:12
% R
eadb
ack
Time (h:mm:ss) As 188.980 Cd 228.802 Pb 220.353 Se 196.026
250ppb As/Se/Pb/Cd solution in 25% NaCl
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3. Simple Operation • Plug-and-play torch and SIS • Enhanced user maintainability
- Pre optic window (axial and radial) - Optics gas filter
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3. Simple Operation • ICP Expert software
- Intuitive workflow - Trend monitoring of argon
backpressure to the nebulizer and argon emission per sample
• e-Familiarization DVD videos - Software - Hardware - Routine Maintenance
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Dual View Minus the wait Agenda
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Highest throughput with highest performance
• What is the 5100 ICP-OES?
• How does the 5100 work?
• Key benefits
• Analytical performance and applications
Agilent 5100 Synchronous Vertical Dual View ICP-OES
Environmental
Food & Agriculture
Materials Science
Chemical & Energy Pharmaceuticals
Drinking and natural water Trace toxic metals in food Mining and Metals Petroleum refining Heavy metals (USP<232>/<233>)
Soil and sediment Nutrient elements Toys and Consumer Products Alternative Energy (Biodiesel) Incoming raw material testing
Waste (solids/liquids/gases) Feed and fertilizer Semicon, Ceramics, Batteries Fine and Bulk Chemicals QA/QC of Final Product
Where can Agilent 5100 ICP-OES be used?
Performance (technology) • Speed/low gas costs (SVDV, Vista Chip II) • EIE interference immunity (SVDV) • LDR (VistaChip II) • Resolution/interference minimization
(Echelle optics, FACT/IEC, Fitted Background Correction)
• Usability (Software, Easy Fit Torch)
Performance (technology) • Highly stable plasma system (SSRF) • Matrix tolerance and robust sample intro
(Vertical torch, HF resistant SIS) • Long term stability (MFC, Thermostatted
optics)
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Agilent 5100 ICP-OES Environmental Application
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Analysis of Environmental Samples using the Agilent 5100 ICP-OES SVDV • Elemental Analysis on water samples Measurement challenge: How to improve sample throughput when measuring water samples, according to the US EPA 200.7 method: “Determination of Metals and Trace Elements in Water, Solids and Biosolids by ICP-AES?
Solution
Using the Agilent 5100 Synchronous Vertical Dual View ICP-OES, fitted with a Switching Valve System and an autosampler allowed the analysis of a sample every 58 seconds, with excellent recoveries and measurement stability and a 50% reduction in argon consumption.
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Experimental Instrumentation
Agilent 5100 Synchronous Vertical Dual View ICP-OES Fitted with: • Seaspray nebulizer • Single-pass glass cyclonic spray
chamber • White-white pump tubing • Standard 1.8 mm injector torch
Agilent 5100 Synchronous Vertical Dual View ICP-OES
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Experimental Instrumentation
Accessories:
• SVS 2+ Switching Valve System - reduces sample uptake, stabilization times, and rinse delays.
• SPS 3 autosampler
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Experimental Operating parameters
Table 2. Agilent SVS 2+ Switching Valve System settings
Parameter Setting
Sample loop size (mL)
1.0
Loop uptake delay (s) 7.0
Uptake pump speed (rpm) - refill 355
Uptake pump speed (rpm) – move 355
Uptake pump speed (rpm) – inject 100
Time in sample (s) 6.6
Bubble inject time (s) 6.8
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Experimental Samples and sample preparation
• Standards were prepared from single element standards and diluted with 1% HNO3.
• 2 x trace metals in drinking water (TMDW) Certified Reference Materials (CRM)* were analyzed: • TMDW-A • TMDW-B
Inter Element Corrections were used for interference correction
* Purchased from High Purity Standards, Charleston, South Carolina, USA.
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Experimental Method
• Sample analysis was performed as per US EPA method 200.7
• Long term stability was also measured according to US EPA method 200.7
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Results and discussion Method Detection Limits
• Excellent detection limits were obtained for the elements selected by the
instrument to be measured in the axial view e.g. As, Pb, and Se. • In the same measurement, detection limits for K and Na were equivalent
to those from a typical radial measurement.
Table 3. Method detection limits, acquired per EPA Method 200.7. All MDLs were determined in one analytical run. Note: MDL for other elements listed in full application note.
Element Method Detection Limit (ppb) As 188.980 3.7 K 766.491 21.6 Na 588.995 10.1 Pb 220.353 1.9 Se 196.026 3.2
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Results and discussion Sample throughput
• The Synchronous Vertical Dual View capability
of the 5100 measures both the axial and the vertical view of the plasma at the same time
• 1 sample measurement = 58 seconds and consumed < 21 L argon
• This is 55% faster than conventional dual view ICP-OES instruments, with approx 50% less argon consumption per sample
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Conclusion Water samples were analyzed as per US EPA method 200.7, using the Agilent 5100 SVDV ICP-OES with sample introduction accessories. The study found that: • The 5100 delivered accurate results in 58 seconds per sample. • The 5100 consumed less than 21 L of argon per sample • Excellent method detection limits in the μg/L (ppb) range were
obtained for all elements in a single run. • Good recovery results for 26 elements in two CRMs were achieved • Stability better than 1.3% for all elements during a 12 hour period Comparing the results to those published by other ICP-OES manufacturers allows us to calculate that the 5100: • is up to 55% faster than dual view instruments • consumes approx 50% less argon than dual view instruments
To find out more, visit agilent.com/chem
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Agilent 5100 ICP-OES summary
Lowest cost of ownership
Enhanced Performance
Simple Operation
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Questions
Visit us at www.agilent.com/chem/DualViewMinusTheWait • Technology Video
• Application Notes
• Technical Overviews
• Agilent’s Atomic Spectroscopy Portfolio of Solutions
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