5. TEM - Electron Microscopy and Diffraction
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Transcript of 5. TEM - Electron Microscopy and Diffraction
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Electron Microscopy Electron Microscopy and Diffractionand Diffraction
5. 5. Transmission Electron MicroscopeTransmission Electron Microscope
Do Minh NghiepMaterials Science Center
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01.01.2009 Materials Science Center, HUT 2
Electron optics and instrument Image contrast (mass thickness
contrast, phase contrast, diffraction contrast)
Magnification and electron beam adjustment
Sample preparation Application
ContentContent
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Introduction Introduction
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What’s TEM What’s TEM The transmission electron microscope (TEM) is an analytical tool that allows:detailed microstructural examination through high-resolution and high-magnification imaging: magnifications of up to 500,000x and detail resolution below 1 nm are achieved routinely, investigation of crystal structures and orientations through electron diffraction pattern,determination of chemical compositions in phases, precipitates and contaminants through X-ray and electron spectroscopy: qualitative and quantitative elemental analysis can be provided from features smaller than 30 nm.
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What’s TEM imageWhat’s TEM image Basic idea of a TEM is to
project a magnified image of the specimen onto a fluorescent screen where it can be viewed by the user.
The image itself is the result in intensity difference of beam electrons that are forward scattered by the specimen vs. those that are not (transmitted unscattered) .
and aperture
Objective
Projective
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Pros and consPros and cons
AdvantageAdvantage
- TEM is the only technique that will allow the determination of the Burgers vector.
- TEM can also provide atomic scale resolution (2 Å). DisadvantageDisadvantage
- TEM is an expensive and destructive technique.
- Some materials are sensitive to electron beam radiation, resulting in a loss of crystallinity and mass.
- Sample preparation is very time-consuming, sample dimension small (3 mm diameter, less than 100 nm thick)
- Artifacts cause misleading for the interpretation of transmission images.
This usually causes by the fact that the TEM presents us with 2D-images of 3D-specimens viewed in transmission.
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3D-object 3D-object 2D-image 2D-image
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A single projection image is plainly insufficient to infer the structure of
an object.
Each image represents a 2D projection of the 3D object
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3D-object 3D-object 2D-image 2D-image
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Watch out!A cover slide!
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InstrumentInstrument
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TEM components TEM components and electron pathand electron path
A simplified ray diagram of a TEM consists of - an electron source, - condenser lens with aperture,- specimen, - objective lens with aperture, - projector lens and - a fluorescent screen.
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SuplementarySuplementary
In actuality a modern TEM consists of many more components including- a dual condenser system,- stigmators, - deflector coils, and -a combination of intermediate and dual projector lens.
Sîi ®èt
AnètChao
Khe cè ®ÞnhCuén chØnh nguån
Condenser 1
Condensor 2
Stigmator 1Khe cè ®Þnh
DeflectorKhe tô kÝnh
VËt kÝnh
Khe vËt kÝnh
Gi¸ gi÷ mÉu
Stigmator 2
KÝnh trung gianKhe kÝnh trung gian (nhiÔu x¹)
Dual projector
Mµn huúnh quang
Focus wobble
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Conventional TEMsConventional TEMs
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200 kV (left) and 100 kV (right)
TEM
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Modern TEMsModern TEMs
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High Resolution Transmission High Resolution Transmission Electron Microscope (HRTEM)Electron Microscope (HRTEM)
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HRTEM - a comparisonHRTEM - a comparison
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Image contrast Image contrast
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Imaging mechanismImaging mechanism
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Phase contrastPhase contrast
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Bright field (BF) Dark field (DF)
Parallel incident beam
Phase contrast/ image mode
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Diffraction contrastDiffraction contrast
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Diffraction contrast/ image mode (Electron microdiffraction)
Convergent incident beam
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Diffraction contrastDiffraction contrast
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If a monochromatic e-beam of known l strikes a crystal at the appropriate Bragg’s angle a number of the diffracted electrons will be forward scattered.
Like the transmitted electrons these diffracted electrons will have nearly their same energy but will have been significantly altered from their trajectory.
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Diffraction contrastDiffraction contrast
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The transmitted electrons will be brought to convergence in the back focal plane of the objective lens (Y).
Likewise the diffracted electrons will also be brought to convergence in the back focal plane of the lens but at a different spot (X).
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.
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Normally an aperture is placed in the back focal plane of the objective lens to stop widely scattered electrons from reaching the viewing screen, but in the case of diffraction it is these same scattered electrons that contain the information about the diffraction event.
To operate the TEM in diffraction mode
the objective aperture is removed from the beam path and the microscope is adjusted to focus an image of the back focal plane of the objective lens, not the image plane.
Diffraction contrastDiffraction contrast
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Diffraction contrastDiffraction contrast
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This is most easily accomplished by adjusting the strength of the objective lens so that an image of the back focal plane is projected onto the viewing screen.
Back focal plane
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DF imageDF imageBF imageBF image
Mass-thickness contrast (fringes)Mass-thickness contrast (fringes)
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Contrast is caused by:- Unscattered electrons coming into screen (bright area)- Scattered electrons not coming into screen (dark area)
Contrast imageContrast image
Scattered eTransmitted e(unscattered)
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MagnificationMagnification
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Total magnification in the TEM is a combination of the magnification from the objective lens times the magnification of the intermediate lens times the magnification of the projector lens.
Each of which is capable of approximately 100x.
Mob x Mint x Mproj = Total Mag so Mtotal can be a magnitude of 106
What’s magnificationWhat’s magnification
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Under different conditions of high and low magnification the same component can have different functions:
MagnificationMagnification
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Contrast forming
Image focus
Diffraction focus
Diffraction stigmation
Image stigmation
Area selection
Low magnificationHigh magnification
Objective lens
Diffraction lens
Objective aperture
SA aperture
Object. stigmator
Diffract. stigmator
Image focus
Diffraction focus
Contrast forming
Area selection
Diffraction stigmation
Image stigmation
Components
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Depth of Field (Dfi): the range of distance at the specimen parallel to the illuminating beam in which the object appears to be in focus. Depth of Focus (Dfo): the range of distance at the image plane (i.e. the eyepiece, camera, or photographic plate) in which a well focussed object appears to be in focus.
Magnification and focusing Magnification and focusing
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In TEM thanks to great Dfi and Dfo the image is well focuced even at high magnification
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Magnification and focusing Magnification and focusing
The depth of focus is so great for the projector lens system that an image that is in focus on the screen will also be in focus on plate film beneath the screen or even a TV camera below the plate film
Fluorescent screen
Binocular viewing scope
Viewport
Plate camera
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Adjustment of Adjustment of electron beamelectron beam
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Adjustment of condenserAdjustment of condenser
The role of the condenser lenses is to make the beam that is striking the specimen as nearly parallel as is possible.
Condenser lens
Specimen
Primary beam
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Adjustment of condenserAdjustment of condenser
As magnification increases the condenser lens must be adjusted to properly illuminate the specimen. When the lens is brought to its smallest spot the beam is said to be at the crossover point.
Screen before focal point: large beam (under focused)
Screen at focal point: minimum beam
size/crossover, maximum brightness (focused)
Screen behind focal point: large beam
(over focused)
(-) Change in condenser lens current (+)
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Holey (not Holy) Formvar is used to critically adjust the stigmation of a TEM. When the beam is under or over focused on the specimen a Fresnel fringe becomes visible due to the effects of diffraction around the edges of the whole. When this Fresnel fringe is evenly distributed then the beam is said to be stigmated.
StigmatorStigmator
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Deflection coils
In older TEMs functions such as gun and beam alignment were accomplished by physically moving components in the column.
Today they are achieved by use of electromagnetic deflection coils that are positioned throughout the column.
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Shift / tilt of beam by deflecton coilsShift / tilt of beam by deflecton coils
Using the deflection coils the beam can be: shifted so that the focused beam is centered in the back focal plane of the lens and tilted so that the beam is centered on the specimen. - deflection angle
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Pivot pointPivot point
We call these centering spots “pivot points” and as the beam is shifted or tilted back and forth there should be no apparent movement if the microscope is properly aligned
Pivot point
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Specimen stage positionSpecimen stage position
Likewise the position of the specimen relative to the beam is of critical importance. To adjust the height or “Z” position of the specimen it is physically rocked back and forth until an object in the center no longer moves.
Specimen stage
Specimen
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SpecimenSpecimen stagestage
In-column motion of specimen: Z-Y-Z shift, rotation/ tilt around a common axis by coresponding mechanism.
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Sample tilt in single obj. lensSample tilt in single obj. lens A major problem with TEM
lens design is the fact that there is very little space between the pole pieces of the objective lens to accommodate the specimen and objective aperture.
This also puts severe constraints on how far the specimen can be tilted within the lens.
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Twin/double objective lensTwin/double objective lens
A clever solution to this problem came in the invention of the double objective or “twin” lens.
In this lens design the specimen actually lies between two separate lens fields allowing for tilt angles as large a 60o from perpendicular to the optical axis.
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Focus Wobbler shifts the image back and forth, and when the movement is stable the image is focused.
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Specimen Specimen preparationpreparation
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Wedge sample Wedge sample -”windows” technique-”windows” technique
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ElectropolishingElectropolishing
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Sample sections after Sample sections after electropolishing and sample gridselectropolishing and sample grids
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Cutting thin sample Cutting thin sample by microtomy by microtomy
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Replica foilsReplica foils
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TEM grids
3 mm
Instrumentation Instrumentation
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Sample positions
Cooling
Standard
Heating
Sample holdersSample holders
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ApplicationsApplications
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Dislocation structureDislocation structure(diffraction contrast) (diffraction contrast)
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Contrast image Contrast image and and
microdiffraction microdiffraction pattern of two pattern of two
screw dislocation screw dislocation groups with groups with
different Burgers different Burgers vectors vectors
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BF and DF BF and DF images of images of
dispersive dispersive precipitates precipitates
in Al-Cr-Zr in Al-Cr-Zr alloyalloy
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Lattice Lattice image of image of
(111) (111) planes in planes in
Ga-AsGa-As
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HR image HR image of of
phase in phase in Al alloysAl alloys
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HR contrast HR contrast image of image of
metal atom metal atom arrangement arrangement
in 1,97 nm in 1,97 nm thick thick
specimen specimen of Nb-W-O of Nb-W-O
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