Lessons for MEMS Test Engineers - Ira Feldman 111020

Wafer probe technology & application overview ira feldman 101108

Silicon Valley Test Workshop - 2.5D-3D What - Ira Feldman 111111

IEEE SWTW 2011 - Probe Card Cost Drivers - Ira Feldman 110615b

Ideal 3D Stacked Die Test - IEEE Semiconductor Wafer Test Workshop SWTW 2013

IEEE SWTW 2012 Road to 450 mm Semiconductor Wafers - Ira Feldman li2

IEEE SWTW 2011 Probe Card Cost Drivers - Ira Feldman 110621

IEEE Semiconductor Wafer Test Workshop SWTW 2014 - International Technology Roadmap for Semiconductors (ITRS)

Environmental leadership: EPA's “Beyond compliance” pilot program