Post on 17-Nov-2021
Page 1 of 21
TEST REPORT
For
Shenzhen RAKwireless Technology Co.,Ltd. Room 506, Bldg B, New Compark, Pingshan First Road, Taoyuan Street, XiLi
town,Nanshan District, Shenzhen, China
Model: RAK7240/RAK7249
This Report Concerns:
Original Report
Product Type:
Outdoor LoRa Gateway
Test Engineer: Jobian Yang
Report Number: RSZ190806001-SF
Test Date: 2019-08-09 To 2019-08-14
Report Date: 2019-08-19
Reviewed By: Andrew Luo
Prepared By:
Bay Area Compliance Laboratories Corp. (Dongguan). No.69,Pulongcun ,Puxinhu Industrial Area, Tangxia , Dongguan, Guangdong, China. Tel: +86-0769-86858888 Fax:+86-0769-86858588
Note: The test data was only valid for the test sample(s). This test report is prepared for the customer shown above and for the specific product described herein. It must not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. (Dongguan).
Report No.:RSZ190806001-SF
Page 2 of 21
TABLE OF CONTENTS
1. TEST PROJECT ......................................................................................................................................... 3 2. GENERAL PRODUCT INFORMATION ...................................................................................................... 3 3. SAMPLE PHOTOS BEFORE THE TEST ................................................................................................... 3 4. TEST EQUIPMENT ..................................................................................................................................... 4 5. ENVIRONMENTAL CONDITIONS ............................................................................................................. 4 6. TEST STANDARD ...................................................................................................................................... 4 7. TEST CONDITION ...................................................................................................................................... 4
7.1 LOW TEMPERATURE STORAGE ....................................................................................................... 4 7.2 LOW TEMPERATURE OPERATION ................................................................................................... 4 7.3 HIGH TEMPERATURE STORAGE ...................................................................................................... 5 7.4 HIGH TEMPERATURE OPERATION ................................................................................................... 5
8. TEST RESULTS ......................................................................................................................................... 5 9. TESTING PHOTO ....................................................................................................................................... 5 10. SAMPLES PHOTOS AFTER THE TEST .................................................................................................. 7 11. FUNCTIONAL TEST DIAGRAM ............................................................................................................... 8
Report No.: RSZ190806001-SF
Page 3 of 21
1. Test Project No. Test Item
1 Low temperature storage test
2 Low temperature operation test
3 High temperature storage test
4 High temperature operation test
2. General Product Information
Sample No. Sample Name Model Quantity
#001 Outdoor LoRa Gateway RAK7249(915MHz) 1pc
#002 Outdoor LoRa Gateway RAK7240(868MHz) 1pc
#003 Outdoor LoRa Gateway RAK7249(868MHz) 1pc
#004 Outdoor LoRa Gateway RAK7240(915MHz) 1pc
3. Sample Photos before the Test
RAK7249
Report No.: RSZ190806001-SF
Page 4 of 21
RAK7240
4. Test Equipment
Test Equipment Model Cal. Date Due Date
Constant temperature and humidity box BTH-408-50 2018-10-12 2019-10-11
5. Environmental Conditions
Temperature: 24.0~26.0˚C; Humidity: 58~65%RH 6. Test Standard
According to customer requirements 7. Test Condition 7.1 Low temperature storage
1. Place #001 and #002 in the temperature chamber. 2. Set the low temperature to -40 °C. 3. After 8 hours, power the sample repeatedly to view the serial port print information. The
order of power-on and power-off is: - 10 times of fast power-on and power-off. - After 5 minutes of interval, 10 times of slow power-on and power-off. - After 5 minutes of interval, the power is fully turned on and off once.
4. Record the data and the test is complete.
7.2 Low temperature operation 1. Place #001 and #002 in the temperature chamber. Place #003 and #004 outside of the
temperature chamber. #001 and #002 as receiving devices, #003 and #004 as transmitting devices.
2. Set the low temperature to -40 °C. 3. Power up the sample and keep the sample in transmit or receive state. 4. Keep this condition for 8 hours. 5. Record the data and the test is complete.
Report No.: RSZ190806001-SF
Page 5 of 21
7.3 High temperature storage 1. Place #001 and #002 in the temperature chamber. 2. Set the temperature to 85 °C. 3. After 8 hours, power the sample repeatedly to view the serial port print information. The
order of power-on and power-off is: - 10 times of fast power-on and power-off. - After 5 minutes of interval, 10 times of slow power-on and power-off. - After 5 minutes of interval, the power is fully turned on and off once.
4. Record the data and the test is complete. 7.4 High temperature operation
1. Place #001 and #002 in the temperature chamber. Place #003 and #004 outside of the temperature chamber. #001 and #002 as receiving devices, #003 and #004 as transmitting devices.
2. Set the low temperature to 85 °C. 3. Power up the sample and keep the sample in transmit or receive state. 4. Keep this condition for 8 hours. 5. Record the data and the test is complete.
8. Test Results
Test Project Test Result
Low temperature storage The sample can start normally at -40 ° C.
Low temperature operation During the test, the sample did not appear to restart, hang up, etc.
High temperature storage The sample can start normally at 85 ° C.
High temperature operation During the test, the sample did not appear to restart, hang up, etc.
9. Testing Photo
Low temperature storage
Report No.: RSZ190806001-SF
Page 6 of 21
Low temperature operation
High temperature storage
High temperature operation
Report No.: RSZ190806001-SF
Page 8 of 21
11. Functional Test Diagram Low temperature storage:
#001
#002