RSZ190806001-SF test report - RAKwireless

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TEST REPORT

For

Shenzhen RAKwireless Technology Co.,Ltd. Room 506, Bldg B, New Compark, Pingshan First Road, Taoyuan Street, XiLi

town,Nanshan District, Shenzhen, China

Model: RAK7240/RAK7249

This Report Concerns:

Original Report

Product Type:

Outdoor LoRa Gateway

Test Engineer: Jobian Yang

Report Number: RSZ190806001-SF

Test Date: 2019-08-09 To 2019-08-14

Report Date: 2019-08-19

Reviewed By: Andrew Luo

Prepared By:

Bay Area Compliance Laboratories Corp. (Dongguan). No.69,Pulongcun ,Puxinhu Industrial Area, Tangxia , Dongguan, Guangdong, China. Tel: +86-0769-86858888 Fax:+86-0769-86858588

Note: The test data was only valid for the test sample(s). This test report is prepared for the customer shown above and for the specific product described herein. It must not be duplicated or used in part without prior written consent from Bay Area Compliance Laboratories Corp. (Dongguan).

Report No.:RSZ190806001-SF

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TABLE OF CONTENTS

1. TEST PROJECT ......................................................................................................................................... 3 2. GENERAL PRODUCT INFORMATION ...................................................................................................... 3 3. SAMPLE PHOTOS BEFORE THE TEST ................................................................................................... 3 4. TEST EQUIPMENT ..................................................................................................................................... 4 5. ENVIRONMENTAL CONDITIONS ............................................................................................................. 4 6. TEST STANDARD ...................................................................................................................................... 4 7. TEST CONDITION ...................................................................................................................................... 4

7.1 LOW TEMPERATURE STORAGE ....................................................................................................... 4 7.2 LOW TEMPERATURE OPERATION ................................................................................................... 4 7.3 HIGH TEMPERATURE STORAGE ...................................................................................................... 5 7.4 HIGH TEMPERATURE OPERATION ................................................................................................... 5

8. TEST RESULTS ......................................................................................................................................... 5 9. TESTING PHOTO ....................................................................................................................................... 5 10. SAMPLES PHOTOS AFTER THE TEST .................................................................................................. 7 11. FUNCTIONAL TEST DIAGRAM ............................................................................................................... 8

Report No.: RSZ190806001-SF

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1. Test Project No. Test Item

1 Low temperature storage test

2 Low temperature operation test

3 High temperature storage test

4 High temperature operation test

2. General Product Information

Sample No. Sample Name Model Quantity

#001 Outdoor LoRa Gateway RAK7249(915MHz) 1pc




3. Sample Photos before the Test

RAK7249


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RAK7240

4. Test Equipment

Test Equipment Model Cal. Date Due Date

Constant temperature and humidity box BTH-408-50 2018-10-12 2019-10-11

5. Environmental Conditions

Temperature: 24.0~26.0˚C; Humidity: 58~65%RH 6. Test Standard

According to customer requirements 7. Test Condition 7.1 Low temperature storage

1. Place #001 and #002 in the temperature chamber. 2. Set the low temperature to -40 °C. 3. After 8 hours, power the sample repeatedly to view the serial port print information. The

order of power-on and power-off is: - 10 times of fast power-on and power-off. - After 5 minutes of interval, 10 times of slow power-on and power-off. - After 5 minutes of interval, the power is fully turned on and off once.

4. Record the data and the test is complete.

7.2 Low temperature operation 1. Place #001 and #002 in the temperature chamber. Place #003 and #004 outside of the

temperature chamber. #001 and #002 as receiving devices, #003 and #004 as transmitting devices.

2. Set the low temperature to -40 °C. 3. Power up the sample and keep the sample in transmit or receive state. 4. Keep this condition for 8 hours. 5. Record the data and the test is complete.


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7.3 High temperature storage 1. Place #001 and #002 in the temperature chamber. 2. Set the temperature to 85 °C. 3. After 8 hours, power the sample repeatedly to view the serial port print information. The

order of power-on and power-off is: - 10 times of fast power-on and power-off. - After 5 minutes of interval, 10 times of slow power-on and power-off. - After 5 minutes of interval, the power is fully turned on and off once.

4. Record the data and the test is complete. 7.4 High temperature operation

1. Place #001 and #002 in the temperature chamber. Place #003 and #004 outside of the temperature chamber. #001 and #002 as receiving devices, #003 and #004 as transmitting devices.

2. Set the low temperature to 85 °C. 3. Power up the sample and keep the sample in transmit or receive state. 4. Keep this condition for 8 hours. 5. Record the data and the test is complete.

8. Test Results

Test Project Test Result

Low temperature storage The sample can start normally at -40 ° C.

Low temperature operation During the test, the sample did not appear to restart, hang up, etc.

High temperature storage The sample can start normally at 85 ° C.

High temperature operation During the test, the sample did not appear to restart, hang up, etc.

9. Testing Photo

Low temperature storage


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Low temperature operation

High temperature storage

High temperature operation


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10. Samples Photos after the Test RAK7249

RAK7240


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11. Functional Test Diagram Low temperature storage:

#001

#002


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Before low temperature operation:

#001(SPI)

#001(USB)


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#002(SPI)

#002(USB)


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#003

#004


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After low temperature operation:

#001(SPI)

#001(USB)


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#002(SPI)

#002(USB)


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#003

#004


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High temperature storage:

#001

#002


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Before high temperature operation:

#001(SPI)

#001(USB)


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#002(SPI)

#002(USB)


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#003

#004


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After high temperature operation:

#001(SPI)

#001(USB)


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#002(SPI)

#002(USB)


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#003

#004

********** End of Report **********

RSZ190806001-SF test report - RAKwireless

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