Post on 07-Feb-2017
Internship Report
Application Overview
PARAMETRIC SHIFT ANALYSES USING ANOVA, DELTA SIGMA, CPK
DEVICE DRIFT ANALYSIS
Automotive Test qualification methods
Group A
Accelerated
Environment
Stress test
Group B
Accelerated
Life time
Simulation
test
Group E
Package
Assembly
Integrity
Tests
Group X
Customer
Specific
tests
Biased HAST
Temperature Humidity Bias
High Temperature Operating Life
Human Body Model (Electro Static Discharge)
Charged Device Model (Electro Static Discharge)
Charged Device Model (Electro Static Discharge)
Low Temperature Operating Life
High score in FMEA
Wafer Fab Transfer
New material
Qualification
Process Change qualification
TP release
Qualification of changes in
manufacturing Process