Modeling and Simulation TWG Hsinchu Dec. 6, 2000 1 Modeling and Simulation TWG Paco Leon, Intel International TWG Members: I. Bork, Infineon E. Hall, Motorola.
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Modeling and Simulation ITWG San Francisco, July 24, 2002 24 July 2002 Work In Progress – Not for Publication Modeling and Simulation ITWG Jürgen Lorenz.
1 Empowering Innovation TSMC Libraries Advanced Technology Standard Cells Industry Standard I/Os.
Recent Challenges. 2 Soft Errors Scaling: SEU (Single-event upset): −Ionizing radiation corrupts data stored Cause: −Radioactive impurities in device.
Taiwan Semiconductor Manufacturing Company, Ltd. The Creator and Leader of the Foundry Industry.
