Test and Test Equipment July 2012 San Francisco, USA Roger Barth.
Compression
On Diagnosis of Multiple Faults Using Compacted Responses Jing Ye 1,2, Yu Hu 1, and Xiaowei Li 1 1 Key Laboratory of Computer System and Architecture Institute.
EE141 System-on-Chip Test Architectures Ch. 2 – Digital Test Architectures - P. 1 Chapter 2 Digital Test Architectures.
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