Effect of mesh grid structure in reducing hot carrier effect of nmos device simulation
IRPS Slides_KAJ4
Comprehensive Radiation Damage Modeling of Silicon Detectors
Trento, Feb.28, 2005 Workshop on p-type detectors 1 Comprehensive Radiation Damage Modeling of Silicon Detectors Petasecca M. 1,3, Moscatelli F. 1,2,3,
