HPK L1 teststructures HPK L1 half moon teststructure corresponding to main chips 6,7 Results on Diode C-V Coupling capacitors polysilicon arrays.
Grounding and Testing L0 (L1) --- noise studies --- Kazu Hanagaki, Sara Lager, Gustavo Otero Introduction of noise issue What is going on the other side.
1 The BaBar Silicon Vertex Tracker (SVT) Claudio Campagnari University of California Santa Barbara.
November 6 2002Vertex 2002 Kazu Hanagaki1 Layer 0 in D0 Silicon Tracker for run2b Kazu Hanagaki / Fermilab for D0 run2b Silicon Tracker group Motivation.
