Combinatorial Testing using Covering Arrays: Going beyond ...
chp-3A10.1007-2F978-3-642-05031-2_1
Combinatorial Testing Using Covering Arrays - Going Beyond Pairwise Testing Raghu Kacker, NIST Yu Lei, UTA 5/15/06.
Name:Wolfgang Grieskamp Title: Software Architect Company: Microsoft Session Code: DEV316.
Jüri Vain Tallinn University of Technology J.Vain Doctoral course ’Advanced topics in Embedded Systems’. Lyngby'09.
Lecture 6 Model-based Testing and Automated Test Case Generation.
Model Based Software Testing Preliminaries Aditya P. Mathur Purdue University Fall 2005 Last update: August 18, 2005.
Natallia Kokash (Accepted for PACO’2011) ACG, 31/05/2011 1 Input-output conformance testing for channel-based connectors 1.
Lecture 6
Nohau Training Course Descriptions
Thoughts on TDL Stephan Schulz Rapporteur Meeting, Munich, Dec 2010
April 20, 2006 Model Program Based Black-Box Testing, Lentedagen, Vught, The Netherlands 1 Model Program Based Black-Box Testing Margus Veanes Foundations.
