bput_mtech_vlsi_2010
Chapter 7 - DSP Based Testing
Chapter 7 - DSP Based Testing. Outline n Trigonometric Fourier Series (FS) n Discrete-Time Fourier Series (DTFS) – Relationship to FS – Working directly.
Expanded “Cookbook” Instructions for the Teradyne Integra J750 Test System Team May 07-12 Client ECpE Department Faculty Advisor Dr. Weber Team Members.
96212_03
