TEST TIME OPTIMIZATION In Scan Circuits Priyadharshini S. Masters Thesis Defense Thesis Advisor: Dr. Vishwani D. Agrawal Committee Members: Dr. Adit D.
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock Priyadharshini Shanmugasundaram [email protected] Vishwani D. Agrawal.
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock
Dynamic Scan Clock Control In BIST Circuits
