Measurement of Residual Stress by Phase Shift Shearography
Photo Elasticity
Diffraction
Automated ADM with micrometer accuracy using the Michelson interferometer 1 Coherent and Electro-Optics Research Group (CEORG) K Alzahrani, D Burton, M.
Functional Bioelectronic Interfaces on Electrolessly Deposited Gold for Bioelectronic Applications Brian L. Hassler, Neeraj Kohli, Lavanya Parthasarathy,
1 Absolute distance metrology: - sweeping wavelength - frequency comb referenced 2 interferometric system P. Pfeiffer* L. Perret** N. Schuhler*** * Université.
Using the Michelson Interferometer Physical Experiment Center 2007 Laboratory.
P. Pfeiffer* L. Perret** N. Schuhler ***
1 Application of polymer materials in thin-film optical devices Alexei Meshalkin Institute of Applied Physics of Academy of Sciences of Moldova Chisinau,
