Dec. 19, 2005ATS05: Agrawal and Doshi1 Concurrent Test Generation Auburn University, Department of Electrical and Computer Engineering Auburn, AL 36849,
Jan 6-10th, 2007VLSI Design 20071 A Reduced Complexity Algorithm for Minimizing N-Detect Tests Kalyana R. Kantipudi Vishwani D. Agrawal Department of Electrical.
Independence Fault Collapsing and Concurrent Test Generation Thesis Advisor: Vishwani D. Agrawal Committee Members: Victor P. Nelson, Charles E. Stroud.
Diagnostic and Detection Fault Collapsing for Multiple Output Circuits
