1 Testing - Overview MotivationMotivation –fault models –testing methods Automatic Test Pattern Generation (ATPG) algorithmsAutomatic Test Pattern Generation.
fireray5000_igb (1)
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 31/22alt1 Lecture 31 System Test (Lecture 22alt in the Alternative Sequence) n Definition n Functional.
Spring 08, Apr 17 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 System Test Vishwani D. Agrawal James J. Danaher.
Apr. 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 311 Lecture 31 System Test n Definition n Functional test n Diagnostic test Fault dictionary Diagnostic.
Testing4.pdf
Lecture 31 System Test
