COTS Testing
4. Sequential Element Design With Built-In Soft Error Resilience
Test
BGP Convergence
Smart Card security analysis Smart Card security analysis Marc Witteman, TNO.
Fuzzing with complexities Vishwas Sharma //nullcon.net
RREACT Reliability and Radiation Effects on Advanced CMOS Technologies A. Paccagnella et al.
Michael Gavin Senior Analyst Forrester Research
nullcon 2011 - Fuzzing with Complexities
Using QEMU for cross development
RCW@DEI - Real Needs And Limits
Playing in Tune: How We Refactored Cube to Terabyte Scale
