The Biased Paracentric Hemispherical Deflector Analyzer
PICO-group SAB presentation, Nov 9, 2006, Jukka Pekola Dr. Alexander Savin senior scientist Dr. Matthias Meschke research scientist Dr. Juha Vartiainen.
Transmission Electron Microscopy Print
Elias Papavasiliou Varvara Lagaki
