The top documents tagged [ebeam hardware]

Luidia eBeam Interact V2.2 Software Features VF

Luidia eBeam Interact V2.2 Software Features VF

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1 Optimized cavity-enhanced compact inverse-Compton X-ray source for semiconductor metrology Jeremy Kowalczyk (BS Cornell '00 ECE) (jeremymk@hawaii.edu)

1 Optimized cavity-enhanced compact inverse-Compton X-ray source for semiconductor metrology Jeremy Kowalczyk (BS Cornell '00 ECE) ([email protected])

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