The top documents tagged [drop impact reliability]

-1- Andrew Farris Add Company Logo Here May 27 – 30, 2008 58 th ECTC, Lake Buena Vista, May 27–30, 2008 Drop Test Reliability of Lead-free Chip Scale Packages.

-1- Andrew Farris Add Company Logo Here May 27 – 30, 2008 58 th ECTC, Lake Buena Vista, May 27–30, 2008 Drop Test Reliability of Lead-free Chip Scale Packages.

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