presentation
HP Quality Center Portfolio Overview Valérie Joubert SOGETI – Managed Testing Services Carole Malinge HP Software & Solutions France Sogetis Second Testing.
Tmax for ATPG n Diagnosis
Comprehensive Study on Designing Memory BIST
Coverage-Based Testing Strategies and Reliability Modeling for Fault- Tolerant Software Systems Presented by: CAI Xia Supervisor: Prof. Michael R. Lyu.
Jan 6-10th, 2007VLSI Design 20071 A Reduced Complexity Algorithm for Minimizing N-Detect Tests Kalyana R. Kantipudi Vishwani D. Agrawal Department of Electrical.
Coverage-Based Testing Strategies and Reliability Modeling for Fault-Tolerant Software Systems
Automated Counterfeit IC Physical Defect Characterization
