Intel trng report_20120312
505 Army Base Workshop
Embedded Memory Bist for Systems-On-A-chip
Lv3421272135
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock Priyadharshini Shanmugasundaram [email protected] Vishwani D. Agrawal.
Vishwani D. Agrawal Foster Dai Auburn University, Dept. of ECE, Auburn, AL 36849, USA
tpg_PRESTO.docx
Actuation Systems
