Partial Scan Design with Guaranteed Combinational ATPG Vishwani D. Agrawal Agere Systems, Circuits and Systems Research Lab Murray Hill, NJ 07974, USA.
Oct. 5, 2001Agrawal, Kim and Saluja1 Partial Scan Design With Guaranteed Combinational ATPG Vishwani D. Agrawal Agere Systems Processor Architectures and.