Copyright 2001, Agrawal & BushnellLecture 12: DFT and Scan1 VLSI Testing Lecture 10: DFT and Scan n Definitions n Ad-hoc methods n Scan design Design.
Copyright 2005, Agrawal & BushnellLecture 9: Analog Test1 VLSI Testing Lecture 9: Analog Test Analog circuits Analog circuit test methods Specification-based.
VLSI Testing Lecture 10: DFT and Scan
VLSI Testing Lecture 9: Delay Test
