Atomic Force Microscope and its potential use in biology
Figure 3.1. Schematic showing all major components of an SPM. In this example, feedback is used to move the sensor vertically to maintain a constant signal.
Introduction to Atomic Force Microscopy. AFM Background Invented by Binnig, Quate, and Gerber in 1986 Measures the interaction forces between the tip.
From the Human Eye Down to Microscopes at the Nano-Scale
Optical and Atomic Force Microscopy for analysis of wet sediments from the Canale dei Navicelli LIFE 12 ENV IT 000652 Cleansed.
Lecture 8: Measurement of Nanoscale forces II. What did we cover in the last lecture? The spring constant of an AFM cantilever is determined by its material.
Imaging
Notre Dame extended Research Community 1 From the Human Eye Down to Microscopes at the Nano-Scale Michael Crocker Valerie Goss Pat Mooney Rebecca Quardokus.
The Atomic Force Microscope
Advanced Manufacturing Choices
Announcements Mid-Term Test next Tuesday in class! (Oct. 7 th, 9:30-11am, Rm 136LLP) Will cover all of classes Lec 1-10 plus (qualitatively) on Lec 11–
