Source of Acquisition NASA Goddard Space Flight Center
Stephen Meyer, Stephen Buchner,, Harvey Moseley, Knute Ray, Jim Tuttle, Ed Quinn, Ernie Buchanan,
Dave Bloom, Tom Hait, Mike Pearce, David A. Rapchun
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
1
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To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29.2006
2
To be presented by Stephen Meyer and Stephen Buchner at Radiation and its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 1
https://ntrs.nasa.gov/search.jsp?R=20070022224 2019-04-06T02:41:45+00:00Z
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;: Earth i' .e* ..f
Moon ..... *............'..' 0 Temperature
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 21333 Athens Greece. September 27-29, 2006
3
Telescope Focus
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I To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 2729,2006
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To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 2
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on 5 Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 3
I I
D"
I DDD
To be presented by Stephen Meyerand Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
nun.:.
7
0 TID Effects (1 pm process) in gate and field oxides. - Electrons exit oxide - Holes are trapped at generation site
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
8
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 4
0 Above approximately 3x4 O6 Voltskm, the holes and protons are mobile.
0.0
0.25
- + 0, p 0.w
(4MVlcm) 0 3 0.75
1.0 $04 10-3 10-2 10-1 100 io1 io* 103
TIME AFTER PULSE (8)
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
9
Both TID and SEE at the same time
Devices at 30 K during irradiation
Heavy ion needed for Single Event Dielectric Breakdown (SEDB) test
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
10
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 5
Proton (63 MeV) Fluence (cm") To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
11
z- E
2
v + c L
3 (I) 0) m Y m (I) -I
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RAOECS) 2006, Athens Greece, September 27-29,2006 I
12
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 6
To be presented by Stephen Meyer and Stephen Buchner at Raoiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29.2006
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0 Features - 1 .O pm, Single Poly/Double Metal, HV CMOS - Closed transistors via ion implantation to suppress
leakage currents in “bird’s beak region of NMOSFETs
- Gate oxide thickness reduced by 50% 1100 A for HV transistor (SEGR)
e 200 A for LV transistor
0 Added Functions - Mask to isolate faulty outputs - Comparator to measure Vout
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
14
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 7
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
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1
To be presented by Stephen Meyer and Stephen Buchner at Kaaiatlon and Its tttects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006 I 16
I
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 8
m Performed at 30 K in a dewar
0 Co60 (gamma ray source)
Dose rate was -7 krad(Si)/hr
- Eight devices
- Up to 200 krad(Si)
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29.2006
17
Total Current Through Eight Devices
t t t t Tested While Irradiated with Gamma Rays
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece. September 27-29,2006
18
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 9
Total Current Through Eight Devices I
t t t t I Tested While Irradiated with Gamma Rays I
1 To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
19
Channel Uniformity 200 KRad
10
5
0 0 m a, Bo 1w im 140
Channel Nurnber
To be presented by Stephen Meyer and Stephen Buchner at Radlatlon and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29.2006
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To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 10
n
2 .c P) .- I c =I 9. c a 0
0 50 100 150 200
Total Dose [krad(Si)] To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece. September 27-29,2006
40 V
40 V
ov
5v
ov
21
5 .
ov
40 V
40 V
ov
To be presented by Stephen Meyer and Stephen Buchner at Radiation arid Its Effects on 22 Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006.
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006 I 23
I To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
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To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 12
* The original HV583 level shifter - a COTS part -was not suitable for JWST because the supply currents exceeded specs after 20 krad( Si) .The HV584 - functionally similar to the HV583 -was designed using RHBD approach that reduced the leakage currents to within acceptable levels and had only a small effect on the level-shifted output voltage.
To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006
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To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 13
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