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The application of electron backscatter diffraction and ...johnf/g777/AmMin/Prior-1999.pdfIn a scanning electron microscope (SEM) an electron beam sets up an omni-directional source
Monte Carlo simulation of zOutline: EPMA measurements on ...johnf/g777/777Penelope/PENEPMA-Madiso… · 2 M&M 2006 7 zElectron/positron interactions (Energy: 50 eV to 1 GeV) M&M 2006
Microsc. Microanal. 12, 2–25, 2006 DOI: 10.1017 …johnf/g777/MM/Friel-xraymap.pdf · 2008-08-29 · Tutorial Review X-ray Mapping in ... X-ray mapping in the SEM or EPMA may be
Microsc. Microanal. 7, 100–107, 2001 DOI: …johnf/g777/MM/Duncumb.pdf · the 20th century, the basic physics was soon understood, but it required the invention of the curved crystal
Determination of Fe3+/Fe using the electron microprobe: A ...johnf/g777/AmMin/Lamb-2012.pdf · table uncertainties that arise when characterizing the chemical composition of minerals
[J. Res. Natl. Inst. Stand. Technol. 107 Sample ...johnf/g777/NIST/NIST-Geller.pdf · That is, the sample analyzed should be representative of the population ... except care must
Introduction to IntAct Pablo Porras Millán, IntAct [email protected].