Workshop PHOTOTRANSISTORS Septembre 9, 2003, Budapest / Hungary C. Gonzalez 1 Workshop «...

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Workshop PHOTOTRANSISTORS Septembre 9, 2003, Budapest / Hungary C. Gonzalez 1 Workshop « Phototransistors » September 9, 2003 Budapest Hungary InP-based Phototransistors and comparison of performances to those of PIN and UTC photodiodes Carmen Gonzalez Alcatel R&I - Laboratoire OPTO+ Carmen. [email protected]

Transcript of Workshop PHOTOTRANSISTORS Septembre 9, 2003, Budapest / Hungary C. Gonzalez 1 Workshop «...

Page 1: Workshop PHOTOTRANSISTORS Septembre 9, 2003, Budapest / Hungary C. Gonzalez 1 Workshop « Phototransistors » September 9, 2003 Budapest Hungary InP-based.

Workshop PHOTOTRANSISTORS Septembre 9, 2003, Budapest / Hungary C. Gonzalez 1

Workshop « Phototransistors »September 9, 2003 Budapest Hungary

InP-based Phototransistors and comparison of performances to those of

PIN and UTC photodiodes

Carmen Gonzalez

Alcatel R&I - Laboratoire OPTO+Carmen. [email protected]

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Outline

InP/InGaAs-based bipolar phototransistor

Photo-HBT performances as a direct photodetector

Optoelectronic integrated circuits OEIC:- O/E narrow band amplifier- O/E upconverting mixers

Performances of:- Top illuminated PIN photodiode- Back illuminated UTC photodiode

Summary

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Choice of material to maximize carrier velocities

Material System : InP (despite of cost) vs GaAs

InP, InGaAs : Higher electron velocities and lower surface recombination velocities than GaAs

InGaAs : Narrow band gap Eg = 0.75 eV, compatible with the detection of 1.30 and 1.55 µm wavelength light

Photo-HBT developed at OPTO+

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Photo-HBT developed at OPTO+

Layer Growth : Chemical Beam Epitaxy

Base Layer : Carbon doped Low diffusion coefficient

Compositionally graded-base InxGa1-XAs

Vertical structure Key technology : epitaxy

• no antireflection layer

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Emitter area : 9 µm2

Base area : 44 µm2

Optical window area : 16 µm2

-20

-15

-10

-5

0

5

10

15

20

25

1,00E+08 1,00E+09 1,00E+10 1,00E+11 1,00E+12

Frequency (Hz)

Ph

oto

resp

on

se (

dB

)

20 dB/decade

FC = 110 GHz

FCPD-mode

Tr-mode

Gopt = 32 dB

Photo-HBT as a direct photodetector

1A/W

R(A/W)20.LogR(dB)

RDC = 0.2 A/W

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Saturation characteristics

Photo-HBT saturation at 19 GHz

-60

-55

-50

-45

-40

-35

-30

-25

-20

-15 -10 -5 0 5

Pavg (dBm)

RF

ou

tpu

t p

ow

er

(dB

m)

-1 dBTr-mode

@ -1dB: -21 dBm

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photo-HBT CHAIN

Spectrum

Analyser

32C

E

B1

<Iin

>

Ib_ tot

Ib_ tot =I b_ elec + Iph

LNAb-tee

G = 50 dB

NF < 5 dB Psys_noise

(dBm/Hz)

RBW = 2 MHz

Analog noise characteristics

Input noise current spectral density <Iin> (pA/Hz^0.5)

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Analog noise characteristics

Input noise current spectral density

@ 40 GHz: Ic <Iin> (mA) (pA/Hz^0.5)

2 50 10 66

0

10

20

30

40

50

60

70

80

1,00E+09 1,00E+10 1,00E+11

Frequency (Hz)

<Ii

n>

(p

A/H

z^0.

5)

36 pA/Hz 0̂.5@28 GHz

51 pA/Hz 0̂.5@28 GHz

28 GHz

Ic = 10 mA

Ic = 2 mA

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Data signal : 25 Mb/s, 16 QAM

1,E-11

1,E-10

1,E-09

1,E-08

1,E-07

1,E-06

1,E-05

1,E-04

1,E-03

1,E-02

10 15 20 25 30C/N (dB)

BE

R

@ 27.875 GHz

@ 800 MHz

photo-HBT at 27.875 GHz

Pavg = -5,5 dBm

R = 0.35 A/WIc = 10.3 mA

Digital noise characteristics

BER at 10-9: C/N = 24.3 dB

Laser 1.55 m

Photo-HBT

Opticalattenuator

EOM 5 dBm

LNA

MPG2 Generator

16 QAMmapping

I Qmodulator1.6 GHz

OL29.475 GHz

Filtre27.875 GHz

BERmeasurements

OL2.4 GHz

OL29.475 GHz

27.875

GHz

1.6 GHz800 MHz30 dB

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OEIC using photo-HBTs

-25

-15

-5

5

15

25

35

45

55

10 15 20 25 30 35 40

Frequency (GHz)

TZ

Gai

n (

dB

Oh

m)

GTZ @ 28 GHz = 50 dBOhm

4 GHz

Photodetection at 27.875 GHz

1,E-12

1,E-11

1,E-10

1,E-09

1,E-08

1,E-07

1,E-06

1,E-05

1,E-04

1,E-03

14 16 18 20 22 24 26 28C/N (dB)

BE

R PINPavg = 1 dBm

photo-HBT circuitPavg = -5 dBm

Data signal : 25 Mbit/s 16 QAM

PhotoHBT

/4 line

CB VC

E

OutIn

IB

h

RBp

ol

An O/E narrow-band amplifier at 28 GHz: 2 cascode cells with 1 photo-HBT+3HBTs

Transimpedance Gain = 50 dB @ 28 GHz

BER at 10-9: 24.3 dB

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B B B B

PLOPRF

Cascode cells28 GHz

Photo-HBT

B B

PLO PRF

Chip size : 1634 x 1300 µm2

42 GHz

Chip size : 2850 x 1600 µm2

Optoelectronic mixers using photo-HBTs

Upconversion mixer from 2 GHz to 28 GHz and to 42 GHz

HBTphotoPDmodeout

circuitoutconv

)(IFPIF)(LOP

G

Gconv

28 GHz 17.8 dB

42 GHz 9.2 dB

Mixer

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Top illuminated PIN photodiode

P

I

N

Trade-off between efficiencyand speed (bandwidth)The better performances with aPhotoabsorption layer of 400nm: Bandwidth = 30 GHz R = 0.30 A/W

Photoabsorption layer

The main attraction of this device is itscompatibility for integration with SHBTs.For example, this photoreceiver realized byD. Huber et al., IEEE JLT 2000

P+:InGaAs

InGaAs

N+:InGaAs

SHBT Base-collector homojunction = PIN homojunction Bandwidth = 53 GHz Transimpedance gain = 44.3 dB

PINphotodiode

SHBT-based preamplifier

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PIN photodiode

For higher-speed operations, waveguide or travelling-wave photodiodes

are proposed. TW-PD with bandwidth of 100 GHz has been reported.

However, photoreceivers based on edge-coupled PIN PDs exhibit similar

characteristics to those obtained with top-illuminated PIN-PD

Top-illuminated phototransistors, which offer internal gain, could greatly

reduce the need for preamplification, with circuits less complicated than

those associated to PIN PD, in particular at millimeter wave frequencies.

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In high-speed optical systems optical pre-amplifier can be installed directly in front of the photoreceiverNeed of photodiodes with broad bandwidth, high responsivity and high output power

Back illuminated UTC photodiode

p-Contact Subcollector

Barrier

Basep+p+

p+

Collectorn

n+

Opticalabsorption region

Space-chargeregion

CB

VB

+

-Uni-traveling-carrier photodiode principle

Separate absorption and space-charge region:

high carrier density

Electrons only contribute to drift current:

transit time improved

Proposed by T. Ishibashi et al., NTT, 1997

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Back illuminated UTC photodiode

p+ : Base contact

p+ : Barrierp+ : Base

absorption layer

Composite collector

Sub-collector

InP-Substrate

Thickness (nm)

Responsivity (A/W)

Bandwidth (GHz)

Vpp (V)

Collector Base 208 140 140

0.16 A/W

0.16 A/W

152 GHz 114 GHz 125 GHz

0.65 V 1.9 V 0.6 V

Since UTCs require a thin absorption layer:

Responsivity is relatively low* < 0.2 A/W

Need of edge-illumination for improving R

*The responsivity is generally the same as that of a PIN-PD for the same absorption layer thickness

Shimizu et al. IEEE PTL, vol 10, pp. 412, 1998

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Light

Thickness (nm)

Responsivity (A/W)

Bandwidth (GHz)

Collector Base 200 280

0.43 A/W

54 GHz

Output power dependance on input light

UTC photo-HBT 20 GHz 19 GHzPopt 2.5 dBm 2.5 dBmPRF -30 dBm -21 dBm

UTC refracting-faced photodiode

To achieve higher responsivity in edge illuminated configuration

Fukushima et al. EL, vol 37, pp 780-781, 2001

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Summary - Future prospect

High speed photo-SHBT based on InP technology

Frequency performances up to the mm-wave band

Compatible with SHBT technology for monolithically

integrated photoreceivers (amplifiers, mixers, oscillators)

It is well suited for performing more complex O/E functions, as mixing

or selft-oscillation, at high frequency and high bit rates