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DISTRIBUTION STATEMENT A. Approved for public release as Document #88 ABW-09-4332Distribution is unlimited.
TELA Wideband Array
Demonstration
Thomas W. Dalrymple
Materials Engineer
AFRL/RYDR
6 April 2010
2
Transformational Element Level Array
(TELA) Testbed
6 April 2010
Wideband Arrays
Miniature WidebandReceivers
Wideband Digital Beamforming
Integrated RF Front-end MMICs
Sub-System IntegrationSub-System Modeling
Sub-System Testing
Multiple High-gain beams
Improved Range Resolution
Plastic Packaging
TDU MMIC
Wideband SIGINTDigitalReceiver
Centralized Beamformer
OutputBeam
x1 x2 xN
y = wTx
Weight and Sum
3
Time Delay Beamsteering
• Requirements
– 1 – 8 GHz RF Bandwidth (BW)
– >2 GHz Instantaneous BW
– ± 60° scan
– 8 element linear array
• Element Level Phase Shifting
– Traditional Approach
– Frequency Dependent
– Leads to beam squint over instantaneous bandwidth
• Element Level Time Delay– Frequency Independent
– Accurate beam pointing over broad frequency range
– Avoid Elaborate Calibration Schemes
– Wideband Replacement for Phase Shifters
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4
TELA TDU Module
• Module developed by AFRL & Cobham (formerly REMEC & M/A-COM)
• Flat insertion loss vs. frequency and delay state
• 100 MHz Serial Control ASIC with Cyclic Redundancy Checking
• Plastic QFN Packaging for light weight and reduced cost
– Compared to traditional Ceramic Packaging
• 8-bit True Time Delay Unit
– 764-ps total delay, 4-ps LSB
• 0.8 – 8 GHz Frequency Coverage
• 6-bit Attenuator
– 31.5-dB total attenuation, 0.5-dB LSB
• 20-dB gain, 5-dB NF
• 18-dB I/O return loss
• 13 mm x 9 mm
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5
Measured On-Wafer Gain and Return Loss of
TDU MMIC for Cardinal Time-Delay States
0 1 2 3 4 5 6 7 8 9 10 11 12
Frequency (GHz)
-40
-20
0
20
40
Input RL
Output RL
Res
po
nse
(d
B)
Gain
On-Wafer RF Probe Data; No Bond Wires; T = 25 C; VD = +3.3 V, ID = 150 mA;-3.3 V supply current – 2 to 4 mA
The gain change from reference for any cardinal state (4-, 8-, 16-, 32-, 64-, 128-, 256 psA and 256 psB bits) is typically less than 0.5 dB. There is a very small change in the input and output return loss.
6 April 2010
6
Measured Time-Delay of
Packaged TDU Module
0.5 1.5 2.5 3.5 4.5 5.5 6.5 7.5 8
Frequency (GHz)
0
200
400
600
800
1.0 GHz16.3
1.0 GHz31.1
1.2 GHz63.0
1.0 GHz123.7
1.0 GHz264.1
1.0 GHz767.5
4.5 GHz16.5
4.5 GHz32.3
4.5 GHz780.9
4.5 GHz61.0
4.5 GHz124.5
4.5 GHz260.6
Tim
e-d
elay
(p
s)
6 April 2010
7
AFRL Control ASIC
• Serial to parallel control using daisy chain architecture
• Low cost scalable control approach
• Reduces routing complexity vs. competing control techniques
6 April 2010
Legend:
Data
Latch
Master Latch
SL
SL
SL
SL
SL
SL
SL
SL
SL
MS MS MS
OL
FPGA
Beamsteering Commands
(Ethernet)
3x3 Phased Array
8
Time Delay Array – 1D Scan
• Time Delay Array is capable of 1-D Scan across Azimuth
• Array combines 8 columns of 16 elements each into 8 outputs received by the TDU board which forms beams along the azimuth direction
256 Element Wideband ArrayCenter 8 Columns Used
8 x 1 8 1
Power & control lines
8 Element TDU Board 8:1 Combiner Board
PC Motherboard FPGA
Ethernet
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9
Test Setup
Phased Array Nearfield Calibration and Holography (PANCHO) Chamber
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10
TDU Array Patterns - Boresite
Initial Patterns2 GHz
Instantaneous BW
6 April 2010
11
TDU Array Patterns - 26° Steer
TDU Steered Pattern
Ideal Pattern
Cable Steered
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12
TDU Array Patterns - 45° Steer
TDU Steered Pattern
Ideal Pattern
Cable Steered
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13
Summary
• Initial demonstration of time delay technology has
proven successful
• Future efforts
– 16 Element Array
– 2D Scan Array with 64 elements
– Multi-beam array demo
6 April 2010