Wetting Behaviors of a-C:H:Si:O Film Coated Nano-scale Structured Surface
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Transcript of Wetting Behaviors of a-C:H:Si:O Film Coated Nano-scale Structured Surface
Wetting Behaviors of a-C:H:Si:O Film Coated Nano-scale Structured
Surface
Tae-Young Kim*,*** , Bialuch Ingmar **, Klaus Bewilogua **, Kyu Hwan Oh ***and Kwang-Ryeol Lee *
* Future Technology Research Division, KIST, KOREA** New Tribological Coating, Fraunhofer IST, GERMANY
***School of Material Science and Engineering, SNU, KOREA
The International Conference OnMetallurgical Coatings And Thin Films
ICMCTF 2006
Lotus Leaf Surface
• Property of lotus leaf– Water droplet is not
spread (static wetting angle reached 150o)
– Water droplet removed by slight tilting of surface (wetting angle hysteresis is very low)
Applications of Super-hydrophobic Surface
Water repellent surfaceSelf cleaning of surfaceLow resistance coating against liquid flow
Applications related with water droplet moving
Microstructure of Lotus Leaf
Surface Material - cuticular wax Surface morphology – very rough in micrometer scale
20μm
Planta, 202,(1998) 1
Previous Works
Langmuir 2004; 20(2); 287-290
Langmuir 2004; 20(2); 10015
Langmuir 2006; 22; 2433
Dual Roughness Effect?
20μm
Planta, 202,(1998) 1
Motivation of This Work
• Does dual roughness surface structure (DRS) affect super- hydrophobic property?
• How much does DRS contribute the hydrophobic property?
Experimental
Surface structure control:Plasma Si etching technique
Nano-meter size metal mask formation
Surface chemical control: hydrophobic a-C:H:Si:O film
deposition
Super-hydrophobic surface
Analysis
Plasma Si Etching
Plasma source gas : CF4
Plasma source gas : CF4+O2
CF4+O2 plasma gasCF4 plasma gas
Si wafer Si wafer
– RF-PECVD– Source gas : Pure CF4 gas and CF4+O2 mixing
gas – Chamber Pressure : 2 and 5 Pa– RF power : 150 and 300 W– RF bias : 300V– Etching time : 10min
Plasma Si Etching
Plasma source gas : CF4
Nano post formation
Plasma source gas : CF4+O2
Flat etched surface
400nm 400nm
Surface Structure Manipulation
Without Cu mask
CFCF44+O+O2 2
plasma plasma etchingetching
CFCF44 plasma plasma etchingetching
Si wafer
Si wafer
Flat
Small Post
Nano Size Metal Dot Formation
Si wafer
Metal film separation byby heat treatment
Cu sputtering on Si surface
Surface Structure Manipulation
Without Cu mask With Cu mask
CFCF44+O+O2 2
plasma plasma etchingetching
CFCF44 plasma plasma etchingetching
Si wafer
Si wafer
Flat
Small Post
Si wafer
Si wafer
Surface Structure Manipulation
Without Cu mask With Cu mask
CFCF44+O+O2 2
plasma plasma etchingetching
CFCF44 plasma plasma etchingetching
Si wafer Si wafer
Si waferSi wafer
Flat Big Post
Small Post Dual Rough
Microstructures
Without Cu mask With Cu mask
CFCF44+O+O2 2
plasma plasma etchingetching
CFCF44 plasma plasma etchingetching
Big Post
Small Post
Flat
500nm
250nm
500nm
500nm
Dual Rough
Static Wetting Angle
Without Cu mask With Cu mask
CFCF44+O+O2 2
plasma plasma etchingetching
CFCF44 plasma plasma etchingetching
Water drop volume : 5μLGently drop on the surface
93.2o 103.8o
134.0o 159.6o
Flat Big Post
Small Post Dual Rough
Static Wetting Angle
• Wetting angle hysteresis
RA
Dynamic Wetting Angle
A R
Wetting angle hysteresis
High Low
Dynamic Wetting Angle
Dynamic Wetting Angle
Without Cu mask With Cu mask
CFCF44+O+O2 2
plasma plasma etchingetching
CFCF44 plasma plasma etchingetching
Flat Big Post
Small Post Dual Rough
: o
o
93.2
:15.3
Y
: o
o53.
1 3.8
8
0
:
Y
: o
o48.
1 4.0
7
3
:
Y
: o
o
159.6
4.8 :
Y
Dynamic Wetting Angle
Dual Rough Structure Effect
134.0Static
wetting angle
159.6
48.7Wetting
angle hysteresis
4.8
Conclusions
• We fabricated various structures with mono and dual roughness through nano structuring of Si and studied their wetting behavior.
• Dual rough structure shows higher static wetting angle and lower wetting angle hysteresis than that of mono structures.
• Dual rough structure could be effective structure for moving droplet application.