VISpION Prospekt

VISpION 2

INDEX

1_ThE VISpION SENSOr SySTEm

2_SySTEm cOmpOSITION

3_hOw ThE SySTEm wOrkS

4_pOTENTIal uSES Of VISpION

5_uNIquENESS aND bENEfITS

6_EXamplES Of pOTENTIal uSE

6_1_Textile coating

6_2_crystalline Structure formation

6_3_Engine block castings

6_4_bulk Granular coffee

6_5_quality control on printing

6_6_Spectrum analysis in flame process

7_DEVElOpmENT

8_cONDITIONS fOr purchaSE

9_DETaIlED TEchNIcal DEScrIpTION

10_cONTacT DETaIlS

VISpION �>> back to Index

1_ThE VISpION SENSOr SySTEm

employs a new fractal recognition and analysis algorithm that greatly improves the capabilities of optical sensors. It is a versatile tool for material analysis and quality control, and for process analysis and control. It solves the problems inherent in the limitations of standard sensors that use conventional optical imagery. Instead, VISpION system uses its patented digital fractal analysis system, and is an all-in-one solution that offers dramatic increases in:

• ability to identify patterns and abstract required data in apparentlychaotic surfaces, processes, or systems

• speed

• accuracy

• consistency

• system and unit cost

• adaptability

• processing time and storage overhead

• costs/benefit and productivity VISpION will analyse production processes, and perform surface analysis, shape and structure analysis, sequence analysis, or spectra analysis.

VISpION is especially suited to amorphous or difficult-to-inter-pret applications where subtlety, apparent chaos, extraneous environmental factors, or ambivalence confuse or defeat other sensor systems.

VISpION offers instant data on any examined surface or environment, in-cluding solids, liquids, and gases; and situations that are static or in flux, including changes to surface composition, integrity, shape, spetra, flame temperature, etc.

VISpION uses logarithmic fractal mathematics, and creates a “fractal dimension” quotient for each “image”, or, in other words, each instance of analysis.


The system is also versatile and user-adjustable. It will make evaluative statements about objects, object flows, or processes according to user-defined criteria. It can operate in any environment, and offers the ability to employ visible light, or alternatively, only a portion of the visible spec-trum, or to use other electro-magnetic, thermal, or sonic impulses, as appropriate to the subject of analysis.

The VISpION sensor and reporting system is specifically designed to be easily adapted to many applications and environments. The system can both store the data and display needed data in a user-friendly interface.


2_SySTEm cOmpOSITION

The system is composed of:

1. an illuminating device: depending on application, illumination may be by imaging ray bundle, or, for example, by fibre optics, transmis-sion, hologram generator, laser diode, x-ray, or any other detectible source.

2. a signal receiving device,

�. a detection-event and data storage unit,

�. and dedicated VISpION calculation and analysis software with a graphic user interface.


3_hOw ThE SySTEm wOrkS

a. The physical sensor components, custom-adapted for the intended application, are fixed in position to read illumination from object(s) to be analysed. The system is adaptable for laboratory, assembly-line, fabrication plant, optical instrument. The sensor illumination can be varied by spectrum or time or other modulation. The size and shape of the field of illumination can be adjusted. Polarizing, grid, or frequency filters (chroma) may be applied.

b. Using a fractal algorithm, the sensor interprets a sequence of reflected or transmitted image patterns and performs a logarithmic

calculation, to determine a “fractal dimension” for each occurrence of specimen examination.

c. The system can analyse individual objects, sequences of objects, material flows, and processes in real time. The system will comment on examined specimens in relation to user-defined criteria.

d. VISpION will recognize specimen qualities and report on consistency or rate of change. That is, it will identify specimen units that exhibit qualities outside of defined parameters, or report changes in

processes that are outside of parameters.

e. The user may input desired variables, such as an upper and lower tolerance.

f. The system stores detection event data for each step of compari-son. The system will display event data in real time or save for post-event analysis, or reporting.


4_pOTENTIal uSES Of VISpION

The system is designed to be easily adapted to a broad range of applications:

• Industrial, chemical, medical, graphic arts and printing industry.

• Quality control of industrial processes where shape, texture, spectra, diffusion, opacity, or reflection are evaluative properties.

• Quality control of such products, liquids, gases, or material flows.

• Analysis and comparison to production samples, to a prototype, or to a norm, with user-adjustable parameters.

• Detection of forgery in works of art, financial instruments, signa-tures, or currency.

• Analysis of flame or ignition spectra or pattern.

• Analysis of pore patterns, scar patterns, bubbles in foams, folding patterns, welding faces, casting surfaces, color registration and

cellular patterns.

• Analysis of maps, weather systems, and geological formations.

VISpION 8>> back to Index

5_uNIquENESS aND bENEfITS

The VISpION system is especially astute at discerning patterns and accurately abstracting evaluative criteria in apparently chaotic or ambiguous situations.

The VISpION system is a single system that can be easily adapted to many dissimilar applications, environments, and uses.

In real time, VISpION’s sensor bundle receives and interprets the digital optical data simultaneously and automatically from a number of areas of affinity on the subject or within the subject process.

The system is equally responsive to transmitted or reflected light or electro-magnetic energy over a wide range of frequencies. VISpION offers unusually high competence over a wide variety of applica-tions, and offers both data storage and instant reporting.

VISpION recognition parameters are easily user-adjustable through dedicated software, using the same logic for all applications.

The system is user-friendly: it does not require competence in the VISpION logic or code.

The system is extremely cost-effective, in terms of up-front cost, set-up cost, operational efficiency, and resultant savings in productivity.

Data is reported in real time while processes are running and parameter adjustments and corrections may be made to the specimen environment or to the reporting variables while processes are running.

The VISpION system requires very reduced real-time data volume and reduced data storage volume compared to conventional optical systems.

The VISpION sensor unit requires an extremely small footprint and can be introduced easily into the application environment.



6_1_Textile coating

Sample A Sample B

The system reports on quality control on a textile fleece manufacturing production line: One sample within parameters and one sample outside parameters.



6_2_crystalline Structure formation

Before crystalisation After

The system reports on the integrity of the process of crystalline structure formation.



6_3_Engine block castings

Sample A Sample B

VISpION examines engine block castings for Daimler AG



6_4_bulk Granular coffee

Sample A Sample B

The system performs quality control on bulk coffee.

VISpION 1�>> back to Index


6_5_quality control on printing

Printing Specimen

VISpION detects integrity of printed piece.



6_6_Spectrum analysis in flame process

The system analyses the spectrum, and thereby the temperature, and also the continuity of a flame process.


7_DEVElOpmENT

The VISpION system was conceived, researched, designed, and refined by development engineer Gebhard Birkle, principal of Pheno Struktursensorik at Bodensee, Germany. Mr. Birkle has fifty years of experience in industrial processes, atomic physics, and electron microscopy, with a development focus on densitometry, optical sensor and laser systems, and production techniques. Mr. Birkle has developed more than thirty patented inventions in the field.

The initial impetus for the development of the logic and system that would become VISpION was in response to client requests for an accurate way to analyse and classify cognate structures, among others for example, blowholes within the surfaces of pistons. The sampling and scanning were accomplished conventionally. However, it became apparent that for this application, and for many other client applications, much finer sorting and grading, increasaed accuracy, and faster speed, were ideally required. Could there be a single universal solution to all of these different situa-tions?

The Eureka moment occurred while on holiday at Dorgalie, Sardinia, while Mr. Birkle was exploring a deep cave with a group of friends. The approach to the cave had been through a hilly area of olive groves, and Mr. Birkle, an amateur painter, was intrigued by the patterns of shape and color crea-ted by this landscape. During the long descent into the cave, he was asto-nished to recognize similar patterns in the underground rock formations. During the ascent, Mr. Birkle lagged behind the group as he marvelled at what appeared to be similar and self-affined patterns – fractals - in what he was seeing. He emerged from the cave and announced, “I have it!” to the waiting goup of astonished friends.

He returned to the lab and embarked on a study of fractal analysis of chaotic patterns and systems, including electrical resistance patterns in super-conductors. Informed also by his previous experience with the limi-tations of sensoric applications, Mr. Birkle in time successfully created the interpretive logic that could employ fractal analysis in interpreting optically-acquired sensor data.

Research was then undertaken to change completely the paradigm of sen-soric data analysis to an algorithm based on this fractal logic. All physical observations could then be reduced to mathematical quanta and related functions. The concept was simple and elegant. Further development, testing, and refinement were undertaken to bring the system to the cur-rent level ofaccuracy, consistency, reliability, and versatility.


The development process has included computer modelling; successive prototype development, including miniaturisation, modification of illumi-nation and receiving unit bundles, refinement of algorithm and GUI; and successful on-site trials in more than thirty industrial applications.


8_cONDITIONS fOr purchaSE

The purchaser will receive outright ownership of the System, including ow-nership of rights to developed hardware and VISpION software, including source code, European and U.S. patents, and rights to market exploitati-on.

The ideal purchaser will be experienced in the field of detection technology engineering, manufacturing and sales. The purchaser should be in a po-sition to manufacture, or to contract the manufacturing, of the system in quantity, and to market the system across a wide range of industries and areas, and/or to license the use of the system.

Anticipated revenue stream for the purchaser will be in direct sales, end-user training, programming, engineering, and licensing of distributors and/or end-users.


9_DETaIlED TEchNIcal DEScrIpTION

Please see the U.S. Patent document online at:

http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=�0&co1=AND&d=PTXT&s1=Birkle-Gebhard.INNM.&OS=IN/Birkle-Gebhard&RS=IN/Birkle-Gebhard

we are happy to make a personal presentation including an interactive cD and a simulated analysis of your application.


10_cONTacT DETaIlS

pheno Struktursensorik

Gebhard birkle/ Developer

adelheid birkle/ Marketing [email protected] mobile 0049 (0)160 755 768 1

Tel 0049 (0)40 - 605 36 588 Fax 0049 (0)40 - 506 932 38 Hoisbütteler Dorfstraße 2 22949 Ammersbek/ Hamburg

VISpION Prospekt

Technology

Transcript of VISpION Prospekt