Understanding and Optimizing Electromagnetic Compatibility in...

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1 Understanding and Optimizing Electromagnetic Compatibility in Switchmode Power Supplies

Transcript of Understanding and Optimizing Electromagnetic Compatibility in...

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Understanding and Optimizing Electromagnetic Compatibility in

Switchmode Power Supplies

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EMI = Electro Magnetic InterferenceEMC = Electro Magnetic Compatibility (No EMI)

Three Components of EMI:• Noise generator (source)• Noise transmission (coupling)• Noise receptor (victim)

Definitions

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• Electromagnetic Fields Caused by Changing Currents and Voltages

• Maxwell’s Equations:

• Slower Rise/Fall Times (with tradeoffs)

• Low Energy Phenomenon – At 1 Mhz, 20 nW can fail FCC limits

dtdv

Ci,dtdi

Me ==

Understanding EMI

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Radiated (>30 MHz)

Magnetic Electric

System Usage: Class A - Industrial and CommercialClass B - Includes Residential

EMI

Categorizing EMI

Conducted (<30 MHz)

Differential Common Mode Mode

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USA - FCC: CFR Title 47, Part 15 (etc.)Europe - IEC: EN50081 (and others)French - CISPR: Publication 22

Frequency Ranges (FCC) -

Conducted EMI: 450 kHz to 30 MHzRadiated EMI: 30 MHz to 1 GHz

Note: Measurement dependencies on operating conditions

EMI Specifications

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Conducted Noise Limits (FCC vs CISPR)

70

65

60

55

50

45

40

Frequency - MHz

Vol

tage

- dB

uV

0.1 0.3 0.50.2

FCC

FCC

CISPR

CLASS B

CLASS A

1 3 5 102 30 50 10020

CISPR

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Radiated Noise Limits (FCC vs CISPR)

50

45

40

35

30

25

2010 30 50 100 500 1000

Frequency - MHz

Fiel

d S

treng

th -

dBuV

/m

30020020

FCC

CISPR

CISPRCLASS B

CLASS A

Measuring Distance = 10 mFCC

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Measuring Conducted Noise

10 µF10 nF

to330 nF*50 Ω

50 µHPower Source

Ground

Power Supply Input

To Spectrum Analyzer

Line Impedance Stabilization Network (LISN)

* Capacitor value determined by lowest specified frequency

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Elements of Conducted Noise

Two LISN Circuits

SpectrumAnalyzer 50 Ω

SMPSDM

OUTPUTS

CM

CM

CM

NEUTRAL

GROUND

LINE

CM and DM add vectoriallyEMI (line) = CM + DMEMI (neutral) = CM - DM

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Switching action causes current pulses at input and output.

Sources of Differential Mode Noise

INPUTNOISE

OUTPUTNOISE

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Sources of Common Mode Noise

InputNoise

OutputNoise

Capacitive Currents Direct to Chassis

Capacitive Currents Primary to Secondary

Chassis Ground Chassis Ground Chassis Ground

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DMInputFilter

SMPS VOUT+

-

Positive Input

Negative Input

Line

Return

Ground

POWERSOURCE

Combating Differential Mode Noise

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Basic Ideal Filter

VIN VOUT

20 µH

3200 µF+

0

20 dB

40 dB

60 dB

80 dB

100 dB

120 dB100Hz 1 kHz 10 kHz 100 kHz 1 MHz 10 MHz 100 MHz 1 GHz

Frequency - Hz

Atte

nuat

ion

- dB

(a)

20 µH3200 µF

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Actual Filter with Parasitics

3200 µF

VIN VOUT

20 µH

500 pF

+

ESR 0.02 Ω

ESL 16 nH

0

20 dB

40 dB

60 dB

80 dB

100 dB

120 dB100Hz 1 kHz 10 kHz 100 kHz 1 MHz 10 MHz 100 MHz 1 GHz

Frequency - Hz

Atte

nuat

ion

- dB

(a)

(b)

500 pF20 µH

0.02 Ω16 µH

20 µH3200 µF 0.02 Ω

3200 µF

16 n

H50

0 pF

(b)

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Four Paralleled Capacitors Reduces ESL

VIN

800 µF

20 µH

500 pF

+

0.08 Ω

16 nH

800 µF

VOUT

+

0.08 Ω

16 nH

800 µF+

0.08 Ω

16 nH

800 µF+

0.08 Ω

16 nH

0

20 dB

40 dB

60 dB

80 dB

100 dB

120 dB100Hz 1 kHz 10 kHz 100 kHz 1 MHz 10 MHz 100 MHz 1 GHz

Frequency - Hz

Atte

nuat

ion

- dB

(a)

(b)

500 pF20 µH

0.02 Ω4 nH

20 µH3200 µF 0.02 Ω

3200 µF

(c)

(c)

4 nH

500

pF

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Improved Inductor Reduces Shunt CVIN

800 µF

20 µH

50 pF

+

0.08 Ω

16 nH

800 µF

VOUT

+

0.08 Ω

16 nH

800 µF+

0.08 Ω

16 nH

800 µF+

0.08 Ω

16 nH

0

20 dB

40 dB

60 dB

80 dB

100 dB

120 dB100Hz 1 kHz 10 kHz 100 kHz 1 MHz 10 MHz 100 MHz 1 GHz

Frequency - Hz

Atte

nuat

ion

- dB

(a)

(b)

(d)

50 pF20 µH

0.02 Ω4 nH

20 µH3200 µF 0.02 Ω

3200 µF

(c)

4 nH

50 p

F

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Adding a Second Stage Inductor

VIN

800 µF

20 µH

50 pF

+

0.08 Ω

16 nH

800 µF

VOUT

+

0.08 Ω

16 nH

800 µF+

0.08 Ω

16 nH

800 µF+

0.08 Ω

16 nH

5 pF

1 µH

0

20 dB

40 dB

60 dB

80 dB

100 dB

120 dB100Hz 1 kHz 10 kHz 100 kHz 1 MHz 10 MHz 100 MHz 1 GHz

Frequency - Hz

Atte

nuat

ion

- dB

(a)

(b)

(d)

(e)

8 nH50 pF

5 pF1 µH

50 pF20 µH

0.02 Ω4 nH

0.08 Ω1 µH

20 µH3200 µF 0.02 Ω

3200 µF

(c)

(c)

(e)

8 nH

5 pF

(b)

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Reducing Inductor Parasitic Shunt Capacitance

Core

S FWindings

Bobbin

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Natural Resonant Frequency =

Three Potential Problems:

1. Step application of input voltage could ring to 2VP.

2. High frequency noise at input could be amplified by “Q” of filter.

3. Filter output impedance rises at fr with potential oscillation with ZIN of converter.

LC21

π

Filter Resonance

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Filter Damping

Undamped Filter

L

C

LINE

SOURCE

RETURN

DampingComponents

POWERSUPPLY

CL2RD ≈

CCD ≈

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Combating Common Mode Noise

12 pF

+200 VDC

20 ns+48 mA

? 8 mA

100 ns

I

V400 V

5 µs

IRMS = 9.6 mA

(Typical TO-220 insulator capacity is 12 pF, fs = 200 kHz)

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3rd harmonic equivalent noise voltage circuit

• VN = 68 mV• FCC Limit (class A) = 1.0 mV• Required noise filter attenuation:

37 db at 600 kHz

Common Mode Noise Analysis

LISNs

PWR

SMPS

50 Ω50 Ω

12 pF

400 V200 kHz

ICM

RET

VN

VN

12 pF

25 Ω60 VRMS600 kHz

VN

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Allowable parasitic capacitance is unrealistic.

Achieving 37 dB Attenuation With Series Inductor

12 pF

25 Ω

0.95 mVVN

(Xc = 22.1 kΩ)

419 mH

Co < 0.17 pF!

(XL = 1.58 MΩ)(N @ 2 X 250T)

60 VRMS600 kHz

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Required capacitor will not meet safety specifications.

Achieving 37 dB Attenuation With Shunt Capacitor

12 pF(XC = 22.1 kΩ)

25 Ω

0.95 mVVN

60 VRMS600 kHz

760 nF(XC = 0.35 Ω)

ESL < 93 nH

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Optimum Solution Uses Both L and C

12 pF

25 Ω

0.95 mVVN1.07 mH

Co < 66 pF

(XL = 4.03 kΩ)(N @ 2X13T)

60 VRMS600 kHz

4.7 nF(XC = 56 Ω)

153 mV

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Complete Input Filter for Both DM and CM Conducted Noise

Cc2 Cd3Cc1

Cd2

Cc2

AC LineD

isch

arge

LN

CN

RNCc1

Lc1

Inrush Limiter

Cd1 DC Bus

Ld1

Final Cleanup Common Mode Differential Mode

DifferentialMode

Lc1

Notch filter for fS

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Minimizing CM Noise Injection

Case at HF AC

Insulators

PCB

Bracket ContactingPCB Ground

Chassis GroundedHeat Sink

Heat Sink Tied to PCB Ground (return)

PCB MountedHeat Sink

Shielding Heat Sink Bracket

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• Also called a Faraday shield• Connect to V+ if turn-off is fastest, to return with

faster turn-on

Electrostatic Shielding

ALTERNATESHIELD

CONNECTION

CORE

V

UnshieldedTransformer Correct Incorrect!

Use of Primary Shield

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• Noise is easily transformed back and forth between conducted and radiated form

• Conductors become antennas and antennas become receivers

• Testing more difficult– Frequency > 30 MHz

– Test environment and fixturing is critical

Radiated EMI

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Radiated Noise Measurements

SMPS "Load"Power Source

Antenna

SpectrumAnalyzer

Test fixture onrotating turntable

Antenna on variableheight vertical support

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Electric Field:

– Minimize high dv/dt on large surfaces

Magnetic Field:– Minimize high di/dt in conductive loops

Near Field:– Electric and magnetic fields act independently

Far Field:– Electric and magnetic fields merge

At 1 MHz,

=dtdv

CE

=dtdi

MH

πλ<2

πλ>2

meters300=λ

Characteristics of Radiated Noise

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Potential Electric Field EMI Sources

Shielding possible

LARGE AREA,HIGH dV/dtANTENNAS

E EE

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Magnetic Fields from Transformers and Inductors

Stray Transformer andInductor Fields

H

II H

High dI/dtSwitching

Loops

Shielding difficult

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Potential Magnetic Field EMI Sources

Tran

sfor

mer

Transformer

Wide, Closely Spaced CopperStraps

Worst case! Much Better!

Large Loop AreaWith High dI/dt

Rectifier Rectifier

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Leakage fields radiate

with intensity of

Opposing fields tend to cancel

with intensity of3d

14d

1

Magnetic Fieldsfrom Leakage Inductance

Core

SE

C

PR

I

SE

C

PR

ICore

SE

C P

SE

CPP P

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• Continuous copper strap around both windings and core.

• Converts stray magnetic fields to eddy current.

• Eddy current creates a canceling magnetic field.

Minimizing Stray Magnetic Fieldsin Transformers

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Poor Construction Techniques

Minimizing Stray Magnetic Fieldsin Inductors

Core

Coil

Cor

e

Winding

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• Presented a general overview• Defined various categories of noise• Described measurement techniques• Discussed ways to minimize noise

generation• Did not cover shielding or techniques

to minimize susceptibility• Should mention frequency modulation• Valuable additional references listed

Summary