Type of testing/ Faculty Equipments (picture & name) Model...

Faculty Equipments (picture & name) Model Type of testing/ services offered

Location PIC Function

I2E

(MiNT –

SRC)

ATOMIC FORCE MICROSCOPE (AFM) with IFM/MFM mode (non-contact)

XE- 100 Park Systems

Imaging, measuring and manipulating

matter at the nano scale.

Central Lab Management

(F5-002-01 )

Pn. Faezahana Mohkhter

Thin Film Surface Characterization

I2E

(MiNT –

SRC)

ATOMIC FORCE MICROSCOPE (AFM) mode (contact)

Hitachi Nanocute

(S/N : 0200780000001)

Imaging, measuring and manipulating

matter at the nano scale.


(F5-002-01 )


Thin Film Surface Characterization

I2E

(MiNT –

SRC)

RAMAN SPECTROSCOPY

X Plora Plus Raman Microscope

To observe vibrational,

rotational and other low-

frequency modes in a system.


(F5-002-01 )


Material Properties especially grapheme.

I2E

(MiNT –

SRC)

FOUR POINT PROBE

Lucas Labs Pro 4 Sheet resistance,

metal film thickness and

resistivity measurement.


(F5-002-01 )


Thin Film Resistivity

I2E

(MiNT –

SRC)

CONTACT ANGLE

VCA Optima Quantitative

measure of a solid by a liquid.


(F5-002-01 )


Surface Tension.

Hydrophobic

Hydrophilic

I2E

(MiNT –

SRC)

INCIDENT PHOTON TO CURRENT EFFICIENCY (IPCE)

Peccell PEC- S20

Indicates the ratio of the number of photons incident on a solar cell to the number of

generated charge carriers.


(F5-002-01 )


Solar Cell Energy Conversion

I2E

(MiNT –

SRC)

BET SYSTEM

V-Sorb 4800P Measure surface area and porosity


(F5-002-01 )


Material Porosity

I2E

(MiNT –

SRC)

MASK ALIGNER

EZ-MAS microfabrication

process


(F5-002-01 )


transfers the pattern onto the wafer

(photolitography equipment)

I2E

(MiNT –

SRC)

SURFACE PROFILER

Alpha Step IQ Surface metrology

analysis and surface

topography control.

Preston Shipyard Sdn. Bhd Research

Laboratory

(F5-002-02)

Head of MiNT-SRC

(Prof. Madya Dr. Nafarizal

bin Nayan)

Thin Film Thickness

I2E

(MiNT –

SRC)

THERMAL EVAPORATOR

VPC -061 Physical vapor

deposition techniques.


Laboratory

(F5-002-02)

Head of MiNT-SRC


bin Nayan)

Aluminium Deposition

I2E

(MiNT –

SRC)

HALL EFFECT

Lake Shore 8404 Measure carrier density and

magnetic field with a hall probe


Laboratory

(F5-002-02)

Head of MiNT-SRC


bin Nayan)

Electrical Properties

I2E

(MiNT –

SRC)

SOLAR SIMULATOR

PEC -101

Solar simulation.


Laboratory

(F5-002-02)

Head of MiNT-SRC


bin Nayan)

Solar cell Efficency

I2E

(MiNT –

SRC)

B1500A SEMICONDUCTOR DEVICE PARAMETER ANALYZER

KeySight BOS 00A/ Lake Shore

PS- 100 Measurement capabilities.


Laboratory

(F5-002-02)

Head of MiNT-SRC


bin Nayan)

Thin Material Electrical

Characterization

I2E

(MiNT –

SRC)

OSCILLOSCOPES

Keysight DSOX 6004A

Observe the change of an

electrical signal over time.


Laboratory

(F5-002-02)

Head of MiNT-SRC


bin Nayan)

Electrical Characterization

I2E

(MiNT –

SRC)

MUSE CELL ANALYZER

MERCK 0500-3115

Uses patent-pending,

miniaturized fluorescent

detection and microcapillary technology to deliver truly

accurate, precise and quantitative

cell analysis.


Laboratory

(F5-002-02)

Head of MiNT-SRC


bin Nayan)

Cell Viability

I2E

(MiNT –

SRC)

DIAMOND CUTTER SAW

MTI Corporation SYJ-400P

Suitable for cutting thin film

and wafer.


Laboratory

(F5-002-02)

Head of MiNT-SRC


bin Nayan)

Cutting concrete

I2E

(MiNT –

SRC)

BALL MILLER

Pulverisette 6 Planetary

Equipment for grinding crushed

materials for powder such as

cement, silicates, refactory material.


Laboratory

(F5-002-02)

Head of MiNT-SRC


bin Nayan))

Used to grind and blend materials

I2E

(MiNT –

SRC)

XRAY DIFFRACTOMETER (XRD)

PANALYTICAL X’ Pert ‘3 Powder

(S/N : DY 5006)

Phase identification &

percent crystallinity material.

Failure Analysis Research Laboratory

(F5-002-04 )

Head of MiNT-SRC


bin Nayan)

Material Characterization

I2E

(MiNT –

SRC)

DC & RF MAGNETRON SPUTTERING

SNTEK / Korea Deposit thin films of various metal

and oxide materials.

Dry Processing Research Laboratory

(F5-002-05 )

Head of

MiNT-SRC

(Prof.

Madya Dr.

Nafarizal

bin Nayan)

Thin Film Deposition

I2E

(MiNT –

SRC)

REACTIVE ION ETCHING

SNTEK BEP 5002 Uses chemically

reactive plasma to remove material

deposited on wafers.

Dry Processing Research Laboratory

(F5-002-05 )

Head of

MiNT-SRC

(Prof.

Madya Dr.

Nafarizal

bin Nayan)

Thin Film Etching

I2E

(MiNT –

SRC)

THERMAL CVD

VT Furnace CVD 1100- 20-35

Deposit materials.

Semiconductor Nanomaterials

Processing Research Laboratory

(F5-002-07A )

Prof. Madya Dr. Mohd Zainizan Sahdan)

Thin Film Deposition

I2E

(MiNT –

SRC)

SPIN COATER

WS-650MZ-8NPP/LITE

Machine spinner to deposit uniform

thin film to flat substrates.

Semiconductor Nanomaterials

Processing Research Laboratory

(F5-002-07A )

Prof. Madya Dr. Mohd Zainizan Sahdan)

Spin processor

I2E

(MiNT –

SRC)

DC SPUTTER

JEOL JFC- 1600 Auto Fine Coater

PVD method of thin film

deposition.

Liquid Crystal and Nano Devices

Research Laboratory

(F5-002-08 )

En. Ahmad Nasrull

Mohamed Thin Film Deposition

I2E

(MiNT –

SRC)

FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM)

JEOL JSM – 7600F Imaging at nano

scale.


Research Laboratory

(F5-002-08 )

En. Ahmad Nasrull

Mohamed

Material Surface Characterization

I2E

(MiNT –

SRC)

ENERGY DISPERCIVE X-RAY MICROANALYSIS (EDS)

X- Max Measure quantitative micro-analysis of metal

and metal element.


Research Laboratory

(F5-002-08 )

En. Ahmad Nasrull

Mohamed

Material Characterization

I2E

(MiNT –

SRC)

E-BEAM LITHOGRAPHY SYSTEM

ELPHY Plus

Create very small structures in the

resist and transferred to

substrate material.


Research Laboratory

(F5-002-08 )

En. Ahmad Nasrull

Mohamed

Nano- scale patterning

I2E

(MiNT –

SRC)

UV-VIS

UV- 1800 SHIMADZU

Spectrophotometer

Measure the intensity of light.


Research Laboratory

(F5-002-08 )

En. Ahmad Nasrull

Mohamed

Optical Characterization

I2E

(MiNT –

SRC)

ABEM

ABEM 2.1 Resistivity Terrameter

For a broad range of subsurface

mapping applications such as groundwater

prospecting, mineral

exploration , geological

mapping and geotechnical

investigations.


Research Laboratory

(F5-002-08 )

En. Ahmad Nasrull

Mohamed

Resistivity and IP imaging.

I2E

(MiNT –

SRC)

3D PRINTER

CUBICON

Build a model


Research Laboratory

(F5-002-08 )

En. Ahmad Nasrull

Mohamed

For printing 3D model

I2E

(MiNT –

SRC)

NANOINDENTER (NANOMECHANICAL TEST INSTRUMENTS)

BRUKER HYSITRON TI

PREMIER Nanoindenter

Measure Young’s modulus,

hardness, fracture toughness and

other mechanical properties via

nanoindentation.


Research Laboratory

(F5-002-08)

Head of MiNT-SRC


bin Nayan)

Mechanical properties of thin film

I2E

(MiNT –

SRC)

VACCUM OVEN

MV/DZF-6090 Malaysia

Semiconductor process

applications

Sensor Devices Research Laboratory

(F5-101-01 )

Dr. Marlia Morsin

heating treatment of special materials

I2E

(MiNT –

SRC)

CENTRIFUGE

Eppendorf C5804

applies centrifugal force to its

contents, typically to separate fluids

of different densities

Sensor Devices Research Laboratory

(F5-101-01 )

Dr. Marlia Morsin

separate fluids of different densities

I2E

(MiNT –

SRC)

OVEN

ESCO Isotherm

Enables accurate constant

temperature for harmless

substances within the set scope of

temperature

Solar Device Research Laboratory

(F5-101-06 )

Prof. Madya Dr. Khairul

Ahmad

Process applications for laboratory ovens can be for annealing, drying and polyimide

baking

I2E

(MiNT –

SRC)

IMPEDANCE ANALYSER

Electrochemical

Test System

measuring resonance

characteristics of piezoelectronic

element.

Solar Device Research Laboratory

(F5-101-06 )

Prof. Madya Dr. Khairul

Ahmad

testing of electronic components

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