Time-to-market reduction by optimal integration and test ... · Slide 9 9 Tangram Lines of...
Transcript of Time-to-market reduction by optimal integration and test ... · Slide 9 9 Tangram Lines of...
Time-to-market reduction by optimal integration and test planning
Roel Boumen
Ivo de JongAsia van de Mortel-Fronczak
Koos Rooda
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Contents• Introduction• Tangram project
– Outline– Lines of Attentions
• Integration and test planning – Problem– Method
• ASML case studies– Manufacturing test– Prototype integration
• Summary• Conclusions
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Lithographic machineProperties:• >12 M LoC• 13.7 M € average
selling pricePerformance (XT:1900i)• < 40 nm line width• > 131 WPH
throughput
Source: www.asml.com
ASML lithographic machines
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ASML integration and testIntegration and test phases:• First-of-a-kind machine (prototype)
– Performance tests, reliability tests– Multiple prototypes to test different performance criteria
• Software– Weekly Validation Test + Alpha test + Beta test
• Manufacturing– Subsystem test, System qualification @ASML & @customer
• Operation– Diagnosis, Maintenance
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ASML integration and test problem:
• Tight specification– Many components (1000+)– Multi disciplinary components– Incomplete designs
• Time-to-market– Concurrent engineering– Incomplete test phases
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ASML integration and test
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Challenges
ASML integration and test challenges:• How to balance TTM versus Quality/Cost?• How to construct/maintain integration and test plans?• How to perform tests as early (in parallel) as possible?
timeShipment
date
Development
Integration and test
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Contents• Introduction• Tangram project
– Outline– Lines of Attentions
• Integration and test planning – Problem– Method
• ASML case studies– Manufacturing test– Prototype integration
• Summary• Conclusions
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Tangram outline• Research project on test and integration performed at
ASML: lithographic systems provide cases
• Duration: 4 years (2003-2007) total of 60 FTE (5 PhD students)
• Partners: ASML, ESI, RUN, S&T, TNO, TUD and TU/e
• Goal: Reduce ASML TTM by integrating and testing earlier/smarter/faster using models while maintaining or improving system quality
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Tangram Lines of Attention
1. Integration and test strategy2. A) Model-based integration and testing
B) Test infrastructure3. Model-based testing4. Model-based diagnosis
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1) Integration and test strategy
Define goal
Planning
Control andexecution
Untested subsystems Tested system
Plan
Objectives/Constraints
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Use formal, executable models for • Model-based system analysis (validation, verification)• Model-based integration and testing with realizations
integrate
designR D
R1
Rn
define
define
design
design
D1
Dn
M1
Zn
model
realize
define
Mnmodel
Z1
infra
stru
ctur
e I
integraterealize
2A) Model-based integration and testing
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SUT
Testdriver
Stub
Middleware to access components
Data driven architecture to connect processes (models and realizations)
2B) Test infrastructure
integrate
designR D
R1
Rn
define
define
design
design
D1
Dn
M1
Zn
model
realize
define
Mnmodel
Z1
infra
stru
ctur
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integraterealize
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3) Model-based testing
model
SUT
SUTconf
model
pass fail
testtool
testgeneration
tool
testexecution
toolSUT passes tests
SUT conf model
⇔
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Diagnosis from 60 days to 30 milliseconds
4) Model-based diagnosis
systemunknown
health state h
Model
captures nominal behavior and
possibly explicit fault modes
diagnosis
inferredhealth state h
inputs
outputs
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Contents• Introduction• Tangram project
– Outline– Lines of Attentions
• Integration and test planning – Problem– Method
• ASML case studies– Manufacturing test– Prototype integration
• Summary• Conclusions
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Integration and test plan
Dev Lens
Dev Laser
Dev WS
Dev WH
Dev IL
Dev RS
Dev RH
Time
Integration and test plan
Risk
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Integration and test plan
Dev Lens
Dev Laser
Dev WS
Dev WH
Dev IL
Dev RS
Dev RH
Test
Test
Test
TestTest
TestSequence integration
actions
Select and sequence
tests
Time
Maximize system quality
Minimize total cost
Minimize total time
Risk
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Problem and approach
Goal: Time-to-market and flow time reduction by integration and test time reduction.
Problem: The selection and sequencing of integration and test actions within an integration and test plan is – difficult and therefore sub-optimal,– too much manual effort (re-planning).
Approach: Automatic optimization using (mathematical) models.
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Method1. Integration sequencing
Optimize integration sequence on integration time– Model– Algorithm
2. Test sequencingOptimize for each test phase the test sequence on test time, test
cost and/or system quality
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Integration sequencing: model
Integration model:• Modules
– Development time and cost
• Interfaces– Creation time and cost
• Tests that could be performed– Test time and cost– Modules needed to perform test
M3: Laser
M4: IL
M5: RS
M6: Lens
M7: WSM2: WH
M1: RHI1
I2
I3
I4
I5
I6
test 0-test 5
test 8-test 10
test 13-test 16test 20-test 25
test 6-test 7
test 11-test 12
test 17-test 19
Example: ASML wafer scanner
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Integration sequencing: solution
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Method1. Integration sequencing
Optimize integration sequence on integration time
2. Test sequencingOptimize for each test phase the test sequence on test time, test
cost and/or system quality– Model– Algorithm
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Test sequencing: modelFor each test phase: create test model
S \ T t0 t1 t2 t3 t4 t5 Ps1 1 1 0 0 1
10102
10%s2 1 0 1 0
01101
10%s3 1 0 0 1 10%s4 1 0 0 0 10%s5 1 0 0 0 10%C 3 1 1 1 2
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S \ T t0 t1 t2 t3 t4 t5 Ps1 1 1 0 0 1
10102
10%s2 1 0 1 0
01101
10%s3 1 0 0 1 10%s4 1 0 0 0 10%s5 1 0 0 0 10%C 3 1 1 1 2
Multiple fault algorithm
Test sequencing: solution
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Integration and test plan
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Contents• Introduction• Tangram project
– Outline– Lines of Attentions
• Integration and test planning – Problem– Method
• ASML case studies– Manufacturing test– Prototype integration
• Summary• Conclusions
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Case study 1: Manufacturing test sequencing
Manufacturing time
Subsystem test
Reticle handler
Wafer handler
Reticle stage
Dual wafer stage
Lens
Laser
Test at ASML Install at CustomerDisassemble –
ship – assemble Assemble
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Case study 1: Results
Test at ASML Install at customer
Old time
Test phase 1 730 609 17% 730 500 32%
815
-
Old time New time Reduction New time Reduction
Test phase 2 815 784 4%
18%
16%
Test phase 3 33 27
690
- -
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Case study 2: Prototype integration sequencing
Development of a new ASML machine• 2 prototypes for testing:
– Functional requirements– Performance requirements
• Problem statistics:– 105 modules with different delivery times (0 – 22 weeks)– 138 interfaces with assembly times– 67 tests (80% fixed to one of the prototypes, 20% not fixed)
• Goal: Both machines must be at customer ASAP, all tests need to be performed at least once
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Case study 2: results• Manual created sequence duration: 38.4 weeks• Automatic optimized sequence duration: 33.7 weeks• Potential integration time improvement: ~10%• Resulting (MS Project) Gantt chart of proto 1:
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Practical lessons learned
The Test-Diagnose-Fix loop introduces variability on the final shipment date. Keep this loop as short as possible.
The “perfect” test has a 50% fault probability when it is performed. Select the tests that have this property.
Compare integration and test plans with each other. Choose the best suited plan from all solutions you can find.
Risk in the system introduces variability on the final shipment. Therefore, keep the risk as low as possible by controlling the risk. (integration introduces risk while testing reduces risk)
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Summary
• Tangram project– Large research project in industry– Using specific models for different problems
• Integration and test planning:– Integration sequencing algorithm and model– Test sequencing algorithm and model– Optimization on time/cost and/or risk
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Conclusions
• Integration and test sequencing suited to solve real life ASML problems:– Up to 10% integration time reduction– Up to 20% test time reduction
• Models can be used as knowledge container and are intuitive for engineers
• Less planning effort because of automated planning
Time-to-market reduction by optimal integration and test planning
Further information:[email protected]
orSee you at the 12e Nederlandse Testdag at ASML on 17 November
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Diagnosis from 60 days to 30 milliseconds
Diagnosisengine
LydiaModel
System Under Test
a bd e
c
Diagnosisa,b,c,d,e
4) Model-based diagnosis