The upgrades of the ATLAS pixel detector€¦ · Introduction The original inner tracker of ATLAS...
Transcript of The upgrades of the ATLAS pixel detector€¦ · Introduction The original inner tracker of ATLAS...
The upgrades of the ATLAS pixel detector
Stefano Terzo
Max-Planck-Institut fur PhysikMunchen
Young Scientist WorkshopRingberg Castle17th July 2014
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 1 / 15
Introduction
The original inner tracker of ATLAS
144 cm
43cm
6 cm6 cm
2 cm
Composed of hybrid planar pixel detectors:I 1744 modulesI 46080 pixel channels per module:
I 50µm× 400µm cell pitchI n-in-n silicon sensors: 250µm thick
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 2 / 15
3 barrel layers2× 3 end cap disks
Introduction
Hybrid silicon pixel detectors
I Lightly n-doped silicon:I n-doped (− charge) pixelsI p-doped (+ charge) backside
I A reverse bias voltage is applied:I silicon depletion from the backside
(pn junction)I ∆Vbias > Vdep → full depletionI depleted region = sensitive volume
I A particle passing through the depletedregion creates electron-hole pairs which driftto the electrodes
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 3 / 15
Introduction
Hybrid silicon pixel detectors
I Lightly n-doped silicon:I n-doped (− charge) pixelsI p-doped (+ charge) backside
I A reverse bias voltage is applied:I silicon depletion from the backside
(pn junction)I ∆Vbias > Vdep → full depletionI depleted region = sensitive volume
I A particle passing through the depletedregion creates electron-hole pairs which driftto the electrodes
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 3 / 15
Introduction
Hybrid silicon pixel detectors
I Lightly n-doped silicon:I n-doped (− charge) pixelsI p-doped (+ charge) backside
I A reverse bias voltage is applied:I silicon depletion from the backside
(pn junction)I ∆Vbias > Vdep → full depletionI depleted region = sensitive volume
I A particle passing through the depletedregion creates electron-hole pairs which driftto the electrodes
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 3 / 15
Introduction
Hybrid silicon pixel detectors
I Lightly n-doped silicon:I n-doped (− charge) pixelsI p-doped (+ charge) backside
I A reverse bias voltage is applied:I silicon depletion from the backside
(pn junction)I ∆Vbias > Vdep → full depletionI depleted region = sensitive volume
I A particle passing through the depletedregion creates electron-hole pairs which driftto the electrodes
+V +V
-V
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 3 / 15
Introduction
Hybrid silicon pixel detectors
I Lightly n-doped silicon:I n-doped (− charge) pixelsI p-doped (+ charge) backside
I A reverse bias voltage is applied:I silicon depletion from the backside
(pn junction)I ∆Vbias > Vdep → full depletionI depleted region = sensitive volume
I A particle passing through the depletedregion creates electron-hole pairs which driftto the electrodes
+V +V
-V
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 3 / 15
Introduction
Hybrid silicon pixel detectors
I Lightly n-doped silicon:I n-doped (− charge) pixelsI p-doped (+ charge) backside
I A reverse bias voltage is applied:I silicon depletion from the backside
(pn junction)I ∆Vbias > Vdep → full depletionI depleted region = sensitive volume
I A particle passing through the depletedregion creates electron-hole pairs which driftto the electrodes
+V +V
-V
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 3 / 15
Introduction
Hybrid silicon pixel detectors
I Pixel surface segmentation:I precise two dimensional spatial
informationI Guard ring structures to smoothly drop
the potential at the edge of the sensorI Readout chip coupling (bump bonding)
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 4 / 15
Introduction
Hybrid silicon pixel detectors
I Pixel surface segmentation:I precise two dimensional spatial
informationI Guard ring structures to smoothly drop
the potential at the edge of the sensorI Readout chip coupling (bump bonding)
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 4 / 15
Introduction
Hybrid silicon pixel detectors
I Pixel surface segmentation:I precise two dimensional spatial
informationI Guard ring structures to smoothly drop
the potential at the edge of the sensorI Readout chip coupling (bump bonding)
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 4 / 15
Motivations
The inner tracker upgrade plan
Energy: 8 TeV 13/14 TeV
Luminosity: >1034cm−2s−1 ∼3×1034 cm−2s−1
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 5 / 15
5×1034 cm−2s−1
Motivations
The inner tracker upgrade plan
Energy: 8 TeV 13/14 TeV
Luminosity: >1034cm−2s−1 ∼3×1034 cm−2s−1
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 5 / 15
Insertable B-Layer (IBL): new pixellayer at 3.2 cm from the pp interaction
5×1034 cm−2s−1
Motivations
The inner tracker upgrade plan
Energy: 8 TeV 13/14 TeV
Luminosity: >1034cm−2s−1 ∼3×1034 cm−2s−1
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 5 / 15
Insertable B-Layer (IBL): new pixellayer at 3.2 cm from the pp interaction
“Phase II”: full inner detectorreplacement (4 layers)
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5
0.0
0.5
1.0
1.5
z (m)
r(m
)
eta = 0.0 eta = 1.0
eta = 2.0
eta = 3.0
5×1034 cm−2s−1
Motivations
Why a fourth layer?
I Mantain and improve performances lost due to current detectordegradation:
I radiation damageI module failure
I Improve tracking, vertexing and b-tagging:I proximity to the interaction pointI larger extension along the beam lineI improve track measurement
I Cope with pile-up at high luminosityI The new IBL will be tolerant to higher
occupancy without saturation
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 6 / 15
The Insertable B-Layer (IBL)
The Insertable B-Layer (IBL)
14 support structures (staves) to hold 32 new front-end chips each
I Mixed sensor technology:I 200 µm thick planar n-in-n silicon sensorsI 230 µm thick 3D n-in-p silicon sensors
I Full φ coverage by tilting staves by 14◦
I Overlap of the inactive regions
I Coverage in |η| <2.8I No overlap possible due to limited space
I Recover z coverage with slim edge sensors
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 7 / 15
The Insertable B-Layer (IBL)
The Insertable B-Layer (IBL)
14 support structures (staves) to hold 32 new front-end chips each
I Mixed sensor technology:I 200 µm thick planar n-in-n silicon sensorsI 230 µm thick 3D n-in-p silicon sensors
I Full φ coverage by tilting staves by 14◦
I Overlap of the inactive regions
I Coverage in |η| <2.8I No overlap possible due to limited space
I Recover z coverage with slim edge sensors
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 7 / 15
The Insertable B-Layer (IBL)
The Insertable B-Layer (IBL)
14 support structures (staves) to hold 32 new front-end chips each
I Mixed sensor technology:I 200 µm thick planar n-in-n silicon sensorsI 230 µm thick 3D n-in-p silicon sensors
I Full φ coverage by tilting staves by 14◦
I Overlap of the inactive regions
I Coverage in |η| <2.8I No overlap possible due to limited space
I Recover z coverage with slim edge sensors
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 7 / 15
The Insertable B-Layer (IBL)
Slim edge planar pixel sensors for IBL
I Initial designI 1.1 mm dead area
I Reduced guard rings and edge cutI 450 µm dead area
I Pixels shifted behind the guard ringsI Dead area is reduced to 200 µm
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 8 / 15
No overlap possiblealong the beam direction
for the inner layer→ new slim edge design
The Insertable B-Layer (IBL)
Slim edge planar pixel sensors for IBL
I Initial designI 1.1 mm dead area
I Reduced guard rings and edge cutI 450 µm dead area
I Pixels shifted behind the guard ringsI Dead area is reduced to 200 µm
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 8 / 15
No overlap possiblealong the beam direction
for the inner layer→ new slim edge design
The Insertable B-Layer (IBL)
Slim edge planar pixel sensors for IBL
I Initial designI 1.1 mm dead area
I Reduced guard rings and edge cutI 450 µm dead area
I Pixels shifted behind the guard ringsI Dead area is reduced to 200 µm
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 8 / 15
No overlap possiblealong the beam direction
for the inner layer→ new slim edge design
The Insertable B-Layer (IBL)
The new readout chipFE-I3 vs FE-I4
50×400 µm2 Smaller pixel pitch 50×250 µm2
1×1 cm2
160 row×
18 columns
Bigger area
2×2 cm2
336 row×
80 columns
1×1015neq/cm2 Radiation hardness 5×1015neq/cm
2
columndrain
architecturetrigger
higherhit
rate
localin pixelstorage
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 9 / 15
The Phase II upgrade at HL-LHC
From IBL to the inner layers of Phase II
A smaller pixel cell to reduce the occupancy
Now: FE-I3 chip 50×400 µm2
IBL: FE-I4 chip 50×250 µm2
Ph. II: new chip 25×100 µm2
or 50×50 µm2
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 10 / 15
preliminary studies using theFE-I4 chip and 25×500 µm2
pixel shape
Pil
e up
eve
nts 23
230
.
.
The Phase II upgrade at HL-LHC
From “n-in-n” to “n-in-p” sensors
Present pixel detector + IBL → Phase II (HL-LHC)
N-in-nI Depletion from the backsideI Guard rings on the backsideI Double sided process→ Pixel can be shifted below
the guard rings
N-in-pI Depletion from the pixel sideI Guard rings on the pixel sideI Single sided process→ Cost effective to cover
large areas
A new solution is necessary to reduce the dead area
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 11 / 15
The Phase II upgrade at HL-LHC
Planar active edge sensors for HL-LHC
p-substrateSensor
n+
100
µm
50 µm
GR GR
Edge implantationSilicon oxide Boron doping Phosphorus doping
Support wafer
50 µm
I Present IBL design:I n-in-n sensor with 200 µm edge
(pixel shifted under the guard rings)
I Phase II alternatives:I n-in-p sensor with 125 µm active edge
(only one Bias Ring)
I n-in-p sensor with 50 µm active edge(Floating Guard Ring)
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 12 / 15
125 µm
50 µm
200 µm
Backside implantationextended to the edges
The Phase II upgrade at HL-LHC
Edge efficiency
FE-I3, 50 µm active edge FE-I3, 125 µm slim edge
m]µDistance from last pixel edge [-100 0 100 200 300 400 500 600
Effic
ienc
y [%
]
6065707580859095
100
m]µDistance from the last pixel edge [
Eff
icie
ncy
[%]
60
65
70
75
80
85
90
95
100
-1000100200300400500
Active area extends outside the lastpixel implant up to the active edge
Active area only until thebias ring structure
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 13 / 15
→ last pixel implant
← end of the implant
last pixel implant←
end of the implant→
600 -1250-50 6000
The Phase II upgrade at HL-LHC
N-in-p quad modules for the outer layers
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 14 / 15
3 2
0 1
Quad module:4× readout chips connected to a bigger sensors
I Planned full module geometry for phase III No guard ring structures between the 4 chipsI Fully active area between the 4 chips
The Phase II upgrade at HL-LHC
N-in-p quad modules for the outer layers
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 14 / 15
3 2
0 1
Quad module:4× readout chips connected to a bigger sensors
I Planned full module geometry for phase III No guard ring structures between the 4 chipsI Fully active area between the 4 chips
First tests performed on pseudoquad module interconnected to
IBL FE-I4 chips
Summary and outlook
Summary and outlook
I IBL, the 4th pixel layer in ATLAS has been successfully inserted:I closer to the interaction pointI featuring the new FE-I4 chipI improved radiation hardness
I New module designs are necessary to cope with the HL-LHCenvironment:
I reduced occupancyI radiation hardnessI increased active area (for the innermost layers)
I N-in-p active/slim edge sensor are under investigation for theHL-LHC upgrade:
I 50 µm active edge sensors show efficiency even outside the pixel area
I First pseudo quad modules have been assembled and characterized
Young Scientist Workshop 16th - 19th July 2013 Stefano Terzo (MPI fur Physik) 15 / 15