June 2015

The Next Generation

Mixed-Signal Test Bench

Scopes for Mobile Devices

Keysight Shares Its Vision for

5GInterview with Roger Nichols

Keysight 5G Program Manager

CLICK HERE

CONTENTS

3

4

10

16

24

32

TECH SERIESMixed-Signal Scopes The Importance of a Varied Test Bench

INDUSTRY INTERVIEWThe Next GenerationKeysight Shares its Vision for 5G Interview with Roger Nichols

PRODUCT WATCHWi-Pry Pro from OsciumSimple Solution for Wireless Networking

TECH REPORTResolving Human Body Model Test ChallengesUsing Latest Traditional Low-parasitic Tester

TECH REPORTChanges in Instrument DesignInterface Technology for the Next-generation Engineer

CONTENTS

Modern Test amp Measure

eewebcomregister

Join Today

READY TO LAUNCH

For the launch of the Tiva C Series Connected LaunchPad TI has partnered with Exosite mentioned briefly above to provide easy access to the LaunchPad from the Internet The LaunchPad takes about 10 minutes to set up and you can immediately interact with it across the Internet and do things like turn an LED on and off remotely from the website and see the reported temperature as well It can also display approximate geographic location based on the assigned IP address and display a map of all other connected LaunchPad owners if they are active and plugged-in to Exosite ldquoIn addition it supports a basic game by enabling someone to interface to the Connected LaunchPad through a serial port from a terminal while someone else is playing with them through their browser It is basically showing how you can interact remotely with this product and a user even if you are across the globerdquo Folkens explained

START DEVELOPING

The Tiva C Series Connected LaunchPad is shipping now and the price is right at $1999 USD it is less than half the price of other Ethernet-ready kits The LaunchPad comes complete with quick start and user guides and ample online support to ensure developers of all backgrounds are well equipped to begin creating cloud-based applications ldquoWe have assembled an online support team to monitor the Engineering-to-Engineering (or E2E) Communityrdquo Folkens said ldquoAlong with this you also got a free Code Composer Studio Integrated Development Environment which allows developers to use the full capability We also support other tool chains like Keil IAR and Mentor Embedded

Affordable versatile and easy to use the Tiva Series Connected LaunchPad is well suited for a broad audience and promises to facilitate the expansion of ingenious IoT applications in the cloud As Folkens concluded ldquoThe target audiences actually are the hobbyists students and professional engineers A better way of looking at it is that we are targeting people with innovative ideas and trying to help them get those ideas launched into the cloudrdquo

CLICK HERE

CONTENTS

3

4

10

16

24

32

TECH SERIESMixed-Signal Scopes The Importance of a Varied Test Bench

INDUSTRY INTERVIEWThe Next GenerationKeysight Shares its Vision for 5G Interview with Roger Nichols

PRODUCT WATCHWi-Pry Pro from OsciumSimple Solution for Wireless Networking

TECH REPORTResolving Human Body Model Test ChallengesUsing Latest Traditional Low-parasitic Tester

TECH REPORTChanges in Instrument DesignInterface Technology for the Next-generation Engineer

CONTENTS

Modern Test amp Measure

eewebcomregister

Join Today

READY TO LAUNCH

For the launch of the Tiva C Series Connected LaunchPad TI has partnered with Exosite mentioned briefly above to provide easy access to the LaunchPad from the Internet The LaunchPad takes about 10 minutes to set up and you can immediately interact with it across the Internet and do things like turn an LED on and off remotely from the website and see the reported temperature as well It can also display approximate geographic location based on the assigned IP address and display a map of all other connected LaunchPad owners if they are active and plugged-in to Exosite ldquoIn addition it supports a basic game by enabling someone to interface to the Connected LaunchPad through a serial port from a terminal while someone else is playing with them through their browser It is basically showing how you can interact remotely with this product and a user even if you are across the globerdquo Folkens explained

START DEVELOPING

The Tiva C Series Connected LaunchPad is shipping now and the price is right at $1999 USD it is less than half the price of other Ethernet-ready kits The LaunchPad comes complete with quick start and user guides and ample online support to ensure developers of all backgrounds are well equipped to begin creating cloud-based applications ldquoWe have assembled an online support team to monitor the Engineering-to-Engineering (or E2E) Communityrdquo Folkens said ldquoAlong with this you also got a free Code Composer Studio Integrated Development Environment which allows developers to use the full capability We also support other tool chains like Keil IAR and Mentor Embedded

Affordable versatile and easy to use the Tiva Series Connected LaunchPad is well suited for a broad audience and promises to facilitate the expansion of ingenious IoT applications in the cloud As Folkens concluded ldquoThe target audiences actually are the hobbyists students and professional engineers A better way of looking at it is that we are targeting people with innovative ideas and trying to help them get those ideas launched into the cloudrdquo

54

TECH SERIES

54

Modern Test amp Measure

MIXED-SIGNAL Mixed-signal design is ubiquitous these days with hybrids of digital and

analog circuitry turning up everywhere A typical mixed-signal designer

may be a hardware or software engineer with specific needs They may

be working with 4-bit 8-bit 16-bit and 32-bit microcontrollers in a single

embedded controller or across several embedded systems They need to

capture a host of different signal types and serial-data protocols as well as

understanding the timing relationships between them Then therersquos all the

different sensor signals power-supply signals and PWM control signals to

guarantee embedded system performance and reliability

Is Your Test Bench

Ready

76

TECH SERIES

76

Modern Test amp Measure

Further mixed-signal design touches a large number of application areas including appliances

audio automotive avionics consumer electronics industrial equipment and automation medical equipment military hardware networking equipment motor control power conversion power supplies and more (Figure 1) So it behooves just about any designer or design team to ensure that they have test and measurement equipment that is up to the task

Of course an oscilloscope is a top priority for mixed-signal design With it the designer or technician can usually

Another key advantage of a mixed-signal oscilloscope is digital pattern search and find This capability allows the user to search across many digital lines to find specific digital patterns Once the desired pattern is found oscilloscopes such as Teledyne LeCroyrsquos HDO-MS models enable you to automatically zoom in on the relevant portion of the waveform Digital pattern search and find is ideal for searching for timing problems where invalid patterns may occur

make do for the analog aspects of the circuitry For the digital portions a logic analyzer comes into play The best option is a mixed-signal oscilloscope that adds dedicated capabilities for acquiring and analyzing digital signals

Besides the obvious addition of some number of digital input lines a mixed-signal oscilloscope provides such capabilities as analogdigital cross-pattern triggering (Figure 2) With it you can create complex analog and digital pattern triggers to isolate problems It enables searching for timing errors by specifying a trigger for an invalid digital state

Figure 1

With a mixed-signal

scope you can create complex

analog and digital pattern

triggers to isolate problems

Figure 2

Figure 3

HDO-MS

HD4096 technology

SIGLENT

schematicscom

88

Modern Test amp Measure

In the case of the HDO-MS oscilloscopes all of the instrumentrsquos powerful measurement tools are available for use on the digital lines Measurements include delay delta delay Dtrig time duty frequency half period period and width Functions such as histicons statistics tracks and trends show you how the measurements are changing over time

A useful feature of the HDO-MS oscilloscopes is activity indicators for the digital lines (Figure 3) These indicators let you see the current state (high low or transitioning) of all of the digital lines at a glance They can also help you quickly identify lines that are incorrectly hooked up such as to ground or to a power-supply line The indicators are active even when the oscilloscope is not triggering

For these reasons among others mixed-signal design and debug is best approached with an instrument that is suited for the task such as the Teledyne LeCroy HDO-MS (an added benefit on the analog side of the equation is HD4096 technology) A mixed-signal oscilloscope integrates all of the best aspects of a traditional oscilloscope and a dedicated logic analyzer and thus is among the best options for the mixed-signal testbench

Mixed-signal design and

debug is best approached with

an instrument that is suited for the task

Your Circuit Starts HereSign up to design share and collaborate

on your next projectmdashbig or small

Click Here to Sign Up

76

TECH SERIES

76

Modern Test amp Measure

Further mixed-signal design touches a large number of application areas including appliances

audio automotive avionics consumer electronics industrial equipment and automation medical equipment military hardware networking equipment motor control power conversion power supplies and more (Figure 1) So it behooves just about any designer or design team to ensure that they have test and measurement equipment that is up to the task

Of course an oscilloscope is a top priority for mixed-signal design With it the designer or technician can usually

Another key advantage of a mixed-signal oscilloscope is digital pattern search and find This capability allows the user to search across many digital lines to find specific digital patterns Once the desired pattern is found oscilloscopes such as Teledyne LeCroyrsquos HDO-MS models enable you to automatically zoom in on the relevant portion of the waveform Digital pattern search and find is ideal for searching for timing problems where invalid patterns may occur

make do for the analog aspects of the circuitry For the digital portions a logic analyzer comes into play The best option is a mixed-signal oscilloscope that adds dedicated capabilities for acquiring and analyzing digital signals

Besides the obvious addition of some number of digital input lines a mixed-signal oscilloscope provides such capabilities as analogdigital cross-pattern triggering (Figure 2) With it you can create complex analog and digital pattern triggers to isolate problems It enables searching for timing errors by specifying a trigger for an invalid digital state

Figure 1

With a mixed-signal

scope you can create complex

analog and digital pattern

triggers to isolate problems

Figure 2

Figure 3

HDO-MS

HD4096 technology

SIGLENT

schematicscom

88

Modern Test amp Measure

In the case of the HDO-MS oscilloscopes all of the instrumentrsquos powerful measurement tools are available for use on the digital lines Measurements include delay delta delay Dtrig time duty frequency half period period and width Functions such as histicons statistics tracks and trends show you how the measurements are changing over time

A useful feature of the HDO-MS oscilloscopes is activity indicators for the digital lines (Figure 3) These indicators let you see the current state (high low or transitioning) of all of the digital lines at a glance They can also help you quickly identify lines that are incorrectly hooked up such as to ground or to a power-supply line The indicators are active even when the oscilloscope is not triggering

For these reasons among others mixed-signal design and debug is best approached with an instrument that is suited for the task such as the Teledyne LeCroy HDO-MS (an added benefit on the analog side of the equation is HD4096 technology) A mixed-signal oscilloscope integrates all of the best aspects of a traditional oscilloscope and a dedicated logic analyzer and thus is among the best options for the mixed-signal testbench

Mixed-signal design and

debug is best approached with

an instrument that is suited for the task

Your Circuit Starts HereSign up to design share and collaborate

on your next projectmdashbig or small

Click Here to Sign Up

HDO-MS

HD4096 technology

SIGLENT

schematicscom

88

Modern Test amp Measure

In the case of the HDO-MS oscilloscopes all of the instrumentrsquos powerful measurement tools are available for use on the digital lines Measurements include delay delta delay Dtrig time duty frequency half period period and width Functions such as histicons statistics tracks and trends show you how the measurements are changing over time

A useful feature of the HDO-MS oscilloscopes is activity indicators for the digital lines (Figure 3) These indicators let you see the current state (high low or transitioning) of all of the digital lines at a glance They can also help you quickly identify lines that are incorrectly hooked up such as to ground or to a power-supply line The indicators are active even when the oscilloscope is not triggering

For these reasons among others mixed-signal design and debug is best approached with an instrument that is suited for the task such as the Teledyne LeCroy HDO-MS (an added benefit on the analog side of the equation is HD4096 technology) A mixed-signal oscilloscope integrates all of the best aspects of a traditional oscilloscope and a dedicated logic analyzer and thus is among the best options for the mixed-signal testbench

Mixed-signal design and

debug is best approached with

an instrument that is suited for the task

Your Circuit Starts HereSign up to design share and collaborate

on your next projectmdashbig or small

Click Here to Sign Up

1110

TECH REPORT

1110

Modern Test amp Measure

INSTRUMENT

DESIGNNew Interface Technology for the Next Generation of Engineers

by Jerry Janesch Keithley Instruments a Tektronix Company

The test instrumentation market is gradually evolving as the profile of the typical instrument user has broadened In addition to electrical engineering many of todayrsquos users have been trained in other disciplines such as mechanical engineering electrochemistry biology physics etc Although they may not have training in electrical engineering their jobs still demand the ability to make good electrical measurements For these new classes of users traditional button and command menu interfaces can be challenging because they require the time and instrument familiarity needed to find the right function from among complex menus of options They also demand the ability to interpret results that are sometimes presented in less-than-intuitive ways

As touchscreen-equipped electronics like tablets and smartphones have become integral to modern life instrument users are coming to assume that operating any modern device will be virtually self-explanatory This assumption is having an impact on the instrument selection process by creating new expectations for ease of use

Changes in

httpswwwyoutubecomwatchv=2sOWokd9YDM

1312

TECH REPORT

1312

Modern Test amp Measure

Instrument developers have been quick to respond to these changing user expectations At Keithley wersquove developed an instrument design philosophy based on three principles

This ldquoTouch Test Inventrdquo philosophy underlies our latest Source Measure Unit (SMU) and digital multimeter instruments With simplified setups configured from the front panel these instruments support faster time to measurement and significant improvements in test productivity Their intuitive touchscreen interfaces also offer instant access to context-sensitive help which eliminates the need to consult a user manual to get an instrument up and running

As new users enter the instrumentation marketplace a growing number of them will demand that their suppliers offer products that ensure greater ease of use For a brief demonstration of how changes in instrument design are affecting the test and measurement process watch this video on configuring a current vs voltage sweep httpswwwyoutubecomwatchv=2sOWokd9YDM

Jerry Janesch is a senior market development manager at Keithley Instruments wwwkeithleycom part of the Tektronix test and measurement portfolio He earned a bachelorrsquos degree in electrical engineering from Fenn College of Engineering and a masterrsquos of business administration from John Carroll University He has been with Keithley since 2000

TOUCHAllow the user to reach out and literally touch the data This means incorporating a touchscreen interface that helps even novice users find the functions they need quickly and view data graphically so they can gain an intuitive understanding of their results

TESTHelp the user to perform a test accurately and get results quickly

INVENTMake the measurement process and interpretation of results easier so users can focus on their next breakthrough

The DMM7510 Graphical Sampling Multimeterrsquos high speed digitizing function allows capturing and displaying voltage and current waveforms

The Model 2460 SourceMeterreg Source Measure Unit (SMU) Instrumentrsquos touchscreen supports ldquopinch and zoomrdquo operation to allow examining data in the graph in detail

httpswwwyoutubecomwatchv=2sOWokd9YDM

1312

TECH REPORT

1312

Modern Test amp Measure

Instrument developers have been quick to respond to these changing user expectations At Keithley wersquove developed an instrument design philosophy based on three principles

This ldquoTouch Test Inventrdquo philosophy underlies our latest Source Measure Unit (SMU) and digital multimeter instruments With simplified setups configured from the front panel these instruments support faster time to measurement and significant improvements in test productivity Their intuitive touchscreen interfaces also offer instant access to context-sensitive help which eliminates the need to consult a user manual to get an instrument up and running

As new users enter the instrumentation marketplace a growing number of them will demand that their suppliers offer products that ensure greater ease of use For a brief demonstration of how changes in instrument design are affecting the test and measurement process watch this video on configuring a current vs voltage sweep httpswwwyoutubecomwatchv=2sOWokd9YDM

Jerry Janesch is a senior market development manager at Keithley Instruments wwwkeithleycom part of the Tektronix test and measurement portfolio He earned a bachelorrsquos degree in electrical engineering from Fenn College of Engineering and a masterrsquos of business administration from John Carroll University He has been with Keithley since 2000

TOUCHAllow the user to reach out and literally touch the data This means incorporating a touchscreen interface that helps even novice users find the functions they need quickly and view data graphically so they can gain an intuitive understanding of their results

TESTHelp the user to perform a test accurately and get results quickly

INVENTMake the measurement process and interpretation of results easier so users can focus on their next breakthrough

The DMM7510 Graphical Sampling Multimeterrsquos high speed digitizing function allows capturing and displaying voltage and current waveforms

The Model 2460 SourceMeterreg Source Measure Unit (SMU) Instrumentrsquos touchscreen supports ldquopinch and zoomrdquo operation to allow examining data in the graph in detail

MYLINK

CLICK HERE

1716

TECH REPORT

1716

Modern Test amp Measure

Using Latest Traditional Low-Parasitic Tester

By Barry Fernelius ESD and Latch-Up Manager Evans Analytical Group (EAG)

Todayrsquos human body model (HBM) ESD tests are widely performed on automated relay-based testers While this is the most common test

example these testers can cause false failures due to parasitic impedance from resistance inductance and capacitance introduced by the relays device under test (DUT) board and sockets Recent changes in the HBM spec now allow for the use of a low-parasitic HBM tester that because it is electrically connected at only two points provides a highly accurate and nearly perfect HBM pulse However it also has a drawback because it is slow and not practical to use for parts with high pin counts

Part one of this two-part article series will provide an overview of the HBM specrsquos evolution while part two will describe the challenges of using the associated low-parasitic HBM tester and how to resolve them with a hybrid test approach

Resolving

HBM ESD Test Challenges

1918

TECH REPORT

1918

Modern Test amp Measure

Low-Parasitic HBM Testing

The HBM electrostatic discharge (ESD) test is the oldest and most widely used ESD test in the electronics industry The JEDEC HBM test isnrsquot static it has been revised to keep up with the rapid changes in the semiconductor industry The latest revision of the spec addresses failures that are caused by parasitic impedances in HBM testers

SPEC PUBLISHED CHANGES

JESD22-A114 1995 Almost identical to MIL-STD-883 Method 30158

JESD22-A114-A October 1997 Minor changes to MIL-STD-883

JESD22-A114-B June 2000 1 pulsepinpolarity 03 seconds minimum between pulses

JESD22-A114-C January 2005 01 seconds between pulses stress both non-supply and no connect pins detection of the trailing EOS pulse

JESD22-A114-C01

March 2005 Minor editorial corrections only (deleted unused figure 3)

JESD22-A114-D March 2006 No connect pins to be left floating at all times

JESD22-A114-E January 2007 Elimination of pre-pulse voltage rise use of 10K ohm shunt resistor

JESD22-A114-F December 2008 Addition of alternate (reverse) pin combinations

JS-001-2010 April 2010 First joint ESDAJEDEC spec rewrites of sections on apparatus and equipment qualification

JS-001-2011 March 2011 Reduced non-supply stressing (Table 2A) IO-IO stressing for differential pairs single polarity supply-supply testing first allowance of 2 point HBM tester for die only shorted supply pins

JS-001-2012 January 2012 New section added to describe low-parasitic HBM simulators and how they may be used

JS-001-2014 August 2014 Addition of section on testing a statistical sample of cloned non-supply pins minor changes to definitions and Ips values

Figure 1 Idealized HBM Tester

Evolution of the HBM Spec

The current ANSIESDAJEDEC HBM test JS-001-2014 evolved from the military ESD testing spec MIL-STD-883 Method 30178 The first JEDEC version of the spec was published in 1995 Over the last twenty years incremental improvements have been made to the HBM spec based on the data and analysis performed by reliability engineers from

a cross-section of the IC industry One of the main goals has been the reduction of the cost and time required for HBM testing Other changes have addressed issues with the HBM simulator hardware The following table summarizes the different revisions of the HBM spec

An idealized model of an HBM tester is shown in Figure 1 In this model a 100pF capacitor is charged with a high

Table Idealized Model of the HBM Tester

2120

TECH REPORT

2120

Modern Test amp Measure

Figure 2 HBM Current vs Time +1000V HBM

voltage power supply not shown in the diagram The supply is removed from the circuit and the capacitor is discharged through a 1500Ω resistor In this case the device under test is the simplest one possible a piece of wire If you measure the current through the piece of wire as a function of time the waveform looks like the one shown in Figure 2

Because relays are used to connect the terminals of the device under test (DUT) to the HBM tester parasitic inductance and resistance is added to the discharge path In real HBM simulators the 1500Ω resistor is distributed with approximately 1400Ω on the Terminal A side and 100Ω on the Terminal B side The resistance is divided in order to provide an in-spec waveform across the entire relay array

Most IC devices have more than two terminals making the situation is more complicated Every pin on the device has a capacitively-coupled impedance path to the HBM simulator whether the pin is connected or not When one pin of a multi-pin power or ground group is stressed the other pins in that group are floated and they add additional capacitance on the order of 4-8pF per pin This extra capacitance can significantly change the

A More Realistic Model of the HBM Tester

The waveform in Figure 2 shows some ringing suggesting that there are parasitic impedances in the circuit Parasitic impedances are any combination of extra unwanted passive devices (resistors capacitors and inductors) in the signal path For the discharge of an HBM simulator through a piece of wire a more realistic circuit is shown in Figure 3

Figure 3 A more realistic HBM tester model

CLICKHERE

2222

Modern Test amp Measure

shape of the waveform In addition the DUT board and socket also add additional resistance inductance and capacitance causing additional changes to the HBM waveform Any circuitry that is sensitive to the waveform slope or to the Terminal B resistance can be affected by parasitic impedances It is even possible to damage non-stressed pins during HBM testing because of capacitive coupling All of these can impact the waveform and cause false HBM failures (see Reference 6) An even more realistic model of the HBM tester is shown in Figure 4

Part two of this article series will more closely examine todayrsquos low-parasitic HBM tester address the challenges posed by their inadequate speed and impracticality for parts with high pin counts It will also describe a hybrid test strategy that eliminates the parasitic impedance problems and associated false failures of relay-based testers without having to slow down testing by moving completely to a low-parasitic 2-point tester

Figure 4 An even more realistic HBM tester model

1918

TECH REPORT

1918

Modern Test amp Measure

Low-Parasitic HBM Testing

The HBM electrostatic discharge (ESD) test is the oldest and most widely used ESD test in the electronics industry The JEDEC HBM test isnrsquot static it has been revised to keep up with the rapid changes in the semiconductor industry The latest revision of the spec addresses failures that are caused by parasitic impedances in HBM testers

SPEC PUBLISHED CHANGES

JESD22-A114 1995 Almost identical to MIL-STD-883 Method 30158

JESD22-A114-A October 1997 Minor changes to MIL-STD-883

JESD22-A114-B June 2000 1 pulsepinpolarity 03 seconds minimum between pulses

JESD22-A114-C January 2005 01 seconds between pulses stress both non-supply and no connect pins detection of the trailing EOS pulse

JESD22-A114-C01

March 2005 Minor editorial corrections only (deleted unused figure 3)

JESD22-A114-D March 2006 No connect pins to be left floating at all times

JESD22-A114-E January 2007 Elimination of pre-pulse voltage rise use of 10K ohm shunt resistor

JESD22-A114-F December 2008 Addition of alternate (reverse) pin combinations

JS-001-2010 April 2010 First joint ESDAJEDEC spec rewrites of sections on apparatus and equipment qualification

JS-001-2011 March 2011 Reduced non-supply stressing (Table 2A) IO-IO stressing for differential pairs single polarity supply-supply testing first allowance of 2 point HBM tester for die only shorted supply pins

JS-001-2012 January 2012 New section added to describe low-parasitic HBM simulators and how they may be used

JS-001-2014 August 2014 Addition of section on testing a statistical sample of cloned non-supply pins minor changes to definitions and Ips values

Figure 1 Idealized HBM Tester

Evolution of the HBM Spec

The current ANSIESDAJEDEC HBM test JS-001-2014 evolved from the military ESD testing spec MIL-STD-883 Method 30178 The first JEDEC version of the spec was published in 1995 Over the last twenty years incremental improvements have been made to the HBM spec based on the data and analysis performed by reliability engineers from

a cross-section of the IC industry One of the main goals has been the reduction of the cost and time required for HBM testing Other changes have addressed issues with the HBM simulator hardware The following table summarizes the different revisions of the HBM spec

An idealized model of an HBM tester is shown in Figure 1 In this model a 100pF capacitor is charged with a high

Table Idealized Model of the HBM Tester

2120

TECH REPORT

2120

Modern Test amp Measure

Figure 2 HBM Current vs Time +1000V HBM

voltage power supply not shown in the diagram The supply is removed from the circuit and the capacitor is discharged through a 1500Ω resistor In this case the device under test is the simplest one possible a piece of wire If you measure the current through the piece of wire as a function of time the waveform looks like the one shown in Figure 2

Because relays are used to connect the terminals of the device under test (DUT) to the HBM tester parasitic inductance and resistance is added to the discharge path In real HBM simulators the 1500Ω resistor is distributed with approximately 1400Ω on the Terminal A side and 100Ω on the Terminal B side The resistance is divided in order to provide an in-spec waveform across the entire relay array

Most IC devices have more than two terminals making the situation is more complicated Every pin on the device has a capacitively-coupled impedance path to the HBM simulator whether the pin is connected or not When one pin of a multi-pin power or ground group is stressed the other pins in that group are floated and they add additional capacitance on the order of 4-8pF per pin This extra capacitance can significantly change the

A More Realistic Model of the HBM Tester

The waveform in Figure 2 shows some ringing suggesting that there are parasitic impedances in the circuit Parasitic impedances are any combination of extra unwanted passive devices (resistors capacitors and inductors) in the signal path For the discharge of an HBM simulator through a piece of wire a more realistic circuit is shown in Figure 3

Figure 3 A more realistic HBM tester model

CLICKHERE

2222

Modern Test amp Measure

shape of the waveform In addition the DUT board and socket also add additional resistance inductance and capacitance causing additional changes to the HBM waveform Any circuitry that is sensitive to the waveform slope or to the Terminal B resistance can be affected by parasitic impedances It is even possible to damage non-stressed pins during HBM testing because of capacitive coupling All of these can impact the waveform and cause false HBM failures (see Reference 6) An even more realistic model of the HBM tester is shown in Figure 4

Part two of this article series will more closely examine todayrsquos low-parasitic HBM tester address the challenges posed by their inadequate speed and impracticality for parts with high pin counts It will also describe a hybrid test strategy that eliminates the parasitic impedance problems and associated false failures of relay-based testers without having to slow down testing by moving completely to a low-parasitic 2-point tester

Figure 4 An even more realistic HBM tester model

2120

TECH REPORT

2120

Modern Test amp Measure

Figure 2 HBM Current vs Time +1000V HBM

voltage power supply not shown in the diagram The supply is removed from the circuit and the capacitor is discharged through a 1500Ω resistor In this case the device under test is the simplest one possible a piece of wire If you measure the current through the piece of wire as a function of time the waveform looks like the one shown in Figure 2

Because relays are used to connect the terminals of the device under test (DUT) to the HBM tester parasitic inductance and resistance is added to the discharge path In real HBM simulators the 1500Ω resistor is distributed with approximately 1400Ω on the Terminal A side and 100Ω on the Terminal B side The resistance is divided in order to provide an in-spec waveform across the entire relay array

Most IC devices have more than two terminals making the situation is more complicated Every pin on the device has a capacitively-coupled impedance path to the HBM simulator whether the pin is connected or not When one pin of a multi-pin power or ground group is stressed the other pins in that group are floated and they add additional capacitance on the order of 4-8pF per pin This extra capacitance can significantly change the

A More Realistic Model of the HBM Tester

The waveform in Figure 2 shows some ringing suggesting that there are parasitic impedances in the circuit Parasitic impedances are any combination of extra unwanted passive devices (resistors capacitors and inductors) in the signal path For the discharge of an HBM simulator through a piece of wire a more realistic circuit is shown in Figure 3

Figure 3 A more realistic HBM tester model

CLICKHERE

2222

Modern Test amp Measure

shape of the waveform In addition the DUT board and socket also add additional resistance inductance and capacitance causing additional changes to the HBM waveform Any circuitry that is sensitive to the waveform slope or to the Terminal B resistance can be affected by parasitic impedances It is even possible to damage non-stressed pins during HBM testing because of capacitive coupling All of these can impact the waveform and cause false HBM failures (see Reference 6) An even more realistic model of the HBM tester is shown in Figure 4

Part two of this article series will more closely examine todayrsquos low-parasitic HBM tester address the challenges posed by their inadequate speed and impracticality for parts with high pin counts It will also describe a hybrid test strategy that eliminates the parasitic impedance problems and associated false failures of relay-based testers without having to slow down testing by moving completely to a low-parasitic 2-point tester

Figure 4 An even more realistic HBM tester model

CLICKHERE

2222

Modern Test amp Measure

shape of the waveform In addition the DUT board and socket also add additional resistance inductance and capacitance causing additional changes to the HBM waveform Any circuitry that is sensitive to the waveform slope or to the Terminal B resistance can be affected by parasitic impedances It is even possible to damage non-stressed pins during HBM testing because of capacitive coupling All of these can impact the waveform and cause false HBM failures (see Reference 6) An even more realistic model of the HBM tester is shown in Figure 4

Part two of this article series will more closely examine todayrsquos low-parasitic HBM tester address the challenges posed by their inadequate speed and impracticality for parts with high pin counts It will also describe a hybrid test strategy that eliminates the parasitic impedance problems and associated false failures of relay-based testers without having to slow down testing by moving completely to a low-parasitic 2-point tester

Figure 4 An even more realistic HBM tester model

INDUSTRY INTERVIEW

2524

Modern Test amp Measure

Interview with Roger Nichols Keysight 5G Program Manager

As seen throughout the tech industry as soon as one solution is introduced into the market the focus immediately shifts towards developing the next generation of that product Such is the case for mobile networks After rolling out the first-ever 4G LTE network in the United States around 2008 network providers began working on its successor 5G The 4G LTE network saw unprecedented data rates and offered Internet access to smartphones forever changing the inter-device communication that now shapes the mobile industry As a result the vision for the Internet of Things began to take shape and with that vision came the need to bolster what will be the largest network of connected devicesmdasha feat that far exceeds the current 4G capabilities The development of a next-generation

The Next Generation

Keysight Shares Its Visionfor 5G

5G network has already begun and companies are quickly working to develop and test a new set of standards that will revolutionize the mobile industry

At the leading edge of 5G development is Keysight a test and measurement device and software company based in Santa Rosa California The company has made a significant investment in 5G testing by developing software and libraries that developers can use when creating new devices EEWeb spoke with Roger Nichols Keysightrsquos 5G Program Manager about the companyrsquos vision for the 5G deployment how it will affect the test and measure industry as a whole and some of the new 5G testing products they are developing

INDUSTRY INTERVIEW

2726

Modern Test amp Measure

Given your backgroundmdashin working with 1G through 4Gmdash what do you think 5G means

Letrsquos contrast this with the other generations 1G was a way to have a mobile telephone 2G was a way to have a mobile telephone that worked everywhere in the world 3G was the first serious foray into mobile data And now we have 4G From a marketing standpoint 4G is a term that is used to describe any technology from HSPA+ to WiMax to LTE and everything in between The purists will suggest that 4G did not happen until the first commercial launch of LTE Advanced A good example of that is the carrier aggregation launches that began back in November when ATampT introduced their first multi-carrier LTE system Still 2G to 3G and then 3G to 4G has been mostly about higher data-rates with an eye to improving capacity

But 5G isnrsquot just a new technology or a new air-interface the way that the industry is visualizing 5G is more holistic than in the past The best way I have heard this described is the way the METIS Consortium in Europe did in their five-point list which included amazingly fast great service in a crowd the best service follows you super real-time and reliable communications and ubiquitous things communicating I like this because the focus is on how 5G enables what the user does versus how fast the downlink data-rate will be To me 5G will be a revolutionary user experience

How will 5G enable applications that will truly have an impact on society

We have come a long way with mobile communications from just being able to carry your phone anywhere to now being able to carry your office anywhere But there are limits in the current commercial systems that create constraints key examples are speed latency reliability and spectrum and energy efficiency If you look at those limits together they put constraints on the application space and the network operator business model If you really did have a network that was truly reliable and amazingly fast what kind of innovations would come out that would revolutionize the industry Eight years ago we didnrsquot have Facebook iPads or AirBnBmdashso imagine what would be the new applications if we turned the functionality of the system up dramatically

One of my industry colleagues recalled being in a room many years ago where there was a heated argument about whether or not we would ever need more than one megabit per second on a wireless link Nowadays we are on the road to upwards of several hundred megabits per second The demand for data and performance and the need to expand beyond these constraints on the application space is where 5G will deliver

When will we see 5G commercialized

A lot of industry experts are saying that 2020 is the year But what does that necessarily mean In some sense 5G is going to be a revolution but it wonrsquot be ldquoovernightrdquo 2020 is an objective based on balancing the desire for 5G network performance and a practical notion based on how long some of the significant changes in the standards and the resulting technology are going to take The reality is that these changes are driven by three forces that can be unpredictable These forces are technology network operator business model and policy such as spectrum policy and net neutrality These are forces that we need to pay close attention to

What is Keysightrsquos role in the 5G deployment

Since 5G is more than a new air interface this vision drives technical development in a really wide range of disciplines This is going to provide great opportunities for most of the Keysight product line if not all of it We view test and measurement very broadlymdasheverything from simulation and design to manufacturing and deployment tests and everything from DC to daylight The industry is going to certainly require traditional communications technology measurements like frequency power bandwidth modulation accuracy sensitivity and functional

verification and conformance testing But if you think about the new technologies being discussed these areas and some new areas represent significant opportunity for us

The millimeter wave space which provides super high bandwidths for very high data rates is an area that gets very limited use today in commercial wireless This requires us in the test and measurement industry to help newcomers get the insight they need for much wider bandwidths As a test and measurement organization we are also going to have to develop simulation design and measurement capabilities for an industry that has a very different budget and buying cycle than the traditional millimeter wave users in the aerospace amp defense industry The vision for millimeter-wave in access communications also includes using

ldquoTo me 5G will be a

revolutionary user

experiencerdquo

ldquoThe test and measurement

industry is going to have to

move towards addressing a lot more RF

channels in very efficient waysrdquo

Pictured below Roger Nichols and colleagues

INDUSTRY INTERVIEW

2928

Modern Test amp Measure

many more RF channelsmdasha particular example is very high-order MIMO (ldquomassive MIMOrdquo) This means there will be a lot more attention paid on spatial multiplexing that drives higher spectrum and energy efficiency The test and measurement industry is going to have to move towards addressing a lot more RF channels in very efficient ways

Another growing requirement is in making measurements without a physical connection to the device under test At the millimeter wave end the antennas are likely to be connected directly to the semiconductor radio and there is no connector in between them Making calibrated measurements then without a connector and a predictable transmission line between device under test and test equipment is a very difficult thing to do This is the same at the lower frequencies where for the sake of aesthetics and costs there is also a lot of pressure to pull antenna connectors out of these devices

5G deployment will also require much faster digital speeds in the underlying electronic systems If you are talking about very high bandwidths and very low latencies 5G is going to place large demands on user equipment base

stations backhaul and data servers That requires moving a lot of data and digital information around very rapidly Our test equipment will need to manage bandwidth and data rates for high-speed digital testing and it will also require us to design internal parts of our equipment to move large amounts of information around very quicklymdashjust for our own architectures Fiber-optic communication will have to be much higher bandwidth on the backhaul So this high-speed demand impacts everything from short-distance inside our devices to long-distance connecting our devices

When you say ldquomassive MIMOrdquo what is the scale you are talking about

I was recently at a conference in Brooklyn where a question was posed to a panel of industry experts about how big ldquomassiverdquo actually is The prevailing wisdom in the room was that it meant anywhere between 50 and hundred data streams I believe these conclusions are driven to a certain extent by what is practical with todayrsquos technology and what people can foresee I have also read in research papers that the point of diminishing returns kicks in between 100 and 200 It all depends on the research that is being done right now about how this can be realized The challenge is the more antennas you put together the more expensive things get It also requires a lot more signal processing on multiple streams of data If you get up into the tens of data streams the amount of power you use in the digital signal processing may exceed what you use in your RF

power amplifiers You then eliminate one of the major gains of massive MIMO which is to save how much power you use up in transmission

Today around 70 percent of the power used in a wireless network is consumed in the power amplifiers that are a part of the radio transmitters or the air conditioning used to cool down those power amplifiers The MIMO system that just moves the power consumption from power amplifiers to the DSP hasnrsquot really accomplished anything aside from making a more spectrally efficient system We have to move a bit further than that if we are going to add all of the density that is anticipated with 5G

What are you most excited about for 5G and what are some of the biggest challenges ahead of you

The vision for 5G that is forming in the industry means change in technological demand that spans a wide range of disciplines For me what is most exciting is the breadth of the impact of the technologymdashthat is what we at Keysight as a premier measurement company aim to tackle The biggest challenge comes with the wireless market dynamics themselves Having been through four generations of technological and social change in this space Irsquove noticed that a lot of the changes have been driven by fads The part that is most challenging is the pace at which the network operates and how fast we have to respond to trends in the market

How will Keysight help its clients develop for 5G

Keysight has work going across our portfolio to make sure our customers get the best insights from our solutions To ensure this we engage with our customers and research institutions around the world to test their new ideas They want to do everything from testing their new ideas to developing new solutions for the complicated problems Irsquove been talking about A public example of this is our work with the China Mobile Research Institute on massive MIMO We are also looking forward to our participation on a couple of research projects sponsored by the European Commission associated with signaling work as well as millimeter wave

In the coming months quarters and years you can expect Keysight to deliver on many of these industry expectations In the short term most of the 5G work in the industry is in research where we will provide continuing product releases in both hardware and software that enable our solutions to show customers what they need to know and implement their new ideas As the standards work gets underway you will see the solutions become more optimized to the necessary standards to ensure our customerrsquos designs perform in accordance to global and industry standards Lastly the expertise we have developed in these technical areas and how to simulate design and measure puts our people in the equation to yield the best insight for our customers

ldquoThe demand for data and performance and the need

to expand beyond these

constraints on the application space is where 5G will deliverrdquo

ldquoMost of the 5G work in the industry is in

research where [Keysight]

will provide continuing

product releases in both hardware and softwarerdquo

CLICK HERE

MYLINK

4000 amp 3000 SERIES CALIBRATORSCalibrate ACDC Volts ACDC

Current to 30A Temperature Clamp Meters Oscilloscopes Inductance

Frequency Capacitance amp more

1000 amp 9000 SERIES CALIBRATORSTake your Cal Lab to the Field

25 50 amp 80 ppm Models AvailableA truly integrated industrial strength design

MODEL 3200 CALIBRATORFast amp Efficient Calibration of

Insulation Testers HIPOTS RCD Testers Loop amp Earth Bond Testers

PROCAL CALIBRATION SUITEManaging the Complete Calibration Cycle

Multi Discipline Automation Software Total Laboratory Management Bar Coded

Receiving Automated Calibration and Recall Letters

8081 PRECISION DMMThe Metrologistrsquos 8frac12 Digit DMMWider Ranges More Functions

and Lower Uncertainties

3000ZR Precision Zener Voltage Reference3000CS Precision Current Shunt Array3000RS Precision Resistance Standard

3000AC Precision ACV Standard

MULTI PRODUCT CALIBRATORS

TRANSPORTABLECALIBRATORS

ELECTRICAL TESTCALIBRATORS

CALIBRATION SOFTWARE SUITE

PRECISION DIGITALMETERS

PRECISION REFERENCE STANDARDS

Transmille Calibration158 Brentwood Drive Unit 4Colchester VT 05446Phone (802) 846 7582 I E-mail salestransmillecalibrationcomWeb www transmillecalibrationcom

Transmille LtdUnit 4 Select Business Centre Lodge Road Staplehurst Kent TN12 0QW UKPhone +44(0)1580 890700 I E-mail salestransmillecomWeb wwwtransmillecom

USA

UK

INDUSTRY INTERVIEW

2726

Modern Test amp Measure

Given your backgroundmdashin working with 1G through 4Gmdash what do you think 5G means

Letrsquos contrast this with the other generations 1G was a way to have a mobile telephone 2G was a way to have a mobile telephone that worked everywhere in the world 3G was the first serious foray into mobile data And now we have 4G From a marketing standpoint 4G is a term that is used to describe any technology from HSPA+ to WiMax to LTE and everything in between The purists will suggest that 4G did not happen until the first commercial launch of LTE Advanced A good example of that is the carrier aggregation launches that began back in November when ATampT introduced their first multi-carrier LTE system Still 2G to 3G and then 3G to 4G has been mostly about higher data-rates with an eye to improving capacity

But 5G isnrsquot just a new technology or a new air-interface the way that the industry is visualizing 5G is more holistic than in the past The best way I have heard this described is the way the METIS Consortium in Europe did in their five-point list which included amazingly fast great service in a crowd the best service follows you super real-time and reliable communications and ubiquitous things communicating I like this because the focus is on how 5G enables what the user does versus how fast the downlink data-rate will be To me 5G will be a revolutionary user experience

How will 5G enable applications that will truly have an impact on society

We have come a long way with mobile communications from just being able to carry your phone anywhere to now being able to carry your office anywhere But there are limits in the current commercial systems that create constraints key examples are speed latency reliability and spectrum and energy efficiency If you look at those limits together they put constraints on the application space and the network operator business model If you really did have a network that was truly reliable and amazingly fast what kind of innovations would come out that would revolutionize the industry Eight years ago we didnrsquot have Facebook iPads or AirBnBmdashso imagine what would be the new applications if we turned the functionality of the system up dramatically

One of my industry colleagues recalled being in a room many years ago where there was a heated argument about whether or not we would ever need more than one megabit per second on a wireless link Nowadays we are on the road to upwards of several hundred megabits per second The demand for data and performance and the need to expand beyond these constraints on the application space is where 5G will deliver

When will we see 5G commercialized

A lot of industry experts are saying that 2020 is the year But what does that necessarily mean In some sense 5G is going to be a revolution but it wonrsquot be ldquoovernightrdquo 2020 is an objective based on balancing the desire for 5G network performance and a practical notion based on how long some of the significant changes in the standards and the resulting technology are going to take The reality is that these changes are driven by three forces that can be unpredictable These forces are technology network operator business model and policy such as spectrum policy and net neutrality These are forces that we need to pay close attention to

What is Keysightrsquos role in the 5G deployment

Since 5G is more than a new air interface this vision drives technical development in a really wide range of disciplines This is going to provide great opportunities for most of the Keysight product line if not all of it We view test and measurement very broadlymdasheverything from simulation and design to manufacturing and deployment tests and everything from DC to daylight The industry is going to certainly require traditional communications technology measurements like frequency power bandwidth modulation accuracy sensitivity and functional

verification and conformance testing But if you think about the new technologies being discussed these areas and some new areas represent significant opportunity for us

The millimeter wave space which provides super high bandwidths for very high data rates is an area that gets very limited use today in commercial wireless This requires us in the test and measurement industry to help newcomers get the insight they need for much wider bandwidths As a test and measurement organization we are also going to have to develop simulation design and measurement capabilities for an industry that has a very different budget and buying cycle than the traditional millimeter wave users in the aerospace amp defense industry The vision for millimeter-wave in access communications also includes using

ldquoTo me 5G will be a

revolutionary user

experiencerdquo

ldquoThe test and measurement

industry is going to have to

move towards addressing a lot more RF

channels in very efficient waysrdquo

Pictured below Roger Nichols and colleagues

INDUSTRY INTERVIEW

2928

Modern Test amp Measure

many more RF channelsmdasha particular example is very high-order MIMO (ldquomassive MIMOrdquo) This means there will be a lot more attention paid on spatial multiplexing that drives higher spectrum and energy efficiency The test and measurement industry is going to have to move towards addressing a lot more RF channels in very efficient ways

Another growing requirement is in making measurements without a physical connection to the device under test At the millimeter wave end the antennas are likely to be connected directly to the semiconductor radio and there is no connector in between them Making calibrated measurements then without a connector and a predictable transmission line between device under test and test equipment is a very difficult thing to do This is the same at the lower frequencies where for the sake of aesthetics and costs there is also a lot of pressure to pull antenna connectors out of these devices

5G deployment will also require much faster digital speeds in the underlying electronic systems If you are talking about very high bandwidths and very low latencies 5G is going to place large demands on user equipment base

stations backhaul and data servers That requires moving a lot of data and digital information around very rapidly Our test equipment will need to manage bandwidth and data rates for high-speed digital testing and it will also require us to design internal parts of our equipment to move large amounts of information around very quicklymdashjust for our own architectures Fiber-optic communication will have to be much higher bandwidth on the backhaul So this high-speed demand impacts everything from short-distance inside our devices to long-distance connecting our devices

When you say ldquomassive MIMOrdquo what is the scale you are talking about

I was recently at a conference in Brooklyn where a question was posed to a panel of industry experts about how big ldquomassiverdquo actually is The prevailing wisdom in the room was that it meant anywhere between 50 and hundred data streams I believe these conclusions are driven to a certain extent by what is practical with todayrsquos technology and what people can foresee I have also read in research papers that the point of diminishing returns kicks in between 100 and 200 It all depends on the research that is being done right now about how this can be realized The challenge is the more antennas you put together the more expensive things get It also requires a lot more signal processing on multiple streams of data If you get up into the tens of data streams the amount of power you use in the digital signal processing may exceed what you use in your RF

power amplifiers You then eliminate one of the major gains of massive MIMO which is to save how much power you use up in transmission

Today around 70 percent of the power used in a wireless network is consumed in the power amplifiers that are a part of the radio transmitters or the air conditioning used to cool down those power amplifiers The MIMO system that just moves the power consumption from power amplifiers to the DSP hasnrsquot really accomplished anything aside from making a more spectrally efficient system We have to move a bit further than that if we are going to add all of the density that is anticipated with 5G

What are you most excited about for 5G and what are some of the biggest challenges ahead of you

The vision for 5G that is forming in the industry means change in technological demand that spans a wide range of disciplines For me what is most exciting is the breadth of the impact of the technologymdashthat is what we at Keysight as a premier measurement company aim to tackle The biggest challenge comes with the wireless market dynamics themselves Having been through four generations of technological and social change in this space Irsquove noticed that a lot of the changes have been driven by fads The part that is most challenging is the pace at which the network operates and how fast we have to respond to trends in the market

How will Keysight help its clients develop for 5G

Keysight has work going across our portfolio to make sure our customers get the best insights from our solutions To ensure this we engage with our customers and research institutions around the world to test their new ideas They want to do everything from testing their new ideas to developing new solutions for the complicated problems Irsquove been talking about A public example of this is our work with the China Mobile Research Institute on massive MIMO We are also looking forward to our participation on a couple of research projects sponsored by the European Commission associated with signaling work as well as millimeter wave

In the coming months quarters and years you can expect Keysight to deliver on many of these industry expectations In the short term most of the 5G work in the industry is in research where we will provide continuing product releases in both hardware and software that enable our solutions to show customers what they need to know and implement their new ideas As the standards work gets underway you will see the solutions become more optimized to the necessary standards to ensure our customerrsquos designs perform in accordance to global and industry standards Lastly the expertise we have developed in these technical areas and how to simulate design and measure puts our people in the equation to yield the best insight for our customers

ldquoThe demand for data and performance and the need

to expand beyond these

constraints on the application space is where 5G will deliverrdquo

ldquoMost of the 5G work in the industry is in

research where [Keysight]

will provide continuing

product releases in both hardware and softwarerdquo

CLICK HERE

MYLINK

4000 amp 3000 SERIES CALIBRATORSCalibrate ACDC Volts ACDC

Current to 30A Temperature Clamp Meters Oscilloscopes Inductance

Frequency Capacitance amp more

1000 amp 9000 SERIES CALIBRATORSTake your Cal Lab to the Field

25 50 amp 80 ppm Models AvailableA truly integrated industrial strength design

MODEL 3200 CALIBRATORFast amp Efficient Calibration of

Insulation Testers HIPOTS RCD Testers Loop amp Earth Bond Testers

PROCAL CALIBRATION SUITEManaging the Complete Calibration Cycle

Multi Discipline Automation Software Total Laboratory Management Bar Coded

Receiving Automated Calibration and Recall Letters

8081 PRECISION DMMThe Metrologistrsquos 8frac12 Digit DMMWider Ranges More Functions

and Lower Uncertainties

3000ZR Precision Zener Voltage Reference3000CS Precision Current Shunt Array3000RS Precision Resistance Standard

3000AC Precision ACV Standard

MULTI PRODUCT CALIBRATORS

TRANSPORTABLECALIBRATORS

ELECTRICAL TESTCALIBRATORS

CALIBRATION SOFTWARE SUITE

PRECISION DIGITALMETERS

PRECISION REFERENCE STANDARDS

Transmille Calibration158 Brentwood Drive Unit 4Colchester VT 05446Phone (802) 846 7582 I E-mail salestransmillecalibrationcomWeb www transmillecalibrationcom

Transmille LtdUnit 4 Select Business Centre Lodge Road Staplehurst Kent TN12 0QW UKPhone +44(0)1580 890700 I E-mail salestransmillecomWeb wwwtransmillecom

USA

UK

INDUSTRY INTERVIEW

2928

Modern Test amp Measure

many more RF channelsmdasha particular example is very high-order MIMO (ldquomassive MIMOrdquo) This means there will be a lot more attention paid on spatial multiplexing that drives higher spectrum and energy efficiency The test and measurement industry is going to have to move towards addressing a lot more RF channels in very efficient ways

Another growing requirement is in making measurements without a physical connection to the device under test At the millimeter wave end the antennas are likely to be connected directly to the semiconductor radio and there is no connector in between them Making calibrated measurements then without a connector and a predictable transmission line between device under test and test equipment is a very difficult thing to do This is the same at the lower frequencies where for the sake of aesthetics and costs there is also a lot of pressure to pull antenna connectors out of these devices

5G deployment will also require much faster digital speeds in the underlying electronic systems If you are talking about very high bandwidths and very low latencies 5G is going to place large demands on user equipment base

stations backhaul and data servers That requires moving a lot of data and digital information around very rapidly Our test equipment will need to manage bandwidth and data rates for high-speed digital testing and it will also require us to design internal parts of our equipment to move large amounts of information around very quicklymdashjust for our own architectures Fiber-optic communication will have to be much higher bandwidth on the backhaul So this high-speed demand impacts everything from short-distance inside our devices to long-distance connecting our devices

When you say ldquomassive MIMOrdquo what is the scale you are talking about

I was recently at a conference in Brooklyn where a question was posed to a panel of industry experts about how big ldquomassiverdquo actually is The prevailing wisdom in the room was that it meant anywhere between 50 and hundred data streams I believe these conclusions are driven to a certain extent by what is practical with todayrsquos technology and what people can foresee I have also read in research papers that the point of diminishing returns kicks in between 100 and 200 It all depends on the research that is being done right now about how this can be realized The challenge is the more antennas you put together the more expensive things get It also requires a lot more signal processing on multiple streams of data If you get up into the tens of data streams the amount of power you use in the digital signal processing may exceed what you use in your RF

power amplifiers You then eliminate one of the major gains of massive MIMO which is to save how much power you use up in transmission

Today around 70 percent of the power used in a wireless network is consumed in the power amplifiers that are a part of the radio transmitters or the air conditioning used to cool down those power amplifiers The MIMO system that just moves the power consumption from power amplifiers to the DSP hasnrsquot really accomplished anything aside from making a more spectrally efficient system We have to move a bit further than that if we are going to add all of the density that is anticipated with 5G

What are you most excited about for 5G and what are some of the biggest challenges ahead of you

The vision for 5G that is forming in the industry means change in technological demand that spans a wide range of disciplines For me what is most exciting is the breadth of the impact of the technologymdashthat is what we at Keysight as a premier measurement company aim to tackle The biggest challenge comes with the wireless market dynamics themselves Having been through four generations of technological and social change in this space Irsquove noticed that a lot of the changes have been driven by fads The part that is most challenging is the pace at which the network operates and how fast we have to respond to trends in the market

How will Keysight help its clients develop for 5G

Keysight has work going across our portfolio to make sure our customers get the best insights from our solutions To ensure this we engage with our customers and research institutions around the world to test their new ideas They want to do everything from testing their new ideas to developing new solutions for the complicated problems Irsquove been talking about A public example of this is our work with the China Mobile Research Institute on massive MIMO We are also looking forward to our participation on a couple of research projects sponsored by the European Commission associated with signaling work as well as millimeter wave

In the coming months quarters and years you can expect Keysight to deliver on many of these industry expectations In the short term most of the 5G work in the industry is in research where we will provide continuing product releases in both hardware and software that enable our solutions to show customers what they need to know and implement their new ideas As the standards work gets underway you will see the solutions become more optimized to the necessary standards to ensure our customerrsquos designs perform in accordance to global and industry standards Lastly the expertise we have developed in these technical areas and how to simulate design and measure puts our people in the equation to yield the best insight for our customers

ldquoThe demand for data and performance and the need

to expand beyond these

constraints on the application space is where 5G will deliverrdquo

ldquoMost of the 5G work in the industry is in

research where [Keysight]

will provide continuing

product releases in both hardware and softwarerdquo

CLICK HERE

MYLINK

4000 amp 3000 SERIES CALIBRATORSCalibrate ACDC Volts ACDC

Current to 30A Temperature Clamp Meters Oscilloscopes Inductance

Frequency Capacitance amp more

1000 amp 9000 SERIES CALIBRATORSTake your Cal Lab to the Field

25 50 amp 80 ppm Models AvailableA truly integrated industrial strength design

MODEL 3200 CALIBRATORFast amp Efficient Calibration of

Insulation Testers HIPOTS RCD Testers Loop amp Earth Bond Testers

PROCAL CALIBRATION SUITEManaging the Complete Calibration Cycle

Multi Discipline Automation Software Total Laboratory Management Bar Coded

Receiving Automated Calibration and Recall Letters

8081 PRECISION DMMThe Metrologistrsquos 8frac12 Digit DMMWider Ranges More Functions

and Lower Uncertainties

3000ZR Precision Zener Voltage Reference3000CS Precision Current Shunt Array3000RS Precision Resistance Standard

3000AC Precision ACV Standard

MULTI PRODUCT CALIBRATORS

TRANSPORTABLECALIBRATORS

ELECTRICAL TESTCALIBRATORS

CALIBRATION SOFTWARE SUITE

PRECISION DIGITALMETERS

PRECISION REFERENCE STANDARDS

Transmille Calibration158 Brentwood Drive Unit 4Colchester VT 05446Phone (802) 846 7582 I E-mail salestransmillecalibrationcomWeb www transmillecalibrationcom

Transmille LtdUnit 4 Select Business Centre Lodge Road Staplehurst Kent TN12 0QW UKPhone +44(0)1580 890700 I E-mail salestransmillecomWeb wwwtransmillecom

USA

UK

CLICK HERE

MYLINK

4000 amp 3000 SERIES CALIBRATORSCalibrate ACDC Volts ACDC

Current to 30A Temperature Clamp Meters Oscilloscopes Inductance

Frequency Capacitance amp more

1000 amp 9000 SERIES CALIBRATORSTake your Cal Lab to the Field

25 50 amp 80 ppm Models AvailableA truly integrated industrial strength design

MODEL 3200 CALIBRATORFast amp Efficient Calibration of

Insulation Testers HIPOTS RCD Testers Loop amp Earth Bond Testers

PROCAL CALIBRATION SUITEManaging the Complete Calibration Cycle

Multi Discipline Automation Software Total Laboratory Management Bar Coded

Receiving Automated Calibration and Recall Letters

8081 PRECISION DMMThe Metrologistrsquos 8frac12 Digit DMMWider Ranges More Functions

and Lower Uncertainties

3000ZR Precision Zener Voltage Reference3000CS Precision Current Shunt Array3000RS Precision Resistance Standard

3000AC Precision ACV Standard

MULTI PRODUCT CALIBRATORS

TRANSPORTABLECALIBRATORS

ELECTRICAL TESTCALIBRATORS

CALIBRATION SOFTWARE SUITE

PRECISION DIGITALMETERS

PRECISION REFERENCE STANDARDS

Transmille Calibration158 Brentwood Drive Unit 4Colchester VT 05446Phone (802) 846 7582 I E-mail salestransmillecalibrationcomWeb www transmillecalibrationcom

Transmille LtdUnit 4 Select Business Centre Lodge Road Staplehurst Kent TN12 0QW UKPhone +44(0)1580 890700 I E-mail salestransmillecomWeb wwwtransmillecom

USA

UK

3332

PRODUCT WATCH

3332

Modern Test amp Measure

The Simple Solution to Wireless Networking

Have you ever been at the store ready to check out with two or three items and then realize that only one very busy checkout lane is open As you patiently wait your turn the express lane opens and you are out of the store in five minutes You just bypassed the complex and took the simple solution In the test and measure world Osciumrsquos WiPry-Pro spectrum analyzer is the simple solution to wireless networking

from Oscium

WiPry-Pro

3534

PRODUCT WATCH

3534

Modern Test amp Measure

WiPry-Pro is the express-lane tool for analyzing your invisible wireless environment Take Jerry as an example he owns and manages a local internet cafeacute and coffee shop in the University Heights neighborhood of San Diego California Although Jerryrsquos shop is open 24 hours a day his typical customer comes into the store in the evening and stays until the early morning hours of the next day The place is usually filled to capacity between the hours of 9PM and 4AM Customers come to Jerryrsquos store because of the free high-speed Internet access and because itrsquos open all night making it a great place to get some rush homework done Jerry makes his money selling sandwiches and espresso but customers only buy his food because they need internet which requires it to be working at top speed

Jerry operates his coffee shop on a tight budget like many business owners To reduce expenses Jerry does as much as he can on his own in order to minimize expensive service calls When the wireless networks are slow or stop working all together Jerry stops managing the store long enough to see if he can fix the problem himself

WLAN Sniffers are wireless networking tools used for network optimization diagnostic checks and troubleshooting Sniffers detect wireless networks and provide users information from the highest-level radio frequency broadcasting to the lowest-level packet capture and analysis and everything in between Many of these tools have expensive licensing agreements To be effective with these tools requires the user to have the necessary training and above average knowledge of computer networking

For the routine connectivity issues Jerry deals with day to day the all-inclusive WLAN sniffer solution is overkill Their relative cost and complexity are beyond what Jerry can pay or easily understand Jerry needs a tool that is simple to use that wonrsquot tie up space in his store time in his schedule or a lot of money in his business account

WiPry-Pro is the solution for Jerry and people like him that need an efficient means for surveying wireless networks The WiPry product line by Oscium is an uncomplicated tool that performs simple but effective network analysis functions

It is easy to use and works with Applersquos iOS devices like the iPhone iPad iPod Within minutes of plugging the WiPry-Pro accessory into his iOS device and installing the free WiPry software Jerry gets all the information he needs about the health of his wireless network He can either resolve the connectivity problem or if necessary refer it to a network specialist With WiPry-Pro Jerry can see that his SSIDs are broadcasting their signal strength is adequate and that they arenrsquot operating close to interference This allows Jerry to keep his network and business running strong

Think of Osciumrsquos products as one tool in your toolbox you have many tools in the box and while not all of them are appropriate for every job each is suited for a particular task Osciumrsquos WiPry-Pro is designed to be the right tool at the right time Solving problems with your wireless network should not require a technician visit every time your internet runs slowly Osciumrsquos products are simple effective and affordable solutions to everyday problems with wireless networks Bypass the complex and go for the express lane

Solving problems with your wireless network should not require a technician visit every time your internet runs slowly

The WiPry product line by Oscium is an uncomplicated tool that performs simple but effective network analysis functions Side View Top View

Sierra CircuitsA Complete PCB Resource

PLUS The Ground rdquo Myth in PrintedCircuits

ldquo

PCB Resin Reactor+

Ken BahlCEO of Sierra Circuits

Let There Be

How Cree reinvented the light bulb

LIGHT

David ElienVP of Marketing amp Business

Development Cree Inc

New LED Filament Tower

Cutting Edge Flatscreen Technologies

+

+

M o v i n g T o w a r d s

a Clean Energy

FUTUREmdash Hugo van Nispen COO of DNV KEMA

MCU Wars 32-bit MCU Comparison

Cutting Edge

SPICEModeling

Freescale and TI Embedded

Modules

ARMCortex

Programming

From Concept to

Reality Wolfgang Heinz-Fischer

Head of Marketing amp PR TQ-Group

Low-Power Design Techniques

TQ-Grouprsquos Comprehensive Design Process

+

+

PowerDeveloper

Octobe r 20 13

Designing forDurability

View more EEWeb magazinesmdash Click Here

3534

PRODUCT WATCH

3534

Modern Test amp Measure

WiPry-Pro is the express-lane tool for analyzing your invisible wireless environment Take Jerry as an example he owns and manages a local internet cafeacute and coffee shop in the University Heights neighborhood of San Diego California Although Jerryrsquos shop is open 24 hours a day his typical customer comes into the store in the evening and stays until the early morning hours of the next day The place is usually filled to capacity between the hours of 9PM and 4AM Customers come to Jerryrsquos store because of the free high-speed Internet access and because itrsquos open all night making it a great place to get some rush homework done Jerry makes his money selling sandwiches and espresso but customers only buy his food because they need internet which requires it to be working at top speed

Jerry operates his coffee shop on a tight budget like many business owners To reduce expenses Jerry does as much as he can on his own in order to minimize expensive service calls When the wireless networks are slow or stop working all together Jerry stops managing the store long enough to see if he can fix the problem himself

WLAN Sniffers are wireless networking tools used for network optimization diagnostic checks and troubleshooting Sniffers detect wireless networks and provide users information from the highest-level radio frequency broadcasting to the lowest-level packet capture and analysis and everything in between Many of these tools have expensive licensing agreements To be effective with these tools requires the user to have the necessary training and above average knowledge of computer networking

For the routine connectivity issues Jerry deals with day to day the all-inclusive WLAN sniffer solution is overkill Their relative cost and complexity are beyond what Jerry can pay or easily understand Jerry needs a tool that is simple to use that wonrsquot tie up space in his store time in his schedule or a lot of money in his business account

WiPry-Pro is the solution for Jerry and people like him that need an efficient means for surveying wireless networks The WiPry product line by Oscium is an uncomplicated tool that performs simple but effective network analysis functions

It is easy to use and works with Applersquos iOS devices like the iPhone iPad iPod Within minutes of plugging the WiPry-Pro accessory into his iOS device and installing the free WiPry software Jerry gets all the information he needs about the health of his wireless network He can either resolve the connectivity problem or if necessary refer it to a network specialist With WiPry-Pro Jerry can see that his SSIDs are broadcasting their signal strength is adequate and that they arenrsquot operating close to interference This allows Jerry to keep his network and business running strong

Think of Osciumrsquos products as one tool in your toolbox you have many tools in the box and while not all of them are appropriate for every job each is suited for a particular task Osciumrsquos WiPry-Pro is designed to be the right tool at the right time Solving problems with your wireless network should not require a technician visit every time your internet runs slowly Osciumrsquos products are simple effective and affordable solutions to everyday problems with wireless networks Bypass the complex and go for the express lane

Solving problems with your wireless network should not require a technician visit every time your internet runs slowly

The WiPry product line by Oscium is an uncomplicated tool that performs simple but effective network analysis functions Side View Top View

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Sierra CircuitsA Complete PCB Resource

PLUS The Ground rdquo Myth in PrintedCircuits

ldquo

PCB Resin Reactor+

Ken BahlCEO of Sierra Circuits

Let There Be

How Cree reinvented the light bulb

LIGHT

David ElienVP of Marketing amp Business

Development Cree Inc

New LED Filament Tower

Cutting Edge Flatscreen Technologies

+

+

M o v i n g T o w a r d s

a Clean Energy

FUTUREmdash Hugo van Nispen COO of DNV KEMA

MCU Wars 32-bit MCU Comparison

Cutting Edge

SPICEModeling

Freescale and TI Embedded

Modules

ARMCortex

Programming

From Concept to

Reality Wolfgang Heinz-Fischer

Head of Marketing amp PR TQ-Group

Low-Power Design Techniques

TQ-Grouprsquos Comprehensive Design Process

+

+

PowerDeveloper

Octobe r 20 13

Designing forDurability

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