Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of...

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Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary

Transcript of Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of...

Page 1: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

Testing of A/D Converters

István Kollár

Budapest University of Technology and Economics

Dept. of Measurement and Information Systems

Budapest, Hungary

Page 2: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 2

Summer School on ADC and DACJune-July 2006

Outline

• Dynamic measurements: what is the input?• Standards

• Standardization projects, advantages and problems

• Main test methods• Sine wave fit: 3-parameter vs. 4-parameter• 4-parameter fit

• Starting values• Algorithm

• Programs• LabView• MATLAB

• Summary

Page 3: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 3

Summer School on ADC and DACJune-July 2006

Input signals

• Paradox: determine signal from erroneous data…

• Solution: parametric model:• sine wave• exponential• ramp

Page 4: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 4

Summer School on ADC and DACJune-July 2006

Standardization Projects• IEEE 1057-1994 (standard for digitizing

waveform recorders)• IEEE 1241-2000 (standard for terminology

and test methods for analog-to-digital converters)

IEC

• DYNAD – dynamic characterization and testing of analogue to digital converters

• EUPAS – European project for ADC-based devices standardization (in IMEKO TC4)

Page 5: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 5

Summer School on ADC and DACJune-July 2006

Location of Code Transitions

Direct measurement: feedback loop

Histogram – of what?

Ramp vs. sine wave

Nonlinearity

Page 6: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 6

Summer School on ADC and DACJune-July 2006

DFT/FFT Test Test

Sine wave

Coherent sampling

Total harmonic distortion

Spurious-free dynamic range

Intermodulation distortion

Page 7: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 7

Summer School on ADC and DACJune-July 2006

Sine Wave Fitting

IEEE 1241-2000 (standard for terminology and test methods for analog-to-digital converters)• Sine wave fitting

Problems: detailed description, but• Complex algorithms using computer• One-step and/or iterative solutions• Non-defined or partly defined details• Not always repeatable results

Page 8: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 8

Summer School on ADC and DACJune-July 2006

Causes of Ambiguity

• Starting values• Iteration details• Stop criteria• Number representation• Numerical algorithms (roundoff)

Written standard + standard program(s)

vs. detailed standard

Page 9: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 9

Summer School on ADC and DACJune-July 2006

3-parameter vs. 4-parameter Fit

• 3-parameter:• Frequency ratio must be exactly known• Linear in the parameters (one-step solution)

• 4-parameter:• More robust• Works also when the frequency ratio is exactly

known• Non-linear in the parameters (iterative solution)

Page 10: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 10

Summer School on ADC and DACJune-July 2006

3-parameter Fit

Linear in A, B, C

A, B, C: LS solution of

where is known.

2M

1=n

2nnn )(min C - )tBsin( - )tAcos( -ymin xDy

xDy )(

0

C

B

A

x

Page 11: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 11

Summer School on ADC and DACJune-July 2006

4-p Fit: Starting ValuesNonlinear in • Choice of is optional in the standard

• Maximum of DFT ( /2)• Count zero crossings (min. 5 periods)• Interpolated FFT

Page 12: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 12

Summer School on ADC and DACJune-July 2006

Algorithm I.

Minimize vs. , A, B, C

M

1=n

2nnn C - )tBsin( - )tAcos( -y

Page 13: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 13

Summer School on ADC and DACJune-July 2006

Algorithm II.

Algorithm: recursively find LS solution for xi of

i

i

i

i

i C

B

A

x

MiMiMiMiMiMi

iiiiii

iiiiii

i

ttBttAtt

ttBttAtt

ttBttAtt

111111

212121212121

111111111111

1

cossin1sincos.

.

.

.

.

. cossin1sincos

cossin1sincos

D

ii xDy )( 1

Page 14: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 14

Summer School on ADC and DACJune-July 2006

Algorithm III.

Newton-Raphson method

...)(

2

1)()()(

2

2

pp

ppp

p

pppp T KK

KK

p

p

p

p

p

p

pp

p

2

T

p

T

p

KKδK 2

0

T

p

p

p

pp

)()(

1

2

2 KK

Page 15: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 15

Summer School on ADC and DACJune-July 2006

Algorithm IV.

Newton-Gauss method

Advantage:

0)()()()(

1

2

2

T

p

p

p

p

p

pp

p

p KKKK

11T

1

1

1T

1

1

2

2 )()(

iiiiii xy

KKDDDD

p

p

p

pxp

T

yiiiiiiT

1

1

1T

11

DDDxxx

01

1

1

1i

i

i

i C

B

A

x

i

i

i

i

i C

B

A

x

Page 16: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 16

Summer School on ADC and DACJune-July 2006

Algorithm V.

Difficulty: Nothing guarantees decrease of cost function

when applying step (second-order approximation)

Stop criterion?

Good news: In practice cf almost always decreases,

especially if at least 5 periods were measured

Page 17: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 17

Summer School on ADC and DACJune-July 2006

Stop Criteria

Stop if error is small enough (?): Largest possible step is already small Step below noise level Step below noticeable error Step below roundoff error

Display: significant bits only

Page 18: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 18

Summer School on ADC and DACJune-July 2006

Candidate Programs

MATLAB LabView LabWindows Agilent VEE GeniDAQ MATRIXx Scilab Mathematica

Page 19: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 19

Summer School on ADC and DACJune-July 2006

Sources of Program Information

MATLAB, URL: http://www.mathworks.com/

LabView, URL: http://www.ni.com/labview/

LabWindows, URL: http://www.ni.com/cvi/

VEE, URL: http://www.get.agilent.com/gpinstruments/products/vee/support/

GeniDAQ, URL: http://www.advantech.com/products/GeniDAQ%20for%20Windows%20CE.asp

MATRIXx, URL: http://www.windriver.com/products/html/matrixx.html

Scilab, URL: http://www-rocq.inria.fr/scilab/scilab.html

Mathematica, URL: http://www.wolfram.com/

Page 20: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 20

Summer School on ADC and DACJune-July 2006

Labview Programs

Aim: support IEEE-STD-1057 • Original LabView source• New: stand-alone programs for PC and

Macintosh

Page 21: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 21

Summer School on ADC and DACJune-July 2006

Labview Program

Page 22: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 22

Summer School on ADC and DACJune-July 2006

General Requirements for a Program

• Theoretical• Accurate and fast realization• Careful documentation of the standard algorithms

• Practical• Known environment• User-friendly and flexible interface• Availability (via internet)• Interactivity

LabView is good, but Matlab is also required

Page 23: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 23

Summer School on ADC and DACJune-July 2006

Why MATLAB?

• Available for several platforms in many labs and universities

• IEEE double-precision numbers (64 bit)• Matrix, vector processing oriented (including

DFT), implemented in C• Easy to examine and extend the code• User-interface support• Negligible cross-platform compatibility

problems

Page 24: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 24

Summer School on ADC and DACJune-July 2006

The Framework

• Standard mode• Curve fitting, DFT and other standardized

methods, support automatic processing

• Graphical mode• For visual evaluations

• Compatible mode• Compatible with the LabView program

• Advanced, development mode• Test-bed for new ideas

Page 25: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 25

Summer School on ADC and DACJune-July 2006

Interfaces

• User interface• Graphical user interface• Self-documentation to support repeatability• ASCII file format to modify the settings easily

• I/O interface• Several input file format supporting (ASCII, wave,

custom)• Different output files (ASCII, mat, custom)

Page 26: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 26

Summer School on ADC and DACJune-July 2006

The ProgramPage http://www.mit.bme.hu/services/ieee/ADC-test/

Page 27: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 27

Summer School on ADC and DACJune-July 2006

The Program

Page 28: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 28

Summer School on ADC and DACJune-July 2006

Data Files (Common for Programs)

Page: http://www.mit.bme.hu/services/ieee/ADC-test/data/

Page 29: Testing of A/D Converters István Kollár Budapest University of Technology and Economics Dept. of Measurement and Information Systems Budapest, Hungary.

István KollárBudapest University of Technology and Econ. 29

Summer School on ADC and DACJune-July 2006

Summary

• The framework• Standard, precise calculations• Flexible interfaces for different purposes

• Future work• Version 3.1 is on the internet:

http://www.mit.bme.hu/services/ieee/ADC-test/• Continuous development• Interactive environment• Ideas and comments are appreciated