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Transcript of Tensile, Creep, and ABI Tests on Sn5%Sb Solder.pdf
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8/10/2019 Tensile, Creep, and ABI Tests on Sn5%Sb Solder.pdf
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J o u r n a l o f E l e c t r o n i c M a t e r i a l s Vo l . 2 6 No . 7 1 9 9 7
Special ssue Paper
T e n s ile , C r e e p , a n d A B I T e s ts o n S n 5 S b S o l d e r
fo r M e c h a n i c a l P r o p e r t y E v a l u a t io n
K. LINGA MURTY,* FAHMY M. HA GG AG /a nd RAO K. MAHIDHARA*
*North Carolina State University, Raleigh, NC 27695-7909
*Advanced Technology Corporation, 661 Emo ry Valley Road, Suite A,
Oak Ridge, TN 37830
Sn5 Sb is one of the mate ria ls considered for replacing lead containing alloys
for soldering in electronic packaging. We eval uated the tensile properties of the
bulk materi al at varied strain- rates a nd tempe ratu res (to 473K) to determi ne
the underly ing deformation mechanisms. Stress exponents of about three and
seven were observed at low and high stresses, respectively, and very low
activation energies for creep (about 16.7 and 37.7 kJ/mole) were noted. A
maxi mum ductility of about 350 was noted at ambient temper ature . Creep
tests performed in the same temperature regime also showed two distinct
regions, albeit with slightly different exponents (three an d five) and activation
energy (about 54.4 kJ/mole). Ball indentation tests were performed on the
shoulder portions of the creep samples (prior to creep tests) using a Stress-
Strain Microprobe~ (Advanced Technology Corporation) at vari ed ind enta tion
rates (strain-rates). The automated ball indentation (ABI) data were at rela-
tively high strai n-rates; however, they were in excellent agree ment with creep
data, while both these results deviated from the tensile test data. Work is
planned to perform creep at high str esses at ambient and extend ABI tests to
elevated temperatures.
Ke y w ords : Chemical diffusion, creep, deformation mechanisms, dislocation
glide, dislocation pipe diffusion, grain -boundary diffusion, lead-
free, self-diffusion, solder, tensile properties
I N T R O D U T I O N
Sn-Sb alloys are viable candidates as soldering
materi als in electronic packaging and ar e considered
in the development of lead-free alloys to replace
currently used lead-based alloys. Tin alloyed with
5 Sb has a near-perit ecti c composition and a rela-
tively high melt ing point of 245~ This alloy has good
creep resistance and thermal fatigue characteris-
tics. 1,2 The room t empera tur e ductil ity of the alloy is
very high while the contact angle for the alloy on
copper subs tra te is relat ively large (43 + 4 ~ com-
pared to t ha t of 17 + 4 ~ for the Pb-Sn eutectic, albeit
it is quite adequate from the wettability consider-
ation/Mechanical and creep properties have been
reporte d by several investigators using conventional
tensile and creep tests on bulk specimens.4~
It is important to develop techniques to charac-
*Currently with Tessera Inc., 3099 Orchard Dr., San Jose,
CA 95134
(Received November 15, 1996; accepted February 21, 1997)
terize mechanical, creep, and fatigue properties of
solder structures so tha t these charact eristics can be
evaluate d in
near r ea l
situations where the amounts
of material available are relatively small. A funda-
menta l require ment is the development of echniques
to characterize the mechanic al and fracture proper-
ties of components of various joint configurations so
tha t proper a ssessme nt can be made of the degrada-
tion and remaining life of solder joints in various
applications. While destructive tests of specimens
made from materials of which these structures are
constructed provide relevant data, direct measure-
ment, preferably using nondestructive techniques on
the real structures, is desirable for reliable assess-
ment of the safety of these structures. One such
technique is the automated ball indentation (ABI)
which has been demonstrated to yield the stress-
strain behavior of many structural met al s/T he se
tests are relatively simple, rapid, and essentially
nondestructive.
We report here the room-temperature deformation
characteristics obtained on the shoulder portions of
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8/10/2019 Tensile, Creep, and ABI Tests on Sn5%Sb Solder.pdf
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8 4 0 M u r t y , H a g g a g , a n d M a h i d h a ra
3 0
2
10
S n - S S b / T e n s i l e Tests
j e
. 0 / , 5 1 . 0
p l a s t i c s t r a i n
F i g . 1 . S t r e s s v s s t ra i n a t ~ = I O - 4 s - L
i , 1 1 5 2 . 0
400
300
i 200
100
i i I i
S n - S S b S o l d e r
1041ec'l ~
0 i I t 1 | I i I
275 325 375 425 475
Temperature K
F i g . 2 . T e m p e r a t u r e v a r i a t i o n o f d u c t i li t y a t t w o c o n s t a n t s t r a i n -r a t e s
t h e t e n s i l e / c r e e p s p e c i m e n s u s i n g t h e s t r e s s - s t r a i n -
m i c r o p ro b e ( S S M - - d e v e l o p e d b y t h e A d v a n c e d T e c h -
n o lo g y C o r p o r a ti o n b a s e d o n t h e A B I p r i n c i p l e ) t o
c o m p a r e w i t h t h e s t a n d a r d d e s t r u c ti v e t e n s il e a n d
c r e e p t e s t r e s u l ts . A l t h o u g h t h e S S M c a n b e u s e d o n
s m a l l s o l d e r b u m p s , s u c h t e s t s r e q u i r e f u r t h e r d e v e lo p -
m e n t s w h e r e r e l a ti v e l y s m a l l i n d e n t e r s ( o f m i c r o n
s iz e ) n e e d t o b e u s e d a n d v e r y l o w l o a d s ( m i c r o g r a m s )
c a n b e m o n i t o r e d . A m a j o r o b j e c t i v e o f t h e c u r r e n t
s t u d y is t o i n v e s t i g a t e t h e u n d e r l y i n g d e f o r m a t i o n
m e c h a n i s m i n t h e s o l d e r a l lo y .
E X P E R I M E N T A L
D E T A I L S
T i n - a n t i m o n y a l l oy w i t h c h e m i c a l c o m p o s i t i o n S n -
5 % S b w a s o b t a i n e d i n t h e f o r m o f i m m t h i c k s h e e t
f r o m A l p h a M e t a l s , I nc . T e n s i l e s p e c i m e n s w i t h a
g a g e l e n g th o f 1 2. 4 m m w e r e m a c h i n e d f r om t h e s h e e t
p a r a l l e l t o t h e r o l li n g d i r e c ti o n . T h e m e c h a n i c a l p r o p -
e r t i e s w e r e c h a r a c t e r i z e d u s i n g t e n s i l e t e s t s p e r -
f o r m e d o n a c l os e d -l o o p I n s t r o n t e s t i n g m a c h i n e a t
t e m p e r a t u r e s f r o m a m b i e n t t o 4 7 3 K b o t h a t c o n s t a n t
c r o s s - h e a d s p e e d a n d a l s o s t r a i n - r a t e c h a n g e t e s t s .
Th e s t r a i n - r a t e s r a n g e d f ro m ~ 5 x 1 0~ s ~1 to - 1 10 2 s -1.
I n a d d i ti o n , t e n s i l e c r e e p t e s t s w e r e p e r f o r m e d u n d e r
c o n s t a n t l o ad i n t h e s a m e t e m p e r a t u r e r a n g e a n d t h e
s t r a i n s w e r e m o n i t o r e d u s i n g a l in e a r v a r i a b l e d i f f e r-
e n t i a l t r a n s f o r m e r ( L V D T ) in t h e l o a d- l in e . T h e
s t r e s s e s r a n g e d f r o m a b o u t 1 . 2 5 M P a t o 30 M P a .
M e t a l l o g r a p h y w a s p e r f o r m e d u s i n g o p ti c al a n d s c a n-
n i n g e l e c t r o n m i c r o s c o p y .
A B I t e s t i n g i n v o l v e s m u l t i p l e i n d e n t a t i o n s a t t h e
s a m e l o c a ti o n u s i n g a s p h e r i c a l i n d e n t e r w h i l e m e a -
s u r i n g t h e l o a d v s d e p t h o f p e n e t r a t i o n f r o m w h i c h
t r u e s t r e s s a n d t r u e s t r a i n a r e e v a l u a t e d u s i n g t h e
e l a s t i c a n d p l a s t i c a n a l y s e s . 7 F o r A B I t e s t s , n o s p e c i f i c
s p e c i m e n p r e p a r a t i o n w a s n e c e s s a r y e x c e p t t o m a k e
s u r e t h a t t h e s p e c i m e n w a s f l a t a n d t h e s u r f a c e s w e r e
p a r a l le l . W h i l e t h e s h o u l d e r p o r t i o n s o f t h e t e s t e d
s p e c i m e n s c o u l d b e u s e d f o r A B I t e s t i n g , o n e o f th e
a r c h i v a l c r e e p s p e c i m e n s w a s d e v o t e d f o r t h i s p u r -
p o s e to e l im i n a t e a n y m i c r o s t r u c t u r a l d e v e l o p m e n t
t h a t m a y h a v e t a k e n p l ac e d u r in g l o n g t e r m e x p o s u r e
a t h i g h t e m p e r a t u r e . l ig h t m e c h a n i c a l p o l is h w a s
g i v e n t o r e m o v e a n y s u r f a c e c o n t a m i n a t i o n t h a t m i g h t
h a v e a c c u m u l a t e d . T h e b a l l in d e n t a t i o n t e s t s w e r e
p e r f o r m e d o n a t a b l e t o p s y s t e m m o d e l P o r t a F l o w - P 1 @
s y s t e m u s i n g a t u n g s t e n c a r b i d e s p h e r i c a l i n d e n t e r
w i t h 1 . 57 5 m m ( 0 .0 6 1 ) d i a m e t e r ( D ), a n d m a x i m u m
d e p t h o f p e n e t r a t i o n (hm ax) o f a b o u t 0 . 1 m m ( 0 . 0 0 4 ) .
T h e i n d e n t e r v e l o c i t y w a s v a r i e d f r o m 5 . 0 8 1 0 -4 to
0 . 5 0 8 m m / s ( 2 x 1 0 - s t o 0 . 0 2 i n / s) a n d t h e i n d e n t a t i o n
l o a d v s d e p t h w e r e c o n t i n u o u s ly m e a s u r e d u s i n g a n
o n - l i n e l o a d c e l l a n d a n L V D T , r e s p e c t i v e l y ( F i g. l b ) .
A t t h e m a x i m u m i n d e n t a t i o n d e p t h o f 0 .1 m m , t h e
d i a m e t e r s o f i n d e n t a t i o n s w e r e l e ss t h a n 0 .3 7 5 m m
w h i l e s p e c i m e n t h i c k n e s s w a s a b o u t f o u r t i m e s t h i s
v a l u e . A t t h e s a m e t i m e , b e c a u s e o f t h e r e l a t i v e l y
s m a l l ( 1 0 g m ) g r a i n s iz e , a l a r g e n u m b e r o f g r a i n s a r e
c o v e r e d .
E X P E R I M E N T A L R E S U L T S A N D
D I S C U S S I O N
T e n s i l e T e s t R e s u l t s
U n i a x i a l t e n s i l e t e s t s w e r e c o n d u c t e d a t c o n s t a n t
c r o s s - h e a d s p e e d s c o r r e s p o n d i n g t o s t r a i n - r a t e s o f
1 0-~ s -1 a n d 1 0 -3 s -1 a t t e m p e r a t u r e s f r o m a m b i e n t t o
4 7 3 K . T y p i c a l s t r e s s v s s t r a i n c u r v e s a r e s h o w n i n
F i g . 1 a s a f u n c t i o n o f t h e t e s t t e m p e r a t u r e a t a
n o m i n a l s t r a i n - r a t e o f 1 0-4 s -L Th e d u c t i l i t y i s h i g h ,
w i t h a v a l u e a r o u n d 3 50 % a t 3 9 8 K ( 25 ~ M a x i m u m
d u c t i l i t y (3 5 0% ) s e e m s t o c o r r e s p o n d t o a s t r a i n - r a t e
s e n s i ti v i ty o f 0 .3 a n d d e c r e a s e s a s t e s t t e m p e r a t u r e
w a s i n c r e a s e d . O n t h e o t h e r h a n d , a t e = 1 0 ~ s -1,
d u c t i l i t y w a s m u c h l o w e r t h a n a t ~ = 1 0 ~ s -1 a t a l l
t e m p e r a t u r e s ; i t a l so i n c r e a s e d w i t h t e m p e r a t u r e .
F i g u r e 2 d e p i c t s t h e i n f l u e n c e o f t e s t t e m p e r a t u r e o n
d u c t i l i t y a t t h e s e t w o s t r a i n - r a t e s .
M e t a l l o g r a p h i c e x a m i n a t i o n w a s p e r f o r m e d o n f r ac -
t u r e d s p e c i m e n s . S p e c i m e n s d e f o r m e d a t ~ = 1 0-3 s -~
d i d n o t e x h i b i t c o a r s e n i n g o f g r a i n s o r S n S b i n t e r m e -
t a l li c p a r t i c le s a s i n d i c a t e d b y s p e c i m e n s t e s t e d a t
2 9 8 K ( 2 5 ~ a t 1 0-~ s -L H o w e v e r , d e f o r m a t i o n a t a =
1 0 -4 s -~ a t e l e v a t e d t e m p e r a t u r e s s h o w e d c o n s i d e r a b l e
c o a r s e n i n g o f g r a i n s . T h e c o n c e n t r a t i o n o f S n S b i n t e r-
m e t a l l i c p a r ti c l e s w i t h i n t h e m a t r i x a l s o d e c r e a s e d
d u e t o g r a i n b o u n d a r y s e g r e g a t i o n a n d / o r d i s s o l u t io n
o f t h e S n S b i n te r m e t a l l i c . F i g u r e s 3 a a n d 3 b c o m p i l e
t h e o p t i c al m i c r o g r a p h s t a k e n f r o m t h e g a g e s e c t i o n s
o f t h e f r a c t u r e d s p e c i m e n s a t r o o m t e m p e r a t u r e a n d
4 2 3 K ( 1 5 0~ r e s p e c t i v e l y , a n d c l e a r l y d e p i c t t h e i n -
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Tensile, Creep, and ABI Tests on Sn5%Sb Solder
for Mechanical Property Evaluation
841
situ grain growth and coarsening of he intermetallics
at the elevated temperature. These microstructural
modifications seem to be responsible for the observed
ductility loss at high temper ature s and low strain-
rates.
Deformation enhanced grain-growth has been re-
ported for several alloy systems, including Sn-lBi and
7475 A1, and causes th e stra in-r ate sensitiv ity expo-
nent m and, therefore, resistance to necking, to de-
crease with strain. 6 The SnSb interm etallic s tend to
segregate at grain boundaries, thereby causing a
reduct ion in the overall ductility. It has been sug-
gested s tha t the co ncurrent phase change due to high
activity of dislocations and vacancies ne ar grain bound-
aries during high temperature deformation makes
boundaries preferred locations for anomalous nucle-
ation effects. Therefore, the combined influence of
microstructural instability due to grain and SnSb
particle-coarsening during high temperature defor-
mation reduces the ductility significantly. However,
the s trai n-ra te s ensitivi ty m, indicative of the ductil-
ity at ~ = 10 -4 s -1, rema in ed high er.
Strain-rate change tests were supplemented by
constant cross-head speed (initial strain-rate) tests at
str ain -ra tes of 10 -4 s -1 and 10-3 s -1 to cha ract eriz e the
stra in-ra te depe ndence of the flow stress. The true
(ultimate) tensile stresses were evalua ted at the load
b
Fig. 3. Optical micrographof the Sn-5 Sbsolder deformedat ~ =
-4 1
10 s- to fracture at 298 (a), and 423K (b).
maxim a and true strain-rates were calculated at the
corresponding true uniform strains. These data are
plotted on double-logarithmic scale in Fig. 4a as the
true strain-rate vs the true stress, with low stress
da ta following the power-law,
= A ~ . (la)
Far larger strain-rates are noted at high stresses
where an exponential stress dependence is usually
noted. The stress exponent, n, varied from around
three to slightly less tha n four. Data at high stresses
followed an expon ential stress dependen ce as shown
in Fig. 4b,
= A e B'~, (l b)
with B = 1.33 + 0.29, which is essentially indep ende nt
of the test temp erature .
The activation energy was determined using these
data at a constant strai n-rate of 2 x 10~ s -1 by plot tin g
the normalized stress vs inverse absolute tempera-
ture where the stress is divided by the tempe rature
dependent elastic modulus. Such a plot is shown in
Fig. 5 which yie lded a valu e of 26.8 + 1.6 kJ/m ole for
the activation energy for creep. This value is very
small co mpared to th at for self-diffusion in Sn as well
as t ha t for lattice diffusion of Sb atoms (about 100.5
10 -1
10 -2
lu
9 10 -3
lo 4
1 0 - 5
1 -I
i . . . . .
Sn-5Sb / Tens i le Tests
298
K
A = o D /
o 373 K ~ ~, o [] /
r
423
K
A o o [] /
473K~ n=4
I 0 I 0 0
S t res s MPa
r
S n - 5 S b T e n s i l e D a t a / H i g h S t r e s s
B = 1.325 + 0.285
10 2
t i t D f = 9 4 K 073 K
* 423 K
473 K
10 -3 , I , I I , I ,
0 1 0 2 0 3 0 4 0 5 0
Stress, MPa
b
Fig. 4. a) Log-log plot of strain-rat e vs tensile stress, and b) high
stress data exhibiting exponential stress variation of strain-rate.
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Tensile, Creep, and ABI Tests on Sn5%Sb Solder
for Mechanical Property Evaluation 843
experiment al results falls in this region, and thus we
believe that the high stress region is due to climb of
edge dislocations. On the other hand, the activation
energy is noted to be 54.4 kJ/mole, which is closer to
tha t for grain boundary diffusion tha n t hat for lattice
or chemical interdiffusion. If his is taken to repre sent
the low-te mperatu re climb mechan ism due to climb of
dislocations by vacancies diffusing through disloca-
tion pipes, one expects a value o f seven for the s tress
exponent.~l,~4
While the tensile and creep data reveal these two
mechani sms at the lower stresses, creep data did not
extend to very high stresses in the power-law break-
down regime. The tensile test results, however, do
exhibit an increasing n value with applied stress at
very high stresses, which is indicative of the power-
law breakdown. Disagreement between the experi-
mental activation energies and model predictions
notwithstanding, the plausible deformation mecha-
nisms a re viscous glide at low stresses, low-tempera-
ture dislocation climb at int erme diat e stresses, and
power-law breakdown at very high stresses. More
experimental work is warranted to determine the
various para met ers in all of the stress ranges. Micro-
struc tural investigations following deformation will
shed light on the un derlyin g creep mechanism. In the
climb creep regime, one expects to find distinct
subgrain formation whereas randomly distributed
dislocations are observed in the viscous glide creep
contro lled region. 15
ABI e s u l t s
As pointed out earlier, a major objective of he study
#3 - 0.005 in/s / ~ ~ t
#2 - 0.001 . / - ~ t
~ . ~ J l . - - ~ Sn5%Sb t
~ r DISPLACEMENT t
t
Indenter Velocity ~ I
#1 - 0.02 ires ..
#2- 0.0001 f_ f
#3 - 0 0000~~ / - f ~
Fig. 7 . Indentat ion load N) vs depth mm) curves at var ied indenter
speeds .
was to use SSM to obtain the stre ss-stra in curves to
demonstrate use of the ABI technique to determine
these mechanical data on small size specimens in a
nondestructive fashion. A numbe r of such tests could
be performed in a limited space on the specimen
shoulder. Typical load vs deformation (depth) curves
are included in Figs. 7a and 7b corresponding to
different indent er speeds. The system, in its cu rren t
configuration allows testing at ambient te mperature,
and a hig h-tem pera ture chamber is being installed.
We report here ABI test results at room tempe ratur e
and compare them with creep and tensile test data
obtained on the same mat erial.
The sys tem software utilizes elastic-plastic analy-
ses to evaluate the true plastic strains and stresses
from the depth and load data; the details are pre-
sented in th e Appendix A. 18,17The strain- rate is evalu-
ated from the indent er speed s from,
= 2 v ~ 3 )
5 d p '
where v i is the indent er velocity and dp is the plastic
inden ter dia mete r at the point of interest. The effect
of flow stress (about 7% true plastic strain) on the
strain-rate is shown on a double log plot in Fig. 8
which reveals that the data set breaks into two dis-
tinct regions.
At low stresses, strain-rate followed a power-law
10 0
.r
101
10 -2
I0 -3
10 -4
105
10
r
E]
~3
Sn-5Sb / ABI
data
oom Temperature
i i i i i i i i
Stress, MPa 100
Fig. 8. Doub le-log plot of s t rain-rate vs s t ress of ABI da ta.
.=
1 0 0 . . . . . . .
10 -1 Sn- 5Sb /
oom Temperature
10 -2 n 9
10 -3
10 -4
10 -s
10 -6 s
I CreepData 1
10 -7 = Tensile
a t a
10-8 . . . . . . . . . . . . . . .
1 1
S t r e s s M P a
Fig. 9. Com pariso n of tens i le, creep, and AB I test resul ts .
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Tensile, Creep, and ABI Tests on Sn5 Sb Solder
for Mechanical Property Evaluation
where b is the Bur gers vector.
Physically, the activation area may be interpr eted
as the area swept by a dislocation segment in sur-
mounti ng a barri er in its slip plane or the area swept
betw een consecutive events. The ABI data in Fig. 10b
yield a val ue of 96.5b 2, wit h valu es of ~10b 2 to 100b 2
corres ponding to the climb of edge dislocations as the
dominant mechanism vs nonconservative glide of
jogged screw dislocation with a charact erist ic activa-
tion are as in excess of 1000b2.19 One can co mbine t he
two equations [Eq. (5) and Eq. (6)] using a Sinh-
function so that the whole data set may be described
by a single equation,
= A(sinh B(~)n = 1.235 x 10 -5 (si nh 0 . 0 4 ~ ) 4 5 . 8 )
Here, ~ is in per sec and (~ is in MPa. This implies tha t
a doubleqo g plot of str ain- rat e vs sinhB(~ should yield
a stra ight line as indicated in Fig. 11, with the slope
of the line bein g 4.5. Thus, we note th at the ABI
technique is useful in nondestructive evaluation of
the deformation mechanisms in materials.
It is clear tha t by decreasing the size of the in-
denter, say to micron size, ver y small specimens can
be tested using SSM. It is possible to utilize this
machine and technique in characterizing
real
solder
joints in electronic packages. Such development is
now underwa y, especially to use this as a probe to
monitor the degradation of struct ural materialsY
CONCLUSIONS
Tensile and creep tests, perfor med on bulk Sn5Sb
solder at various tempe rat ures from ambi ent to 473K,
exhibited power-law stress dependence of strain- rate
at low stresses and exponential stress variation at
high stresses. In addition, automated ball indenta-
tion (ABI) tests were perf ormed at room temper atu re
at various strain rates, and the results were in excel-
lent agreement with creep tests. Slight deviation
exhibited by the tensile test dat a from the creep and
ABI results was believed to arise from the flat tensile
stress vs strain curves which made an accurate de-
termi natio n of the ul timate tensile stress difficult.
The present study clearly demonstrated the useful-
ness of the ABI technique to charact erize the me-
chanical properties of microelectronic solder joints.
C K N O W L E D G M E N T S
We wish to express our appreciation to the re-
viewers for various constructive suggestions and for
their efforts in correcting the manuscript.
R E F E R E N C E S
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Solder Paste in Electronic Packaging,
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Scripta Met.
31, 1145 (1994).
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tion NDE) and Materia ls Properties III,
TMS Fall Meeting,
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Cincinnati, 1996.
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P P E N D I X
B I D a t a n a l y s i s
A brief summ ary of the r elevant equations used in
the derivation of the flow properties from ABI tests is
included here, while details can be found in various
references.7,16, '7 As no te d in Fig. 7, the pr im ar y info r-
mation obtained from ABI tests is the indentat ion
load (P) and the depth /hei ght of pene tra tio n (hp). The
system software calculates the plastic strain while
the flow stresses are evaluated using elastic and
plastic analyses. The true plastic strain is given by,
d
s = 0 . 2 D ' (A1)
wher e dp and D are the p las t i c indentation diameter
and diameter of indenter, respectively. The corre-
sponding flow stress is calculated using,
4P
~ i - - - - ~d~5' (A2)
wher e (~i is the tr ue inde ntat ion stress, P is inden-
tation load, and 5 is a param ete r which depends on the
system compliance and indentation stress with a
val ue b etw een 1.12 and 2.87ocm. The fa ctor a mdepends
on strain r ate sensitivity, with a value of unity for
strain- rate insensitive materials. The plastic inden-
tat ion depth, dp, is given by,
l p / I I / D I h 0 2 5 a }
d , = 2.735 ~Ei E-~fi ~h2, ~--~'~ ~-~- hvD (A3)
Here, E i and E~ rep res ent the elastic moduli of the
indent er and t he specimen, respectively. As we note
-
8/10/2019 Tensile, Creep, and ABI Tests on Sn5%Sb Solder.pdf
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8 4 6 M u r t y , Ha g g a g , a n d M a h i d h a ra
h e r e , t h e p a r a m e t e r d D a p p e a r s i n b o t h t h e l e ft a n d
r i g h t - h a n d t e r m s , a n d t h u s a n i t e r a t i v e s o l u ti o n i s
s o u g h t w h i c h t h e s o f t w a r e o f t h e s y s t e m h a s t h e
c a p a b i l i t y t o e v a l u a t e . T h e p l a s t ic s t r e s s a n d s t r a i n
c a n b e r e l a t e d b y t h e p o w e r l aw ,
a i = K ~ ' , ( A 4 )
w h e r e K a n d n ' a r e t h e s t r e n g t h c o e f fi c i en t a n d t h e
s t r a i n - h a r d e n i n g p a r a m e t e r , r e s p ec t iv e l y . F r o m t h e
f a c t t h a t t h e s t r a i n - h a r d e n i n g p a r a m e t e r , n ', i s e q u a l
t o t h e t r u e u n i f o r m s t r a i n , o n e c a n e v a l u a t e t h e
t e n s i l e s t r e s s ( az s) ,