Susol MCCB -40 ℃ Derating Test Report 1) TD160/TS250 -40 ℃ Verification of Temperature...
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Transcript of Susol MCCB -40 ℃ Derating Test Report 1) TD160/TS250 -40 ℃ Verification of Temperature...
Susol MCCB -40℃ Derating Test Report
1) TD160/TS250 -40℃ Verification of Temperature Correction2) TD160/TS250 -40 ℃ Temperature Correction Table3) TS400/TS630/TS800 -40 ℃ Cold-Resistant Characteristic4) TS400/TS630/TS800 -40 ℃ Temperature Correction Table5) Susol electronic MCCB -40 ℃ Characteristic Verification - EMS, ETM, OCR A Type6) Conclusion
L/V SOLUTION TEAM
Report Date : 2012. 11. 5.
C o n t e n t s
* Testing Photo
11. TD160/TS250 -40℃ Verification of Temperature Correction- Susol MCCB TS250 Temperature correction at -40℃ was verified in accordance with IEC60068-2-1 standard, test of operation characteristic with 105~130% over current.
- Correction ratio were calculated in order to implement over current test of TS250 at -40℃.The test was successful and we have selected final correction ratio based on the test result.
- First temp. correction increase ratio (based on room temp.) : -0.5 %/℃(-40 ℃ correction ratio 140%)
- Second temp. correction increase ratio (Finalized) : -0.9 %/℃(-40 ℃ correction ratio 172%)
발생하여 2 차에 온도보정 상승비를 - 적용온도보정 상승비
200% single pole over current test
105-130% over current Test
* TS250 -40 ℃ Over current test result
(A) (h) (%) R(sec) S(sec) T(sec) R(℃) S(℃) T(℃) U(℃) V(℃) W(℃) (trip time)1 TS250N 250 4 140 230 289
4 140 310 263 502 114.9 92.8 108 50.3 86.5 52.84 140 39.1 38.2 24.3 15.5 7.6 6.64 140 84.6 91.7 72.7 50.9 40.7 38.8- 156 112.5 121.2 96.8 73.5 61.4 58.5 N/T(Fail)- 172 113.8 122.3 97.9 75.4 62.3 59.4 51sec
3 TS250N 250 96 172 N/T 93.8 104.7 73.9 52.3 42.6 37.6 220sec4 TS100N 40 96 172 N/T 65sec
130%결과
TS250N2 250 N/T
단자부 온도200%(trip time)온도보정
105%(no trip)-40도지속시간구분
정격전류AF
N/T(Fail)
Attachment of temperature sensor at
terminal
This part is covered with heat insulating material to protect from radiant heat caused by convection current
* Testing Photo
- Since correction ratio of TS250 and TD160 are identical at room temperature, TD160 is also tested with TS250 correction ratio. As a result, no problem found in over current test.
- No problem found in over current test of every ampere frame at min/max rated current.
105-130% 과전류 검증
* TD160 -40℃ Over Current test result
(A) (h) (%) R(sec) S(sec) T(sec) (no trip) (trip time)
96 172 N/T 81sec6 172 166 155 165
2 TD100N 16 96 172 N/T 641sec
1
-40도지속시간
정격전류
TD160N 160
온도보정 200%(trip time) 130%105%AF구분
* IEC60068-2-1 test standard
- Specific heat dispersion MCCB sample was used in the test- 96 hours of full saturated time, IEC Standard, was applied to the test
* Tester Opinion- It seems correct to keep the surrounding temperature constant and carry on test after the product temperature stabilized in surrounding temperature.-It is found that sustainment time after stabilization does not affect the characteristic of product.-The main purpose of assignment is not to develop product for extremely low temperature but to develop correction ratio of surrounding temperature in order to check Susol MCCB’s over current characteristic at -40℃
11. TD160/TS250 - 40℃ Verification of Temperature Correction
22. TD160/TS250 Temperature Correction Table
- The final correction ratio was selected between the two linear section of temperature rise ratio 0.5 at the room temperature and 0.9 at the extremely low temperature
- Correction ratio of existing product at room temperature (10~40 ℃) is same and correction ratio at low temperature increases in the shape of exponential function
(Temperature correction ratio of OQC outgoing inspection standard and CB construction data is clearly stated between 10~40 ℃)
No. 온도 상온
No. 온도 저온
0℃ 122.1 - 40℃ 172.0 1℃ 121.3 - 39℃ 170.5 2℃ 120.5 - 38℃ 169.0 3℃ 119.7 - 37℃ 167.6 4℃ 119.0 - 36℃ 166.1 5℃ 118.2 - 35℃ 164.7 6℃ 117.5 - 34℃ 163.2 7℃ 116.9 - 33℃ 161.8 8℃ 116.2 - 32℃ 160.3 9℃ 115.6 - 31℃ 158.9 10℃ 115.0 - 30℃ 157.5 11℃ 114.5 - 29℃ 156.1 12℃ 114.0 - 28℃ 154.7 13℃ 113.5 - 27℃ 153.3 14℃ 113.0 - 26℃ 151.9 15℃ 112.5 - 25℃ 150.5 16℃ 112.0 - 24℃ 149.1 17℃ 111.5 - 23℃ 147.8 18℃ 111.0 - 22℃ 146.5 19℃ 110.5 - 21℃ 145.1 20℃ 110.0 - 20℃ 143.9 21℃ 109.5 - 19℃ 142.6 22℃ 109.0 - 18℃ 141.3 23℃ 108.5 - 17℃ 140.1 24℃ 108.0 - 16℃ 138.8 25℃ 107.5 - 15℃ 137.6 26℃ 107.0 - 14℃ 136.4 27℃ 106.5 - 13℃ 135.3 28℃ 106.0 - 12℃ 134.1 29℃ 105.5 - 11℃ 133.0 30℃ 105.0 - 10℃ 131.9 31℃ 104.5 - 9℃ 130.8 32℃ 104.0 - 8℃ 129.8 33℃ 103.5 - 7℃ 128.7 34℃ 103.0 - 6℃ 127.7 35℃ 102.5 - 5℃ 126.7 36℃ 102.0 - 4℃ 125.7 37℃ 101.5 - 3℃ 124.8 38℃ 101.0 - 2℃ 123.9 39℃ 100.5 - 1℃ 123.0
Temperature Correiton Ratio TABLE Temperature Correction Ratio Curve
* Testing Photo
3. TS400/TS630/TS800 - 40℃ Verification of Temperature Correction- Verification was implemented by applying Identical selection method with TD160/TS250.
- The correction ratio was selected after comparing the difference between correction ratio of TD160/TS250 at room temperature and correction characteristic of TS630/TS800
TS400N -40℃ Over Current test
* TS400, TS630, TS800 -40℃ over current test result
TS630N -40℃ Over Current Test
TS800N -40 ℃ Over Current Test
결과(A) (℃) (h) (%) R(℃) S(℃) T(℃) U(℃) V(℃) W(℃) (trip time)
25.2 - 103.7 65.8 79.7 69.4 69 76.3 70.1 N/T 36-40 72 136 N/T 102030.5 - 102.5 98.5 118 106 89.1 114.9 103.1 N/T 765-40 96 136 N/T 480
수평 30.5 - 102.5 82 93.2 90.8 84.1 94.9 81.2 N/T 765수평 -40 96 136 N/T 1800
130%온도보정취부방식
105%(no trip)-40도지속시간AF구분
정격전류
1 TS400N 300 수평
주위온도 단자부 온도
2 TS630N 630 수평
3 TS800N 800
No problem found in the test
4. TS400/TS630/TS800 Temperature Correction Table
- Correction ratio of existing product at room temperature (10~40 ℃) is same and correction ratio at low temperature increases in the shape of exponential function
(Temperature correction ratio of OQC outgoing inspection standard and CB construction data is clearly stated between 10~40 ℃)
Temperature Correiton Ratio TABLE Temperature Correction Ratio Curve
No. 온도 상온
No. 온도 저온
0℃ 111.1 - 40℃ 136.0 1℃ 110.7 - 39℃ 135.3 2℃ 110.3 - 38℃ 134.5 3℃ 109.9 - 37℃ 133.8 4℃ 109.5 - 36℃ 133.1 5℃ 109.1 - 35℃ 132.4 6℃ 108.8 - 34℃ 131.6 7℃ 108.5 - 33℃ 130.9 8℃ 108.1 - 32℃ 130.2 9℃ 107.8 - 31℃ 129.5 10℃ 107.5 - 30℃ 128.8 11℃ 107.3 - 29℃ 128.1 12℃ 107.0 - 28℃ 127.4 13℃ 106.8 - 27℃ 126.7 14℃ 106.5 - 26℃ 126.0 15℃ 106.3 - 25℃ 125.3 16℃ 106.0 - 24℃ 124.6 17℃ 105.8 - 23℃ 123.9 18℃ 105.5 - 22℃ 123.3 19℃ 105.3 - 21℃ 122.6 20℃ 105.0 - 20℃ 122.0 21℃ 104.8 - 19℃ 121.3 22℃ 104.5 - 18℃ 120.7 23℃ 104.3 - 17℃ 120.1 24℃ 104.0 - 16℃ 119.4 25℃ 103.8 - 15℃ 118.8 26℃ 103.5 - 14℃ 118.2 27℃ 103.3 - 13℃ 117.7 28℃ 103.0 - 12℃ 117.1 29℃ 102.8 - 11℃ 116.5 30℃ 102.5 - 10℃ 116.0 31℃ 102.3 - 9℃ 115.4 32℃ 102.0 - 8℃ 114.9 33℃ 101.8 - 7℃ 114.4 34℃ 101.5 - 6℃ 113.9 35℃ 101.3 - 5℃ 113.4 36℃ 101.0 - 4℃ 112.9 37℃ 100.8 - 3℃ 112.4 38℃ 100.5 - 2℃ 112.0 39℃ 100.3 - 1℃ 111.5
* Testing Photo
5. Susol Electronic MCCB -40℃ 200% Over Current Test- 200% over current test of ETS, ETM, OCR A type was implemented at -40℃and no problem found.- TS1600 was not able to apply 200% over current test due to not enough size of constant
temperature oven and other facilities. 0.5% ground fault operation test was implemented instead.- TS1600 OCR PS type was excluded from the test due to below standard specification of LCD parts.
* Susol electronic MCCB -40℃ Over current test result
TS250N ETS23 200% over current test
TS630N ETM33 200% over current test TS1600N AG1 ground fault trip test
(A) (h) (%) (sec) (sec)1 TS250N ETS 250A 200% 과전류검증 96 100 50~70 602 TS630N ETM 250A 200% 과전류검증 96 100 90~150 1213 TS1000N AG1 800A 0.5% 지락검증 96 100 0.07~0.14 0.1
시험 결과trip time구분 AF
정격전류
시험항목
온도보정판정기준trip time
-40도지속시간
6. Conclusion
- -40℃ Correction ratio was selected for all AF of Susol MCCB and verified 105~130% over current characteristic in accordance with IEC60068-2-1 standard.
- Correction ratio of Trip parts at -40℃ was verified through Design of experiment and additional research of core technology regarding designing correction ratio to surrounding temperature is necessary.
- This test covers only 105~130% over current characteristic at -40℃. Mechanical endurance was not able to be tested due to not enough facility in PT&T.