Surface texture measurement for AM · J. Vaithilingam, E. Saleh, C. Tuck (Uni. Nottingham)...
Transcript of Surface texture measurement for AM · J. Vaithilingam, E. Saleh, C. Tuck (Uni. Nottingham)...
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Surface texture measurement for AM
Nicola Senin1, Andrew Townsend2, Liam Blunt2, Richard Leach1
1 University of Nottingham, 2 University of Huddersfield
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Surface metrology
Measurement and characterisation of surface topography = form + texture
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AM Processes (e.g. SLM of metals)
Products or artefacts
Measurement instruments
Topography = form + texture
Surface texture measurement for AM
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Measurement solutions
Areal topography datasets
Areal topography measurement instruments
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Why characterise texture?
AM Process
Study texture as means to deliver function
Destined to a function?
Destined to post-processing?
Study texture as source of post-processing challenges
Study texture to understand and optimise the AM process
Regardless of destination…
feedback
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Why characterise texture?
AM Process
Study texture as means to deliver function
Destined to a function?
Destined to post-processing?
Study texture as source of post-processing challenges
Study texture to understand and optimise the AM process
Regardless of destination…
feedback
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Texture characterisation for “understanding” the manufacturing process
Mfg. process SIGNATURE / FINGERPRINT
What are these formations?
How were they generated?
Selective laser melting of metal alloy
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The challenge of understanding
From: John S. Taylor, Met&Prop 2015
E.g. for SLM of metals
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Scales of observation (spatial bandwidths) 20x
50x
100x
e.g. SLM of metals
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A paradigm shift in texture characterisation
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Az (x , y ) dx dy
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Sq
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Az 2 x , y( )dx dy
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Az 4 x , y( )
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pores
canyon
scratch
From “field” properties (texture parameters)…
… to selective characterisation of relevant features
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Surface features in AM
Defect in SLM surface (inclusion?)
Overlapping weld tracks in SLM surface
Spheroidal formation in SLM surface (spatter/balling?)
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Dimensional metrology of surface features
Feature identification
Extraction
Dimensional metrology
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Characterisation of artefacts
SLM track Jetted formations – A. Husler, M. Alexander, R. Wildman (Uni. Nottingham)
Jetted tracks – J. Vaitilingham, E. Saleh, C. Tuck (Uni. Nottingham)
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Dimensional metrology of jetted artefacts
Jetted tracks
J. Vaithilingam, E. Saleh, C. Tuck
(Uni. Nottingham)
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Dimensional metrology of jetted artefacts
Jetted tracks
J. Vaithilingam, E. Saleh, C. Tuck
(Uni. Nottingham)
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Evolution of the top layer
Jetted formations
A.Husler, M. Alexander, R. Wildman
(Uni. Nottingham)
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NanoScribe - regular grids for light entrapment devices A.Knotts + 3DPRG (Uni. Nottingham)
Measurement challenges
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Conclusions
- Profile parameters still dominant
- Ra most widely used
- Areal texture parameters have distinct advantages for AM
- Topography should be characterised in context (function, mfg. process)
- Measurement should be planned in context (e.g. spatial bandwidths)
- Texture parameters can be complemented by segmentation and dimensional metrology of relevant topographic features