Summary of previous slides : How are reactions of the ... · How are reactions of the various...
Transcript of Summary of previous slides : How are reactions of the ... · How are reactions of the various...
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FYS 4550, 2010 Steinar Stapnes 1
Instrumentation
Summary of previous slides :
We now know how most particles ( i.e all particles that live long enough to reach a detector; e,u,p,,k,n,, neutrinos,etc) react with matter.
We now know how to identify particles to some extend, how to measure E and p, v, and how to measure lifetimes using secondary vertices, etc
Lecture set 2 : but we skipped one essential step in the process …..
How are reactions of the various particles with detectors turned into electrical signals. We would like to extract position and energy information channel by channel from our detectors.
Three effects are usually used :
1 Ionisation
2 Scintillation
3 Semi Conductors
and these are used in either for tracking, energy
measurements, photon detectors for Cherenkov or TRT, etc
4 Finally we will have a quick look at how electrical
signals are amplified in FE electronics
and from then on it is all online (trigger, DAQ) and offline
treatment and analysis ….
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FYS 4550, 2010 Steinar Stapnes 2
0
50
100
0.1 1 10 100 1000
X/p%
Elastic Excitation
Ionization
Kinetic
Neon
0
50
100
0.1 1 10 100 1000
X/p
%
Elastic
Kinetic
Excitation
Ionization
Ne + 1% A
Add a sprinkling of argon
L. B. Loeb, Basic Processes of Gaseous Electronics
Ionisation Detectors
Approximate computed curves showing the percentage of electron energy going to various actions at a given
X/p (V/cm/mmHg)
Elastic: loss to elastic impactExcitation: excitation of electron levels, leading to light emission and metastable statesIonization: ionization by direct impact
Kinetic: average kinetic energy divided by their “temperature”Vibration: energy going to excitation of vibrational levels
From CERN-CLAF, O.Ullaland
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FYS 4550, 2010 Steinar Stapnes 3
0.001
0.01
0.1
1
10
10 100 1000
Energy (eV)
Tota
l Io
niz
ation C
ross
Section /
a02
He
Ne
Ar
Kr
Xe
Experimental results. Rare gases.
Experimental results. Diatomic molecules.
D. Rapp et al., Journal of Chemical Physics, 43, 5 (1965) 1464
Ionisation Detectors
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FYS 4550, 2010 Steinar Stapnes 4
0
10
20
30
1 11 21 31 41 51 61 71 81
Z
Ioniz
atio
n P
ote
ntial (e
V)
Ne
ArKr
Xe
He
Fig 1. Ionisation potiential. The work required to remove a given electron from its orbit and place it at
rest at an infinite distance.
Fig 2. Note that limited number of primary electrons/ions.
Fig 3 (table). Taking into account that some of the primary electrons will ionise further (factor 3-4
increase); nevertheless keep in mind that electronics noise can be 300-500 ENC.
CRC Handbook 63 ed.
Ionisation Detectors
From C.Joram
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FYS 4550, 2010 Steinar Stapnes 5
The different regions :
Recombination before collection.
Ionisation chamber; collect all primary charge.
Flat area.
Proportional counter (gain to 106); secondary
avalanches need to be quenched.
Limited proportionality (secondary avalanches
distorts field, more quenching needed).
Geiger Muller mode, avalanches all over wire,
strong photoemission, breakdown avoided by
cutting HV.
Ionisation Detectors
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FYS 4550, 2010 Steinar Stapnes 6
Ionisation Detectors
From C.Joram
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FYS 4550, 2010 Steinar Stapnes 7
0.01
0.1
1
10
100
1.E+00 1.E+01 1.E+02 1.E+03 1.E+04 1.E+05
Electric Field (V/cm)
Chara
cte
rist
ic E
nerg
y (
eV
)
0.001
0.01
0.1
1
10
Dri
ft V
elo
city (
cm
/ ms)
CO2 at 294 oK and 760 Torr
The drift velocity of the positive ions under the action of the electric field is linear with the
reduced electric field (E/pressure) up to very high fields.
v +ions = m+ions E where m + 1/p and diffusion D+ions m +ions T
Drift of electrons under the action of
the electric field (superimposed on
thermal movements) :
in CO2 with E=104 V/cm
310ion
electron
v
v
Ionisation Detectors
From CERN-CLAF, O.Ullaland
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FYS 4550, 2010 Steinar Stapnes 8
0
00 ln
0
0
ln
expV
r
RBpr
e
r
R
V
B
AM
A B
(Torr/cm) (V Torr/cm)
He 3 34
Ne 4 100
Ar 14 180
Xe 26 350
CO2 20 466
1.E+02
1.E+03
1.E+04
1.E+05
1.E+06
1000 1500 2000
Anode Voltage (V)
Gas
Am
plif
ication
for a gas mixture of Ar/CO2 : 80/20
Ionisation DetectorsThe amplification process :Let a-1 be the mean free path (also called the first
Townsend coefficient) between each ionization, in other
words dn = nadx.
The gas amplification is then given by :
x
xdxx
eM 1
EBpAep
/
Korff’s approximation (model) where A and B are gas dependent constants and p is the pressure.
From CERN-CLAF, O.Ullaland
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FYS 4550, 2010 Steinar Stapnes 9
Cathode :A metallic cylinder of radius b
Anode : A gold plated tungsten wire of radius a
a = 10-5 m
b/a = 1000
The formation of signal can be understood as
follows. The electrostatic energy of the
configuration is :
a
b
V
rE
ln
1 0
Ionisation Detectors
02
1lCVW
where C is the capacitance per unit length of the
configuration and l is the length.
The potential energy of a charged particle at
radius r is given by the charge times the potential :
a
rCVqW ln
2
0
The result is an equation for how the voltage
(signal) changes when the particle moves in the
electric field :
a
rCVr
drdr
rdqdVlCVdW
ln2
)(
)(
0
0
CathodeAnode
100
1000
10000
100000
0 10 20 30 40
Distance from anode in units of anode radius
Ele
ctr
ic F
ield
/Volt
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FYS 4550, 2010 Steinar Stapnes 10
Signal induced by (mainly) the positive ions created near the anode.Assume that all charges are created within a distance from the anode. is of the order of a few 10’s of µm v electron = v ion /100 which can be seen from the equations below setting in the correct values for a and b :
a
b
l
Qdr
dr
dV
lCV
Qv
a
a
l
Qdr
dr
dV
lCV
Qv
b
a
ion
a
a
electron
ln2
ln2
0
0
Ionisation Detectors
Assuming a=0 and all the signal comes from the ions we can write:
a
tr
l
Qdr
dr
dV
lCV
Qtv
tr
r
)(ln
2)(
)(
)0(0
r(t) can be taken from :
)(rEdt
drm
The final result for v(t) :
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FYS 4550, 2010 Steinar Stapnes 11
In modern fast ionisation detectors the electrons are used (faster) as well as the beginning of the ion signal.
For example if we use 5% of the signal with a gain 104 we still have a healthy signal compared to the noise – and we can operate mostly with the fast part of the signal (electrons) and differentiate away the tails ….
Ionisation Detectors
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FYS 4550, 2010 Steinar Stapnes 12
s d l
Classic Multi-Wire Proportional Chamber (MWPC)Typical parameters :
l : 5 mms : 2 - 4 mmd : 20 mm
Still possible to calculate by hand (leave as
exercise for you) :
s
y
s
x
s
lzV
ds
22
0
sinh4sin4ln2
s
d
s
l
VQ
ln2
20
s
dsl
d
sVE
ln
2
00and
Ionisation DetectorsWith these tools, we can now make :
Straw Tube
Multiwire Proportional Chambers
Drift Chambers
Time Projection Chambers
Thin Gap Chambers
Jet Chambers
etc
From CERN-CLAF, O.Ullaland
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FYS 4550, 2010 Steinar Stapnes 13
Ionisation Detectors
0.0000001
1
2
3
40.00000011
2
0
50
y (mm)
x (mm)
Vs(z)
Two dimensional readout can be obtained by; crossed wires, charge division with resistive wires, measurement of timing differences or segmented cathode planes with analogue readout
Resolution given by (binary readout) :
Analogue readout and charge sharing can improve this significantly when the left/right signal size provide more information about the hit position.
Advanced calculations of
electric field, drift, diffusion and
signal formation can be done
with Garfield.
From Leo
12/ d
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FYS 4550, 2010 Steinar Stapnes 14
Charge on a single wire/strip is the worst possible situation for the
resolution:
Resolution
pitch) the toequalidth box with w a case (in this
position xin readout charge is )( where
12/2 2)( )()(2
xQ
ddxxxxQx d
)(xQ
1 2 3
1 2 3
With analogue readout and charge sharing we improve the
information content significantly – on the left we know that
the hit was between the second and third readout electrode
and closest to the 2nd, so we can make a probability
function which is much more narrow (some times pitch/10).
Another way of saying it: For every point between wire/strip
2 and 3 there is a unique value of : (Q2-Q3)/(Q2+Q3), so by
measuring this quantity we can reconstruct the position.
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FYS 4550, 2010 Steinar Stapnes 15
Ionisation Detectors
Drift Chambers :
Reduced numbers of readout channels
Distance between wires typically 5-10cm giving
around 1-2 ms drift-time
Resolution of 50-100mm achieved limited by field uniformity and diffusion
More problems with occupancy
From C.Joram
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FYS 4550, 2010 Steinar Stapnes 16
Ionisation Detectors
Time projection chamber :
Drift to endplace where x,y are measured
Drift-time provides z
Analogue readout provide dE/dx
Magnetic field provide p (and reduce transverse diffusion during drift)
From Leo
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FYS 4550, 2010 Steinar Stapnes 17
Ionisation Detectors
From Leo
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FYS 4550, 2010 Steinar Stapnes 18
In recent years there has been several developments directed towards making gas detectors more
suitable for high rate applications (driven by the needs for LHC)
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FYS 4550, 2010 Steinar Stapnes 19
GEM : Gas Electron
Multiplier
Can be used as a
detector on its own or as
amplifier stage in
multiple structure
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FYS 4550, 2010 Steinar Stapnes 20
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21
Angelini F, et al. Nucl. Instrum. Methods A335:69 (1993)
Micro Gap Chambers
Micro Gap Wire Chamber
E. Christophel et al, Nucl. Instr. and Meth, vol 398 (1997) 195
B. Adeva et al., Nucl. Instr. And Meth. A435 (1999) 402
Micro Wire Chamber
R. Bellazzini et alNucl. Instr. and Meth. A424(1999)444
MicroGroove
R. Bellazziniet alNucl. Instr. and Meth. A423(1999)125
MicroWELL
Biagi SF, Jones TJ. Nucl. Instrum. Methods A361:72 (1995)
MicroDot
P. Rehak et al., IEEE Nucl. Sci. Symposium seattle 1999
MicroPin
Ochi et al NIMA471(2001)264
mPIC
Slide: E.Oliveri, CERN
FYS 4550, 2010 Steinar Stapnes
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FYS 4550, 2010 Steinar Stapnes 22
Scintillators are used in many connections :
•Calorimetry (relatively cheap and good energy resolution)
•Tracking (fibres)
•Trigger counters
•Time of flight
•Veto Counters
Will discuss mainly inorganic (often used in calorimeters due to high
density and Z; slow but high light output and hence good resolution)
and organic (faster but less light output)
Will discuss readout (wavelength shifters, photon detectors and new
developments to increase granularity of the readout).
Scintillators
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FYS 4550, 2010 Steinar Stapnes 23
0
20
40
60
80
100
-100 -50 0 50 100 150
Temperature (oC)
Rel
ativ
e lig
ht o
utp
ut (
%)
BGO NaI(Tl) CsI(Tl), CsI(Na)
0
1
2
3
4
5
200 400 600 800
Wavelength (nm)
Inten
sity (
Arbit
rary U
nits)
Na(Tl)
CsI(Na)
CsI(Tl)
Inorganic Crystalline Scintillators
The most common inorganic scintillator is
sodium iodide activated with a trace
amount of thallium [NaI(Tl)],
Conduction Band
Valence Band
Traps
Lum
ines
cenc
e
Que
nchi
ng
Exci
tatio
n
Energy bands in impurity activated crystal
http://www.bicron.com.
Strong dependence of the light
output and the decay time with
temperature.
ScintillatorsFrom CERN-CLAF, O.Ullaland
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FYS 4550, 2010 Steinar Stapnes 24
Parameters for some common scintillator materials
NaI has a light output of typically 40000 photons per MeV; keep in mind that light collection, and the quantum efficiency of the photo detector will reduce the signal significantly.
The detector response is fairly linear (see Leo).
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FYS 4550, 2010 Steinar Stapnes 25
Organic Scintillators
These are fast and with typical light
output around half of NaI.
Practical organic scintillators uses a
solvents; typically organic solvents
which release a few % of the exited
molecules as photons (polystyrene in
plastic for example, xylene in liquids)
+ large concentration of primary fluor
which transfers to wavelengths where
the scintillator is more transparent
(Stokes shift) and changes the time
constant
+ smaller concentration of secondary
fluor for further adjustment
+ ......
Generally the final light output has two time
constants and the relative contributions from them depend on the energy deposition (particle type); this can be used for particle identification (pulse shape discrimination). This is for example used for neutron counting; the detectors are sensitive to proton recoils (contain hydrogen) from neutrons.
Scintillators
List of materials and solvents can be found in most textbooks
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FYS 4550, 2010 Steinar Stapnes 26
External wavelength shifters
and light guides are used to
aid light collection in
complicated geometries;
must be insensitive to ionising
radiation and Cherenkov
light. See examples.
Scintillators
From C.Joram
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FYS 4550, 2010 Steinar Stapnes 27
http://www.hamamatsu.com/
Photo Multiplier Tube for readout
Photon-to-Electron
Converting
Photo-Cathode
Dynodes with
secondary electron emission
Anode
Typical gain 106
Transient time spread 200 ps
Limited space resolution
Scintillators
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FYS 4550, 2010 Steinar Stapnes 28
The energy resolution is determined mainly by the fluctuation of the number of secondary electrons emitted at each dynode.
!
,r
erP
r mmm
Poisson distribution
where m = mean number
= the variancer = 1, 2 , 3 ...
Fluctuations mainly induced at the first dynode where the number of primary electrons are small
0.001
0.01
0.1
1
0 5 10 15
Pulse height (arbitrary scale)
Rate
Noise 5 cut
1
photoelectron
2
photoelectron
s
Scintillators
From CERN-CLAF, O.Ullaland
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FYS 4550, 2010 Steinar Stapnes 29
Physical principles of Hybrid Photo Diodes
Photo Multiplier Tube
Silicon Sensor
Hybrid
Photo
Diode
p+
n+
n
+ -+ -
+ -
V
photocathode
focusing
electrodes
silicon
sensor
electron
Take one
Add
inside tube
Electron-hole pairs:
Kinetic energy of the
impinging electron
/ Silicon ionization energy
~ 20 kV; i.e 4 - 5000
electron-hole pairs
Good energy
resolution
Remove dynodes and anode
Scintillators
From CERN-CLAF, O.Ullaland
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FYS 4550, 2010 Steinar Stapnes 30
Hybrid Photo Diode
Multialkali
SbNa2KCs (S20)
photocathode
Q.E.
)(
/124%..
nm
WmAskEQ e
(Philips Photonic)
Bialkali
SbK2Cs
Solar blind
CsTe
Transmission
of various windows
materials
(Philips Photonic)
not shown:
MgF2: cut @115 nm
LiF: cut @105 nm
V
photocathode
focusing electrodes
silicon
sensor
electron
Scintillators
From CERN-CLAF, O.Ullaland
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FYS 4550, 2010 Steinar Stapnes 31
But…
• Electronic noise, typically of the order of 500 e2
.int2
.22
.int2 elecEtotal loss
• Back scattering of electrons from Si surface
18.0Si
silicon
electron
E
< 2 dPC-Si
back scattering probability at E
20 kV
20% of the electrons deposit only
a fraction o<1 of their initial
energy in the Si sensor .
continuous background (low energy side)
C. D’Ambrosio et al.
NIM A 338 (1994) p.
396.
Scintillators
From CERN-CLAF, O.Ullaland
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FYS 4550, 2010 Steinar Stapnes 32
Semi-Conductors
Solid state detectors have been
used for energy measurements a
long time (Si,Ge…). It takes a
few eV to create an e/h pairs so
the energy resolution is very
good.
Nowadays silicon detectors are
mostly used for tracking.
From C.Joram
e
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FYS 4550, 2010 Steinar Stapnes 33
When isolated atoms are brought together to form a lattice, the discrete atomic states shift to form energy bands as
shown below.
The number of states per volume and energy can be calculated – from this we can derive the number of electrons in the conduction band and holes in the valence band – per unit volume (as a function of temperature)
For basic semi-conduction physics see : http://jas.eng.buffalo.edu/index.htmlText, illustrations, models and online diagrams, etc …
kT
WWWP Fexp)(
Semi-Conductors
WF = Fermi Level = the Energy where P(W)=1/2
From E.Cortina, A.Sfyrla, Univ. of Geneva
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FYS 4550, 2010 Steinar Stapnes 34
Semi-Conductors
Intrinsic silicon will have electron density = hole
density; 1.45 1010 cm-3 (from basic semiconductor
theory).
In the volume above this would correspond to 4.5
108 free charge carriers; compared to around 3.2 104
produces by MIP (Bethe Bloch loss in 300um Si
divided by 3.6 eV).
Need to decrease number of free carriers; use
depletion zone (reduce temperature would also help
but one would need to go to cryogenic temperatures)
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FYS 4550, 2010 Steinar Stapnes 35
Doping of semiconductors.
N-TypeP, As, Sb
5 electrons in the M-
shell
1 electron with binding
energy 10-50 meV
B, Al, Ga
3 electrons in the M-
shell
1 electron missing
P-Type
Semi-Conductors
The zone between the N and P type doping is free of charge carriers, forms an capasitor, have an electric field and is well suited as detector volume; need to increase by applying reverse biasing
From E.Cortina, A.Sfyrla, Univ. of Geneva
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FYS 4550, 2010 Steinar Stapnes 36
Semi-Conductors
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FYS 4550, 2010 Steinar Stapnes 37
Semi-Conductors
One can quickly establish the most critical parameters for a silicon detector by
looking at the p,n junction above :
np
nApD
AD
xxd
xNxN
eNx
x
dx
Vd
/
2
2
)(
)(
Poisson’s equation :
With charge density from –xp to 0 and from 0 to xn defined
by :
ND and NA are the doping concentrations (donor,
acceptor).
The depletion zone is defined as :
By integrating one the E(x) can be determined, by
integrating twice the following two important relations are
found :
2/1
2
Vd
AC
dV
By increasing the voltage the depletion zone is expanded and
C (capasitance) decreased – giving decreased electronics noise.
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FYS 4550, 2010 Steinar Stapnes 38
Signal formation in general terms
For ionisation detectors we used energy balance to look at how a voltage signal was created due to charge drifting in the device.More general we have to use the Shockley-Ramo theorem for induced charge:
The main message is that the signal is induced by the motion of charge after incident radiation (not when the charge reach the electrodes).
References: Particle Detection with Drift Chambers, W.Blum, W.Riegler and L.Rolandi, Springer Verlag, ISBN 978-3-540-76684-1
For ionisation chambers it can be used to study not only the signal on the primary anode but also for the neighbours, or the cathode strips (if these are read out). For silicon detectors to study charge sharing between strips or pixels.
0)).( electrodesother allfor and unity)(study under electrode (for the conditionsboundary artificial
someith equation w Laplace solvingby found is potential weightingThe
path. theof end the tobeginning thefrom difference potential the and field weighting theis where
or
00
0
0
E
Evqi
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FYS 4550, 2010 Steinar Stapnes 39
Semi-Conductors
Let us have look at the signal formation using the same simple model of the
detector as two parallel electrodes separated by d.
A electric charge q moving a distance dx will induce a signal dQ on the readout
electrode :
dQ d = q dx
As in the case of the proportional chamber we use :
giving
where
The time dependent signal is then :
dtdt
dx
d
etQ
eN
txtx
xEdt
dx
e
hA
h
e
)(
/
)exp()(
)(
0
m
m
m
m
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FYS 4550, 2010 Steinar Stapnes 40
Semi-Conductors
The final result showing (when
entering real numbers and using a
more complete model) time-
scales of 10/25 ns for
electron/hole collection :
However, there are many caveats: In reality one as to start from the real e/h distribution from a particle. Use a real description of E(x) taking into account strips and over-depletion.Traps and changes in mobility can also come in, etc
From Leo
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FYS 4550, 2010 Steinar Stapnes 41
1 mm Al
+ V
Depleted
Layer
1 mm Al
Ele
ctr
on
s
Ho
les
~ 1018 /m3
-V
p+ implant
n+ implant
Si (n type)
Silicon Detectors.
H. Pernegger - CERN
G. Bagliesi - INFN Pisa
Semi-Conductors
From CERN-CLAF, O.Ullaland
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• Sensors (Pixel Trends)•
Steinar StapnesFYS 4550, 2010 42
n+
n or p bulk
Al
Guard Rings
p-stop
p+
Planar Sensors
•“Classic” sensor design
•Oxygenated n-in-n or n-in-p FZ100-150μm thick (inner layers)
200-250μm thick (outer layers)
100-200μm thick (disc layers)
•Radiation hardness proven up
to 2.4×1016 p/cm2
•HV >1000 V needed
3D Silicon
• Electrodes are columns
processed into detector
bulk
• Max. drift and depletion
distance set by electrode
spacing
• Reduced collection time
and depletion voltage
• Part of IBL 3D
Diamond
• Intrinsic radiation
tolerance, no cooling
needed, BUT expensive
• Used in ATLAS beam
monitoring, current and
replacement in 2014
• Can be planar of 3D
Slide: S.McMahon, Oxford/RAL
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FYS 4550, 2010 Steinar Stapnes 43
The DELPHI Vertex Detector
K0 and Lambda
reconstruction
Reconstructed B decays
Semi-Conductors
From CERN-CLAF, O.Ullaland
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FYS 4550, 2010 Steinar Stapnes 44
Semi-Conductors
At the moment silicon detectors are used close to the interaction region is most collider experiments and are exposed to severe radiation conditions (damage).
The damage depend on fluence obviously as well particle type (,,e,n,etc) and energy spectrum and influences both sensors and electronics. The effects are due to bulk damage (lattice changes) and surface effects (trapped charges). Three main consequences seen for silicon detectors (plots from C.Joram) :
(1) Increase of leakage current with consequences for cooling and electronics
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FYS 4550, 2010 Steinar Stapnes 45
Semi-Conductors
(2) Change in depletion voltage, high at end of lifetime of detector; combined with increased leakage current this leads to cooling problems again
(3) Decrease of charge collection efficiency (less and slower signal)
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• Monolythic VS Smart Hybridization•
Steinar StapnesFYS 4550, 2010 46
Diode+pre
amp +discr.
~200 trans/pixel > 100 M trans
Fully monolithic
providing the
complete R/O
architecture on-
chip (FE-I3 or FE-
I4 like)
Smart CMOS pixel sensor
+ FE-chip
bonding or capacitive
coupling
Hybrid pixels using
passive CMOS
technology
sensors (cheap, large
area pixels)
Planar Pixel Sensor
CMOS Active Pixel Sensor
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FYS 4550, 2010 Steinar Stapnes 47
Front End electronics
Most detectors rely critically on low noise electronics. A typical Front End is shown below :
where the detector is represented by the capasitance Cd, bias voltage is applied through Rb, and the signal is coupled to the amplifier though a capasitance Cc. The resistance Rs represent all the resistances in the input path. The preamplifier provides gain and feed a shaper which takes care of
the frequency response and limits the duration of the signal.
The equivalent circuit for noise analysis includes both current and voltage noise sources labelled inand en respectively. Two important noise sources are the detector leakage current (fluctuating-some times called shot noise) and the electronic noise of the amplifier, both unavoidable and therefore important to control and reduce. The diagram below show the noise sources and their representation in the noise analysis :
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FYS 4550, 2010 Steinar Stapnes 48
Front End electronics
While shot noise and thermal noise has a white frequency spectrum (dPn/df constant), trapping/detrapping in various components will introduce an 1/f noise. Since the detectors usually turn the signal into charge one can express the noise as equivalent noise charge, which is equivalent of the detector signal that yields signal-to-noise ratio of one. For the situation we have described there is an optimal shaping time as shown below :
Increasing the detector capasitance will increase the voltage noise and shift the noise minimum to longer shaping times.
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FYS 4550, 2010 Steinar Stapnes 49
Front End electronics
which shows that the critical parameters are detector capasitance, the shaping time , the resistances in the input circuit, and the amplifier noise parameters. The latter depends mostly on the
input device (transistor) which has to optimised for the load and use. One additional critical parameter is the current drawn which makes an important contribution to the power consumption of the electronics.
Practical noise levels vary between 102-103 ENC for silicon detectors to 104 for high capasitance LAr calorimeters (104 corresponds to around 1.6fC).
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FYS 4550, 2010 Steinar Stapnes 50
The detector-types mentioned are either for tracking, energy measurement, photon detectors for Cherenkov or TRT, etc in various configurations.
Instrumentation
We now know how most particles ( i.e all particles that live long enough to reach a detector; e,u,p,,k,n,, neutrinos,etc) react with matter.
We now know how to identify particles to some extend, how to measure E and p, v, and how to
measure lifetimes using secondary vertices, etc
Essential three detector types are used :
1 Ionisation detectors
2 Scintillators
3 Semi Conductors
4 Finally we have looked briefly at how
electrical signals are treated in FE
electronics
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FYS 4550, 2010 Steinar Stapnes 51
0
10
20
30
1960 1965 1970 1975 1980 1985 1990 1995
Spark Proportional Drift Chambers
Photo-ionization and
Cherenkov ring imaging
Séguinot, J ; Ypsilantis, T
TMAE81
Fast
RICH89
Published articles with "Cherenkov Ring Imaging"
Published articles with
Evolution of the automatic spark
chambers / Charpak, G
Some research on the multiwire
proportional chambers / Charpak,
G
Drift Chambers /
Charpak, G
0
10
20
30
40
1975 1980 1985 1990 1995 2000 2005
Capacitative charge division read-out with
a silicon strip detector / England, J B A ; Hyams, B D ; Hubbeling, L ; Vermeulen, J
C ; Weilhammer, P ; Nucl. Instrum. Methods Phys. Res. :
185 (1981)
.A silicon surface barrier microstrip
detector designed for high energy physics /
Heijne, E H M ; Hubbeling, L ; Hyams, B D ; Jarron, P ;
Lazeyras, P ;Piuz, F ; Vermeulen, J C ; Wylie, A ; Nucl.
Instrum. Methods Phys. Res. : 178 (1980)
A multi electrode silicon detector for high
energy physics experiments / Amendolia, S R ; Batignani, G ; Bedeschi, F ; Bertolucci, E
; Bosisio, L ; Bradaschia, C ; Budinich, M ; Fidecaro, F ;
Foà, L ; Focardi, E ; Giazotto, A ; Giorgi, M A ;Givoletti, M
; Marrocchesi, P S ; Menzione, A ; Passuello, D ; Quaglia,
M ; Ristori, L ; Rolandi, L ; Salvadori, P ; Scribano, A ;
Stanga, R M ; Stefanini, A ; Vincelli, M L ; IFUP-TH-80-2.
From O.Ullaland
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FYS 4550, 2010 Steinar Stapnes 52
Future
Improved detectors will certainly be needed. Linear colliders and LHC
upgrades will drive this development.
I would identify some main areas of research :
• Radiation hardness will remain a headache. Both for trackers and
calorimeters, detector elements, materials and electronics.
• Reduce power or deliver power in a more intelligent way
(trackers at LHC need of order 100kW at less than 5V, current are
huge, cables the same to keep losses acceptable). The services
complicate the detector integration and compromises the
performance.
• Reduce costs for silicon detectors (strip and various pixels) and
thickness. Today at PIXEL detector cost 5-10 MChf per m2, strip
trackers around 0.3-1 MChf per m2. Similar arguments apply to
large muon chambers.
• Improved space and time resolution.