Structure Changes after High Power Tests Juwen Wang 5 th X-Band Structure Collaboration Meeting

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Structure Changes after High Power Tests Juwen Wang 5 th X-Band Structure Collaboration Meeting May 18, 2010

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Structure Changes after High Power Tests Juwen Wang 5 th X-Band Structure Collaboration Meeting May 18, 2010. T18-SLAC #1 High Power Test The following 900hrs, maximum unloaded gradient is 120MV/m. Short pulse higher gradient condition. Pulse shape dependence BKD study. - PowerPoint PPT Presentation

Transcript of Structure Changes after High Power Tests Juwen Wang 5 th X-Band Structure Collaboration Meeting

Page 1: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Structure Changes after High Power Tests

Juwen Wang 5th X-Band Structure Collaboration Meeting

May 18, 2010

Page 2: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

500 600 700 800 900 1000 1100 1200 1300 14000

50

100

150

Ave

rage

Unl

oade

d G

radi

ent:

MV

/m

500 600 700 800 900 1000 1100 1200 1300 1400-6

-5

-4

-3

Time with RF On: hrs

log1

0(B

KD

Rat

e): 1

/pul

se/m

100ns 70~210ns210ns 230ns

230ns 210ns 190ns

Short pulse higher gradient

condition

Pulse shape dependence BKD

study.

BKD pulse width dependence study at

110MV/m.

BKD gradient dependence study at

230ns pulse width

T18-SLAC #1 High Power Test The following 900hrs, maximum unloaded gradient is

120MV/m

Faya Wang

Page 3: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Amplitude Measurement of T18-SLAC #1 Before and After High Power Test

11421.7 MHz at 21.32°C, N2 Before high Power test

11421.87 MHz at 20.4°C, N2 After high power test

Page 4: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

11421.7 MHz at 21.32°C, N2 ore high Power test

11421.87 MHz at 20.4°C, N2 After high power test

Phase Measurement of T18-SLAC #1 Before and After High Power Test

Page 5: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Comments on T18-SLAC #1 Before and After High Power Test

• From the Standing wave pattern, the output part was mismatched, it can be caused due to the “damage” by the high power test of backward feeding in order to compare with single cavity test.• In general, there was no frequency change of 2π/3 mode at similar operation condition.• CERN confirmation done.• The frequency of high power test was ~ 3 MHz higher than the tuned frequency. Because the structure is a nice band-pass filter, the field pattern and S12 almost no change. Only the mode phase advance was not 2π/3.

Page 6: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Amplitude Measurement of T18-KEK Before and After High Power Test

11421.7 MHz at 21.1°C, N2 Before high Power test

11422 MHz at 21.1°C, N2 After high power test

Page 7: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Phase Measurement of T18-KEK Before and After High Power Test

11421.7 MHz at 21.1°C, N2 Before high Power test

11423.2MHz at 22.7deg°C in N2After high power test

Considering the string perturbation and temperature correction, the frequency was increased by 1.2 MHz (Toshi calculated 1.1 MHz).

Page 8: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Comments on T18-KEK Before and After High Power Test

• From the Standing wave pattern, the output part was damaged.• In general, there was a 1MHz frequency increase of 2π/3 mode at similar operation conditions. In another words, the cumulated phase drift was about 16° at frequency at similar operation conditions.• The total high power test time was 400 hours, is it a reason to cause more “damage” in comparison with T18-SLAC?

Page 9: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

TD18-SLAC High Power Test

0 100 200 300 400 500 600 700 800 900 10000

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Accumulated rf process time (hr)

BDR (1/hr)

<G> for regular cell (MV/m)

Pulse Width (divided by 10 ns)

Faya Wang

Page 10: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Phase Measurement of T18-KEK Before and After High Power Test

16.5°

11424.5 MHz at 21.46°C, N2 Before high Power test

11424.56 MHz at 21.1°C, N2 After high power test

Select bead pulling frequencies based on the same measurement condition for both before and after high power test

Page 11: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Amplitude Measurement of TD18-SLAC Before and After High Power Test

11424.5 MHz at 21.46°C, N2 Before high Power test

11424.56 MHz at 21.1°C, N2 After high power test

Page 12: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Phase Measurement of TD18-SLAC Before and After High Power Test

16.5°

11424.5 MHz at 21.46°C, N2 ore high Power test

11424.56 MHz at 21.1°C, N2 After high power test

Select bead pulling frequencies based on the same measurement condition for both before and after high power test

Page 13: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Comments on TD18-SLAC Before and After High Power Test

• From the Standing wave pattern, the output part was mismatched.• In general, there was a 1MHz frequency increase of 2π/3 mode at similar operation conditions. In another words, the cumulated phase drift was about 16° at frequency at similar operation conditions• The pulse heating for TD18 structure is higher, but we believe the “damage” was still in the disc irises.• The total breakdown event recorded was more than 4000 – only twice higher than T18 SLAC #1, but the TD18 breakdown rate measured after 700 hours was higher than T18 SLAC #1 by factor of 100! The “damage” can be caused at higher power and full pulse width in stead of the process beginning with lower power and short pulse width.

Page 14: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Amplitude Measurement of T18-SLAC #1 Before and After High Power Test

11424.1 MHz at 20.02°C, N2 Before high Power test

11424.15 MHz at 20.4°C, N2 After high power test

Page 15: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Phase Measurement of T24-SLAC Before and After 800 Hours High Power Test

Select bead pulling frequencies based on the measurement condition to get 2π/3 phase advance for both before and after high power test

11424.1 MHz at 21.1°C, N2 After high Power test

11424.1 MHz at 21.2°C, N2 Before high power test

Page 16: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

20110108~20110117,pulse width 252ns;

Red point is ACC BD, green is 1st BD;

Rs reflection phase observed in T24-KEK structure

2011/2/9 Higo for US-HG 2011 at SLAC 16

Rs phase

• Frequency change

+1MHz.

• Body temp change

• IQ amplitude dependence

<< MHz

Damage through operation if not due to change during vac bake?

Page 17: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Comments on T24 Before and After High Power Test

• From the Standing wave pattern, the output part was mismatched.• In general, for SLAC there was a 0.3MHz frequency decrease of 2π/3 mode at similar operation conditions. In another words, the cumulated phase drift was about 6° at frequency at similar operation conditions, but different direction.• For KEK flanges structure there was a 1MHz frequency increase of 2π/3 mode at similar operation conditions. In another words, in the direction like most of structures.

Page 18: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Historical Information for the NLC/GLC Structures in Comparison Before and After High Power Tests

H60VG3R1000 Hours RF on (65MV/m, 400ns)

8000 Body Breakdown

H90VG3N1600 Hours RF on (65 MV/m, 400 ns)

9500 Body Breakdown

T53VG3MC900 Hours RF on (92MV/m., 400ns)

1600 Body Breakdown

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T53VG3MC Smoothed Phase Before/After NLCTAwith difference (After-Before)

Difference (After-Before)After (Smooth 3)Before (Smooth 3)

Cell

<3°<2°

<1.5°

Page 19: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

-2

-1.5

-1

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Bead-Pull Phase Advance Measurements of H60VG3 (FXB2)Before and After 300 Hours of Processing to 70 MV/m

(7000 Breakdowns, 300 Hours RF On)

Cell Number

Inte

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ted P

hase

Advance

(degre

es)

Page 20: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Comments on the History of NLC/GLC Structures Before and After High Power Test

• There was no increased Standing wave pattern, the phase plots in output parts were used to fit together in order to compare the phase change before and after high power tests.• In general, there was a no frequency change for designed mode 2π/3 or 5π/6 at similar operation conditions. In another words, the cumulated phase drift for those long structures were very few degrees at frequency at similar operation conditions

Page 21: Structure Changes  after High Power Tests Juwen Wang 5 th  X-Band Structure Collaboration Meeting

Conclusion

We need continue to pay close attention on the measurement and analysis the structure status before and after high gradient operation. It always is a critical issue for the life time and stabilization of the high gradient accelerating structures.