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Science Advances Today Sci. Adv. Today 2 (2016) 25230
Silicon nanowire heterostructures: growth strategies,
novel properties and emerging applications
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Ramesh Ghosha and P. K. Giri
a,b,*
a Department of Physics, Indian Institute of Technology Guwahati, Guwahati -781039, India
b Centre for Nanotechnology, Indian Institute of Technology Guwahati, Guwahati -781039, India
*Author for correspondence: P. K. Giri, email: [email protected]
Received 30 Oct 2015, Accepted 22 Dec 2015, Published Online 22 Dec 2015
1. INTRODUCTION
Over the past decades, one dimensional (1D) semiconductor
nanostructures, including nanowires (NWs) nanorods (NRs), nanotubes,
nanofibers (NFs) and nanobelts, have been attracting a great deal of
attention in both basic scientific research and potential technological
applications due to their special physical and chemical characteristics [1-
10]. In recent years, NW has emerged as one of the most active research
areas in semiconductor industry due to their high surface-to-volume ratios
as well as the as-revealed excellent performance in various device
applications. Among the important class of semiconductors, Si
nanostructures, specially Si NWs are extensively studied due to the ease
of synthesis and fascinating properties, such as light emission,
antireflective, photocatalytic, electrical and sensing etc [1, 5-7, 10-14]. Si
NWs are employed as active component in various electronic and
optoelectronic devices, e.g., field effect transistors (FET), light emitting
diodes (LED), solar cells, sensors, energy storage and photochemical
reactor etc. Various types of 1D Si nanostructures have been grown by
several groups worldwide over the past decades by various methods such
as chemical vapor deposition (CVD), pulsed laser deposition (PLD),
thermal evaporation, template assisted growth, molecular beam epitaxy
(MBE), reactive ion etching (RIE), and metal assisted chemical etching
(MACE) etc [10, 12, 15-29]. The effect of growth conditions on the
morphology has been studied to control the key parameters, such as
crystallinity, growth orientation, chemical composition, shapes, diameter,
length, etc. of the Si NWs. Such a control over the growth allows one to
design and fabricate the Si NWs based innovative nano-devices with
tunable characteristics. The key parameters of the performance index of
the bare Si NWs based nano-devices are not up to the level for
commercialized applications. Therefore, significant improvements are
required to meet future demands for applications in variety of fields. As
the surface-to-volume ratio in NWs is very high, the surface states play a
key role on optical absorption, luminescence, detection, sensing and
photocatalysis in determining the electrical, optoelectronic and
photocatalytic properties of Si NWs based nano-devices. Thus,
modification of the surface of the Si NWs by using hybrid structures or
heterostructure (HS) approach could enable superior/efficient
performance of the nanoscale devices. In the past few years, several
technological methodologies have been developed for the fabrication of
high quality NW HSs with suitable external materials. Recent studies on
semiconductor NW HSs highlight the significance and developments in
the fabrication and applications of HS. Using the HS approach,
researchers are able to modify/improve the selective property of the Si
NWs according to the requirements. The Si NW HSs find applications in
several nanoelectronic and optoelectronic devices, e.g., LED, solar cells,
sensor and photochemical reactors etc. These devices show efficient and
improved performances compared to the bare Si NWs counterpart.
In this review article, first we present a summary of the widely
used techniques for the growth of high quality Si NWs and fabrication
methodologies of various types of Si NW HSs such as core-shell radial
HS, axial HS, hierarchical HS and quantum dot (QD) decorated NW HS.
Next, we review the fascinating properties (light emitting, antireflective,
photocatalytic, electrical, photovoltaic and sensing etc.) of the Si NW HSs
and their potential applications in different devices, primarily LED, solar
cells, sensor and photochemical reactors. We highlight the impacts of the
HS on the selective properties and performance of the Si NW based
devices. The problems and challenges of utilizing Si NW HS in various
device applications and the key parameters to improve the devices
performances are extensively discussed to highlight the effectiveness of
the HS approach. The recent developments in the commercialization of
the Si NW HSs and future outlook of the field are presented at the end.
In recent years, semiconductor nanowires (NWs) have drawn enormous attention due to their unique optoelectronic properties and
excellent performance in variety of applications. With the introduction of NW heterostructures (HSs) into the device, the device performance is
improved significantly in many cases. Due to the ease of fabrication, excellent optoelectronic properties and compatibility of forming HS with
different inorganic/organic materials, Si NW HSs have attracted a great deal of research interest in last decades. The Si NW HSs exhibit interesting
size, shape, and material-dependent properties that are unique when compared with the single-component material. Here we review the recent
developments in Si NW HSs: fabrication techniques, their properties (e.g., light emission, antireflection, photocatalysis, electrical, photovoltaic
and sensing etc.) and related emerging applications in electronics, photonics, catalysis, sensing and photovoltaics etc. The problems and challenges
of utilizing the Si NW HS in the device applications and the key parameters to improve the device performances are discussed extensively. The
bottlenecks in the commercialization of the Si NW HS based devices and future outlook of the field are presented at the end.
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2. GROWTH OF Si NANOWIRES
The properties of Si NWs strongly depend on their preparation
methods. The production of large area, highly oriented array of NWs
structures is extremely important to control the properties for device
applications. Large amounts of research effort have focused on the
fabrication of Si NWs according to the requirement for the dedicated
device application. The reported methods for the fabrication of Si NWs
are classified into two main approaches: bottom-up and top-down. The
bottom-up approach, which is the oldest method for Si NWs fabrication,
is a gathering process constructed by Si atoms in a sequence to form Si
NWs. Out of several bottom-up approaches, CVD via vapor-liquid-solid
(VLS) process, MBE technique, PLD technique and thermal evaporation
are commonly used. The top-down approach is the selective reduction of
bulk Si wafer by RIE and MACE to form Si NWs. Out of several
traditional approaches, CVD and MACE method are the widely explored
and largely usable methods for their versatility about controllability,
repeatability, quality, low cost and mass production. A lot of review
articles have been published describing the synthesis of Si NWs [1, 4-6,
10, 11, 15, 30-37]. We will give a brief overview of some of the
commonly used methods to fabricate the high class Si NWs for
technological application.
2.1. Chemical Vapor Deposition (CVD)
Among the bottom-up fabrication methods, the CVD approach
offers the concrete capability of fabricating Si NWs with controlled
diameter, density, length, position and doping characteristics, for device
applications. After the first report by Wagner and Ellis [38] in 1964 for Si,
this mechanism is extensively explored by several research groups
worldwide to prepare NWs and NRs from a rich variety of materials [2, 3,
8, 11, 13, 23, 29, 39-45]. CVD growth of Si NWs requires a suitable
noble metal (Au, Al, Cu, Fe etc.), which serves as catalyst and a gaseous
Si precursor such as silane (SiH4), Si tetrachloride (SiCl4) and Si oxide
(SiO) etc. The growth mechanism involves three stages: (1) formation of
liquid metal-Si alloy droplets on substrate kept at higher temperature than
the eutectic point (Teu) of the metal-Si system; (2) dissolution and
diffusion of gaseous Si precursor into the alloy droplets; and (3) Si
precipitation and axial crystal growth due to supersaturation and
nucleation at the liquid-solid interface [5-7]. Figure 1 schematically
illustrates the CVD mechanism of Si NW growth using SiH4 as gaseous
Si precursor and Au as the metal catalyst [7]. A metal capable of forming
a low-temperature eutectic phase with Si is preferable as a suitable
catalyst for the growth of Si NWs. Mostly Au (Teu = 363 C) is used, but
parallel to this Al (Teu = 577.6 C), Cu (Teu = 802 C), In (Teu = 156.6
C), Sn (Teu = 232 C), Fe (Teu = 1207 C) etc. [25, 29, 45-47] have also
been used as metal catalyst for the growth of Si NWs by VLS. Figure 2
shows the SEM image of (a) Au-catalyzed (b) Cu-catalyzed Si NW array
having nearly 100% fidelity over a large (>1 cm2) area [29]. Hochbaum et
al. synthesized controlled Si NWs by using 50 nm Au colloids [45]. SiCl4
was used as the precursor molecule for Si NW and growth temperature
was between 800 and 850 °C. H2 (10%) in Ar was used as the carrier gas.
The density of wire growth was successfully varied from ∼0.1-1.8
NW/μm2. Average NWs diameter could be reduced to ~39 nm. Figure
2(c) shows the SEM image of the arrays of Si NWs, whereas Figure 2(d)
represents the HRTEM lattice image of a single Si NW [45]. Si NWs
were grown directly into microchannels to demonstrate the flexibility of
the deposition technique [45]. Due to high Teu, vapor-solid-solid (VSS)
method has also been developed by using relatively low sub-eutectic
temperature, with the catalyst remaining in the solid phase. The wire
diameter and growth rate are affected by the initial size of the metal
catalyst, the growth temperature, and the type of Si precursor used [6, 47].
Due to high sensitivity of forming oxide for other metals, Au is the most
extensively used metal for the CVD growth of Si NWs. Note that the each
Si NW formed by CVD process contains a metal-Si alloy droplet at the tip
of the NW [6, 7]. The presence of metallic contaminations affects the
properties of intrinsic Si NWs, which are highly undesirable for device
applications. Au catalyst is unfavorable for complementary metal oxide
Figure 1. The Au-Si phase diagram (schematic) and the steps (schematic) of CVD grown Si NWs using Au catalyst.
Figure 2. SEM image of (a) Au-catalyzed, (b) Cu-catalyzed Si NW
array having nearly 100% fidelity over a large (>1 cm2) area
Reprinted with permission from [29]. (c) Cross-sectional image of Si
NW grown from 50 nm Au colloids and resulting Si NW diameters.
(d) HRTEM image of a single crystalline Si NW. Reprinted with
permission from [45].
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semiconductors (CMOSs). Therefore, the other mentioned metals, which
are compatible with CMOSs are preferred [5, 7].
2.2. Pulsed Laser Deposition (PLD)
PLD is another successful method for fabrication of Si NWs [6,
16, 22, 30, 48-50]. In case of PLD, a highly energetic pulsed laser beam is
focused in an ambient temperature on a target made of Si (metal or SiO2
with Si are also used) to form an energetic plasma plume, which then
condenses onto a substrate to form Si NWs. An inert gas is used as a
carrier gas, which transports and cools the ablated products. The main
advantages of PLD technique are: firstly, Si NWs are of high purity, high
yield, and large quantity with fast growth rate; secondly, Si NWs can be
grown in suspension condition without having a substrate and thirdly the
composition of the resulting NWs can be varied by changing the
composition of the target. Target composed of Si (90 %) and Fe (10 %)
kept at 1200 °C shows primarily Si NWs uniform diameter of the order of
10 nm with lengths up to 30 µm [22]. Eisenhawer et al. has grown
controlled Si NWs at 650 °C using Si target and Au metal catalyst [16].
Figure 3(a) shows an SEM image of the as-synthesized Si NWs by PLD
and the inset displays a close-up of a single Si NW. The perpendicular Si
NW growth on the Si (111) surface is also proved by cross-sectional TEM
in Figure 3(b). TEM measurements (shown in Figure 3(c) and (d))
demonstrate that the as-grown Si NWs have a single-crystalline Si shaft
that is covered by a thin native SiOx skin. Figure 3(c) shows the remnants
of the catalyzing Au droplet on the sidewalls of the grown Si NWs [16].
The growth rate of Si NWs was greatly enhanced by using a target
composed of SiO2 and Si powder compared to (a) a metal-Si target, (b) a
pure Si target and (c) a pure SiO2 or SiO target [30, 50, 51]. The Si
nanoparticles embedded in an oxide matrix serve as nuclei for NW
growth. Such a mechanism can avoid the metal contamination and ultra-
thin NWs (diameter ~1 nm) can be produced [51]. High yield and uniform
Si NWs are achieved by this method [48]. The diameter and the
uniformity of the Si NWs not only depends on the metal catalyst but also
it depends significantly on the carrier gas [50]. Though the PLD process is
versatile for the controlled growth of Si NWs, the need of low
wavelength, high-energy, focused pulse lasers with high cost prevents this
method from having wide application.
2.3. Thermal Evaporation
Thermal evaporation technique is a cost effective and easy
fabrication technique to produce a large area, high-purity and ultra-long
(of the order of mm) Si NWs [9, 11, 27, 52-56]. SiO powder is mainly
used as the Si precursor and this process is sometime called as oxide
assisted growth (OAG). SiO powder is heated in a hot zone of a multi-
zone tube furnace and a carrier gas (inert gas) is used to decompose SiO
vapor to Si NWs in the colder zone [52, 55, 56]. In principle, the growth
method is catalyst free but metal catalyst is also used and it provides
relatively rapid growth with controlled diameter, which is consistent with
the concept of CVD growth [20]. By thermal evaporation of SiO powder,
Shi et al. synthesized millimeter length Si NWs on Si substrate with
average diameter 20 nm covered by ~5 nm amorphous Si oxide sheath
[56]. Si NWs with different morphologies and microstructures were
formed over a wide temperature ranged from 890 to 1320 °C by thermal
evaporation of SiO powders at 1350 °C using multi-zone furnace [27, 52].
Very recently Lim et al. has grown ultra-long and uniform diameter (<30
nm) Si NWs on Cu foil with relative thicker oxide layer at 735 °C and
955 °C by heating SiO powder at 1100 °C [55]. Figure 4(a) shows a SEM
image of the NWs grown on Cu foil for 2 hour at a substrate temperature
of 735 °C. This image confirms that dense NWs with length of tens of
micrometers were grown on the Cu surface. Figure 4(b) shows a low
magnification TEM image that confirms the uniformity of the NWs. The
SAED pattern in the inset of Figure 4(b), which was measured from a
single NW, indicates that the NWs are polycrystalline. The HRTEM
Figure 3. (a) SEM image of the as-grown Si NWs; the inset shows a single NW. (b) The cross- sectional TEM image shows the orientation of the
NWs perpendicular to the substrate surface and thereby proves the <111> growth direction of the Si NWs. (c) TEM and (d) HRTEM analysis of a
single Si NW. The residual Au NPs at the sidewalls of the NWs is visible in (c). In (d), the SiOx sheet on the grown NWs is clearly visible. Reprinted
with permission from [16].
Figure 4. (a) SEM image of Si NWs grown on a Cu surface at 735
°C. (b) Low-magnification TEM image of Si NWs. The inset is an
ED pattern of a wire indicating its polycrystalline nature. (c)
HRTEM image of Si NWs. The Si NW is covered with a SiOx shell.
The inset shows the end of a single NW without any metal catalyst.
(d) Plot of diameter of NWs vs temperature. (e) Plot of SiOx shell
thickness at one side vs. temperature. Reprinted with permission
from [55].
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image in Figure 4(c) reveals that the NWs are core-shell structures
consisting of a polycrystalline Si core and an amorphous SiOx shell. The
average diameter of the Si NWs and SiOx layer grown at different
substrate temperatures was measured from HRTEM images and shown in
Figure 4(d) and (e) respectively [55]. The diameter of Si NWs as well as
the oxide layer strongly depends on the source temperature, growth
temperature and the nature of the substrate [52, 55].
2.4. Molecular Beam Epitaxy (MBE)
MBE is also a well-established method for growing high quality
Si NWs [17, 21, 57-60]. The growth mechanism of Si NWs in MBE
process is very much similar to a typical CVD process. High purity Si
plasma is created usually by e-beam evaporation at very high vacuum and
the plasma is directed to the substrate, on which the Si atoms adsorb and
crystallize. Unlike CVD, no carrier gas is used in MBE process. In MBE,
two Si fluxes govern wire growth; first, the direct flux of Si from the Si
source; and second, the flux of diffusing Si adatoms from the Si substrate
surface [17]. However, the nanowhiskers or NWs growth by MBE has a
strong surface-related Si diffusion component, which leads to a larger
growth rate for nanowhiskers with a smaller radius. This is just opposite
to what is well established in the case of CVD-grown nanowhiskers [17].
Schubert et al. have grown Si NWs on Si (111) substrate by using Au
catalyst [17]. Figure 5(a, b) shows the SEM images of the Si NWs for
total growth time of 60 min and 120 min, respectively. Both experiments
confirmed a homogeneous distribution of <111> oriented whiskers of
cylindrical morphology, partly hexagonal facetted. Figure 5(c) shows the
tilted view of sample (b) to get an overview on the arrangement of the
whiskers. These have a diameter in the range from 100 nm to 160 nm,
which is determined by the Au droplet sizes (the initial diameter of the Au
droplets was 70-200 nm). Their average lengths amount to about 95 nm
and 210 nm, respectively. The main advantage of MBE is of its precise
control on the Si flux [17]. Kanungo et al. has grown boron doped Si
NWs by switching evaporation sources by Si and B [21]. The MBE
grown Si NWs are usually grown on Si(111) substrates and the NWS are
also epitaxial and <111> oriented. The NWs are grown at temperature
500-800 C. Though MBE provides excellent controllability of growing
NWs, there are some disadvantages related to this process [4]. The
process requires ultra-high vacuum; the growth rate is slow compared to
the other methods. The average diameter of the NWs is also quite high
[4].
2.5. Reactive Ion Etching (RIE)
In contrast to bottom-up approaches, RIE is one of the well-
known top-down processes for fabricating ordered arrays of Si NWs of
controlled size, density, and tunable properties [10, 15, 18, 19, 61-64].
The process is generally the highly anisotropic dry etching of Si or SiO2
by halogen radicals, mainly fluorine-based compound materials. These
fluorine radicals from the plasma reach the Si surface and form volatile
SiFx, and therefore impede chemical etching. Several studies have
previously measured the etch rates of Si and dielectrics in halogen-based
plasmas and several relevant observations have been made [19, 62, 63]. In
the plasma, the fluorine radicals will rapidly attack the Si surface forming
volatile SiF4 and the layer is etched away. However, on vertical sidewalls
the etching is weaker due to the directionality of the plasma ions and the
sidewalls therefore remain protected from chemical etching by fluorine
radicals. The anisotropic RIE with a mixture of SF6 and O2 gas was
studied in detail by Jansen et al. and the needle like Si nanostructures
were formed in this case [62]. The RIE of Si without protective layer or
masking is anisotropic and the nanostructures formed in this case are also
highly nonuniform. The aspect ratio of the Si NWs can be controlled via
the gas pressure, which determines the directionality of the ions. The
ordered arrays of Si NWs of controlled size and density could be easily
produced on Si wafers by the combination of RIE and lithography [1, 10,
19, 64]. Fu et al. fabricated ordered Si nano and micropillars by
conventional photolithography with AZ5214 photoresist and e-beam
lithography with mask dimensions down to 50 nm [64]. Si etching was
also performed using a mask of Au or Co NPs. RIE of Si wafers were
carried out in three steps: gas flows of SF6, C4F8, and O2 for etching Si,
passivation, and etching the passivation layer. The substrate temperature
was kept at 0 °C by means of a helium-cooled sample holder. Figure 6
shows Si nanopillars fabricated by RIE using mask patterned by (a) UV
lithography, (b) e-beam lithography [64, 65].
2.6. Metal Assisted Chemical Etching (MACE)
During the last decades, MACE has emerged as a promising and
significant tool for the rapid production of large area, aligned and well
controlled Si NWs. MACE is now becoming the most common method
over the other well established methods for the production of high quality
Si NWs. This solution based etching method, called as “metal assisted
chemical etching”, was first introduced by D. Malinovska et al. in 1997
[66]. The idea was to obtain porous silicon by etching Al covered Si
substrate in a solution containing HF, HNO3 and DI water. The arrived at
the conclusion due to the Al film, there is a dramatic increase in the rate
of pore formation on Si wafer. Following this study, Li and Bohn worked
on this method in 2000 using various noble metals like Au and Pd instead
of Al and examined how these metals reacted with HF, H2O2 and ethanol
solution [12]. They obtained rather sharper and straight pores within the
Figure 5. SEM cross section images of Si whiskers grown on a
<111> Si substrate at 0.5 Å/s for (a) 60 min and (b) 120 min growth
time at TS = 552 °C. (c) The sample (b) was tilted to get an
overview on the arrangement of the whiskers. Reprinted with
permission from [17].
Figure 6. Si nanopillars fabricated from mask patterned by (a) UV
lithography, (b) e-beam lithography. Reprinted with permission from
[64].
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Si substrate. In 2002, Peng et al. widely investigated the MACE using
HF/AgNO3 solution where Ag coating and Si etching simultaneously took
place yielding a NW-like structure [26]. After 2000, MACE become the
most powerful tool for rapid fabrication of large area, vertical, ordered,
and single crystalline Si NW arrays due to its ease and low cost of
production. The mechanism of one-step MACE process (simultaneous
metal deposition and etching of Si) and the two-step MACE (pre-
deposited metal of Si wafer) has been explained by different groups [12,
24, 26, 35, 36, 67-70]. However, the shape and size, length, diameter,
density, crystallinity and the properties of the Si NWs strongly depend the
(a) nature of the noble metal, (b) shape and size of the noble metal and the
intermediate distance between them, (c) the etching solution and its
concentration, (d) the doping type, resistivity and the orientation of the Si
wafer, (e), temperature and (f) etching duration [12, 24, 26, 28, 34-36, 67,
69, 71, 72]. Our group has synthesized Si NW arrays by MACE using Ag,
Au and Ag/Au bilayer as noble metal catalyst, and AgNO3/HF and
H2O2/HF as etching solution [24, 67, 73, 74]. We have successfully tuned
the etching parameters such as Si wafer orientation, doping type, doping
level, etching solution concentration, size of noble metal catalyst and the
etching duration and studied the optical properties of the as grown and
surface passivated Si NWs [24, 67, 73, 74]. Figure 7(a) shows FESEM
cross-sectional micrographs of Si NWs grown by Ag assisted chemical
etching of Si (100) (1-10 Ω-cm) in H2O2/HF (1.422 M H2O2 and 4.6 M
HF) for 20 min at room temperature, and inset shows the corresponding
top view image. Figure 7(b) shows the FESEM cross-sectional image
grown in 0.015 M AgNO3 and 5.55 M HF for 1 hour at RT [24]. Figure
7(c) shows the TEM image of an individual Si NW. Figure 7(d) shows a
magnified view of the Si NW, and it is clear that the surface of the Si
NWs is rough due to the side wall etching of the NWs and as a result
arbitrarily shaped Si NCs are formed on the vertical Si NWs. Figure 7(e)
shows the HRTEM image of the surface of the Si NWs. The typical
dimension of a single Si NC is marked by a dashed line. Figure 7(f)
shows the corresponding inverse first Fourier transformed image of the
selected area of Figure 7(e). Figure 7(g) and (h) shows the selected area
electron diffraction pattern and EDX spectrum, respectively. The EDX
spectrum confirms the presence of SiOx layer on the top of the Si
NWs/NCs. It is clear from Figure 7(e) and 7(f) that the Si NCs are single
crystalline and the typical dimension of the Si NC is easily visualized
[73]. In the literature, self-assembling polymers and lithography are used
for patterning the noble metal on Si wafer to control the diameter of the Si
NWs and the spacing between them [69-71, 75, 76]. However, the MACE
grown Si NWs are decorated with arbitrary shaped Si NCs on its surface
due to its sidewall etching, which helps to enhance the optoelectronic
properties of the porous Si NWs arrays [24, 35, 68, 73]. Several review
articles have been published explaining the controlled synthesis, excellent
properties and the device application of MACE grown Si NWs [1, 5, 10,
31-36].
3. FABRICATION OF Si NW HETEROSTRUCTURES
Z. I. Alferov received the Nobel Prize in Physics in 2000 for his
discovery of “The double heterostructure: concept and its application in
physics, electronics and technology” and after that the fabrication of HS is
being intensely investigated in order to exploit the functional properties
arising from the junction of different materials [77]. NWs HSs provide
additional structural complexity and functionality which could
revolutionize the semiconductor industry as well as the fundamental
science. Using suitable external materials for the HS, one can modify the
properties of Si NWs according to the requirements. Although NWs HS
of different compound semiconductors such as, ZnO/CdS [78], ZnO/ZnS
[79], InGaAs/InP[80], InAs/GaAs [81], MoS2/WS2 [82], MnO2/Ag [83],
GaN/AlN [84], TiO2/Ag2O [85], ZnO/CuO [86], SnO2/CdS [87] etc. have
been studied, relatively less studies are reported on Si NWs HS,
Recently, there are reports on the fabrication of radial HS of Si NWs/NRs
using several organic/inorganic materials [74, 88-105]. These are
basically core–shell type NWs with very thin layer of shell. Axial HSs
Figure 7. FESEM cross-sectional image of the Si NWs grown by MACE in (a) H2O2/HF and (b) AgNO3/HF solution for 20 min and 60 min
respectively; inset of (a) shows the corresponding top view image. (c) TEM image of a single Si NW. (d) A magnified view of the Si NW, showing
rough surface of the NWs due to sidewall etching and confirming the presence of Si NCs on its surface. (e) The HRTEM lattice image of a single Si
NC and its shape are marked by dashed line. (f) HRTEM lattice image of the Si NCs; Si (111) NCs show a compressive strain with reduced
interplanar distance. (g) Corresponding selected area electron diffraction pattern of the Si NCs showing different planes of Si. (h) EDX spectrum of
the Si NW/NCs showing the SiOx layer on the surface of the Si NWs/NCs. Reprinted with permission from [73].
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along the length of the Si NWs axis have been reported for a variety of
systems [106-120]. Si NWs covered with dense and uniform ultrasmall
NPs (metals and other inorganic material based NPs) are another form of
NW HS [75, 96, 121-130]. Branched nanostructures on Si NWs are also a
very interesting HS and due to its huge aspect ratio these HSs are
attracting a lot of interest in photocatalysis and photovoltaics [65, 131-
141]. Selective doping of Si NW was carried out for creation of nano-
junctions by introducing the dopant in vertically grown single-crystalline
Si NWs and there are reports on the fabrication of homo-junction in the Si
NWs which can also be treated as Si NWs HS [44, 142, 143]. Figure 8
shows the schematic diagram of different kinds of Si NWs based HS. In
this section, we revisited the use of various strategies for the fabrication of
different types of Si NW HS. In most of the cases or perhaps all the cases,
ex-situ process has been used for the fabrication of the Si NW HSs.
3.1. Si NW Radial Heterostructures
Different inorganic/organic materials, mainly semiconductors
have been used to prepare very thin layer over the NWs for the fabrication
of the Si NW radial HSs. Several studies have been devoted to the effects
of overcoating of thin layers (1–30 Å) of inorganic material such as SiOx
[22], ZnO [96-100], Al2O3 [144, 145], TiO2 [95, 101-103], Fe2O3 [104],
SiNx [146], HfO2 [144], WO3 [147], Cu2O [148], CdS [91], CdSe [105],
ZnS [88], SnO2 [149], Ge [89, 90], etc. and organic material such as
PDEF [94], P3HT [93], PEDOT:PSS [92] etc. on Si NWs. Si NWs core
multi shell HS such as Si NW/SnO2/Fe2O3 [150], Si NW/Al2O3/TiO2
[151], Si NW/Ge/Si [90, 152], Si NW/ZnS/AZO [88], Si NW/ZnO/TiO2
[131], have also developed for enhancement of the device performance. Si
is very much reactive in air atmosphere and the Si NWs covered by the
native SiOx (0≤x≤2) layer forms Si NW/SiOx HS [22, 24, 67, 73, 74].
Figure 9(a) shows a typical diffraction contrast TEM image of a Si/SiOx
NW HS grown by PLD; crystalline material (the Si core) appears darker
than amorphous material (SiOx sheath) in this imaging mode. The inset
shows the convergent beam ED pattern recorded along the [211] zone axis
perpendicular to the nanowire growth axis.[22] The HRTEM image in
Figure 9(b) confirms the crystalline Si core and amorphous SiOx sheath.
The (111) planes (black arrows) (spacing, 0.31 nm) are oriented
perpendicular to the growth direction (white arrow) [22]. The SiOx layer
on the Si NWs sometimes play crucial role to modify the optoelectronic,
photovoltaic and mechanical properties of the bare Si NWs in presence of
different kinds of defects in the Si-SiOx interface. Si NW/TiO2 radial HS
arrays have been prepared by depositing a TiO2 layer on Si NW arrays by
CVD method by H. Yu et al. [101, 102]. The Si NWs were prepared by
MACE and the MACE grown Si NWs samples were put into a tubular
quartz reactor in a furnace and heated in an Ar flow (800 mL/min). When
the temperature reached 320 °C, titanium (IV) isopropoxide (TTIP) was
fed continuously into the tubular quartz reactor through a capillary for 5
min. During this process, the total weight of TTIP, which was fed into
tubular quartz reactor, is 105 mg. The as grown Si NW/TiO2 HS samples
were annealed in air at 400 °C for 5 min to convert TiO2 to a crystalline
phase. Figure 9(c) shows the SEM images of Si NW/TiO2 HS whereas (d)
shows the TEM image of Si NW with Si NW/TiO2 HS as an inset [102].
The length of the HS was ~20 m with core diameter ~200 nm and the
TiO2 shell thickness ~100 nm [101, 102]. S. G. Yenchalwar et al. used
solution process to form Si NW/TiO2 HS [103]. At first a solution of TiO2
is prepared by taking 0.5 ml of titanium isopropoxide in 5 ml of ethanol
and 0.2 ml of acetic acid. Then 0.5 ml of DI water is added drop wise with
sonication for the hydrolysis of titanium isopropoxide. Then the TiO2
solution was diluted by adding some amount of dilute HNO3. The MACE
grown Si NWs samples were deep coated in TiO2 solution for 10 times to
form TiO2 coating on Si NWs. After, complete drying the substrate was
annealed at 500°C for 1 hr. under ambient oxygen to form crystalline
TiO2 covered n-Si NWs HS [103]. Y. J. Hwang et al. used PLD technique
to deposit TiO2 on the Si NW arrays using TiCl4 and pure water as the
precursors [95]. Si NW/ZnO HSs have attracted a great deal of research
interest due to easy fabrication technique and superior optoelectronic
properties compared to bare Si or ZnO [97, 98, 153, 154]. Researchers
have deposited ZnO on Si NW by different techniques, like ALD [98-100,
154], CVD [96], solution synthesis, and RF sputtering [74, 97] to
fabricate Si NW/ZnO device prototypes. Our group has deposited ZnO
thin film by RF magnetron sputtering on MACE grown Si NWs. Figure
9(e) and (f) show the FESEM top-view and cross-sectional image of the
Si NW/ZnO core-shell HS. Figure 9(f) is showing the rough surface of a
Si NW due to ZnO coating on Si NWs [74]. L. Sun et al. have fabricated
Si NW/ZnO core-shell HS by coating ZnO using MOCVD method [96].
Diethyl zinc (DEZn) was used as the precursor material of Zn. Figure 9(g)
and (h) show the TEM and HRTEM images of the Si NW/ZnO core-shell
HS. In Figure 9(h) Si NW display their (111) plane, confirmed by the d-
spacing, of 0.31 nm, while the ZnO layer is composed of many particles
grown along the (100) direction with an evaluated d-spacing value, of
0.28 nm, indicating that the ZnO layer is fully packed onto the Si NWs
due to longer reaction periods [96]. Multilayer core-shell structures based
on Si NW core have also been studied extensively [88, 90, 131, 150, 151].
Katiyar et al. has grown Si NW/ZnS/AZO radial HS by PLD of ZnS and
Al doped ZnO (AZO) on MACE grown Si NWs [88]. Figure 9(i) and (j)
show the TEM images of KOH-treated Si NW and Si NW/ZnS/AZO
core-shell HS, respectively. The Si NW core diameter is ∼100 nm
whereas it is covered by ∼80 nm ZnS followed by ∼20 nm thick AZO
layers. Figure 9(k) depicts the magnified HRTEM image of the Si/ZnS
interface showing the single-crystalline Si core. Figure 9(l) shows the
SAED pattern from the Si/ZnS core-shell structure. The Si/ZnS core-shell
structure exhibits the diffraction rings owing to (111), (220), and (311)
planes of ZnS on the background of Si diffraction spots [88].
3.2. Si NW Axial Heterostructures
Parallel to core-shell HSs, 1D axial NW HSs, with well-defined
and controlled heterojunctions between different have recently become as
potential building blocks of particular interest in future high-performance
nano-optoelectronic and nanoelectronic devices. Based on Si NWs, both
straight and kinked axial HS with different materials have been studied.
Si/Ge axial HS have been grown by different groups [111-116]. Mullane
et al. has grown Si/Ge HS by VLS method using In and Sn catalyst [111].
Ben-Ishai et al. [112] used Au and Y. C. Chou et al. [113] have used Ag-
Au bimetal alloy for the growth of Si/Ge NW axial HS. Both straight and
kinked axial Si/Ge NWs HS were formed and Figure 10(a) shows the
crystallographic structure of straight axial Si/Ge NW HS [112]. The NW
diameter is ~35 nm. HRTEM and SAED pattern (Figure 10(b-d)) from
different parts of the Si/Ge NWs confirm the structure of Si and Ge
distinctly [112]. Y. Wu have grown block-by-block single-crystalline
Si/Ge and Si/SiGe superlattice axial HS by PLD/CVD process [109].
Hocevar et al. have studied growth and optical properties of axial hybrid
Si NW HS with III-V material [110]. The NWs are grown in a horizontal
Aixtron 200 MOVPE reactor with a total pressure of 25 mbar by the VLS
growth mechanism using Au particles. The growth temperature for GaP-
Si and GaP-Si-GaP NWs is set in between 480-610 C. GaAs insertions
are grown at temperatures in the range of 450-540 C. The precursor flow
rates are set to 210-4-210-3 mbar for trimethylgallium and 210-2-
1010-2 mbar for phosphine (PH3). While growing GaAs segments, the
AsH3 flow is 810-3 mbar. Figure 10(e) shows the SEM image of an array
Figure 8. Schematic diagram of different kinds of HSs based on Si
NWs.
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Figure 9. (a) Diffraction contrast TEM image of a Si/SiOx NW HS; crystalline material (the Si core) appears darker than amorphous material (SiOx
sheath) in this imaging mode. Scale bar, 10 nm. (Inset) Convergent beam ED pattern recorded along the [211] zone axis perpendicular to the
nanowire growth axis. (b) HRTEM image of the crystalline Si core and amorphous SiOx sheath. The (111) planes (black arrows) (spacing, 0.31 nm)
are oriented perpendicular to the growth direction (white arrow). Reprinted with permission from [22]. (c) SEM images of Si NW/TiO2 HS and (d)
TEM image of Si NW. The inset shows the Si NW/TiO2 HS. Reprinted with permission from [102]. (e) FESEM cross-sectional image and (f) TEM
image of the Si NW/ZnO core-shell HS showing the rough surface of a Si NW due to ZnO coating on Si NWs. Reprinted with permission from
[74]. TEM and HRTEM image of (g, h) a Si NW/ZnO core-shell HS. Reprinted with permission from [96]. TEM images of (i) KOH-treated Si NW,
(j) Si NW/ZnS/AZO core-shell HS showing ∼100 nm Si core, ∼80 nm ZnS, and ∼20 nm thick AZO layers. (k) Magnified HRTEM image of the
Si/ZnS interface showing the single-crystalline Si core. (l) SAED pattern from the Si/ZnS core-shell structure. Reprinted with permission from [88].
Figure 10. (a) Low-resolution TEM image of a representative Ge-Si HS NW with diameter of ∼35 nm. Scale bar is 200 nm. The bright and the dark
portions are Si and Ge NWs, respectively. The yellow, red, and the light blue rectangles highlight the regions where the high-resolution images were
recorded. Inset: Ge-Si HS NW with higher diameter of 60 nm. Scale bar is 100 nm. (b-d) Lattice-resolved TEM images from regions I, II, and III
and its corresponding 2D Fourier transforms (insets). Scale bars are (b, c) 5 nm and (d) 2 nm (right image). The arrows denote the growth direction.
(c) Upper inset: lower magnification of the corresponding sample. Scale bar is 5 nm. Reprinted with permission from [112]. (e) SEM image of an
array of 60 nm-diameter GaP-Si-GaP nanowires with GaP, Si and GaP segment lengths of 180, 150 and 270 nm, respectively. Tilt angle = 80̊, scale
bar, 1 µm. (f) Triple GaP-Si HS (tilt angle = 80̊) with diameters of 33, 46 and 60 nm (left to right), scale bar 500 nm. (g) SEM picture of an array of
GaP-Si-GaP-GaAs-GaP-Si (hybrid Si/GaAs) nanowires. Tilt angle = 45̊, scale bar, 1 µm. (h) HRTEM picture of a Si-GaP transition, scale bar, 5 nm.
Reprinted with permission from [110].
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of 60 nm diameter GaP-Si-GaP nanowires with GaP, Si and GaP segment
lengths of 180, 150 and 270 nm, respectively, while Figure 10(f) shows
triple GaP-Si HS (tilt angle = 80) with diameters of 33, 46 and 60 nm
(left to right). Figure 10(g) shows SEM picture of an array of GaP-Si-
GaP-GaAs-GaP-Si (hybrid Si/GaAs) nanowires with tilt angle = 45.
Figure 10(h) shows the HRTEM picture of a Si-GaP transition [110]. J.
Kim et al. fabricated wafer-scale Si NWs/graphene HS for molecular
sensing. Single layer graphene has been fabricated by CVD and then
transferred on vertically aligned and high-density Si NWs grown by
MACE [117]. Other axial Si NWs based HSs such as, Si/CdS [106],
MnSi[107], Si/In [155] and Si/InAs [108] etc. have also studied for
different device applications. Parallel to these axial NWs HSs, side-to-
side Si-ZnS [118], Si-ZnS e[118], Si-ZnO [120], Si-CdSe [119] biaxial
NWs, and sandwich like ZnS-Si-ZnS [118], ZnO-Si-ZnO [120] triaxial
NWs HS have been studied. Figure 11(a, b) shows the TEM images of
side-to-side Si-ZnS biaxial and sandwich like ZnS-Si-ZnS triaxial NWs,
respectively while (c, d) shows the corresponding tip-end [118]. The
universal requirement of axial HS for device applications is straight NW
structures but kinking is a common problem for the growth of Si NWs
axial HS.
3.3. Si NW Hierarchical/ Branched Heterostructures
Compared with 0D NPs and 1D NWs, 3D branched HS
represent an additional dimension for increasing structural complexity and
potentiality enabling greater functions, and have been demonstrated for
different nanostructured material. The essence of this idea is the control
over the density and size of the nanoscale braches on the Si NWs
backbone, which ultimately enables the rational design of building blocks.
A variety of 3D branched Si NW HSs have developed to utilize their
distinct properties into their emerging applications in various devices such
as Si/ZnO [131, 139-141, 156], Si/TiO2 [65, 133-135], Si/InGaN [132],
Si/Au[136], Si/Ge [136], Si/GaAs [136], Si/GaP [136], Si/CdS [136],
Si/InP [136], Si/GaN [137], and Si/SiO2 [138] etc. Branched Si NW/TiO2
HS has been studied extensively for improved optoelectronic properties of
the system [65, 133-135]. By growing TiO2 NRs uniformly on dense Si
NW array backbones, J. Shi et al. demonstrated a novel 3D high density
heterogeneous NW architecture that could enhance the
photoelectrochemical efficiency [65]. Si NW backbones were first
fabricated by deep reactive ion etching (RIE) technique using a self-
assembled nanosphere monolayer as mask. The typical size of as-
fabricated Si NWs was ∼300 nm in diameter, ∼15 μm long, and ∼200 nm
apart from each other. Uniform TiO2 NRs were deposited on the entire Si
NW surface by SPCVD process. The NRs exhibited uniform dimensions
that are 355 nm in diameter and 25237 nm in length [65]. In Figure
12(a), FESEM cross section of middle portion of Si/TiO2 NWs branched
HS arrays shows the dense and uniform coating of TiO2 NRs along the
entire NW length and in 12(b), top view of Si NWs shows uniform
covering with high-density TiO2 NRs that grew laterally out of the side
surfaces [65]. Kargar et al. have grown Si NW/ZnO branched HS by
hydrothermal method using ∼45 nm seed layer of ZnO [131]. However,
its actual thickness on Si NW cores was smaller. The average ZnO NW
lengths are ∼90 nm, ∼200 nm and ∼140 nm for 10 and 20 min etching
times, respectively, whereas the Si NWs core diameter was ~280 nm and
length ~1 µm. Figure 12(c) cross-section and (d) top view SEM images of
3D Si/ZnO NW branched HS show the ZnO NW branches on Si NW
cores with 10 min RIE [131]. Some reports have demonstrated the
superiority of Si NW/ZnO branched HSs for device applications [131,
139-141]. Hwang grew complex material InGaN NWs vertically on the
sidewalls of Si wires and acted as a high surface area photoanode for solar
water splitting [132]. Single-phase InGaN nanowires with homogeneous
composition were grown on Si NWs arrays in a three zone halide CVD
furnace. GaCl3, InCl3 and NH3 were used as III/V precursors with N2 as a
carrier gas. Figure 12(e) shows the tilted (45°) SEM images of
hierarchical Si/InxGa1‑xN nanowire arrays on Si (111) substrate with x =
0.08-0.1. A fractured wire reveals the cross section 12(f) showing that
InGaN nanowires grow vertically from the six Si wire facets [132]. X.
Jiang described extensive studies that extend in a substantial manner the
synthesis of branched Si NW HS (including metal such as Au, and IV, III-
V and II-VI semiconductors such as Ge, GaAs, GaP, InP, InAs, ZnS,
ZnSe, CdS, and CdSe) and significantly, these HSs possess well defined
electrical and optoelectronic junction properties, including the
demonstration of addressable nanoscale LED, logic circuits, and
biological sensors [136]. They also studied the NWs branches on Si/SiO2
core/shell HS. Si NW backbones were synthesized using nanocluster
catalyzed CVD method Si/SiO2 core-shell NWs were prepared by
oxidation of Si NWs in pure O2. Au branched NWs were then grown by
immersing the respective substrates with dispersed NWs in a solution
containing HAuCl4. Ge branches were grown by CVD and the growth of
other III-V and II-IV branches was achieved by thermal evaporation and
vapor transport method. Figure 12 shows the SEM images of (g) Si/Au,
(h) Si/Ge, (i) Si/GaAs, and (j) Si/GaP branched NWs HS. Figure 12
shows the TEM images of (k) Si/CdS, (l) Si/Au, (m) Si/Ge, (n) Si/GaAs,
and (o) Si/InP branched NWs HSs. The junctions of the HS are clearly
visible from the respective TEM images [136]. People also have
synthesized other branched and hyperbranched NW structures via a
multistep nanocluster catalyzed VLS approach [137, 138]. Figure 12(p)
shows the SEM images of branched Si/GaN NW HS prepared following
deposition of 0.1 M Ni catalyst precursor solution [137]. Figure 12(q-t)
shows the typical TEM images of Si/SiO2 hierarchical HS grown by Au
catalyst based CVD process; (q) low-magnification view; (r, s) the tip
terminating with a Sn ball; and (t) a flat plate-like tip-end after the Sn ball
dispatch [138].
3.4. NPs Decorated Si NW Heterostructures
Decoration of metal and other semiconductor NPs has been
carried out mainly for the improvement of the sensing, photocatalytic,
luminescence and photovoltaic properties. Sun et al. deposited ZnO NPs
on MACE grown Si NWs by typical metal-organic CVD process [96].
The reaction chamber was evacuated to 510-3 Pa by a molecular pump.
While maintaining the pressure level, 15 sccm DEZn and 5 sccm O2 were
blown into the chamber at the same time under the condition that the
sample is heated to 550 C at the rate of 20 C/min in advance. The
sample is cooled to room temperature followed by reaction for 10 min.
Elliptical ZnO QDs were formed on the surface of Si NWs with 6-10 nm
Figure 11. (a, b) TEM images of side-to-side Si-ZnS biaxial and
sandwich like ZnS-Si-ZnS triaxial NWs, respectively. (c, d) The tip-
end characteristics of the side-to-side and sandwich like NWs,
respectively. Scale bars in (a-d) are 100 nm. Reprinted with
permission from [118].
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in diameter [96]. Xie et al. reported a Si NW array/carbon quantum dot
(CQD) core/shell HS photovoltaic device by directly coating CQDs on
MACE grown Si NWs [75]. The CQDs used in this work were
synthesized by an electrochemical etching method and decorated on Si
NWs by spin coating. Pt NP decorated Si NW based photoelectrochemical
solar cell was fabricated by Peng et al. [121] Si NWs were grown by
MACE and before PT NPs coating the Si NWs were dipped in 50:1 HF
solution to remove oxide layer [121]. Then the n-type Si NWs samples
were immediately immersed into a solution containing H2PtCl6 (0.001M)
to decorate Si NW surface with Pt NPs. The average diameter of the Pt
NPs was ~5 nm [121]. Yenchalwar et al. have fabricated Au NPs
decorated Si NW/TiO2 HS by chemical process [103]. The TiO2 coated Si
NWs samples were soaked in Au salt solution (1 mM HAuCl4) for 30
minutes and dried under IR lamp. These samples were then annealed at
400 °C (10 minutes) for the Au NPs formation. Z. Song et al. fabricated
Rh NPs decorated mesoporous Si NW HS for H2O2 detection with high
selectivity [122]. 90 μL of 1 wt% RhCl3 was added to the as-prepared Si
NWs solution (adding 45, 90 and 135 μL of the RhCl3 solution resulted in
Rh NP decorated Si NW with Rh NP loading of 3.7, 7.4 and 11.1 μg/mm2,
respectively). Then excess amount of 0.1 wt% NaBH4 solution was added
to the solution slowly at 4 °C during stirring in order to prepare Rh NP
decorated Si NW HS [122]. Ag NPs decorated Si NW HS were fabricated
by thermal evaporation of Ag on MACE grown Si NWs [123] (Figure
13(a, b)) and chemical process by dipping the CVD grown Si NWs in a
solution containing AgNO3 (0.001 M)/HF (0.26 M) for 60 s ((Figure 13(c,
d))) [13]. Different metal NPs decorated Si NWs HS systems were
fabricated due to their SPR modified optoelectronic properties, excellent
photocatalytic nature under visible light illumination and outstanding
SERS detection. In most of the cases, these metal NPs were loaded on Si
NWs surface by electroless deposition technique using chemical solution.
However, bimetal NPs decorated Si NWs system showed superior
properties the same in case of single metal NPs decoration. Here is a list
of metal NPs decorated (Table 1) Si NWs HS and their synthesis process.
Figure 12. TiO2 NRs grown on vertical Si NW arrays fabricated by dry etching. (a) FESEM Cross sectional image of middle portion of Si/TiO2
NWs branched HS arrays, showing dense and uniform coating of TiO2 NRs along the entire NW length. (b) Top view of Si NWs uniformly covered
with high-density TiO2 NRs that grew laterally out of the side surfaces. The lengths of Si NWs were ∼15 μm. Reprinted with permission from
[65].SEM (c) cross-section and (d) top view images of 3D Si/ZnO NW branched HS with ZnO NW branches on Si NW cores with 10 min RIE.
Reprinted with permission from [133]. (e) Tilted (45°) SEM images of hierarchical Si/InxGa1‑xN nanowire arrays on Si (111) substrate with x = 0.08-
0.1. A fractured wire reveals the cross section (f) showing that InGaN nanowires grow vertically from the six Si wire facets. Reprinted with
permission from [132]. SEM images of (g) Si/Au, (h) Si/Ge, (i) Si/GaAs, and (j) Si/GaP branched NWs HS. TEM images of (k) Si/CdS, (l) Si/Au,
(m) Si/Ge, (n) Si/GaAs, and (o) Si/InP branched NWs HS. Reprinted with permission from [136]. (p) SEM images of branched Si/GaN NW HS
prepared following deposition of 0.1 M Ni catalyst precursor solution. Reprinted with permission from [137]. (q-t) Typical TEM images of Si/SiO2
heirarchical HS. (q) Low-magnification view; (r, s) the tip terminating with a Sn ball; and (t) a flat plate-like tip-end after the Sn ball dispatch.
Reprinted with permission from [138].
Figure 13. SEM images: evaporated Ag on CVD grown Si NWs, (a)
before and (b) after annealing. Reprinted with permission from
[123]. (c) Si NWs/Ag NPs interface; (d) a single silicon nanowire
decorated with Ag NPs; (A, B) high-magnification images on the
upper and lower parts of a Si NW/Ag NPs, respectively. Reprinted
with permission from [13].
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Sometimes the NPs are coated on Si NW radial and branched HS for
improving the device properties. Sudhagar fabricated high open circuit
voltage QD sensitized solar cells exploring new electrode architectures
[130]. The semiconductor NPS CdS and CdSe were sensitized directly on
Si NW/ZnO branched HS by solution process [130].
4. NOVEL PROPERTIES & EMERGING APPLICATIONS
Recently, semiconductor nanostructures mainly NWs and NRs
and their HSs have drawn a lot of research interest because of their unique
physical properties, which are interesting from the view point of different
device applications. However, due to their high density of electronic state,
diameter dependent band gap, enhanced surface scattering of electrons
and phonons, increased exciton binding energy and high aspect ratio,
NWs exhibit unique electrical, magnetic, optical, thermoelectric and
chemical properties as compared to their bulk parent counterparts. NW
HSs provide additional structural complexity and functionality and by
choosing suitable external materials for the HSs, one can modify the
properties of Si NWs according to the requirements in device
applications. In this section, we will briefly demonstrate some interesting
properties of Si NWs and their improvements strategies by incorporating
suitable materials to form HSs and their device applications.
4.1. Light Emitting Properties
Despite the indirect bandgap of bulk Si, Si nanostructures emit
light with tunable wavelength depending on size, doping and surface
conditions. As a result, Si NW based LEDs have been studied. Efficient
visible-NIR PL has been observed at RT from Si NWs and porous Si
NWs [24, 73, 157-165]. However, the mechanism of PL from Si NWs is
often debated. While several studies emphasize the effect on the visible
PL from Si NWs of the quantum confinement (QC) effect on the carrier, a
strong influence of defects in the PL has been recognized in other studies
[24, 73, 157, 158, 163]. Si NWs are covered with a native oxide layer, and
a non-bridging oxygen hole center (NBOHC) and oxygen vacancy (VO)
within an oxide matrix in a core-shell Si/SiOx nanostructure are also
found to be responsible for the visible-NIR PL at RT [24, 159, 162, 164,
165]. Phonon assisted radiative recombination has also been proposed as a
powerful mechanism of NIR PL in core-shell Si/SiOx HS [160, 161]. In
recent years, Si NW based hybrid LEDs promise improvement in the PL
and electroluminescence (EL), compared to the bare Si NW LED or other
hybrid LED [88, 166-169]. PL and EL properties of Si NW/ZnO HS have
been studied extensively in the last decade [74, 96, 166-168, 170]. In most
of the cases, n-type ZnO is deposited on p-type Si NWs/NRs to form
core-shell structure or NCs decorated p-n junction hybrid LED. Enhanced
visible PL emission was observed by Chang et al. by depositing thin layer
of ZnO by ALD process on CVD grown Si NWs [168]. Both the
increased surface area resulting from the enhanced structural aspect ratio
and the antireflective characteristics inherent to the NWs structure were
believed to be responsible for the orders of magnitude enhancement in
emission intensity [168]. Ghosh et al. have grown Si NWs/ ZnO core-
shell structure by sputter-deposited ZnO on MACE grown Si NWs and
reported that PL spectra of HS was red-shifted with quenching in intensity
compared to the PL spectra of bare Si NWs [74]. This phenomenon was
explained by Forster type resonant energy transfer (FRET) from the
defect induced energylevels in ZnO to the band edge of Si in the close
proximity. FRET efficiency depends on the overlap between the ZnO
(donor) emission and Si NCs (acceptor) absorption energy and the
distance between the energy donor and acceptor (<10 nm (resonant
distance)) [74]. Note that the MACE grown Si NWs are decorated with
ultra-small Si NCs. Figure 14(a) shows a comparison of the broad visible-
NIR PL from the Si NWs/NCs before and after the deposition of the ZnO
overlayer. For comparison, PL spectrum of the as-grown ZnO film on a
clean Si wafer is also included. Figure 14(b) and (c, d) illustrates a
schematic of the HS, the energy band diagram of the Si-SiOx-ZnO HS and
the pathway for the proposed energy transfer from the ZnO to the Si NCs
[74]. It was believed that due to the ultrathin intermediate dielectric SiOx
layer, the energy is transferred by the FRET process from the defect
assisted recombination of the carries in the ZnO shell that excites the Si
NCs on Si NWs core close to the defects and the subsequent de-excitation
Table 1. Summary of the different metal NPs decorated Si NW HSs reported in the literature.
HS System NPs Decoration Process References
Si NW/Ag Chemical [13, 14, 61, 124, 125, 174, 176, 199]
Si NW/Ag Thermal Evaporation [123, 126, 127]
Si NW/Au Chemical [14, 124, 128, 176]
Si NW/Au Thermal Evaporation [126, 129]
Si NW/Pt Chemical [14, 124, 128]
Si NW/Pd Chemical [14, 124, 128, 176]
Si NW/Co Chemical [124]
Si NW/Cu Chemical [174, 176, 219]
Si NW/Rh Chemical [122]
Si NW/Pd-Ni Chemical [176]
Si NW/Au-Pd Chemical [176]
Figure 14. (a) Comparison of the PL spectra with 405 nm laser
excitation for samples P and Q (Si NWs) before and after ZnO
coating; spectrum from ZnO film on Si substrate is shown for
comparison. (b) Schematic of the hybrid Si/ZnO HS. The structure
consists of Si NCs decorated Si NW, coated with ZnO. There is a
thin layer of SiOx in the fence of Si. (c) Band diagram of the sample
Si/ZnO in the interface of Si NC-SiOx-ZnO immediately after
illumination. (d) The magnified view of a portion of (c). Reprinted
with permission from [74].
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process gives rise to red shifted visible PL emission via radiative
recombination. Both the PL intensity and the PL decay time of the Si
NCs/NWs were reduced in presence of the ZnO layer that promote
efficient energy transfer [74]. Sun et al. have grown Si NW/ZnO core-
shell and ZnO QDs coated Si NWs by CVD and showed that in presence
of ZnO the PL spectra of the HS covered the entire visible region (400-
800 nm), which is important for the fabrication of white light LED [96].
Si nanotip/ZnO and nanoporous Si NW/ZnO p-n junction LEDs were
studied by means of EL [166, 170]. Room temperature EL was observed
under a broad range of applied voltage as shown in Figure 15. No EL was
detected under reverse bias. The EL signal becomes detectable when a
forward direct current (dc) bias of 5 V is applied across the device with
Au as cathode and Ag as anode. The emission stability could last about 7-
8 min persistently when applying a forward bias of 15 V [166]. This
indicates that Si/ZnO HS NWs could be a potential light source for future
solid-state white LED devices [166, 170]. Enhanced PL and photoactivity
was observed from plasmon sensitized n-Si NWs/TiO2 HSs [103]. The
synergistic effect between TiO2 emission and Au SPR involvement were
responsible for the enhanced photoactivity in the HS [103].
Solid-state white light sources are in great demand for future
day-to-day lighting applications. Si NWs based broadband white LEDs
have been successfully demonstrated [88, 166, 169]. Moon et al. have
demonstrated white light LED based on surface-oxidized porous Si NWs
arrays and amorphous In-Ga-ZnO capping [169]. Katiyar et al. have
fabricated Si/ZnS radial NW HS arrays for white LED on Si substrate
[88]. Figure 16(a) shows the schematic diagram illustrating coaxial Si
NW/ZnS/AZO radial HS LED device [88]. A white light emission could
be directly observed by the naked eye when sufficient forward bias was
applied across the device with AZO as the cathode and Al as the anode.
The EL spectra of Si/ZnS radial heterojunction arrays at different applied
bias in the range of 2-13 V are shown in Figure 16(b) [88]. The
mechanism of visible light emission through radiative recombination of
charge carriers injected in the Si NWs/ZnS radial heterojunction was
explained using a energy band diagram under zero and forward bias, as
shown in Figure 16(c-d), respectively.[88] The LED performance was
excellent within a broad range of temperature (10-400K) [88]. In recent
years, researchers have concentrated their attention in fabricating Si NWs
based LED heterostructured with different plasmonic material, group IV,
II-VI and III-V semiconductors, organic semiconcuters etc.
4.2. Antireflective Properties
Aligned Si NWs exhibit excellent antireflection properties over
a broad range of wavelength, which is highly beneficial for photovoltaic
application. Low reflectivity implies higher absorption and excitation of
carriers, finally leads to enhanced radiative recombination in the form of
enhanced PL Si NWs. MACE grown Si NWs show higher antireflective
properties as compared to the Si NWs grown by other techniques. Due to
multiple reflections on the inner surface of the vertical Si NWs array and
a broad range of size distribution of the Si NCs on the surface of Si NWs,
the absorption is significantly high in the case of MACE grown Si NWs
over the entire range of wavelength. A refractive index gradient from the
top to the bottom of the Si NWs is also be the possible reason for the
ultra-low reflectivity [151]. Variety of materials has been used to increase
the light trapping capability for generating free carriers to achieve high
efficiency solar cell. G. Fan showed that the Si NW/graphene heterojunction
exhibited enhanced light trapping and faster carrier transport compared to
the graphene on planar Si which could lead to the higher solar cell
performance of the n-Si NW/graphene solar cell [171]. Figure 17 shows
the schematics of (a) graphene/planar Si and (b) graphene/Si NW
junctions. Figure 17(c) shows the comparison of the reflection spectra of
planar Si, Si NWs, graphene/Si, and graphene/Si NWs [171]. Very
recently W. C. Wang et al. fabricated solar cells composed of Si NWs
arrays and an Al2O3/TiO2 dual-layer passivation stack on the n+ emitter
and got 20% efficiency due to the highly antireflective coating of
Al2O3/TiO2 [151]. Figure 17(d) shows the TEM images of the Si NWs
covered with the Al2O3/TiO2 dual-layer passivation stack. Figure 17(e)
shows the total reflectance for the Si NWs samples covered with Al2O3,
TiO2, and the Al2O3/TiO2 dual-layer passivation stack. Compared to the
pristine Si NWs, it can be seen that the total reflectance is reduced by the
individual Al2O3 and TiO2 passivation layers with the reflectance ranging
from 1.5 to 2.5% between 400 and 700 nm. This enhanced reduction in
the total reflectance was attributed to the refractive index gradient caused
by the insertion of a low refractive index layer between Si NWs and air
[151]. J. Y. Jung et al. introduced a ZnSe QD layer over Si NW solar cells
and showed that it considerably enhanced external quantum efficiency
(EQE) over broadband wavelengths due to the superior light trapping
[172]. Figure 17(f) shows the comparison of the reflectance of Si NWs of
different length before and after incorporation of ZnSe QD. The insertion
of ZnSe QDs on the Si NW solar cell significantly reduces Fresnel
reflection at the silicon/air interface because of the refractive index
Figure 15. EL spectra of Si NW/ZnO HS under forward bias at 5,
10, 15, and 20 V at RT. Reprinted with permission from [166].
Figure 16. (a) Schematic diagram illustrating coaxial Si
NW/ZnS/AZO radial HS LED. (b) Room-temperature EL spectra of
Si NWs/ZnS radial HS arrays under different forward bias. Energy
band diagram of the Si NWs/ZnS core-shell heterojunction under (c)
zero applied bias (d) different forward bias condition. Reprinted with
permission from [88].
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mismatch. Figure 17(g) shows that the absorption enhancement is more in
case of 250 nm length Si NWs compared to the 500 nm Si NWs and as
result they got highest cell efficiency for 250 nm length Si NWs, though
the bare Si NWs solar cell shows the opposite trends [172]. The
enhancement in absorption in Si NWs/ZnSe QD significantly enhanced
the photodetection and photocatalytic performances of the Si NWs also
[173]. Metal NPs coated Si NWs show enhanced absorption due to the
SPR effect which is beneficial for the enhancement of photovoltaic,
photoresponse and photocatalytic activity of the Si NWs and its HSs [103,
123, 127]. Though sometimes due to the overcoating the light trapping
capability for generating free carriers is reduced slightly but effective
carrier separation and collection are enhanced which could enhance the
solar cell performance.
4.3. Photocatalytic Properties
Photocatalysis has attracted much interest because of its
potential application in clean energy sources and to degrade organic
pollutants from water. Mainly wide bandgap semiconductors (TiO2) are
commonly used as photocatalysts because of their wide ranging band gaps
and stability towards chemical and photochemical corrosion. Si NW is an
ecofriendly, photostable, inexpensive and nontoxic material and is able to
utilize near UV, visible and NIR light for the degradation of organic
pollutants [128, 174-176]. High aspect ratio, Si NCs decorated Si NWs
with Si-H terminated surface grown by MACE have shown excellent
photocatalytic nature under visible light illumination [14, 174, 175]. In
comparison with the PEC process, direct photocatalysis is a simpler and
less expensive approach for H2 production, as it eliminates the need for a
conducting substrate and application of bias, despite its lower efficiency
of charge separation. Liu et al. have produced H2 by simple pure water-
splitting by Si NWs grown by MACE under light illumination [175].
From the apparent quantum efficiency (AQE) measurements, solar to
chemical conversion efficiency of Si NWs was found comparable to those
of many other visible light photocatalysts [175].
Metal NPs decorated Si NW HSs are studied extensively for the
photodegradation of organic pollutants, such as methylene blue (MB),
methyl red (MR), methyl orange (MO), phenol, rhodamine 6G (R6G),
benzyl alcohol, rhodamine B (RhB) etc. The main advantages of using
noble metals with Si NWs as photocatalyst are: (i) the high work function
of noble metals (Pt, Pd, Au, Ag, etc.) facilitates the electron transfer from
Si NWs to noble metal in the Schottky junction, which significantly
reduces the recombination of photogenerated e-h pairs; (ii) higher
absorption due to the SPR effect of noble metals. Shao et al. have studied
the photodegradation of RhB by Si NWs modified with Au, Ag, Pd, Pt,
and Rh [14]. They showed that the H-Si NWs are excellent photocatalyst,
though not as good as Pt modified ones because of its highest work
function (5.65 eV) [14]. Figure 18(a, b) shows the schematic of the e-h
generation in H-Si NW and metal-semiconductor photocatalyst under
light illumination, while Figure 18(c) shows the degradation of RhB by
various metal modified Si NW catalysts as a function of time [14].
Megouda et al. showed that when the H-Si NWs were loaded with Cu
NPs, the photocatalytic activity was significantly enhanced [174]. A lot of
research articles have been published for understanding the photocatalytic
properties of the Si NWs decorated with different plasmonic metals [128,
174, 176]. F. Liao et al. studied the effect of Au-Pd bimetal and Pd-Ni
bimetal decoration on Si NWs to degrade p-nitroaniline [176]. The
bimetal decorated Si NWs shows the higher degradation rate as compared
to the bare Si NWs or the single metal decorated Si NWs [176]. C. Y.
Chen has demonstrated the Si NWs/TiO2 microparticle combined
photocatalysts, which can respond to both UV and visible light more
efficiently than conventionally used TiO2 for the degradation of RB5 azo
dyes [177].
3D branched Si NWs/NRs HS realized with radial ZnO NWs on
Si NRs surface have been fabricated by Song et al. and the photocatalytic
properties of the 3D hybrid structure was studied [178]. Figure 18(d)
shows a schematic representation of the 3D Si/ZnO NWs HS [178]. It was
demonstrated that the branched structures improved the light harvesting
ability due to an increased optical path by multi-scattering at its enlarged
contact area with the sample solution. The catalytic effect in degradation
of methyl red of the 3D Si/ZnO NWs HS were higher than the ZnO NWs
on flat Si substrates, as shown in Figure 18(e) [178].
Si NWs HS are also used as photocathode and photoanode in
photoelectrocatalysis and it shows excellent photoelectrochemical activity
for the degradation of organic pollutants and water splitting under UV,
visible-NIR light illumination. Branched NW HSs such as Si /TiO2[65,
134], Si/ZnO[141], Si/InGaN[132], core shell HSs such as Si/Fe2O3[104],
Si/TiO2[101, 102], p-Si/SnO2/Fe2O3[150], Si/TiO2/ZnIn2S4[179] have
shown excellent photoelectrocatalytic activity under visible illumination.
Figure 17. Schematics of (a) graphene/Si (G/planar Si) and (b) graphene/Si NWs (G/SiNW) junctions. (c) Reflection spectra of planar Si, Si NWs,
G/Si, and G/SiNWs. Reprinted with permission from [171]. (d) TEM image of the Si NWs covered with the Al2O3/TiO2 dual-layer passivation stack.
(e) Total reflectance for the Si NWs samples covered with Al2O3, TiO2, and the Al2O3/TiO2 dual-layer passivation stack. Reprinted with permission
from [151]. (f) Optical reflectance spectra of various Si NW solar cells; short Si NWs (250 nm), short Si NWs (250 nm) with ZnSe QDs, long Si
NWs (500 nm), and long Si NWs (500 nm) with QDs. (g) Absorption enhancement of Si NW solar cells with ZnSe QDs; 250 nm (red) and 500 nm
(blue) Si NW array. Reprinted with permission from [172].
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4.4. Photovoltaic Properties
The Si NWs are extremely versatile and compatible to create
homo and heterojunction with different material and these HS are
promising candidates to convert photons to charges efficiently. The key
steps involved in solar cells are photon absorption, exciton transport,
exciton dissociation/charge separation, and charge collection. Recently,
Yuan et al. also emphasized that beside morphology, growth chemistry
also play significant role for the performance of Si NWs based solar cell
and importantly MACE grown Si NWs have shown superior photovoltaic
properties over the NWs grown by any other conventional method [180].
In recent years, researchers have concentrated their attention considerably
in choosing appropriate material to form HS with MACE grown Si NWs
in order to improve the photovoltaic properties. Table 2 summarizes the
recent progress in Si NWs based solar cell and its efficiency in terms of
growth methodology of Si NWs, HSs with different suitable materials and
HSs type. However, there are three types of Si NWs HS solar cells: (a) p-
n homojunction [44, 142, 143, 181, 182], (b) Schottky junction [121, 183-
185] and (c) p-n heterojucntion [75, 92-94, 146, 151, 156, 186, 187].
Figure 18. Schematic of the e-h generation in (a) H-Si NW and (b) metal-semiconductor photocatalyst. The mechanisms involved: (left) Ray
promotes the formation of the electron and hole; (middle) the electron transfer to hydrogen atom on the surface; (right) hole is used in the formation
of the OH* groups promoting oxidizing processes. (c) Degradation of RhB under various Si NW catalysts at different times (days). Reprinted with
permission from [14]. (d) Schematic Diagram of the 3D radial Si NW/ZnO arrays. (e) Comparison of the photodegradation of MR by 3D branched
HSs and the same for the ZnO NWs on flat Si. Reprinted with permission from [178].
Table 2. Summary of the Si NW HSs based solar cells describing the Si NWs fabrication process, heterostructured material, types of HS and the
efficiency of the respective solar cell.
Si NWs Fabrication
Method Heterostructure Heterostructure Type
Solar Cell
Efficiency (%) References
CVD Si NW/SiO2/Si Raidal 3.4 [142]
RIE Si NW/Si Radial 5.3 [143]
CVD Si NW/Si Radial 7.9 [44]
MACE Si NW/Si Radial 9.3 [181]
MACE Si NW/graphene Axial 7.6 [184]
MACE Si NW/graphene Axial 7.7 [185]
MACE Si NW/P3HT/graphene Axial 10.3 [184]
MACE Si NW/PDEF Radial 5.9 [94]
MACE Si NW/P3HT Radial 9.2 [93]
MACE Si NW/PEDOT:PSS Radial 9.7 [187]
MACE Si NW/TAPC/PEDOT:PSS Radial 13.1 [92]
MACE Si NW/PbS NPs Decorated 6.53 [186]
MACE Si NW/Carbon NPs Decorated 9.1 [75]
MACE Si NW/SiNx Radial 17.75 [146]
MACE Si NW/Al2O3 Radial 22.1 [145]
MACE Si NW/Al2O3/TiO2 Radial 18.5 [151]
MACE Si NW/ZnO Branched 14 [156]
MACE Si NW/Pt NPs Decorated 8.14 [121]
MACE Si NW/Carbon/Pt Radial/NPs Decorated 10.86 [183]
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Si NW based radial and axial p-n homojunction HSs were
prepared and their photovoltaic properties were studied by different
groups. The power conversion efficiency (PCE) was high compared to the
bulk-Si p-n junction. The highest reported PCE was 9.3% for MACE
grown Si NWs, but it may not be sufficient enough [181]. The importance
of good electrical contact, formation of surface and interface passivation
to reduce the carrier recombination to improve the performance of Si
NW-based solar cell was eventually realized. By using a-SiN:H for
passivating Si NWs surface, Kim et al. have shown that PCE of the solar
cell improved significantly from 7.2% to 11.0% [188]. Very recently, Lin
et al. have demonstrated high performance Si NW-based solar cell
through surface passivation by using the SiO2 and SiNx and the PCE was
17.75% [146]. To improve the photovoltaic parameters of Si NWs based
solar cell, p-i-n and tandem p-i-n+-p+-i-n junction Si NW solar cell are
also studied [182]. Lin et al. fabricated Schottky junction-based Si
NWs/graphene solar cell by transferring CVD grown graphene on Si NWs
array grown by RIE [185]. They found the maximum PCE up to 7.7%.
They studied theoretically the cell performance and concluded that by
controlling graphene layer number, tuning graphene work function and
adding an antireflection film, a maximal theoretical PCE 9.2% could be
achieved [185]. Zhang et al. experimentally found that 4 layers of
graphene exhibits the best performance because the transmittance is
reduced when number of graphene layers is higher than 5 [184]. They
showed that by inserting P3HT conductive polymer (10 nm) as electron
blocking layer, which contributes to prevent electrons transport from Si to
graphene, the maximum PCE could be achieved as 10.3% [184]. Figure
19(a, b) illustrates the energy band of the Si nanoarray/graphene Schottky
junctions (a) without and (b) with a P3HT electron blocking layer. Figure
19(c) displays the schematic illustrations of the Si NH/P3HT/graphene
HS. Photovoltaic characteristics of the Si NH/P3HT/graphene (4-layer)
HS before and after HNO3 doping are depicted in Figure 19(d). The Si
NWs/Carbon QDs heterojunction with a barrier height of 0.75 eV
exhibited excellent rectifying behavior with a rectification ratio of 103 at
0.8 V in the dark and PCE as high as 9.10% under AM 1.5G irradiation.
It is believed that such a high PCE comes from the improved optical
absorption as well as the optimized carrier transfer and collection
capability [75]. More recently, Wang et al. fabricated solar cells
composed of Si NWs arrays and an Al2O3/TiO2 dual-layer passivation
stack on the n+ emitter [151]. The Si NW/Al2O3/TiO2 HS solar cell
showed 11% increased short-circuit current density and 20% efficiency
after performing forming gas annealing (FGA) [151]. Figure 20(a) shows
the schematic diagram of the Si NW/Al2O3/TiO2 HS solar cell with the
n+-emitter/p-base structure, along with a band diagram and (b) shows the
illuminated I-V characteristics of the cell [151]. H. Savin et al. fabricated
greater than 22% efficient solar cell with a surface area of 9.0 cm2 [145].
They used optimal surface reflectance without affecting surface
recombination, due to the outstanding surface passivation achieved with
conformal ALD coated Al2O3. Auger recombination was avoided by
using a surface sensitive 280-μm-thick interdigitated back contact (IBC)
where the junction and the contacts are placed at the back of the cell. The
dependence of the incident angle of the solar spectrum and the latitude on
the performance of the solar cell was extensively studied by the group
[145]. Figure 20(c) and (d) shows the EQE of the cell for different angles
of incidence and the relative photocurrent with respect to photocurrent at
normal incidence, for different light incidence angles. Figure 20(e) shows
the relative increase in total delivered energy throughout the year for the
HS solar cell compared to the reference cell as a function of latitude and
for optimally tilted cells, while 20(f) shows the daily relative increase
over the year, in the energy generated by the HS solar cell compared with
the reference cell for different locations [145].
Recently, immense effort has been made for realizing efficient
Si NWs-based organic HS solar cells to reduce cost by adopting low-
temperature, scalable, and soluble processes of conjugated polymers such
as: P3HT, poly(3,4-ethylene dioxythiophene):poly-(styrenesulfonate)
(PEDOT:PSS), 1,1-bis[(di-4-tolylamino) phenyl]cyclohexane (TAPC)
and p-poly(9,9-diethylfluorene) (PDEF) etc. [92-94, 187]. However, the
maximum PCE obtained till now are 5.9%, 9.2%, 9.7% using PDEF [94],
P3HT [93], PEDOT:PSS [187] as the conjugated polymer, respectively.
Though the PCEs are not high enough, it could be improved by surface
passivation, nature and size of the top and bottom contact and the
dimension of the Si NWs. Very recently Yu et al. have fabricated 13.1%
Si NWs/TAPC/PEDOT:PSS organic solar cell by incorporating a thin
layer of TAPC in between Si NWs and PEDOT:PSS [92]. Figure 21
illustrates the device with the device parameters with and without the
intermediate TAPC layer [92].
Photovoltaic properties of Si NWs based HS in low cost liquid-
state junction photoelectrochemical (PEC) solar cell has also emerged.
Peng et al. demonstrated PEC solar cell consisting of vertical Si NW
arrays, which exhibited remarkable photoactivity and photovoltaic
property in redox electrolyte containing HBR and Br [189]. A 3D NW
architecture consisting of 20 μm long MACE grown Si NWs and dense
TiO2 NRs yielded a PEC efficiency of 2.1%, which is three times higher
than that of TiO2 film-Si NWs having a core-shell structure [65].
However, such PEC solar cell still suffers not only from carrier
recombination loss and poor carrier collection, but also from photo-
corrosion, and photo-oxidation of Si NW surface, which lead to poor
device performance and degradation. By decorating PT NPs on Si NWs,
Peng et al. fabricated PEC solar cell with PCE up to 8.14% [121]. Wang
showed that the PCE could be enhanced to 10.86% by incorporating a thin
carbon layer in between the Pt NPs and Si NWs [183].
The photovoltaic properties of complex Si NWs based HSs such
as branched Si/ZnO [156]; CdS, CdSe QD sensitized branched Si/ZnO
NWs [130]; hierarchical p-Si/n-CdS/n-ZnO nanoforest HS [190] etc. are
also studied. Z. Feng et al. recently studied the photovoltaic properties of
branched Si/ZnO HS solar cell [156]. The PCE of the solar cell was
improved by 14% and short-circuit current was improved by almost 24%
on average, respectively [156]. However, the performances of the
fabricated solar cell are not high enough to utilize in commercial devices.
4.5. Electrical Properties
Radial (or core shell) p-n junction Si NW HSs facilitate carrier
collection along a short collection path, i.e., the radial path demonstrate
excellent electrical properties, which is most significant for solar cell
Figure 19. Energy band diagrams of the Si nanoarray /graphene
schottky junctions (a) without and (b) with a P3HT electron blocking
layer. (c) Schematic illustration of the Si NH/P3HT/graphene HS. (d)
Photovoltaic characteristics of the Si NH/P3HT/graphene (4-layer)
array before and after HNO3 doping. Reprinted with permission from
[184].
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Figure 20. (a) Schematic diagram of the Si NW/Al2O3/TiO2 HS solar cell with the n+-emitter/p-base structure, along with a band diagram. (b)
Illuminated I−V characteristics of the cell. (c-f) Angle-dependent EQE and daily/yearly energy production enhancement of the IBC-Si NW
photovoltaic device. Reprinted with permission from [151]. (c) EQE of the cell for different angles of incidence. (d) Relative photocurrent, with
respect to photocurrent at normal incidence, for different light incidence angles for both the b-Si (circles) and reference (squares) solar cells. Light
incidence angle θ is defined in the inset. (e) Relative increase in total delivered energy throughout the year for the b-Si cell compared with the
reference cell as a function of latitude and for optimally tilted cells. (f) Daily relative increase, throughout the year, in the energy generated by the b-
Si cell compared with the reference cell for different locations. (60° latitude corresponds to Helsinki, 40° to Barcelona). Reprinted with permission
from [145].
Figure 21. (a) Chemical structure of small-molecule TAPC. (b) Fabricated schematic device. (c) Energy band diagram of a hybrid heterojunction
solar cell based on silicon and PEDOT:PSS with an intermediate TAPC layer. (d) Reflectance (R) and external quantum efficiency (EQE) of the
fabricated devices with and without the TAPC layer. (e) Current density-voltage characteristics of the hybrid solar cells under a simulated AM1.5G
illumination condition. (f) Dark current density-voltage characteristics in semi-logarithm plot. Reprinted with permission from [92].
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applications. The surface dependent unique electronic and electrical
properties of Si NWs and its HS attracted considerable research attention
for the fabrication of field effect transistor (FET). In vacuum, the
conductivity of Si NWs dramatically decreases, whereas the hole mobility
increases. Si NWs with appropriate surface passivation i.e. the Si NWs
HS can significantly improve the performance of Si NW based FETs
[191-194]. Zhou et al. investigated the stability of Si NW/Al2O3 HS FET
and showed that FET based on Si NWs exhibit good device performance
for at least 4 months in physiological model solutions at 37 °C when the
Si NWs are covered with 10 nm Al2O3 [194].
Very recently, Chen et al. fabricated Si NWs HS FET modified
by magnetic graphene with long-chain acid groups (MGLA) synthesized
via Friedel-Crafts acylation. The HS FET was used for the detection of
apolipoprotein A II protein (APOA2 protein), a biomarker for the
diagnosis of bladder cancer [193]. Figure 22(a) shows a schematic flow
chart of Ab-MGLA/poly-Si NW FET biosensor preparation. They have
optimized the conditions for Ab-MGLA loading after investigation by
reacting with various concentrations of Ab-MGLA, ranging from 0.025 to
1 µg mL-1 and corresponding to 1 ng mL-1 protein (Figure 22(b)). The
current of the Ab-MGLA/poly-Si NW FET biochip decreased with
increasing concentration of Ab-MGLA in the reaction. The relative
current change (-ΔI/I0, in %) at each concentration of Ab-MGLA in the
reaction was 6.3% at 0.025 µg mL-1, 11.3% at 0.125 µg mL-1, 22.6% at
0.625 µg mL-1 and 23.6% at 1.0 µg mL-1. The device was compared with
that obtained using short-chain acid groups (MGSA). Compared with
MGSA, the MGLA showed a higher immobilization degree and
bioactivity to the anti-APOA2 antibody (Ab) due to its lower steric
hindrance [193]. Constantinou et al. have fabricated N,N
dimethylformamide (DMF) passivated Si NWs FET [191]. Figure 22(c)
shows the HRTEM image of the DMF modified the Si NWs. The
oxidizing agent DMF modified the Si NWs to a single-crystal Si NWs
core with 30 nm diameter and a ∼5-8 nm thick amorphous oxidized
polyphenylsilane shell which could lead to a hysteresis reduction of over
300 times (from 32 to 0.1 V) [191]. One of the lowest trap densities,
3.71010 cm−2 was achieved with DMF-dispersed NW FETs and near-
zero hysteresis of 0.1 V is shown in Figure 22(d) [191]. Cho et al. have
shown the experimental evidence of ballistic transport in cylindrical gate-
all-around twin Si NWs metal oxide semiconductor FET with 4 nm radius
and the gate length ranging from 22 to 408 nm [195]. They observed
strong transconductance overshoot in the linear source-drain bias regime
in the devices with channel length shorter than 46 nm [195]. Enhanced
thermoelectric performance was also observed for Si NWs and its HSs
[196, 197].
4.6. Sensing Properties
Si NWs provides excellent charge transport properties,
biocompatibility, and environment friendly and are demonstrated as
excellent candidate for sensing of chemical and biological molecules. Si
NWs are flexible to create HS with different kinds of material and the Si
NWs based HS show excellent sensing properties compared to the bare Si
NWs. Si NW HSs based sensors are classified into three major groups: (i)
chemical sensor, (ii) bio-sensor and (iii) gas sensor. Different sensitive
methods, including optical-based detection (surface enhanced Raman
scattering (SERS) or fluorescence), mechanically based detection
(cantilevers), and electrical-based detection (FET) are attractive in a
number of sensing applications.
4.6.1. Chemical Sensors
Si NWs coated with metal NPs, mainly Ag, Au, Pd, Cu, and Pt
have been used as SERS effective substrates for sensing a variety of
inorganic and organic molecules, such as: 4-methylbenzenethiol [125],
crystal violet [27, 198, 199] (CV), RhB [200], R6G [13, 27, 198, 199],
MO [198], nicotine [27], carbaryl [199], calcium dipicolinate [201]
(CaDPA), p-aminothiophenol [198] (PATP), 4-aminothiophenol [202]
etc. Shao et al. have shown that SERS effective Ag NPs decorated Si
NWs can detect R6G (110−16M), CV (110−16M) and nicotine
(110−14M) very efficiently [27]. Figure 23(a, b) shows the Raman
spectra obtained from Ag modified Si NWs coated with 25 µl of
110−16M R6G solution and 110−14M nicotine solution [27]. Han et al.
fabricated highly sensitive, reproducible, and stable SERS sensors based
on well controlled Ag NPs decorated Si NWs building blocks and utilized
them for the detection of a low concentration of carbaryl (0.01 mg/mL)
Figure 22. (a) A schematic of the process of poly-Si NW FET device surface modification and Ab-MGLA/poly-Si NW FET bio sensor preparation.
(b) ISD-VG curves of the reaction of [Ab-MGLA] with a, b, c, and d and the corresponding ISD-VG of a′, b′, c′ and d′ under 1 ng/mL protein binding.
Reprinted with permission from [193]. (c) HRTEM image of Si NWs dispersed in DMF showing a single-crystal Si core with 30 nm diameter and a
∼5-8 nm thick amorphous oxidized polyphenylsilane shell. (d) I-V characteristics of DMF-treated Si NW FETs with 15 NWs in the channel. The
transfer characteristics obtained at VD = -0.5 V showing a very low hysteresis of 0.1 V and a device mobility of 15 cm2V−1s−1. Reprinted with
permission from [191].
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residues on a cucumber surface with 1s acquisition time [199]. Figure
23(c) shows the microscope image of a single Si NW/Ag NP transferred
to the rough cucumber surface. Figure 23(d) clearly shows that the SERS
spectra of a carbaryl contaminated cucumber surface is enhanced by a
single Ag NP decorated Si NW as compared to the Raman spectrum of
the pure cucumber surface [199]. Si NW/metal NP based surface
enhanced fluorescence spectra are also used to detect some lanthanide
ions, such as Pr3+, Nd3+, Ho3+, and Er3+ etc. [203]. Wang et al. have
fabricated fluorescence sensor by naphthalimide derivative onto the
surface of Si NWs for H2S detection [204].
Another way of sensing chemical molecules is Si NW HS based
FET. Among various chemical sensing techniques Si NWs based FET
was first introduced in 2001 by Cui et al. and since then it has attracted
much attention in the semiconductor industry [205]. Si NWs FETs
modified with calmodulin were used to detect the calcium ions (Ca2+),
which are important for activating biological processes such as muscle
contraction, protein secretion, cell death, and development [205]. High
sensitivity detection of toxic heavy-metal cations such as Cd2+ and Hg2+
based on single Si NWs-FET sensor has been demonstrated by Luo et al.
[206] Si NW surfaces were modified with mercaptopropyl silane
(MPTES) and the HS FET was capable to detect Cd2+ and Hg2+ as low as
10−4 and 10−7 M, respectively [206].
4.6.2. Bio-Sensors
SERS effective Si NW HSs are used for sensing a variety of
bio-molecules such as: DNA [27, 207], immune [208] and bacteria [199,
201] (E. coli, Bacillus anthraces etc.) etc. Shao et al. has shown that SERS
effective Ag NPs decorated Si NWs can detect Calf thymus DNA
(110−8mg/mL) very efficiently [27]. Han et al. have used the SERS
effective Si NWs/Ag HS sensor on a commercially available filter film for
label-free, real-time detection of E. coli in drinking water (Figure 24(a-b))
[199]. Si NW/metal NP HS SERS substrate is also used for the detection
of the label-free immunoassay [208]. Ag NPs coated Si NWs array exhibit
strong SERS spectra of mouse immunoglobulin G (mIgG), goat-anti-
mouse immunoglobulin G (gamIgG), and immune complexes formed
from 4 ng each of mIgG and gamIgG [208]. The enhancement of Raman
signal was explained by two kinds of plasmon resonance: local resonance
from every individual Ag NPs and surface electromagnetic wave on the
whole Si NW/Ag substrate surface [208]. M. S. Akin et al. has shown that
the metal NP coated Si NWs after surface modification by polydopamine
could be better SERS effective substrate [209]. Si NW HSs are also used
to detect bio molecules such as proteins and DNA using florescence
detection [210, 211]. Su et al. recently developed novel Au NP decorated
Si NW-based molecular beacons for high-sensitivity multiplex DNA
detection [210] while Han et al. used aminopropyltriethoxysilane
(APTES) modified Si NWs for fluorescence protein immunosensor [211].
FET sensors have a great potential to function as label-free, highly
accurate, and real-time detectors of low concentrations of proteins,
viruses, and DNA. In recent years, there has been magnificent
development of Si NWs FET based bio-sensors for the applications in
toxin testing, bio-molecule detection, medical diagnosis, food purity
detection, environmental monitoring, and many other areas of
biochemical industry [205, 212, 213]. Cui et al. have fabricated Si NWs
based FET for selective detection of biological and chemical species
[205]. Biotin-modified Si NWs were used to detect streptavidin down to
at least a picomolar concentration range (Figure 24(c)). In addition,
antigen-functionalized Si NWs showed reversible antibody binding and
concentration-dependent detection in real time. The conductance of
biotin-modified Si NWs increased rapidly to a constant value upon
addition of a 250 nM streptavidin solution and that conductance value was
maintained after the addition of pure buffer solution (Figure 24(d)).
Figure 23. Raman spectra obtained from Ag-modified Si NWs
coated with 25 µl of (a) 110−16M R6G solution and (b) 110−14M
nicotine solution. Extra curve in (a) is the Raman spectrum collected
from R6G powder. Reprinted with permission from [27]. (c)
Photograph of the detection of the pesticide residue on a cucumber
surface experiment (left) and the microscope image of a single Si
NW/Ag NP transferred to the rough cucumber surface (right). (d)
Raman spectra recorded from the rough cucumber surface with 1s
acquisition time and 50 objective. Curve I, clean cucumber surface;
curve II, carbaryl contaminated surface; curve III, SERS spectra of a
carbaryl contaminated surface modified by a single NW HS; curve
IV, SERS spectra of pure carbaryl. Reprinted with permission from
[199].
Figure 24. (a) Photograph of Si NWs assembled on a commercially
available filter film (with a pore size of 0.22 µm) and schematic of
the E. coli detection. (b) Raman spectra recorded from a blank thin
film and five different sites on the E. coli contaminated Si NW/Ag
NP HS thin film with 10s acquisition time and 50 objective.
Reprinted with permission from [199]. (c-g) Real-time detection of
protein binding. (c) Schematic illustrating a biotin-modified Si NW
(left) and subsequent binding of streptavidin to the Si NW surface
(right). The Si NW and streptavidin are drawn approximately to
scale. (d) Plot of conductance versus time for a biotin-modified Si
NW, where region 1 corresponds to buffer solution, region 2
corresponds to the addition of 250 nM streptavidin, and region 3
corresponds to pure buffer solution. (e) Conductance versus time for
an unmodified Si NW; regions 1 and 2 are the same as in (d). (f)
Conductance versus time for a biotin-modified Si NW, where region
1 corresponds to buffer solution and region 2 to the addition of a 250
nM streptavidin solution that was preincubated with 4 equivalents d-
biotin. (g) Conductance versus time for a biotin-modified Si NW,
where region 1 corresponds to buffer solution, region 2 corresponds
to the addition of 25 pM streptavidin, and region 3 corresponds to
pure buffer solution. Arrows mark the points when solutions were
changed. Reprinted with permission from [205].
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Addition of a streptavidin solution to an unmodified Si NW did not
produce a change (Figure 24(e)). Addition of a streptavidin solution in
which the biotin binding sites were blocked by reaction with 4 equivalents
of d-biotin produced essentially no change in the conductance of biotin-
modified Si NWs (Figure 24(f)). They have found the sensitivity of the
biotin-modified Si NWs to detect streptavidin binding down to a
concentration of at least 10 pM (Figure 24(g)) [205]. H. C. Chen et al.
have fabricated Si NWs HS FET modified by magnetic graphene with
long-chain acid groups (MGLA) and was used to the detection of
apolipoprotein A II protein (APOA2 protein), a biomarker for the
diagnosis of bladder cancer [193]. Modified with different organic
biomolecule, Si NWs HSs based FETs were used for the detection of
nucleic acids, proteins, protein-DNA interactions, small molecule-protein
interactions, cells, virus etc. and diagnosis of different kinds of disease
such as dengue, cancer etc [212, 213].
4.6.3. Gas Sensors
Si NW HSs have been exploited in gas sensing applications.
Compared to the conventional sensors based on flat Si films, the NWs gas
sensors exhibit many impressive characteristics, such as ultra-high
sensitivity, fast response time, higher selectivity, less power consumption
and better stability. Due to the small gap in between the NWs arrays with
high aspect ratio, a few gas molecules are sufficient to change the
electrical properties of the sensing elements. This allows the detection of
a very low concentration of gas within several seconds. Noh et al.
fabricated Pd coated Si NWs based sensors for the H2 and O2 sensing
[214]. Figure 25(a) shows the schematic pictures of Pd coated rough Si
NWs. The Pd coated rough Si NWs showed good reversibility and
excellent H2 sensing performance in terms of sensitivity (>300%),
response time (<3 s), and detection limit (∼5 ppm) [214]. Representative
response curves to varying H2 concentrations in air are shown in Figure
25(b). The sensitivity was defined as percent conductance variation ()
upon flowing H2 to initial conductance (0). The limit of detecting H2 was
5 ppm as shown in the inset [214]. Kim et al. fabricated Si NW/graphene
HS molecular gas sensor [117]. Figure 25(e) shows the schematics
illustrations of Si NW/graphene sensor and the configuration of the HS
for characterization. Figure 25(d, e) depicts the I-V characteristics and
band diagram of the Si NW/graphene HS. The HS device showed highly
rectifying property with an „on/off‟ current ratio of ~102 at 5 V,
indicating well defined behavior of Schottky diodes. Figure 25(f, g)
shows electrical responses of the Si NW/graphene diode as a molecular
sensor to periodic switches of O2 and H2 exposures with intervals of 10
and 30 s at a flow rate of 2500 sccm, respectively in air at room
temperature. The HS sensor shows high sensitivity of 1280% resistance
changes within 12/0.15 s response/recovery times (on/off) under H2
exposure, whereas 37% within 3.5/0.15 on/off times under O2 exposure
[117]. Thus, the selectivity is quite good for the NW HS. Ma et al. have
fabricated Si NWs/WO3 HS sensors for NO2 sensing [215]. However, we have discussed few attractive properties of the Si
NW HSs and their device application. These HSs show plenty of other
superior properties which are extensively studied for the fabrication of
different devices such as: Lithium-ion battery [55], super-capacitors
[216], drug delivery [217], gene delivery [218] etc. However, still there
are limitations towards the successful commercialization of these Si NW
HSs based devices. High performance, reproducibility, robustness,
stability and low cost integration are the key issues on the
commercialization of the Si NW HS devices. More intense research is
taking interest to fulfill the unresolved issues by improving the quality of
the Si NWs as well as the heterostructured material at the junction and
proper surface modification.
5. SUMMARY AND OUTLOOK
We have reviewed the recent progress in Si NWs and its
heterostructures. The Si NWs HS of different categories were discussed
with their growth strategies, enhanced properties and promising
applications associated with each type of HS. The advantage of these HS
in the application of various optoelectronic devices compared to the
conventional Si NWs based devices has been discussed, with particular
attention to improved device performance and stability of the device.
Parallel to the HSs morphology, the growth chemistry highly affects the
novel properties of the HS. The design and method of fabrication of the Si
NW based HSs are discussed in detail on the basis of selective
properties/applications. Many researchers are quite affirmative for the real
life applications of these HSs based on the efficient performances of Si
NWs based heterostructured devices, though the properties are still being
improved with advanced fabrication techniques and post-growth
processing. Such improvements provide further impetus to grow high
quality Si NW as well as high quality heterostructures with defect free
interface. Several strategies have been adopted for the low cost fabrication
and large area production of the HS for device applications. The problems
Figure 25. (a) Schematic of Pd coated rough Si NWs. (b) The real time electrical response curve of semi densely Si NWs coated with a 7 nm thick
Pd film to varying H2 concentrations in air at room temperature. The inset shows clear response behaviors even at very low H2 concentrations down
to 5 ppm. Reprinted with permission from [214]. (c) Schematics illustrations of Si NW/graphene sensor and the configuration of the HS for
characterization. (d)The I-V characteristics and (e) energy band diagrams of the Si NW/graphene HS. Normalized resistance responses of Si
NW/graphene HS molecular sensor under repeated exposures of (f) O2 and (g) H2 gases in air at RT. Exposure intervals of O2 and H2 gases are 10
and 30 s, respectively. Reprinted with permission from [117].
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and challenges of utilizing these Si NW HS in these device applications
and the key parameters to improve the devices performances are
extensively discussed in this review. The remarkably high photovoltaic
efficiency (22.1%) of Si NWs heterostructures is expected to drive the
future research for the commercialization of the devices. More intense
research on NW HSs could find the answers to many unresolved issues,
such as device performance, biocompatibility, reproducibility, robustness,
stability and low cost integration of the devices. The economic constraints
together with the scientific and engineering issues faced by synthesis
approaches of Si NWS based HS have motivated efforts world-wide to
explore new strategies that could meet the demands for the nanoscale
structures today and in the future. It is believed that above results on the
growth strategies and novel applications of Si NWs HS will stimulate
more intense research in this area for viable commercialization of the
devices in the near future.
ACKNOWLEDGEMENTS
We acknowledge the financial support from CSIR (Grant No.
03(1270)/13/EMR-II), DEITY (Grant No. 5(9)/2012-NANO (VOL-II))
and BRNS (Grant No. 2012/37P/1/BRNS) for carrying out part of this
work.
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Cite this article as:
Ramesh Ghosh et al.: Silicon nanowire heterostructures: growth strategies, novel properties and emerging applications.
Sci. Adv. Today 2 (2016) 25230.