Sept 201 FCA47N60F · ID Drain Current - Continuous (TC = 25°C) - Continuous (TC = 100°C) 47 29.7...
Transcript of Sept 201 FCA47N60F · ID Drain Current - Continuous (TC = 25°C) - Continuous (TC = 100°C) 47 29.7...
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©2007 Semiconductor Components Industries, LLC.FCA47N60F Rev. 1
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Absolute Maximum Ratings TC = 25oC unless otherwise noted.
Symbol Parameter FCA47N60F Unit
VDSS Drain-Source Voltage 600 V
ID Drain Current - Continuous (TC = 25°C)- Continuous (TC = 100°C)
4729.7
AA
IDM Drain Current - Pulsed (Note 1) 141 A
VGSS Gate-Source voltage ± 30 V
EAS Single Pulsed Avalanche Energy (Note 2) 1800 mJ
IAR Avalanche Current (Note 1) 47 A
EAR Repetitive Avalanche Energy (Note 1) 41.7 mJ
dv/dt Peak Diode Recovery dv/dt (Note 3) 50 V/ns
PD Power Dissipation (TC = 25°C)- Derate Above 25°C
4173.33
WW/°C
TJ, TSTG Operating and Storage Temperature Range -55 to +150 °C
TL Maximum Lead Temperature for Soldering,1/8” from Case for 5 Seconds
300 °C
FCA47N60F N-Channel SuperFET® FRFET® MOSFET600 V, 47 A, 73 mΩ
Features• 650 V @ TJ = 150 °C• Typ. RDS(on) = 62 mΩ• Fast Recovery Time (Typ. Trr = 240 ns)
• Ultra Low Gate Charge (Typ. Qg = 210 nC)
• Low Effective Output Capacitance (Typ. Coss(eff.) = 420 pF)
• 100% Avalanche Tested
• RoHS Compliant
Applications• Solar Inverter • AC-DC Power Supply
DescriptionSuperFET® MOSFET is ON Semiconductor’s first genera-tion of high voltage super-junction (SJ) MOSFET family that isutilizing charge balance technology for outstanding low on-resistance and lower gate charge performance. This technologyis tailored to minimize conduction loss, provide superior switch-ing performance, dv/dt rate and higher avalanche energy. Con-sequently, SuperFET MOSFET is very suitable for the switchingpower applications such as PFC, server/telecom power, FPDTV power, ATX power and industrial power applications. Super-FET FRFET® MOSFET’s optimized body diode reverse recov-ery performance can remove additional component andimprove system reliability.
Thermal Characteristics
Symbol Parameter FCA47N60F Unit
RθJC Thermal Resistance, Junction-to-Case, Max. 0.3 °C/W
RθJA Thermal Resistance, Junction-to-Ambient, Max. 41.7 °C/W
TO-3PNG
DS
G
S
D
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Package Marking and Ordering Information
Electrical Characteristics TC = 25°C unless otherwise noted
Notes:
1. Repetitive rating: pulse-width limited by maximum junction temperature.
2. IAS = 18 A, VDD = 50 V, RG = 25 Ω, starting TJ = 25°C.
3. ISD ≤ 47 A, di/dt ≤ 1200 A/μs, VDD ≤ BVDSS, starting TJ = 25°C.
4. Essentially independent of operating temperature typical characteristics.
Part Number Top Mark Package Packing Method Reel Size Tape Width Quantity
FCA47N60F FCA47N60F TO-3PN Tube N/A N/A 30 units
Symbol Parameter Conditions Min. Typ. Max. Unit
Off Characteristics
BVDSS Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 μA, TJ = 25°C 600 -- -- V
VGS = 0 V, ID = 250 μA, TJ = 150°C -- 650 -- V
ΔBVDSS/ ΔTJ
Breakdown Voltage Temperature Coefficient
ID = 250 μA, Referenced to 25°C -- 0.6 -- V/°C
BVDS Drain to Source Avalanche BreakdownVoltage
VGS = 0 V, ID = 47 A-- 700 -- V
IDSS Zero Gate Voltage Drain Current VDS = 600 V, VGS = 0 V,VDS = 480 V, TC = 125°C
----
----
10100
μAμA
IGSSF Gate-Body Leakage Current, Forward VGS = 30 V, VDS = 0 V -- -- 100 nA
IGSSR Gate-Body Leakage Current, Reverse VGS = -30 V, VDS = 0 V -- -- -100 nA
On Characteristics
VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250 μA 3.0 -- 5.0 V
RDS(on) Static Drain-SourceOn-Resistance
VGS = 10 V, ID = 23.5 A -- 0.062 0.073 Ω
gFS Forward Transconductance VDS = 20 V, ID = 23.5 A -- 40 -- S
Dynamic Characteristics
Ciss Input Capacitance VDS = 25 V, VGS = 0 V,f = 1 MHz
-- 5900 8000 pF
Coss Output Capacitance -- 3200 4200 pF
Crss Reverse Transfer Capacitance -- 250 -- pF
Coss Output Capacitance VDS = 480 V, VGS = 0 V, f = 1 MHz -- 160 -- pF
Coss(eff.) Effective Output Capacitance VDS = 0 V to 400 V, VGS = 0 V -- 420 -- pF
Switching Characteristics
td(on) Turn-On Delay Time VDD = 300 V, ID = 47 A,VGS = 10 V, RG = 25 Ω
(Note 4)
-- 185 430 ns
tr Turn-On Rise Time -- 210 450 ns
td(off) Turn-Off Delay Time -- 520 1100 ns
tf Turn-Off Fall Time -- 75 160 ns
Qg Total Gate Charge VDS = 480 V, ID = 47 A,VGS = 10 V
(Note 4)
-- 210 270 nC
Qgs Gate-Source Charge -- 38 -- nC
Qgd Gate-Drain Charge -- 110 -- nC
Drain-Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain-Source Diode Forward Current -- -- 47 A
ISM Maximum Pulsed Drain-Source Diode Forward Current -- -- 141 A
VSD Drain-Source Diode Forward Voltage VGS = 0 V, IS = 47 A -- -- 1.4 V
trr Reverse Recovery Time VGS = 0 V, IS = 47 A,dIF/dt = 100 A/μs
-- 240 -- ns
Qrr Reverse Recovery Charge -- 2.04 -- μC
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Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage Drain Current and Gate Voltage Variation vs. Source Current
and Temperatue
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
2 4 6 8 10
100
101
102
- Note 1. V
DS = 40V
2. 250μs Pulse Test
-55°C
150°C
25°C
I D ,
Dra
in C
urre
nt
[A]
VGS
, Gate-Source Voltage [V]10-1 100 101
100
101
102
VGS
Top : 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 VBottom : 5.5 V
* Notes : 1. 250μs Pulse Test
2. TC = 25oC
I D,
Dra
in C
urre
nt [
A]
VDS
, Drain-Source Voltage [V]
0 20 40 60 80 100 120 140 160 180 2000.00
0.05
0.10
0.15
0.20
0.25
VGS = 20V
VGS
= 10V
* Note : TJ = 25°C
RD
S(O
N) [
Ω] ,
Dra
in-S
ourc
e O
n-R
esis
t anc
e
ID, Drain Current [A]
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6100
101
102
25°C150°C
* Notes : 1. V
GS = 0V
2. 250μs Pulse Test
I DR ,
Re
vers
e D
rain
Cur
rent
[A
]
VSD
, Source-Drain Voltage [V]
10-1
100
101
0
5000
10000
15000
20000
25000C
iss = C
gs + C
gd (C
ds = shorted)
Coss
= Cds
+ Cgd
Crss
= Cgd
* Notes : 1. V
GS = 0 V
2. f = 1 MHz
Crss
Coss
Ciss
Cap
acita
nce
[pF
]
VDS
, Drain-Source Voltage [V]
0 50 100 150 200 2500
2
4
6
8
10
12
VDS
= 250V
VDS
= 100V
VDS
= 400V
* Note : ID = 47A
VG
S,
Gat
e-S
ourc
e V
olta
ge [
V]
QG, Total Gate Charge [nC]
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Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation vs. Temperature vs. Temperature
Figure 9. Safe Operating Area Figure 10. Maximum Drain Current vs. Case Temperature
Figure 11. Transient Thermal Response Curve
-100 -50 0 50 100 150 2000.8
0.9
1.0
1.1
1.2
* Notes : 1. V
GS = 0 V
2. ID = 250μA
BV
DS
S,
(Nor
mal
ized
)
Dra
in-S
ourc
e B
reak
dow
n V
olta
ge
TJ, Junction Temperature [°C]
-100 -50 0 50 100 150 2000.0
0.5
1.0
1.5
2.0
2.5
3.0
* Notes : 1. V
GS = 10 V
2. ID = 23.5 A
RD
S(O
N),
(Nor
mal
ized
)D
rain
- Sou
rce
On
-Res
ista
nce
TJ, Junction Temperature [°C]
100
101
102
103
10-1
100
101
102
Operation in This Area is Limited by R DS(on)
DC
10 ms
1 ms
100 μs
* Notes : 1. TC
= 25°C 2. TJ
= 150°C 3. Single Pulse
I D, D
rain
Cu
rren
t [A
]
VDS
, Drain-Source Voltage [V]
25 50 75 100 125 1500
10
20
30
40
50
I D,
Dra
in C
urre
nt [
A]
TC, Case Temperature [°C]
1 0-5
1 0-4
1 0-3
1 0-2
1 0-1
1 00
1 01
1 0-2
1 0-1
* N o te s : 1 . Z θ J C
( t) = 0 .3 °C /W M a x . 2 . D u ty F a c to r , D = t
1/t
2
3 . TJM
- TC = P
D M * Z θ JC
( t)
s in g le p u ls e
D = 0 .5
0 .0 2
0 .2
0 .0 5
0 .1
0 .0 1
Zθ J
C(t
), T
herm
al R
espo
nse
t1, S q u a re W a v e P u ls e D u ra tio n [s e c ]
t1
PDM
t2
Z
θJC
(t),
The
rmal
Res
pon
se [o
C/W
]
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Figure 12. Gate Charge Test Circuit & Waveform
Figure 13. Resistive Switching Test Circuit & Waveforms
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms
VGS
VDS
10%
90%
td(on) tr
t on t off
td(off) tf
VDD
10V
VDS
RL
DUT
RG
VGS
VGS
VDS
10%
90%
td(on) tr
t on t off
td(off) tf
VDD
10V
VDS
RL
DUT
RG
VGS
VGS
Charge
VGS
10VQg
Qgs Qgd
3mA
VGS
DUT
VDS
300nF
50KΩ
200nF12V
Same Typeas DUT
Charge
VGS
10VQg
Qgs Qgd
3mA
VGS
DUT
VDS
300nF
50KΩ
200nF12V
Same Typeas DUT
EAS = L IAS2----
21 --------------------
BVDSS - VDD
BVDSS
VDD
VDS
BVDSS
t p
VDD
IAS
VDS (t)
ID (t)
Time
10V DUT
RG
L
I D
t p
EAS = L IAS2----
21
EAS = L IAS2----
21----21 --------------------
BVDSS - VDD
BVDSS
VDD
VDS
BVDSS
t p
VDD
IAS
VDS (t)
ID (t)
Time
10V DUT
RG
LL
I DI D
t p
VGSVGS
IG = const.
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Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
VDS
+
_
DriverRG
Same Type as DUT
VGS • dv/dt controlled by RG
• ISD controlled by pulse period
VDD
LI SD
10VVGS
( Driver )
I SD
( DUT )
VDS
( DUT )
VDD
Body Diode
Forward Voltage Drop
VSD
IFM , Body Diode Forward Current
Body Diode Reverse Current
IRM
Body Diode Recovery dv/dt
di/dt
D =Gate Pulse Width
Gate Pulse Period--------------------------
DUT
VDS
+
_
DriverRG
Same Type as DUT
VGS • dv/dt controlled by RG
• ISD controlled by pulse period
VDD
LLI SD
10VVGS
( Driver )
I SD
( DUT )
VDS
( DUT )
VDD
Body Diode
Forward Voltage Drop
VSD
IFM , Body Diode Forward Current
Body Diode Reverse Current
IRM
Body Diode Recovery dv/dt
di/dt
D =Gate Pulse Width
Gate Pulse Period--------------------------D =Gate Pulse Width
Gate Pulse Period--------------------------
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Mechanical Dimensions
Figure 16. TO3PN, 3-Lead, Plastic, EIAJ SC-65Package drawings are provided as a service to customers considering our components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact an ON Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of ON Semiconductor’s worldwide terms and conditions,specifically the warranty therein, which covers ON Semiconductor products.
Always visit ON Semiconductor’s online packaging area for the most recent package drawings.
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ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patentcoverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liabilityarising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/orspecifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customerapplication by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are notdesigned, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classificationin a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorizedapplication, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, andexpenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if suchclaim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. Thisliterature is subject to all applicable copyright laws and is not for resale in any manner.
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