Semiconductor/IC Test Solutions - Chroma ATE
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Semiconductor/IC Test Solutions Turnkey Test & Automation Solution Provider Wafer/Chip/Package www.chromaate.com
Transcript of Semiconductor/IC Test Solutions - Chroma ATE
Semiconductor/IC Test Solutions
Turnkey Test & Automation Solution Provider
Wafer/Chip/Package
www.chromaate.com
Turnkey Semiconductor/IC Test Solutions
Chroma ATE Inc, as a turnkey test & automation solution provider, integrates customized solutions with Test & Measurement Instruments, Automatic Test Systems and Manufacturing Execution Systems. Over the years, Chroma has accumulated strong experiences in semiconductor IC test areas. Chroma provides a wide portfolio of semiconductor IC test solutions ranging from ATE, PXI systems, IC handlers, and system level test solutions.
On the ATE & PXI side, the solutions cover applications in consumer SoC (MCU, controller, audio, peripheral), power management IC (Regulator, LDO, DC/DC, AC/DC, LED Driver), RF (FEM, Connectivity, Mobile) and other specific applications (CIS, Light Sensors, RFID).
On the handler & automatic system side, the solutions include thermal control, extreme device handling technologies, bare die handling, pick and place handlers, CIS turnkey solutions, and system level test solutions.
With the turnkey solutions, Chroma provides a best approach for customers to bring down the cost of test while maintaining the test quality and performance.
VLSI Test Systems SoC/Analog Test Systems
Automatic System LevelTest Handler CIS Turnkey Solution
MiniatureIC Handler
Open Short Test
Automatic System Level Test Shipping
Assembly & PackageWafer Process
Final Test
Double Sides WaferInspection System
RF SolutionIntegrated Handler
Hybrid Single SiteTest Handler
Final TestHandler
Wafer Sort
Semiconductor Automatic Test Equipment (ATE)
PVI 100 VI 45 HDADDA
3650 Series OptionsKey Features☑ PVI100 Analog Option ☑ VI45 Analog Option☑ HDADDA Mixed-Signal Option☑ Mixed-Signal and RF Box (MRX)☑ Timing Interval Analyzer Option
SoC/Analog Test Systems
Model 3650-EX
Key Features☑50/100MHz Clock Rate ☑Maximum 1024 I/O Pins☑32/64M Pattern Memory☑Maximum 96 CH DPS☑SCAN / ALPG Function☑512 DUT Parallel Test☑Microsoft Windows® 7 /XP OS
Model 3650
Key Features☑50/100MHz Clock Rate ☑Maximum 640 I/O Pins☑16/32M Pattern Memory☑Maximum 32 CH DPS☑SCAN / ALPG Function☑32 DUT Parallel Test☑Microsoft Windows® 7 /XP OS
Chroma semiconductor ATE is specifically designed for high-throughput and high parallel test capabilities to provide the most cost-
effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and
excellent reliability, it is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
Model 3650-CXKey Features☑ 50/100MHz Clock Rate ☑ Maximum 256 I/O Pins☑ 16/32M Pattern Memory☑ Maximum 16 CH DPS☑ SCAN / ALPG Function☑ 32 DUT Parallel Test☑ Microsoft Windows® 7 /XP OS
ConsumerDevices
SoCMCU
Mixed-SignalDevice
EmbeddedFlash
PMIC
Wireless
TouchSensor
CHROMA ATE
Key Features ☑High Performance in a low-cost production system
☑High parallel test capability
☑Flexibility from engineering to production
☑Powerful suite of software tools
☑Small footprint to save space in factory
☑Adapter board to use other platform directly
STBUSx1UR+I/F
Flexible Slots
LXPG2x1 (No Outlet) PMUVIx1
PXI IC Test Systems
VLSI Test Systems
Programmable Pin ElectronicsModule Model 36010Key Features ☑PXI / PXIe-Hybrid Compatible
☑50/100MHz Clock Rate
☑32M Pattern Memory
☑Per-Channel PMU
☑SCAN Function 4Chain/256M
☑Support Labview / LabWindows
☑Microsoft Windows® 7/XP OS
DUT Power SupplyModel 36020Key Features ☑PXI / PXIe-Hybrid Compatible
☑+10V/-2V Voltage Range
☑6 Selectable Current range
☑16-Bit V Force Resolution
☑18-Bit I Measurement Resolution
☑Support Labview / LabWindows
☑Microsoft Windows® 7/XP OS
Mini ATEModel A360101Key Features ☑Maximum 64 I/O Pins
☑8 Channels DPS
☑Universal Loadboard
☑Support Labview / LabWindows
☑Windows® 7 /XP OS
Model 3380
Key Features☑50/100MHz Clock Rate ☑Maximum 1280 I/O Pins☑32/64/128M Pattern Memory☑Maximum 128 CH DPS (4 wires)☑SCAN / ALPG Function☑1024 DUT Parallel Test☑Microsoft Windows® 7 OS☑Flexible configuration
Flexible Configuration☑Support flexible slots☑Flexible slot can insert I/O, UVI, ADDA, PXIe, and etc. versatile functions☑3360-D : 2 slots ; 3360P : 8 slots ; 3380-P : 9 slots ; 3380 : 20 slots☑Time/Freq Measurement unit
Model 3380-P, 3380-DKey Features☑50/100MHz Clock Rate ☑Maximum 576 I/O Pins (256 for 3380-D)☑32/64/128M Pattern Memory☑Maximum 64 CH DPS (4 wires)☑SCAN / ALPG Function☑512 DUT Parallel Test (256 for 3380-D)☑Microsoft Windows® 7 OS☑Flexible configuration
Model 3360-P, 3360-DKey Features☑ 50 MHz Clock Rate ☑ Maximum 256 I/O Pins (64 for 3360-D)☑ 8/16M Pattern Memory☑ Flexible configuration☑ SCAN / ALPG Function☑ 32 DUT Parallel Test☑ Microsoft Windows® 7 /XP OS
Advanced TEC Controller
Full Range Tri-temp Final Test HandlerModel 3110-40℃~125℃
Model 3110-FT-40℃~125℃
Model 3160-A40℃~125℃
Model 3180Ambient~125℃
Model 54100 SeriesKey Features ☑Bidirectional driving with 150W (24V 8A), 300W (27V/12A),
or 800W (40V/20A) output
☑Filtered PWM output with >90% driving power efficiency
while maintaining linear driving with current ripples<20 mA
☑Temperature reading and setting range -50 to 150℃
with 0.01℃ resolution and 0.3℃ absolute accuracy
☑Short term stability (1 hour) ±0.01℃ and long term
stability ±0.05℃ with optimal PID control
☑Feature true TEC large signal PID auto tune for
best control performance
☑2 T-type thermal couple inputs, one for control feedback and
the other for monitor and offset, providing versatile control modes
Time
Temp.
25
Stability±0.01℃
Chroma 54100 Series
800W
TEC Modules
125
0
50
-40
℃
125
0
50
-40
℃
125
Am
bie
nt
℃
40
125
℃
0 75 150 225 300 350 400
-30-1010
305070
90
85℃ ~ -40℃ : 400 sec. (Tc of Kit)
* Only for 3110 thermal head
Sec.
Temp.
TT Chart - Hot to Cold
0 75 150 225 300 350 400
-30-1010
305070
90
-40℃ ~ 85℃ : 120 sec. (Tc of Kit)
* Only for 3110 thermal head
Sec.
Temp.
TT Chart - Cold to Hot
Pick & Place Handler - Final Test (FT) and System Level Test (SLT)
Final TestFT is taken to test before delivery of the product to customers. This test through test patterns to verify the functionality of the device and
measure the electrical characteristics to meet the desired specifications. The purposes of testing are listed as below.
☑To verify product design
☑To achieve high quality production
☑To control production quality
☑To acquire continue improvement in product yield
System Level Test Handler
Wafer Process
Wafer Sort
Assembly &Package
ASFTManual
Package Test Shipping
Auto. System Function Test
Cycle Probe Test
Wafer
Probe Card ATE Module Boards
ICs ICs
Final Test System Level Test
IC Module BoardWafer
Disruptive Process Implement in Semiconductor Test
Mini Tabletop Single Site Test Handler
Model 3111Key Features ☑IC packages: 5x5 mm to 45x45 mm
☑Software configurable binning
☑Air damper contact
☑Optimizes IC force balance
☑Maximize test socket lifetime
☑Double stack protection
☑Continuous automated re-test
☑Remote control operation
☑Real time system camera monitoring
☑Alerts to mobile device
System Level TestIn conventional IC backend process, to ensure shipment quality, most companies test packaged devices at speed with full function. However
this induces several issues :
【1】 Device shipment quality is not ensured due to the difference between ATE and real working environment
【2】 Time to market is delayed due to months-long test program development on ATE's
【3】 Test cost continually raises in contrast with reducing silicon cost.
Model 3260Key Features ☑Reduce overkill rate by RC (re-check or retest)
☑Time and resources saving
☑Yield increasing
☑Tie-in BICT for various testers for RC
☑Optional PoP (Package on Package) solutions
☑Made-to-order test procedure design
☑Unique FACT (Fault Auto Correlation Test) to reduce
personnel handling time
Time To Market ☑ Shipment made before ATE program ready ☑ Maximize device ☑ Availability
Drivers to System Level Test
Cost ☑ Lower investing cost (COO) than ATE☑ Higher e�ciency (lower unit cost) than manual test
Fault Coverage ☑ Control DPPM☑ Quality asurance☑ Reduce personnel e�ort☑ evaluating the system's compliance☑ Test accessibility☑ Detect inconsistencies between SW and the hardware assemblages
LED Light Source
Capture Cards
MIB Board
Chroma Tester
CIS Turnkey Test Solutions
The CIS (CMOS Image Sensor) test solution is one of Chroma's
unique turnkey solutions. It provides the best UPH with best
optimized resource, which delivers the performance and quality
for functional and image tests. Chroma integrated CIS solution
provide the best COO (Cost Of Ownership) to customers.
Key Features ☑Handler Model 3270 -16 sites Parallel
☑16/16 light source(FT)/IPC
☑ATE 3380P 100MHz clock Rate
☑128 M Pattern Memory
☑192pins I/O pins
☑16 CH UVI (4 wires)
☑RMB2 switching board
☑Capture card (MIPI 1G)
Chroma ATE, Capture Card, and MIB☑3380 Series 100 MHz ATE solutions
☑Flexible optimized configuration by MIB
(Matrix Interface Board)
☑Cost reduction 2-3 times vs traditional
full config ATE solutions
☑Up-to-date capture card solutions :
supporting MIPI CSI1/2, Multiple-lanes
Light Source☑> 10 times longer life time than Halogen light source
☑No overheat issues
☑< 1% difference in spectrum response vs D65 spectrum
☑LED light source size expandable for 16-site above parallelism requirement
☑8 to 10 times cost reduction than Halogen light source
Pick and Place IC Handler☑Reliable high speed pick & place handler,
supporting up to 16 sites
☑Handling various package types, with
outer dimensions 2x2mm to 14x14mm
☑Integrated FT light source for each site
☑Support low temp (-40℃) in quad sites
by Model 3110-FT
Tri-temp Test HandlerModel 3110-FT
Miniature IC HandlerModel 3270
Circuit Probing
Light Source Light Source
HEADQUARTERSCHROMA ATE INC.
66 Huaya 1st Road, Guishan, Taoyuan 33383, TaiwanT +886-3-327-9999F +886-3-327-8898
CHINACHROMA ELECTRONICS (SHENZHEN) CO., LTD.
8F, No.4, Nanyou Tian An Industrial Estate, Shenzhen, China PC: 518052
T +86-755-2664-4598F +86-755-2641-9620www.chroma.com.cn
JAPANCHROMA JAPAN CORP.
472 Nippa-cho, Kouhoku-ku, Yokohama-shi,Kanagawa, 223-0057 Japan
T +81-45-542-1118F [email protected]
U.S.A.CHROMA ATE INC. (U.S.A.)7 Chrysler Irvine, CA 92618
T +1-949-421-0355F +1-949-421-0353
Toll Free [email protected]
SANTA CLARA3350 Scott Blvd., #601 Santa Clara, CA 95054
T +1-408-969-9998F +1-408-969-0375
EUROPECHROMA ATE EUROPE B.V.
Morsestraat 32, 6716 AH Ede, The NetherlandsT +31-318-648282F +31-318-648288
© 2015 Chroma ATE Inc. All Rights Reserved.201501-1000
