SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005 Street...

(A2LA Cert. No. 4184.01) 03/26/2021 Page 1 of 45

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD. No. 26, 40th Street

Thao Dien Ward, Thu Duc City, Ho Chi Minh City VIETNAM

Tran Minh Cuong (Kevin) Phone: 84 28 6281 8479

CALIBRATION

Valid To: February 28, 2023 Certificate Number: 4184.01 In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this laboratory at the location listed above as well as the satellite laboratory location listed below to perform the following calibrations1, 8: I. Acoustical

Parameter/Equipment

Range

CMC2 (±)

Comments

Sound Level Meter – (@ 1 kHz)3

(94 and 114) dB

0.59 dB

KQT-33K3-4-2911-1, BK Cal 73

II. Chemical

Parameter/Equipment

Range

CMC2 (±)

Comments

Conductivity Meter3

1 µS/cm 100 µS/cm 1413 µS/cm

0.25 µS/cm 2.2 µS/cm 5.5 µS/cm

KQT-CD-01 manufacturer’s manual, standard solution

pH Meter3

4.01 pH 7.00 pH 10.00 pH

0.021 pH 0.021 pH 0.021 pH

KQT-17-20SC-42 manufacturer’s manual, standard solution


Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Refractometer3

(5 to 85) % Brix Up to 10 % Salinity

0.13 % Brix 0.12 % Salinity

KQT-RE-01 manufacturer’s manual, Hanna HI96801

Turbidity Meter3

(15 to 750) NTU

3.8 % + 0.02 NTU

KQT-TU-01 manufacturer’s manual, Hanna HI98703

TDS Meter3

0.000 066 % TDS 0.0066 % TDS 0.0933 % TDS

0.000 0013 % TDS 0.000 02 % TDS 0.000 29 % TDS

KQT-CD-01 reference conductivity standard solution

Dissolved Oxygen Meter

(0.0 to 50.0) mg/L

0.5 mg/L

KQT-DO-01 manufacturer’s manual standard solution Hanna HI9147

Hydrometer

(0.600 to 2.000) g/cm3

0.003 g/cm3

DLVN 293: 2016, manufacturer’s manual standard hydrometers

Alcoholmeter

Up to 100 % V

0.4 % V

DLVN 106: 2012 manufacturer’ manual standard alcoholmeter


Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Gas Detectors H2S CO CH4 C4H8 C4H8 O2 O2 CO2 CO2 NH3 NO2 C2H4 SO2

0.0025 % 0.0050 % 50 % LEL 0.001 % 0.01 % 12 % 20.9 % 2 % 0.2 % 0.0025 % 0.0005 % 0.001 % 0.001 %

6.6 % 2.7 % 2.8 % 2.3 % 2.3 % 2.4 % 2.3 % 2.3 % 2.3 % 5.8 % 12 % 12 % 12 %

KQT-17-20SY-06, manufacturer’s manual, standard gas

III. Dimensional

Parameter/Equipment

Range

CMC2 (±)

Comments

Angle Meter/Clinometer

Up to 90°

1.4'

KQT-33K6-4-157-1, angle block set

Calipers3

Up to 500 mm (>500 to 2000) mm

0.015 mm/m + 0.0078 mm 0.027 mm/m + 0.0022 mm

KQT-33K6-4-552-1, gauge block grade 0 +1, caliper checker

Depth Gages3

Up to 1000 mm

0.017 mm/m + 0.007 mm

KQT-33K6-4-17-1, gauge block grade 0 +1

Coordinate Measuring Machines (CMM) 3 – 3-Axis Linearity Only

X: (10 to 900) mm Y: (10 to 900) mm Z: (10 to 500) mm

19 µm/m 19 µm/m 19 µm/m

Manufacturer’s manual, gauge block grade 0 +1


Parameter/Equipment

Range

CMC2 (±)

Comments

Micrometers3

Up to 1000 mm

0.024 mm/m + 1 µm


Dial Indicator3/Dial Test Indicator3

Up to 1 mm (1 to 200) mm

0.006 mm/m + 1.1 µm 0.01 mm/m + 1.7 µm

KQT-IN-01, gauge block grade 0 +1, Mitutoyo UDT-3

Dial Bore Gages3

Up to 500 mm

0.01 mm/m + 1.7 µm

KQT-IN-01, gauge block grade 0 +1

Gage Blocks3

(1 to 25) mm (>25 to 100) mm (>100 to 600) mm

0.31 µm 0.0049 mm/m + 0.3 µm 0.0057 mm/m + 0.8 µm

KQT-33K6-4-1-1, Pratt & Whitney B Mahr ULM-1000E

Height Gages3

Up to 900 mm

0.026 mm/m + 0.6 µm


Holtest

(6 to 75) mm

0.012 mm/m + 0.8 µm

KQT-HT-01 setting ring

Microscope, Measuring3 Profile Projector/Optical Comparator3

Up to 500 mm

0.004 mm/m + 2.5 µm

KQT-33K6-4-1268-1, manufacturer’s manual, KLC source procedure, standard glass scale

Pin/Plug Gages3

Up to 100 mm

0.0048 mm/m + 0.33 µm

KQT-33K6-4-121-1, Pratt & Whitney B Mahr ULM-1000E

Thread Plug Gage

Up to 100 mm

0.032 mm/m + 0.22 um

KLC source procedure, Mahr ULM-1000E


Parameter/Equipment

Range

CMC2 (±)

Comments

Setting Rings

Up to 150 mm

0.002 mm/m + 0.5 µm

KQT-33K6-4-2-1, Mahr ULM-1000E

Thread Ring Gage

Up to 125 mm

0.027 mm/m + 0.22 µm

KLC source procedure, Mahr ULM-1000E

Surface Plate Flatness – Repeatability Only3, 4

[(12 x 12) to (48 x 96)] in

50 µin

KQT-17-20MD-14, repeat-o-zero

Thickness Gages/Feeler Gages and Thickness Films3

Up to 50 mm

0.1 mm/m + 0.8 µm

KQT-TH-01, gauge block grade 0 +1

Steel Ruler

Up to 2000 mm

0.06 mm

DLVN 283:2015 standard glass scale

Measuring Tape

Up to 100 m

0.6 mm

KQT-MT-01 DLVN 266: 2015 standard glass scale standard weight

Distance & Length Measuring Instruments

Up to 50 m

0.003 m

KQT-D&L-01 laser distance meter

Precision Level/Square Level/Sprit Level

0.02 mm/m 0.05 mm/m 0.1 mm/m

0.026 mm/m 0.037 mm/m 0.062 mm/m

KQT-PL-01 DLVN 120: 2013 standard precision level


IV. Electrical – DC/Low Frequency

Parameter/Range

Frequency

CMC2, 6 (±)

Comments

AC Current – Generate3 Up to 2.2 mA (2.2 to 22) mA (22 to 220) mA 220 mA to 2.2 A (1.5 to 11) A (11 to 500) A

(20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz 20 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (45 to 65) Hz (65 to 500) Hz (0.5 to 1) kHz 45 Hz to 1 kHz

0.2 mA/A + 0.035 µA 0.2 mA/A + 0.035 µA 0.2 mA/A + 0.11 µA 1.5 mA/A + 0.65 µA 0.2 mA/A + 0.35 µA 0.2 mA/A + 0.35 µA 0.2 mA/A + 0.55 µA 1.4 mA/A + 5 µA 0.2 mA/A + 3.5 µA 0.2 mA/A + 2.5 µA 0.2 mA/A + 3.5 µA 1.3 mA/A + 10 µA 0.3 mA/A + 35 µA 0.5 mA/A + 80 µA 8.5 mA/A + 160 µA 0.8 mA/A+ 2 mA 1.2 mA/A+ 2 mA 3.8 mA/A + 2 mA 0.6 mA/A + 100 mA

KQT-17-20AQ-101, KLC source procedure manufacturer’s manual, Fluke 5720A Fluke 5500A Fluke 5500A w/ 5500/coil


Parameter/Range

Frequency

CMC2, 6 (±)

Comments

AC Current – Measure3 (5 to 100) μA 100 μA to 10 mA (10 to 100) mA 100 mA to 1 A Up to 2000 A

(10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (50 to 1000) Hz

4.6 mA/A + 0.03 µA 1.7 mA/A + 0.03 µA 0.7 mA/A + 0.03 µA 0.7 mA/A + 0.03 µA 4.6 mA/A + 0.2 µA 1.7 mA/A + 0.2 µA 0.7 mA/A + 0.2 µA 0.4 mA/A + 0.2 µA 4.6 mA/A + 20 µA 1.7 mA/A + 20 µA 0.7 mA/A + 20 µA 0.4 mA/A + 20 µA 4.6 mA/A + 0.2 mA 1.9 mA/A + 0.2 mA 0.97 mA/A + 0.2 mA 1.2 mA/A + 0.2 mA 3.1 mA/A

KQT-17-20AH-06, KLC source procedure, manufacturer’s manual, HP 3458A HP 3458A + high voltage divider + Kyoritsu 2009R


Parameter/Range

Frequency

CMC2, 6 (±)

Comments

AC Voltage – Generate3 Up to 220 mV 220 mV to 2.2 V (2.2 to 22) V (22 to 220) V 220 V to 1.1 kV

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 1000) kHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz 50 Hz to 1 kHz

0.11 mV/V + 7 µV 0.26 mV/V + 7 µV 0.59 mV/V + 17 µV 1.1 mV/V + 20 µV 3.4 mV/V + 45 µV 0.06 mV/V + 8 µV 0.10 mV/V + 10 µV 0.14 mV/V + 30 µV 0.52 mV/V + 80 µV 2.1 mV/V + 0.3 mV 0.06 mV/V + 0.05 mV 0.10 mV/V + 0.1 mV 0.13 mV/V + 0.2 mV 0.35 mV/V + 0.6 mV 1.9 mV/V + 3.2 mV 0.07 mV/V + 0.6 mV 0.10 mV/V + 1 mV 0.14 mV/V + 2.5 mV 0.09 mV/V + 3.5 mV

KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5720A + 5500A

AC Voltage – Measure3 (0 to 10) mV (10 to 100) mV 100 mV to 1 V (1 to 10) V (10 to 100) V 100 V to 1 kV

10 Hz to 20 kHz 40 Hz to 1 kHz 40 Hz to 1 kHz (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (50 to 100) kHz 10 Hz to 20 kHz 40 Hz to 1 kHz

2.8 mV/V + 0.04 mV 0.2 mV/V + 2 μV 0.1 mV/V + 20 μV 0.8 mV/V + 0.4 mV 0.1 mV/V + 0.2 mV 0.2 mV/V + 0.2 mV 1.0 mV/V + 0.2 mV 0.2 mV/V + 2 mV 0.5 mV/V + 20 mV

KQT-17-20AH-06, KLC source procedure, manufacturer’s manual Fluke 8845A HP 3458A


Parameter/Equipment

Range

CMC2, 6 (±)

Comments

Capacitance – Generate3 (@ 1 kHz)

(330 to 500) pF (0.5 to 1.1) nF (1.1 to 3.3) nF (3.3 to 11) nF (11 to 33) nF (33 to 110) nF (110 to 330) nF 330 nF to 1.1 µF (1.1 to 3.3) µF (3.3 to 11) µF (11 to 33) µF (33 to 110) µF (110 to 330) µF 330 µF to 1.1 mF

5.2 mF/F + 10 pF 1.4 mF/F + 10 pF 1.2 mF/F + 10 pF 1.5 mF/F + 10 pF 3.1 mF/F + 100 pF 3.2 mF/F + 100 pF 3.1 mF/F + 300 pF 3.4 mF/F + 1 nF 4.2 mF/F + 3 nF 4.5 mF/F + 10 nF 4.8 mF/F + 30 nF 6.1 mF/F + 0.1 µF 8.2 mF/F + 0.3 µF 12 mF/F + 0.3 µF

KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5500A

DC Current – Generate3

(0 to 220) μA 220 μA to 22 mA (22 to 220) mA 220 mA to 2.2 A (2.2 to 11) A (11 to 500) A

110 μA/A + 6 nA 52 μA/A + 40 nA 69 μA/A + 0.7 µA 110 μA/A + 12 µA 710 μA/A + 330 µA 0.7 mA/A + 17 mA

KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5720A Fluke 5500A Fluke 5500A w/ 550/coil

DC Current – Measure3

(0 to 100) μA 100 μA to 1 mA (1 to 10) mA (10 to 100) mA (0.1 to 1) A (1 to 2000) A

110 µA/A + 0.8 nA 49 µA/A + 5 nA 47 µA/A + 50 nA 67 µA/A + 0.5 µA 150 µA/A + 10 µA 6.6 mA/A + 1.5 mA

KQT-17-20AH-06, KLC source procedure, manufacturer’s manual HP 3458A HP 3458A + Shunt + Kyoritsu 2009R

DC Voltage – Generate3

(0 to 220) mV 220 mV to 2.2 V (2.2 to 11) V (11 to 22) V (22 to 220) V (220 to 1100) V

14 µV/V + 0.7 µV 8.1 µV/V + 1.4 µV 5.6 µV/V + 5 µV 5.6 µV/V + 9 µV 8.1 µV/V + 90 µV 11 µV/V + 0.7 mV



Parameter/Equipment

Range

CMC2, 5, 6 (±)

Comments

DC Voltage – Measure3

(0 to 100) mV 100 mV to 1V (1 to 10) V (10 to 100) V (100 to 1000) V (1 to 10) kV

12 µV/V + 0.35 µV 9.3 µV/V + 0.4 µV 9.3 µV/V + 1 µV 12 µV/V + 40 µV 12 µV/V + 0.15 mV 1.7 %

KQT-17-20AH-06, KLC source procedure, manufacturer’s manual, Fluke 8845A, HP 3458A HP3458A + HV divider

Power Analyzer/Meter3

Up to 10 kW

0.13 %

KQT-33K1-4-1683-1, KLC source procedure, manufacturer’s manual, Fluke 5500A

Resistance – Generate3

(0.001 to 1) Ω (1 to 100) Ω (0.1 to 10) kΩ 10 kΩ to 1 MΩ (1 to 100) MΩ

0.21 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 1.5 mΩ/Ω

KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, standard resistance HARS-X-9-0.001 IET HRRS-B5-1M-5KV

Resistance – Measure3

(0 to 10) Ω (10 to 100) Ω 100 Ω to 1 kΩ (1 to 10) kΩ (10 to 100) kΩ (0.1 to 1) MΩ (1 to 10) MΩ

0.03 mΩ/Ω + 0.05 mΩ 0.017 mΩ/Ω + 0.5 mΩ 0.015 mΩ/Ω + 0.5 mΩ 0.015 mΩ/Ω + 5 mΩ 0.016 mΩ/Ω + 50 mΩ 0.029 mΩ/Ω + 2 Ω 0.073 mΩ/Ω + 100 Ω

KQT-17-20AH-06, KLC source procedure, manufacturer’s manual, HP 3458A


Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Oscilloscopes3 – Square Wave Signal 10 Hz to 10 kHz Leveled Sine Wave Time Markers

1.8 mV to 105 Vp-p 50 kHz to 100 MHz (100 to 300) MHz 5 s to 100 µs (50 to 2) µs 1 µs to 20 ns 10 ns to 2 ns

16 mV/V + 0.1 mV 0.3 mHz/Hz 2 mHz/Hz 6.9 ms/s 17 ms/s 14 ms/s 1.8 ms/s

KQT-CG-7, KLC source procedure, manufacturer’s manual, Fluke 5500A

Gauss Meters3

3 mT 50 mT 300 mT

2.3 % 2.8 % 3.6 %

KQT-33K1-4-1658-1 manufacturer’s manual magnetic tool

Hipot/Withstanding Testers3

(0.5 to 20) kV (0.5 to 100) mA

1.7 % 1.4 %

KQT-33K1-4-181-1, KLC source procedure, manufacturer’s manual, Kikusui 149-10A + TOS 1200 + Tektronix P6015A

Insulation Testers3

(0 to 10) kV (0 to 200) MΩ (0.2 to 100) GΩ

1.1 % 0.2 % 1.6 %

KQT-33K2-4-33-1, KLC source procedure, manufacturer’s manual, Kikusui 149-10A + standard resistance

LCR Meters3

(0 to 200) MΩ (0 to 1000) pF 1 mH to 900 mH

0.4 % 0.14 % 2.3 %

KQT-33K1-4-1260-1, KLC source procedure, manufacturer’s manual, LCR standard

Metal Detector3 – Ferrous Brass

(0.5 to 2.0) mm (0.4 to 2.0) mm

0.0009 mm 0.0009 mm

KQT-ME-01, manufacturer’s manual, precision balls


V. Electrical – RF/Microwave

Parameter/Range

Frequency

CMC2, 6 (±)

Comments

RF Power – Measuring Instruments3 (-70 to 20) dBm (-30 to 20) dBm

100 kHz to 18 GHz 50 MHz to 26.5 GHz

0.54 dBm 0.39 dBm

KQT-33K4-4-715-1, KLC source procedure, manufacturer’s manual, HP 8340B monitored w/ Agilent N1911A w/ 8485A or E4412A

RF Power – Measure3 (-70 to 20) dBm (-30 to 20) dBm


0.54 dBm 0.39 dBm

KQT-33K4-4-105-1, KLC source procedure, manufacturer’s manual, Agilent N1911A w/ E4412A or 8485A

VI. Fluid Quantities

Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Air Speed/Velocity Meters

Up to 30 m/s

0.21 m/s

KQT-33K6-4-1769-1, velocity standard

Air/Mass Flow Meters3

(0.1 to 1) lpm (>1 to 30) lpm (>30 to 2500) lpm

0.03 % lpm 1.7 % lpm 2.3 % lpm

KQT-33K6-4-1769-1A, mini-AP buck flow calibrator M30B

Flow Meter for Liquid

Up to 1000 lpm

(0.0015V) lpm + 4.2 lpm

KQT-33K6-4-1769-1A, flow rate rig, magnetic flowmeter


Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Viscosity Meter

(100 to 200 000) cP

1.5 %

KQT-17-20MV-01 standard solution

Burets

(100 to 1000) µL (1 to 10) mL (10 to 500) mL

1.1 mL/L 0.2 mL/L 0.1 mL/L

KQT-VO-01, standard weight E2 + balance

Pipettes

(10 to 100) µL (100 to 1000) µL (1 to 10) mL (10 to 500) mL

5.2 mL/L 1.1 mL/L 0.2 mL/L 0.1 mL/L

KQT-VO-01, standard weight E2 + standard scale

Volumetric Flasks

(0 to 1000) mL (1000 to 5000) mL

0.17 mL/L 0.14 mL/L


VII. Mechanical

Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Balances and Scales3 Class I and II Class III and IV

(0 to 50) g (50 to 200) g (200 to 500) g 500 g to 6 kg (1 to 10) kg (10 to 50) kg (50 to 100) kg (100 to 150) kg (150 to 2000) kg

0.2 mg 1.4 mg 1.2 mg 15 mg 8.2 g 19 g 68 g 130 g 0.41 kg

KQT-BA-01, OIML R76-1 standard weights

Durometer – Spring Force Type A – B – O Type C – D – DO

Up to 4.5 kg Up to 4.5 kg

0.5 % 0.1 %

KQT-33K6-4-1362-1, ASTM D2240 partial calibration, standard weight E2 + standard scale


Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Force Tester3

Up to 98 kN Up to 2 kgf Up to 10 000 kgf

0.25 % 0.06 % 0.25 %

KQT-17-20MF-04, DLVN 109:2002, KLC source procedure, standard weight E2 + load cell

Hardness Testers3 – Indirect Verification of Rockwell Hardness Testers

HRBW: Medium High HRC: Medium High

0.93 HRBW 0.92 HRBW 0.5 HRC 1.1 HRC

DLVN 63:2000, manufacturer’s manual, indirect verification per ASTM E18 using hardness standard

Hardness Testers3 – Indirect Verification of Vickers Hardness Testers

285 HV 502 HV 700 HV

7.1 HV 13 HV 18 HV

DLVN 63:2000, manufacturer’s manual

Mass/Weights Class F1, F2, M1, M2 and M3 Class F2, M1, M2 and M3 Class M1, M2, and M3

(1 to 500) g (0.5 to 5) kg (5 to 20) kg

0.2 mg + 1.7 mg/g 1.1 mg + 9.2 mg/g 0.03 g + 0.0084 mg/g

KQT-SW-01, OIML R111-1, standard weight E2 + standard scale

Particle Counter3/Dust Monitor

(0.3 to 10) µm (0.001 to 10.000) mg/m3

13 % 13 %

KQT-LCP-2800, particle counter digital dust monitor


Parameter/Equipment

Range

CMC2, 5, 7 (±)

Comments

Pressure – Measuring Equipment3 Gauges/Pressure Switch/Safety Valve Pressure Transmitter Barometer/Manometer

(-12 to 300) psi Up to 10 000 psi (4 to 20) mA Up to 1100 hPa

0.06 % 0.7 % 0.06 %

DLVN 76: 2001, KQT-17-20MP-06, KLC source procedure, Fluke 718 Seri + module + Fluke 1G

Surface Roughness and Surface Roughness Testers3

0.48 µm 2.97 µm 3.02 µm

0.7 µm 0.9 µm 0.7 µm

KQT-33K6-4-2021-1, manufacturer’s manual, Mitutoyo 178-602 + Federal reference standard

Tachometers – (Clockwise only)

Up to 5000 rpm

1.5 rpm

KQT-17-20MA-03, Ideal 1790

Torque Drivers and Wrenches3

Up to 2000 N·m

1.3 %

KQT-33K6-4-2930-1, KLC source procedure, mount LTT-2100, Insize IST-2200 N·m

Torque Analyzers

Up to 10 N·m

0.13 %

DLVN 110:2002, KLC source procedure torque wheel with E2+M1+F1 weights

Vibration Meter3 – Acceleration Velocity Displacement Frequency

10 m/s2 10 mm/s 10 µm 159.2 Hz

0.37 m/s2 0.48 mm/s 0.83 µm 1.8 Hz

KQT-33K1-4-19-1, vibration standard


VIII. Optical

Parameter/Equipment

Range

CMC2, 5, 6, 7 (±)

Comments

Nominal Illumination3 – Measure and Measuring Equipment

(10 to 100) lux (100 to 1000) lux (1000 to 20 000) lux

2.8 % + 0.1 lux 2.8 % + 1 lux 2.8 % + 10 lux

KQT-33K4-4-475-1, Chroma CL-200A

Chroma Meter

(X, Y, L, A, B)

0.08°

Manufacturer’s manual KQT-CH-01 color standard

UV/Vis Spectrometer

(190 to 1100) nm (0 to 2) Abs

0.24 nm 0.0043 Abs

KQT-SP-01, DLVN 91:2001, ASTM E - 925 spectrometer Cal standard

X-Ray Analyzer

As: 0.0017 % Au: 0.26 µm Br: 0.143 % Cd: 0.0146 % Cl: 0.038 % Cr: 0.004 51 % Cu: 9.2 µm Hg: 0.000 99 % Ni: 9.6 µm Pb: 0.006 97 % S: 0.064 % Sb: 0.0086 % Sn: 0.0099 % Zn: 0.117 %

As: 0.000 12 % Au: 0.06 µm Br: 0.008 % Cd: 0.005 % Cl: 0.006 % Cr: 0.000 19 % Cu: 0.5 µm Hg: 0.000 085 % Ni: 0.5 µm Pb: 0.000 25 % S: 0.01 % Sb: 0.0007 % Sn: 0.0006 % Zn: 0.004 %

Manufacturer’s manual KQT-XRF-01 low-density polyethylene standard X-ray thickness standard (Au, Cu, Ni)

Radiometer

Up to 500 mW/cm2

6.8 %

KQT-33K4-4-576-1, manufacturer’s manual, lumen dynamics R2000

Gloss Meter3

(20-60-85)°

1.3 GU

KQT-GL-01, manufacturer’s manual, standard gloss


VIII. Thermodynamics

Parameter/Equipment

Range

CMC2, 7 (±)

Comments

Temperature/Humidity Meter – Humidity Temperature

(0 to 90) % RH (-40 to 70) ºC

2.0 % RH 0.5 ºC

KQT-33K5-4-84-1 JIEO tech TH-ME JIEO tech TH-KE 065 + Data logger Vaisala HMP75 Vaisala HMI41

Temperature – Measure3

(-40 to -25) ºC (-25 to 300) ºC (300 to 650) ºC (650 to 1600) ºC

0.012 ºC 0.07 ºC 0.6 ºC 1.8 ºC

KQT-CG-13, manufacturer’s manual, Fluke 9142 + Fluke 5609 + Fluke 725 (Keithley 740) + Type K, S + LK LAB LC LT408

Thermometer and Temperature Meter3

(-40 to -25) ºC (-25 to 150) ºC (150 to 650) ºC

0.012 ºC 0.15 ºC 0.4 ºC

KQT-33K5-4-42-1, DLVN 137 and 138: 2004, KLC source procedure, E instrument TCS650 + Fluke 9142 + Fluke 5609 + Fluke 725 + LK LAB – LC LT408

IR Temperature – Measuring Instruments3

(-18 to 150) ºC (150 to 982) ºC

1.6 ºC 1.3 ºC

KQT-33K4-4-615-1, DLVN 124:2003, Omega BB701 + BB-4A

Chamber/Dry Oven3 – Humidity Temperature

(0 to 90) % RH (90 to 100) % RH (-50 to 200) °C (200 to 400) °C

1.9 % RH 2.5 % RH 0.6 °C 1.2 °C

KQT-CHDO-2015 ASTM D 5374 -1999 Data logger + Vaisala HMI110

Steam Sterilizer & Autoclave

(-40 to 140) °C (0 to 5) bar

0.16 °C 0.06 bar

KQT-AC-01 temperature and pressure data logger


Parameter/Equipment

Range

CMC2, 7 (±)

Comments

Liquid Bath3

(-50 to 200) °C (200 to 400) °C

0.6 °C 1.2 °C

KQT-CHDO-2015 ASTM D 5374 -1999 data logger

IX. Time & Frequency

Parameter/Equipment

Range

CMC2, 7 (±)

Comments

Frequency – Measure3

0.1 Hz to 12.4 GHz

2.3 parts in 108 Hz

KLC source procedure, manufacturer’s manual: Agilent 53132A

Frequency – Measuring Instruments3

1 Hz to 80 MHz 10 MHz to 26.5 GHz

14 parts in 106 Hz 6.5 parts in 108 Hz

KLC source procedure, manufacturer’s manual: Agilent 33250A, Agilent 8340B

Stopwatch & Timer

Up to 10 800 seconds

0.037 seconds

KQT-ST&T -01 Universal frequency counter


SATELLITE LABORATORY

KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD. 11 Huu Nghi Blvd.

VSIP Bac Ninh, Phu Chan Commune, Tu Son Town, Bac Ninh VIETNAM


CALIBRATION I. Acoustical

Parameter/Equipment

Range

CMC2 (±)

Comments


(94 and 114) dB

0.59 dB

KQT-33K3-4-2911-1, BK Cal 73

II. Chemical

Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Conductivity Meter3




pH Meter3

4.01 pH 7.00 pH 10.00 pH

0.021 pH 0.021 pH 0.021 pH


Refractometer3



KQT-RE-01, manufacturer’s manual, Hanna HI96801

Turbidity Meter3

(15 to 750) NTU

3.8 % + 0.02 NTU

KQT-TU-01 manufacturer’s manual, Hanna HI98703


Parameter/Equipment

Range

CMC2, 5 (±)

Comments

TDS Meter3

0.000 066 % TDS 0.0066 % TDS 0.0933 % TDS

0.000 0013 % TDS 0.000 02 % TDS 0.000 29 % TDS


Hydrometer

(0.600 to 2.000) g/cm3

0.003 g/cm3


Alcoholmeter

Up to 100 % V

0.4 % V

DLVN 106: 2012 manufacturer’ manual standard alcoholmeter


0.0025 % 0.0050 % 50 % LEL 0.001 % 0.01 % 12 % 20.9 % 2 % 0.2 % 0.0025 % 0.0005 % 0.001 % 0.001 %

6.6 % 2.7 % 2.8 % 2.3 % 2.3 % 2.4 % 2.3 % 2.3 % 2.3 % 5.8 % 12 % 12 % 12 %


III. Dimensional

Parameter/Equipment

Range

CMC2 (±)

Comments

Calipers3

Up to 1000 mm

0.005 mm/m + 0.008 mm

KQT-33K6-4-552-1, gauge block grade 0 + 1, caliper checker


Parameter/Equipment

Range

CMC2 (±)

Comments

Coordinate Measuring Machines (CMM)3 – 3-Axis Linearity Only

X: (10 to 900) mm Y: (10 to 900) mm Z: (10 to 500) mm

19 µm/m 19 µm/m 19 µm/m

Manufacturer’s manual, gauge block grade 0 + 1

Depth Gages3

Up to 1000 mm

0.017 mm/m + 0.007 mm


Dial Indicator3

Up to 200 mm

0.01 mm/m + 1.7 µm


Dial Test Indicator3

Up to 1 mm

0.006 mm/m + 1.1 µm

KQT-IN-01, Mitutoyo UDT-3

Dial Bore Gages3

Up to 500 mm

0.01 mm/m + 1.7 µm


Gage Blocks3

(1 to 10) mm (10 to 100) mm (100 to 250) mm

0.31 µm 0.0049 mm/m + 0.3 µm 0.0057 mm/m + 0.8 µm

KQT-33K6-4-1-1, Pratt & Whitney B

Height Gages3

Up to 900 mm

0.026 mm/m + 0.6 µm


Micrometers3

Up to 1000 mm

0.024 mm/m + 1 µm


Microscope – Measuring3

Up to 300 mm

0.004 mm/m + 2.5 µm



Parameter/Equipment

Range

CMC2 (±)

Comments

Pin/Plug Gages3

Up to 100 mm

0.0048 mm/m + 0.33 µm

KQT-33K6-4-121-1, Pratt & Whitney B

Profile Projector/Optical Comparator3

Up to 500 mm

0.003 mm/m + 2.3 µm



[(12 x 12) to (48 x 96)] in

50 µin


Thickness Gages3

Up to 12 mm

0.67 µm

KQT-TH-01, gauge block grade 0 + 1

Holtest

(6 to 75) mm

0.012 mm/m + 0.8 µm



Up to 50 m

0.003 m




Parameter/Range

Frequency

CMC2, 6 (±)

Comments

AC Current – Generate3 (0 to 2.2) mA (2.2 to 22) mA (22 to 220) mA 220 mA to 2.2 A (1.5 to 11) A (11 to 500) A

(20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz 20 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz 45 Hz to 65 Hz 65 Hz to 500 Hz (0.5 to 1) kHz 45 Hz to 1 kHz

0.2 mA/A + 0.035 µA 0.2 mA/A + 0.035 µA 0.2 mA/A + 0.11 µA 1.5 mA/A + 0.65 µA 0.2 mA/A + 0.35 µA 0.2 mA/A + 0.35 µA 0.2 mA/A + 0.55 µA 1.4 mA/A + 5 µA 0.2 mA/A + 3.5 µA 0.2 mA/A + 2.5 µA 0.2 mA/A + 3.5 µA 1.3 mA/A + 10 µA 0.3 mA/A + 35 µA 0.5 mA/A + 80 µA 8.5 mA/A + 160 µA 0.8 mA/A + 2 mA 1.2 mA/A + 2 mA 3.8 mA/A + 2 mA 0.6 mA/A + 100 mA

KQT-17-20AQ-101, KLC source procedure manufacturer’s manual, Fluke 5720A + 5500A Fluke 5720A + 5500A w/ coil


Parameter/Range

Frequency

CMC2, 6 (±)

Comments

AC Current – Measure3 (5 to 100) μA 100 μA to 10 mA (10 to 100) mA 100 mA to 1 A Up to 500 A

(10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (50 to 1000) Hz

4.6 mA/A + 0.03 µA 1.7 mA/A + 0.03 µA 0.7 mA/A + 0.03 µA 0.7 mA/A + 0.03 µA 4.6 mA/A + 0.2 µA 1.7 mA/A + 0.2 µA 0.7 mA/A + 0.2 µA 0.4 mA/A + 0.2 µA 4.6 mA/A + 20 µA 1.7 mA/A + 20 µA 0.7 mA/A + 20 µA 0.4 mA/A + 20 µA 4.6 mA/A + 0.2 mA 1.9 mA/A + 0.2 mA 0.97 mA/A + 0.2 mA 1.2 mA/A + 0.2 mA 3.1 mA/A

KQT-17-20AH-06, KLC source procedure, manufacturer’s manual, HP 3458A HP 3458A + high voltage divider

AC Voltage – Generate3 (0 to 220) mV 220 mV to 2.2 V (2.2 to 22) V (22 to 220) V

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 1000) kHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz

0.11 mV/V + 7 µV 0.26 mV/V + 7 µV 0.59 mV/V + 17 µV 1.1 mV/V + 20 µV 3.4 mV/V + 45 µV 0.06 mV/V + 8 µV 0.10 mV/V + 10 µV 0.14 mV/V + 30 µV 0.52 mV/V + 80 µV 2.1 mV/V + 0.3 mV 0.06 mV/V + 0.05 mV 0.10 mV/V + 0.1 mV 0.13 mV/V + 0.2 mV 0.35 mV/V + 0.6 mV 1.9 mV/V + 3.2 mV 0.07 mV/V + 0.6 mV 0.10 mV/V + 1 mV 0.14 mV/V + 2.5 mV



Parameter/Range

Frequency

CMC2, 6 (±)

Comments

AC Voltage – Generate3 220 V to 1.1 kV

50 Hz to 1 kHz

0.09 mV/V + 3.5 mV


AC Voltage – Measure3 (0 to 10) mV (10 to 100) mV 100 mV to 1 V (1 to 10) V (10 to 100) V 100 V to 1 kV

10 Hz to 20 kHz 40 Hz to 1 kHz 40 Hz to 1 kHz (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (50 to 100) kHz 10 Hz to 20 kHz 40 Hz to 1 kHz

2.8 mV/V + 0.04 mV 0.2 mV/V + 2 μV 0.1 mV/V + 20 μV 0.8 mV/V + 0.4 mV 0.1 mV/V + 0.2 mV 0.2 mV/V + 0.2 mV 1.0 mV/V + 0.2 mV 0.2 mV/V + 2 mV 0.5 mV/V + 20 mV

KQT-17-20AH-06, KLC source procedure, manufacturer’s manual Fluke 8845A HP 3458A

Parameter/Equipment

Range

CMC2, 6 (±)

Comments


(330 to 500) pF (0.5 to 1.1) nF (1.1 to 3.3) nF (3.3 to 11) nF (11 to 33) nF (33 to 110) nF (110 to 330) nF 330 nF to 1.1 µF (1.1 to 3.3) µF (3.3 to 11) µF (11 to 33) µF (33 to 110) µF (110 to 330) µF 330 µF to 1.1 mF

5.2 mF/F + 10 pF 1.4 mF/F + 10 pF 1.2 mF/F + 10 pF 1.5 mF/F + 10 pF 3.1 mF/F + 100 pF 3.2 mF/F + 100 pF 3.1 mF/F + 300 pF 3.4 mF/F + 1 nF 4.2 mF/F + 3 nF 4.5 mF/F + 10 nF 4.8 mF/F + 30 nF 6.1 mF/F + 0.1 µF 8.2 mF/F + 0.3 µF 12 mF/F + 0.3 µF

KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5500A


Parameter/Equipment

Range

CMC2, 5, 6 (±)

Comments


(0 to 220) μA 220 μA to 22 mA (22 to 220) mA 220 mA to 2.2 A (2.2 to 11) A (11 to 500) A

110 μA/A + 6 nA 52 μA/A + 40 nA 69 μA/A + 0.7 µA 110 μA/A + 12 µA 710 μA/A + 330 µA 0.7 mA/A + 17 mA

KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5720A + 5500A + Coil 50


(0 to 100) μA 100 μA to 1 mA (1 to 10) mA (10 to 100) mA (0.1 to 1) A

(1 to 2000) A

110 µA/A + 0.8 nA 49 µA/A + 5 nA 47 µA/A + 50 nA 67 µA/A + 0.5 µA 150 µA/A + 10 µA 6.6 mA/A + 1.5 mA

KQT-17-20AH-06, KLC source procedure, manufacturer’s manual HP 3458A HP 3458A + Shunt + Kyoritsu 2009R


(0 to 220) mV 220 mV to 2.2 V (2.2 to 11) V (11 to 22) V (22 to 220) V (220 to 1100) V

14 µV/V + 0.7 µV 8.1 µV/V + 1.4 µV 5.6 µV/V + 5 µV 5.6 µV/V + 9 µV 8.1 µV/V + 90 µV 11 µV/V + 0.7 mV



(0 to 100) mV 100 mV to 1V (1 to 10) V (10 to 100) V (100 to 1000) V (1 to 10) kV

12 µV/V + 0.35 µV 9.3 µV/V + 0.4 µV 9.3 µV/V + 1 µV 12 µV/V + 40 µV 12 µV/V + 0.15 mV 1.7 %

KQT-17-20AH-06, KLC source procedure, manufacturer’s manual Fluke 8845A HP 3458A HP3458A + high voltage divider

Power Analyzer/ Meter3

Up to 10 kW

0.13 %







Parameter/Equipment

Range

CMC2, 5, 6 (±)

Comments





Oscilloscopes3 Square Wave Signal 10 Hz to 10 kHz Leveled Sine Wave Time Markers

1.8 mV to 105 Vp-p 50 kHz to 100 MHz (100 to 300) MHz 5 s to 100 µs (50 to 2) µs 1 µs to 20 ns (10 to 2) ns

16 mV/V + 0.1 mV 0.3 mHz/Hz 2 mHz/Hz 6.9 ms/s 17 ms/s 14 ms/s 1.8 ms/s

KQT-CG-7, KLC source procedure, manufacturer’s manual, Fluke 5500A

Gauss Meters3

3 mT 50 mT 300 mT

2.3 % 2.8 % 3.5 %

KQT-33K1-4-1658-1 manufacturer’s manual magnetic tool


(0 to 20) kV (0 to 100) mA

1.7 % 1.4 %


Insulation Testers3

Up to 10 kV Up to 200 MΩ (0.2 to 100) GΩ

1.1 % 0.2 % 1.9 %


LCR Meters3

Up to 200 MΩ Up to 1000 F (1 to 900) mH

0.4 % 0.14 % 2.3 %



Parameter/Equipment

Range

CMC2 (±)

Comments


(0.5 to 2.0) mm (0.4 to 2.0) mm

0.0009 mm 0.0009 mm


V. Electrical – RF/Microwave

Parameter/Range

Frequency

CMC2 (±)

Comments

RF Power – Measuring Instruments3 (-70 to 20) dBm (-30 to 20) dBm


0.54 dBm 0.39 dBm

KQT-33K4-4-715-1, KLC source procedure, manufacturer’s manual, HP 8340B monitored w/ Agilent N1911A w/ 8485A or E4412A

RF Power – Measure3 (-70 to 20) dBm (-30 to 20) dBm


0.54 dBm 0.39 dBm

KQT-33K4-4-105-1, KLC source procedure, manufacturer’s manual, Agilent N1911A w/ E4412A or 8485A

VI. Fluid Quantities

Parameter/Equipment

Range

CMC2, 7 (±)

Comments

Air Speed/Velocity – Measuring Equipment

Up to 30 m/s

0.21 m/s

KQT-33K6-4 1769-1, velocity standard


Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Air/Mass Flow Meters3

(0.1 to 1) lpm (>1 to 30) lpm (>30 to 2500) lpm

0.03 % lpm 1.7 % lpm 2.3 % lpm

KQT-33K6-4-1769-1A, mini-AP Buck flow calibrator M30B flow rate standard meter magnetic flowmeter

Viscosity Meter

(100 to 200 000) cP

1.5 %


Burets

(100 to 1000) µL (1 to 10) mL (10 to 500) mL

1.1 mL/L 0.2 mL/L 0.1 mL/L

KQT-VO-01, standard weight E2 + balance

Pipettes

(10 to 100) µL (100 to 1000) µL (1 to 10) mL (10 to 500) mL

5.2 mL/L 1.1 mL/L 0.2 mL/L 0.1 mL/L


Volumetric Flasks

(0 to 1000) mL (1000 to 5000) mL

0.17 mL/L 0.14 mL/L


VII. Mechanical

Parameter/Equipment

Range

CMC2, 5 (±)

Comments



0.5 % 0.1 %

KQT-33K6-4-1362-1, ASTM D2240 partial calibration, standard weight E2 + standard scale


Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Balances and Scales3 – Class I and II Class III and IV

(0 to 50) g (50 to 200) g (200 to 500) g 500 g to 6 kg (1 to 10) kg (10 to 50) kg (50 to 100) kg (100 to 150) kg (150 to 2000) kg

0.2 mg 1.4 mg 1.2 mg 15 mg 8.2 g 19 g 68 g 130 g 0.41 kg

KQT-BA-01, OIML R76-1 standard weight

Force Tester3

Up to 98 kN Up to 2 kgf Up to 10 000 kgf

0.25 % 0.08 % 0.25 %

KQT-17-20MF-04, DLVN 109:2002, KLC source procedure, standard weight E2 + load cell

Hardness Testers3 – Indirect Verification of Rockwell Hardness Testers

HRBW: Medium High HRC: Medium High

0.93 HRBW 0.92 HRBW 0.5 HRC 1.1 HRC

DLVN 63:2000, manufacturer’s manual, Indirect verification per ASTM E18 using hardness standard

Hardness Testers3 – Indirect Verification of Vickers Hardness Testers

285 HV 502 HV 700 HV

7.1 HV 13 HV 18 HV

DLVN 63:2000, manufacturer’s manual


Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Mass/Weights – Class F1, F2, M1, M2 and M3 Class F2, M1, M2 and M3 Class M1, M2 and M3

(1 to 500) g (0.5 to 5) kg (5 to 20) kg

0.2 mg + 1.7 mg/g 1.1 mg + 9.2 mg/g 0.03 g + 0.0084 mg/g

KQT-SW-01, OIML R111-1, standard weight E2 + standard scale

Particle Counter3/Dust Monitor

(0.3 to 10) µm (0.001 to 10.000) mg/m3

13 % 13 %

KQT-LCP-2800, particle counter digital dust monitor

Pressure3 – Gauges/Pressure Switch/Safety Valve Pressure Transmitter Barometer/ Manometer


0.06 % 0.7 % 0.06 %


Surface Roughness and Surface Roughness Testers3

2.97 µm 18.9 µin 119.5 µin

0.9 µm 5 µin 5 µin

KQT-33K6-4-2021-1, manufacturer’s manual, Mitutoyo 178-602 + federal reference standard


Up to 2000 N·m

1.2 %

KQT-33K6-4-2930-1, KLC source procedure, mount LTT-2100

Torque Analyzers

Up to 350 N·m

0.13 %

DLVN 110:2002, KLC source procedure torque wheel with E2+M1+F1 weights, insize IST-2200 N·m


Parameter/Equipment

Range

CMC2 (±)

Comments

Vibration Meter3 – Acceleration Velocity Displacement Frequency

10 m/s2 10 mm/s 10 µm 159.2 Hz

0.37 m/s2 0.48 mm/s 0.83 µm 1.8 Hz

KQT-33K1-4-19-1, vibration standard

VIII. Optical

Parameter/Equipment

Range

CMC2, 5, 7 (±)

Comments



2.8 % + 0.1 lux 2.8 % + 1 lux 2.8 % + 10 lux


Radiometer

Up to 500 mW/cm2

6.8 %

KQT-33K4-4-576-1, manufacturer’s manual, lumen dynamics R2000

UV/Vis Spectrometer

(190 to 1100) nm (0 to 2) Abs

0.24 nm 0.0043 Abs

KQT-SP-01, DLVN 91:2001, ASTM E - 925 spectrometer calibration standard

X-ray Analyzer



KQT-XRF-01 low-density polyethylene standard, x-ray thickness standard (Au, Cu, Ni)


Parameter/Equipment

Range

CMC2 (±)

Comments

Gloss Meter3

(20-60-85)°

1.3 GU

KQT-GL-01, manufacturer’s manual, standard gloss

Chroma Meter

(X, Y, L, A, B)

0.08°


IX. Thermodynamics

Parameter/Equipment

Range

CMC2, 7 (±)

Comments

Temperature/Humidity Meter –

Humidity Temperature

(0 to 90) % RH (-40 to 70) ºC

2.0 % RH 0.5 ºC

KQT-33K5-4-84-1 JIEO tech TH-KE 065 + Data logger + Vaisala HMI41 Vaisala HMP75



0.012 ºC 0.07 ºC 0.6 ºC 1.8 ºC

KQT-CG-13, manufacturer’s manual, Fluke 9142 + Fluke 5609 + Fluke 725 (Keithley 740) + Type K, S + LK LAB – LC LT408


(-40 to -25) ºC (-25 to 150) ºC (150 to 650) ºC

0.35 ºC 0.16 ºC 0.4 ºC

KQT-33K5-4-42-1, DLVN 137&138: 2004, KLC source procedure, E instrument TCS650 + Fluke 9142 + Fluke 5609 + Fluke 725 + LK LAB – LC LT408


(-18 to 150) ºC (150 to 982) ºC

1.6 ºC 1.3 ºC



Parameter/Equipment

Range

CMC2 (±)

Comments

Chamber/Dry – Oven3 Humidity Temperature

(0 to 90) % RH (90 to 100) % RH (-50 to 200) °C (200 to 400) °C

1.9 % RH 2.5 % RH 0.6 °C 1.2 °C

KQT-CHDO-2015 ASTM D 5374 -1999 Data logger + Vaisala HMI110


(-40 to 140) °C (0 to 5) bar

0.16 °C 0.06 bar

KQT-AC-01 temperature and pressure datalogger

Liquid Bath

(-50 to 200) °C (200 to 400) °C

0.6 °C 1.2 °C


X. Time & Frequency

Parameter/Equipment

Range

CMC2, 7 (±)

Comments

Frequency – Measure3

0.1 Hz to 12.4 GHz

2.3 parts in 108 Hz

KLC source procedure, manufacturer’s manual: Agilent 53132A

Frequency – Measuring Instruments3

1 Hz to 80 MHz 10 MHz to 26.5 GHz

14 parts in 106 Hz 6.5 parts in 108 Hz

KLC source procedure, manufacturer’s manual: Agilent 33250A Agilent 8340A

Stopwatch & Timer

Up to 10 800 seconds

0.037 seconds

KQT-ST&T -01 universal frequency counter


SATELLITE LABORATORY

KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD. #259, Pham Hung Street

Hoa Xuan Ward, Cam Le District, Da Nang City VIETNAM


CALIBRATION

I. Acoustical

Parameter/Equipment

Range

CMC2 (±)

Comments


(94 and 114) dB

0.59 dB

KQT-33K3-4-2911-1, BK Cal 73

II. Chemical

Parameter/Equipment

Range

CMC2 (±)

Comments

Conductivity Meter3




pH Meter3

4.01 pH 7.00 pH 10.00 pH

0.021 pH 0.021 pH 0.021 pH


Hydrometer

(0.600 to 2.000) g/cm3

0.003 g/cm3



Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Refractometer3



KQT-RE-01 manufacturer’s manual, Hanna HI96801

TDS Meter3

0.000 066 % TDS 0.0066 % TDS 0.0933 % TDS

0.000 0013 % TDS 0.000 02 % TDS 0.000 29 % TDS


Alcoholmeter

Up to 100 % V

0.4 % V

DLVN 106:2012 manufacturer’ manual standard alcoholmeter

Viscosity Meter

(100 to 200 000) cP

1.5 %



0.0025 % 0.0050 % 50 % LEL 0.001 % 0.01 % 12 % 20.9 % 2 % 0.2 % 0.0025 % 0.0005 % 0.001 % 0.001 %

6.6 % 2.7 % 2.8 % 2.3 % 2.3 % 2.4 % 2.3 % 2.3 % 2.3 % 5.8 % 12 % 12 % 12 %



III. Dimensional

Parameter/Equipment

Range

CMC2, 7 (±)

Comments

Calipers3

Up to 500 mm

0.005 mm/m + 0.008 mm

KQT-33K6-4-552-1, gauge block grade 0 + 1, caliper checker

Depth Gages3

Up to 500 mm

0.017 mm/m + 0.007 mm


Dial Indicator3

Up to 200 mm

0.01 mm/m + 1.7 µm



Up to 50 m

0.003 m


Holtest

(6 to 75) mm

0.012 mm/m + 0.8 µm


Height Gages3

Up to 500 mm

0.026 mm/m + 0.6 µm


Micrometers3

Up to 500 mm

0.024 mm/m + 1 µm



[(12 x 12) to (48 x 96)] in

50 µin


Thickness Gages/Feeler Gages and Thickness Films3

Up to 50 mm

0.1 mm/m + 0.8 µm

KQT-TH-01, gauge block grade 0 +1


Parameter/Equipment

Range

CMC2 (±)

Comments

Microscope, Measuring3 Profile Projector/Optical Comparator3

Up to 500 mm

0.004 mm/m + 2.5 µm



Parameter/Equipment

Range

CMC2, 6 (±)

Comments


(0 to 220) μA 220 μA to 22 mA (22 to 220) mA 220 mA to 1 A

110 μA/A + 6 nA 52 μA/A + 40 nA 70 μA/A + 0.7 µA 110 μA/A + 12 µA

KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Keithley 2450


(0 to 100) μA 100 μA to 1 mA (1 to 10) mA (10 to 100) mA (0.1 to 3) A (3 to 100) A

110 µA/A + 0.8 nA 50 µA/A + 5 nA 47 µA/A + 50 nA 67 µA/A + 0.5 µA 150 µA/A + 10 µA 7.2 mA/A

KQT-17-20AH-06, KLC source procedure, manufacturer’s manual HP 34401A HP 34401A w/ L&N 4361 Shunt


(0 to 220) mV 220 mV to 2.2 V (2.2 to 11) V (11 to 22) V (22 to 200) V

14 µV/V + 0.7 µV 8.1 µV/V + 1.4 µV 5.6 µV/V + 5 µV 5.6 µV/V + 9 µV 8.1 µV/V + 90 µV

KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Keithley 2450


(0 to 100) mV 100 mV to 1V (1 to 10) V (10 to 100) V (100 to 1000) V

12 µV/V + 0.35 µV 9.3 µV/V + 0.4 µV 9.3 µV/V + 1 µV 12 µV/V + 40 µV 12 µV/V + 0.15 mV

KQT-17-20AH-06, KLC source procedure, manufacturer’s manual HP 34401A


Parameter/Equipment

Range

CMC2, 5, 6 (±)

Comments


(100 to 500) pF (0.5 to 1.1) nF (1.1 to 3.3) nF (3.3 to 11) nF (11 to 33) nF (33 to 110) nF (110 to 330) nF 330 nF to 1.1 µF (1.1 to 3.3) µF (3.3 to 10) µF

5.2 mF/F + 10 pF 1.4 mF/F + 10 pF 1.2 mF/F + 10 pF 1.5 mF/F + 10 pF 3.1 mF/F + 100 pF 3.2 mF/F + 100 pF 3.1 mF/F + 300 pF 3.4 mF/F + 1 nF 4.2 mF/F + 3 nF 4.5 mF/F + 10 nF

KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, decade capacitor AEMC-BC05









LCR Meters3

(0 to 200) MΩ (0 to 1000) pF (1 to 900) mH

0.4 % 0.14 % 2.3 %


Power Analyzer/Meter3

Up to 10 kW

0.13 %



(0.6 to 2.5) mm (0.4 to 3.2) mm

0.0009 mm 0.0009 mm



Parameter/Equipment

Range

CMC2, 5 (±)

Comments


(0.5 to 20) kV (0.5 to 100) mA

1.7 % 1.4 %


Insulation Testers3

(0 to 10) kV (0 to 200) MΩ (0.2 to 100) GΩ

1.1 % 0.2 % 1.6 %


V. Fluid Quantities

Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Air Speed/Velocity

Up to 30 m/s

0.21 m/s

KQT-33K6-4-1769-1, velocity standard

Viscosity Meter

(100 to 200 000) cP

1.5 %


Burets

(100 to 1000) µL (1 to 10) mL (10 to 400) mL

1.1 mL/L 0.2 mL/L 0.1 mL/L

KQT-VO-01, standard weight F1 + balance

Pipettes

(100 to 1000) µL (1 to 10) mL (10 to 400) mL

1.1 mL/L 0.2 mL/L 0.1 mL/L

KQT-VO-01, standard weight F1 + balance

Volumetric Flasks

(0 to 1000) mL (1000 to 4000) mL

0.17 mL/L 0.14 mL/L

KQT-VO-01, standard weight F1 + standard scale


VI. Mechanical

Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Balances and Scales3 – Class II Class III and IV

(0 to 50) g (50 to 200) g (200 to 500) g 500 g to 2 kg (1 to 10) kg (10 to 50) kg (50 to 100) kg (100 to 300) kg

0.2 mg 1.4 mg 1.2 mg 15 mg 8.2 g 19 g 67 g 130 g

KQT-BA-01, OIML R76-1 standard weight



0.5 % 0.1 %

KQT-33K6-4-1362-1, ASTM D2240 partial calibration, standard weight F1 + standard scale

Force Tester3

Up to 49 kN Up to 2 kgf Up to 5000 kgf

0.25 % 0.08 % 0.25 %

KQT-17-20MF-04, DLVN 109:2002, KLC source procedure, standard weight E2 +load cell

Mass/Weights – Class F2, M1, M2 and M3 Class F2, M1, M2 and M3 Class M1, M2 and M3

(1 to 500) g (0.5 to 10) kg (5 to 20) kg

0.2 mg + 1.7 mg/g 1.1 mg + 9.2 mg/g 0.03 g + 0.084 mg/g

KQT-SW-01, OIML R111-1, standard weight F1 + standard scale


Parameter/Equipment

Range

CMC2, 5 (±)

Comments

Pressure3 – Gauges/Pressure Switch/Safety Valve Pressure Transmitter Barometer/Manometer


0.06 % 0.7 % 0.06 %



Up to 2000 N·m

1.3 %

KQT-33K6-4-2930-1, KLC source procedure, mount LTT-2100, Insize IST-2200 N·m

Torque Analyzers

Up to 10 N·m

0.13 %

DLVN 110:2002, KLC source procedure torque wheel with E2+M1+F1 weights

VII. Optical

Parameter/Equipment

Range

CMC2, 6, 7 (±)

Comments

Chroma Meter

(X, Y, L, A, B)

0.08°




2.8 % + 0.1 lux 2.8 % + 1 lux 2.8 % + 10 lux


UV/Vis Spectrometer

(190 to 1100) nm (0 to 2) Abs

0.24 nm 0.0043 Abs

KQT-SP-01, DLVN 91:2001, ASTM E – 925 spectrometer calibration standard


Parameter/Equipment

Range

CMC2, 5, 7 (±)

Comments

X-ray Analyzer



Manufacturer’s manual KQT-XRF-01 low-density polyethylene standard, x-ray thickness standard (Au, Cu, Ni)

VIII. Thermodynamics

Parameter/Equipment

Range

CMC2, 7 (±)

Comments

Temperature/Humidity Meter – Humidity Temperature

(0 to 90) % RH (-40 to 70) ºC

2.0 % RH 0.5 ºC

KQT-33K5-4-84-1 JIEO tech TH-KE 065 + Data logger + Vaisala HMI41 + Vaisala HMP75



0.012 ºC 0.07 ºC 0.6 ºC 1.8 ºC

KQT-CG-13, manufacturer’s manual, Fluke 725 + Type K Keithley 740 + LK LAB – LC LT408


(-40 to -25) ºC (-25 to 150) ºC (150 to 650) ºC

0.35 ºC 0.15 ºC 0.4 ºC

KQT-33K5-4-42-1, DLVN 137&138: 2004, KLC source procedure, E instrument TCS650 + Fluke 9142 + Fluke 5609 + Fluke 725 + LK LAB - LC LT408


Parameter/Equipment

Range

CMC2, 7 (±)

Comments


(-18 to 150) ºC (150 to 982) ºC

1.6 ºC 1.3 ºC


Chamber/Dry Oven3 – Humidity Temperature

(0 to 90) % RH (90 to 100) % RH (-50 to 200) °C (200 to 400) °C

1.9 % RH 2.5 % RH 0.6 °C 1.2 °C

KQT-CHDO-2015 ASTM D 5374 -1999 data logger + Vaisala HMI110


(-40 to 140) °C (0 to 5) bar

0.16 °C 0.06 bar

KQT-AC-01 temperature and pressure datalogger

Liquid Bath3

(-50 to 200) °C (200 to 400) °C

0.6 °C 1.2 °C


____________________________________________

1 This laboratory offers commercial calibration service and field calibration service. 2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement

that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device and to influences from the circumstances of the specific calibration.

3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.

4 Surface plate calibrations are only offered as a partial calibration that is limited to repeat readings that

reflect local variations in flatness, as agreed upon by the customer as documented during the contract negotiation process in compliance with ISO/IEC 17025:2017, section 7.1.

5 In the statement of the CMC, percentages are percent of reading, unless otherwise indicated. In the statement of the CMC, V is defined as volume measured.


6 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMC’s are expressed as either a specific value that covers the full range or as a percent or fraction of the reading plus a fixed floor specification.

7 The type of instrument or material being calibrated is defined by the parameter. This indicates the

laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter.

8 This scope meets A2LA’s P112 Flexible Scope Policy.

For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.

Accredited Laboratory

A2LA has accredited

KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD. Ho Chi Minh City, VIETNAM

for technical competence in the field of

Calibration

This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General requirements for the competence of testing and calibration laboratories. This laboratory also meets R205 – Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation demonstrates technical competence for a

defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017).

Presented this 30th day of March 2021 _______________________ Vice President, Accreditation Services For the Accreditation Council Certificate Number 4184.01 Valid to February 28, 2023

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