SA2004 Test conditions: Vout= 5V Iout =50Amp 0-5KGauss
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SA2004 Test conditions: Vout= 5V Iout =50Amp 0-5KGauss
description
SA2004 Test conditions: Vout= 5V Iout =50Amp 0-5KGauss. Setup. SASY2000. Vout. Vset. CHon. To the load. SASY2000. EXTERNAL PWR48. SASY. Address. Communications. +. 48V sig. PWR 48V IN. -. Fuse. Earth. SY2527. 48V sig. Communications. Instruments:. - PowerPoint PPT Presentation
Transcript of SA2004 Test conditions: Vout= 5V Iout =50Amp 0-5KGauss
SA2004 Test conditions:
Vout= 5VIout =50Amp
0-5KGauss
Setup
SY2527BRANCH
CONTROLLER
controls
SASYChannel
Comunications
Rshunt(1mOhm)
Pwr48V+ Vrout -+
-
48Vsig.
VinCH
IinCH
VinSASY
Rshunt(10mOhm)
+ Vrin -
Iout
+
-
+-
Active load+
-Vout
Iin
To the load
SASY2000Vout
CHon
Vset
SASY2000
Address
+
-PWR 48V IN
Communications
48V sig.
Fuse
Earth
SASY
EXTERNAL PWR48
48V sig.
SY2527
.
Communications
Instruments:
-n°1 48V LAMBDA JWS600 Power supply-n°1 Branch Controller -n°1 80V 50A 400W/CH MAX Active load-n°1 Oscilloscope TEKTRONIX YHS720P-n°1 Rshunt 20Amp 10mOhm-n°1 Rshunt 50amp 50mV-n°1 SASY-n°1 System SY2527-n°1 Tester Goldstar DM-332
Waveform across the transfomer primary0KGauss
5KGauss
20V
/Div
60V
0
-60V 1usec/Div
1KGauss 2KGauss
3KGauss 4KGauss
Current absorbed by the primary’s power supply, measured on a 33 mOhm load
0KGauss
1usec/Div
0
33A
/Div
1KGauss 2KGauss
4KGauss 5KGauss3KGauss
23A20A26.4A
33A 34A40A
Effect• Reduction of the dead time on the transformer drive.
• Increment of the absorbed current.
Cause•Reduction of the magnetization inductance
•Increment of the dissipated inductance
SA2004MAGNETIC FIELD TEST RESULTS - CERN 22-23-24/04/2002
SASY absorptions Channel characterization(channel turned off)
Kgauss Vrin Iin-CHoff VinSASY Pin Vrin Iin-Chon IinCH VinSASY VinCH Pi-CH Vout Iout Po-CH Po/Pi%(mV) (Amp) (V) (W) (mV) (Amp) (Amp) (V) (V) (W) (V) (Amp) (W)
0 2,7 0,27 47,8 12,906 70,2 7,02 6,75 47,8 46,6 314,55 5,02 50 251 79,796531 2,8 0,28 47,8 13,384 72,3 7,23 6,95 47,8 46,5 323,175 5,02 50 251 77,66692 2,8 0,28 47,8 13,384 73,8 7,38 7,1 47,8 46,5 330,15 5,02 50 251 76,026053 2,9 0,29 47,8 13,862 77,2 7,72 7,43 47,8 46,4 344,752 5,02 50 251 72,805964 3,1 0,31 47,8 14,818 82,5 8,25 7,94 47,8 46,3 367,622 5,02 50 251 68,276655 3,3 0,33 47,8 15,774 87,7 8,77 8,44 47,8 46,2 389,928 5,02 50 251 64,370866 3,6 0,36 47,8 17,208
Vrin: drop over the 10 mOhm shunt resistance in series to the Pwr 48VIin-Choff: current absorbed by the SASY with the channel offVinSASY: Pwr 48VPin: power absorbed by the SASY with the channel off Iin-Chon: current absorbed by the SASY with the channel on IinCH: current absorbed by the channel (IinChon-IinChoff)VinCH: channel input voltage Pi-CH: power provided by the Pwr 48V with the channel on Vout: channel output voltage Iout: current provided by the channel Po-CH: power over the loadPo/Pi%: percentage efficiency of the channel
Pin(W)12,90613,38413,38413,86214,81815,77417,208
Pi-CH(W)314,55323,17330,15344,75367,62389,93
Po-CH(W)
251251251251251251
Po/Pi%
79,877,6
767368
64,4
KG
0123456
SASY absorbed power (channel off)
0
2
4
6
8
10
12
14
16
18
20
0 1 2 3 4 5 6
Magnetic field (KGauss)
Pin
(W
)
Channel efficiency Vs. magnetic field
0
10
20
30
40
50
60
70
80
90
0 1 2 3 4 5
Magnetic field (KGauss)
(Pou
t/Pin
)%
ConclusionsThe channels have behaved as foreseen during the project phase, this is the reason why components which could stand a larger current stress have been chosen.
ProposalsAccording to the data resulting from these tests, CAEN Power Supply is realizing the revisions of the tested boards in order to improve their performance in magnetic field
Acknowledgements:
For the test runs we wish to thank the following people:
G. Stefanini , S. De Pasquale, F. Cindolo (ALICE)
L. Periale (CERN ESS-EP)
