S4102: SiC Power Devices

12
S4102 N-channel SiC power MOSFET bare die Junction temperature T j 175 °C Range of storage temperature T stg -55 to +175 °C Pulsed drain current I D,pulse *2 180 A Gate - Source voltage (DC) V GSS -4 to +22 V Unit Drain - Source voltage V DSS 1200 V Value Continuous drain current T c = 25°C I D *1 72 A Induction heating Motor drives lAbsolute maximum ratings (T a = 25°C) Parameter Symbol lApplication Solar inverters DC/DC converters Switch mode power supplies lFeatures lInner circuit 1) Low on-resistance 2) Fast switching speed 3) Fast reverse recovery 4) Easy to parallel 5) Simple to drive V DSS 1200V R DS(on) (Typ.) 30mW I D 72A *1 Gate-Source Surge Voltage (t surge < 300nsec) V GSS_surge *3 -4 to +26 V Recommended Drive Voltage V GS_op *4 0 / +18 V (1) Gate (2) Drain (3) Source *1 Body Diode www.rohm.com © 2018 ROHM Co., Ltd. All rights reserved. TSZ2211114001 1/11 TSQ50152-S4102 14.Jun.2018 - Rev.001 Datasheet

Transcript of S4102: SiC Power Devices

Page 1: S4102: SiC Power Devices

S4102N-channel SiC power MOSFET bare die

Junction temperature Tj 175 °C

Range of storage temperature Tstg -55 to +175 °C

Pulsed drain current ID,pulse *2 180 A

Gate - Source voltage (DC) VGSS -4 to +22 V

Unit

Drain - Source voltage VDSS 1200 V

Value

Continuous drain current Tc = 25°C ID *1 72 A

・Induction heating

・Motor drives

lAbsolute maximum ratings (Ta = 25°C)

Parameter Symbol

lApplication

・Solar inverters

・DC/DC converters

・Switch mode power supplies

lFeatureslInner circuit

1) Low on-resistance

2) Fast switching speed

3) Fast reverse recovery

4) Easy to parallel

5) Simple to drive

VDSS 1200V

RDS(on) (Typ.) 30mW

ID 72A*1

Gate-Source Surge Voltage (tsurge < 300nsec) VGSS_surge*3

-4 to +26 V

Recommended Drive Voltage VGS_op*4 0 / +18 V

(1) Gate (2) Drain (3) Source

*1 Body Diode

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S4102

WGate input resistance RG f = 1MHz, open drain - 5 -

30 37.5

Tj = 125°C - 45 -

5.6 V

Static drain - source

on - state resistanceRDS(on)

*5

VGS = 18V, ID = 27A

mWTj = 25°C

Gate threshold voltage VGS (th) VDS = 10V, ID = 13.3mA 2.7 -

-

Gate - Source leakage current IGSS+ VGS = +22V, VDS = 0V - - 100 nA

Gate - Source leakage current IGSS- VGS = -4V, VDS = 0V - - -100 nA

1 10

Tj = 150°C - 2 -

V

Zero gate voltage

drain currentIDSS

VDS = 1200V, VGS = 0V

mATj = 25°C -

Drain - Source breakdown

voltageV(BR)DSS VGS = 0V, ID = 1mA 1200 - -

UnitMin. Typ. Max.

lElectrical characteristics (Ta = 25°C)

Parameter Symbol ConditionsValues

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S4102

V

- 55 -

Gate plateau voltage V(plateau) VDD = 600V, ID = 27A - 9.6 -

nCGate - Source charge Qgs *5 ID = 27A - 30 -

Gate - Drain charge Qgd *5 VGS = 18V

Total gate charge Qg *5 VDD = 600V - 131 -

lGate Charge characteristics (Ta = 25°C)

Parameter Symbol ConditionsValues

UnitMin. Typ. Max.

mJ

Turn - off switching loss Eoff *5 - 204 -

Turn - on switching loss Eon *5 VDD = 600V, ID=27A

VGS = 18V/0V

RG = 0W L=250mH

*Eon includes diode

reverse recovery

- 468 -

-

tr *5 VGS = 18V/0V - 42 -

Turn - off delay time td(off) *5 RL = 22W - 61

72 -

pF

Turn - on delay time td(on) *5 VDD = 400V, ID = 18A - 24 -

nsRise time

Effective output capacitance,

energy relatedCo(er)

VGS = 0V

VDS = 0V to 600V- 157 -

-

Fall time tf *5 RG = 0W - 29

S

Input capacitance Ciss VGS = 0V - 2222 -

pFOutput capacitance Coss

Transconductance gfs *5 VDS = 10V, ID = 27A - 10.8 -

VDS = 800V - 180 -

Reverse transfer capacitance Crss f = 1MHz -

lElectrical characteristics (Ta = 25°C)

Parameter Symbol ConditionsValues

UnitMin. Typ. Max.

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S4102

lBody diode electrical characteristics (Source-Drain) (Ta = 25°C)

*1 Limited only by maximum temperature allowed.For Tj=175°C and thermal dissiparion to ambience of 339W or more.

Limited only by maximum temperature allowed.

*2 PW 10ms, Duty cycle 1%

*3 Example of acceptable Vgs waveform

*4 Please be advised not to use SiC-MOSFETs with Vgs below 13V as doing so may cause

thermal runaway.

*5 Pulsed

A

Qrr *5 - 135 - nC

Peak reverse recovery current Irrm *5

- 10 -

V

Reverse recovery time trr *5

IF = 27A, VR = 600V

di/dt = 1100A/ms

- 27 - ns

Reverse recovery charge

Forward voltage VSD *5 VGS = 0V, IS = 27A - 3.2 -

A

Inverse diode direct current,

pulsedISM

*2 - - 180 A

Inverse diode continuous,

forward currentIS

*1

Tc = 25°C

- - 72

Parameter Symbol ConditionsValues

UnitMin. Typ. Max.

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S4102

lElectrical characteristic curves

Fig.1 Typical Output Characteristics(I)

Dra

in C

urr

ent

: I D

[A

]

Drain - Source Voltage : VDS [V]

Fig.2 Typical Output Characteristics(II)

Drain - Source Voltage : VDS [V]

Fig.3 Tj = 150ºC Typical Output Characteristics(I)

Dra

in C

urr

ent

: I D

[A

]

Drain - Source Voltage : VDS [V]

Fig.4 Tj = 150ºC Typical Output Characteristics(II)

Dra

in C

urr

ent

: I D

[A

]

Drain - Source Voltage : VDS [V]

Dra

in C

urr

ent

: I D

[A

]

0

10

20

30

40

50

60

70

0 2 4 6 8 10

Ta = 25ºC Pulsed

10V

VGS= 8V

12V 16V

20V

18V 14V

0

5

10

15

20

25

30

35

0 1 2 3 4 5

Ta = 25ºC Pulsed

VGS= 8V

10V

14V

16V

18V

20V

12V

0

10

20

30

40

50

60

70

0 2 4 6 8 10

Ta = 150ºC Pulsed

10V

VGS= 8V

18V

16V

20V

14V

12V

0

5

10

15

20

25

30

35

0 1 2 3 4 5

Ta = 150ºC Pulsed

VGS= 8V

18V

16V

14V

12V

20V 10V

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S4102

lElectrical characteristic curves

Fig.5 Typical Transfer Characteristics (I)

Dra

in C

urr

ent

: I D

[A

]

Gate - Source Voltage : VGS [V]

Fig.6 Typical Transfer Characteristics (II)

Gate - Source Voltage : VGS [V]

Fig.7 Gate Threshold Voltage vs. Junction Temperature

Gate

Thre

shold

Voltage :

V G

S(t

h) [V

]

Junction Temperature : Tj [ºC]

Fig.8 Transconductance vs. Drain Current

Tra

nsconducta

nce :

gfs [S

]

Drain Current : ID [A]

Dra

in C

urr

ent

: I D

[A

]

0.1

1

10

0.1 1 10

VDS = 10V Pulsed

Ta = 150ºC Ta = 75ºC Ta = 25ºC

Ta = -25ºC

0

1

2

3

4

5

6

-50 0 50 100 150 200

VDS = 10V ID = 13.3mA

0.01

0.1

1

10

100

0 2 4 6 8 10 12 14 16 18 20

Ta= 150ºC Ta= 75ºC Ta= 25ºC

Ta= -25ºC

VDS = 10V Pulsed

0

10

20

30

40

50

60

70

0 2 4 6 8 10 12 14 16 18 20

Ta= 150ºC Ta= 75ºC Ta= 25ºC

Ta= -25ºC

VDS = 10V Pulsed

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S4102

lElectrical characteristic curves

Fig.9 Static Drain - Source On - State Resistance vs. Gate - Source Voltage

Sta

tic D

rain

- S

ourc

e O

n-S

tate

Resis

tance

: R

DS

(on) [W

]

Gate - Source Voltage : VGS [V]

Fig.10 Static Drain - Source On - State Resistance vs. Junction Temperature

Junction Temperature : Tj [ºC]

Fig.11 Static Drain - Source On - State Resistance vs. Drain Current

Drain Current : ID [A]

Sta

tic D

rain

- S

ourc

e O

n-S

tate

Resis

tance

: R

DS

(on) [W

]

Sta

tic D

rain

- S

ourc

e O

n-S

tate

Resis

tance

: R

DS

(on) [W

]

0

0.01

0.02

0.03

0.04

0.05

0.06

0.07

0.08

0.09

0.1

0.11

0.12

8 10 12 14 16 18 20 22

ID = 27A

ID = 48A

Ta = 25ºC Pulsed

0

0.01

0.02

0.03

0.04

0.05

0.06

0.07

0.08

0.09

0.1

0.11

0.12

-50 0 50 100 150 200

VGS = 18V

Pulsed

ID = 48A

ID = 27A

0.01

0.1

1

1 10 100

VGS = 18V Pulsed

Ta = 150ºC Ta = 125ºC Ta = 75ºC Ta = 25ºC

Ta = -25ºC

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S4102

lElectrical characteristic curves

Fig.12 Typical Capacitance

vs. Drain - Source Voltage

Capacitance :

C [pF

]

Drain - Source Voltage : VDS [V]

Fig.13 Coss Stored Energy

Drain - Source Voltage : VDS [V]

Fig.14 Switching Characteristics

Sw

itchin

g T

ime : t [

ns]

Drain Current : ID [A]

Fig.15 Dynamic Input Characteristics

Gate

- S

ourc

e V

oltage :

VG

S [V

]

Total Gate Charge : Qg [nC]

Coss S

tore

d E

nerg

y : E

OS

S [

mJ]

0

5

10

15

20

25

30

35

40

45

50

0 200 400 600 800

Ta = 25ºC

1

10

100

1000

10000

0.1 1 10 100 1000

Ciss

Coss

Crss

Ta = 25ºC f = 1MHz VGS = 0V

0

5

10

15

20

0 20 40 60 80 100 120 140

Ta = 25ºC VDD = 600V ID = 27A Pulsed

1

10

100

1000

10000

0.1 1 10 100

td(on)

td(off)

Ta = 25ºC VDD = 400V VGS = 18V

RG = 0W

Pulsed

tr

tf

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S4102

lElectrical characteristic curves

Fig.16 Typical Switching Loss

vs. Drain - Source Voltage

Sw

itchin

g E

nerg

y : E

[mJ]

Drain - Source Voltage : VDS [V]

Fig.17 Typical Switching Loss

vs. Drain Current

Drain Current : ID [A]

Fig.18 Typical Switching Loss

vs. External Gate Resistance

Sw

itchin

g E

nerg

y : E

[mJ]

External Gate Resistance : RG [W]

Sw

itchin

g E

nerg

y : E

[mJ]

0

400

800

1200

1600

2000

2400

2800

3200

3600

4000

0 10 20 30 40 50 60 70

Ta = 25ºC VDD=600V VGS = 18V/0V

RG=0W

L=250mH

Eon

Eoff

0

100

200

300

400

500

600

700

800

900

1000

200 400 600 800 1000

Ta = 25ºC ID=27A VGS = 18V/0V

RG=0W

L=250mH

Eon

Eoff

0

400

800

1200

1600

2000

2400

2800

3200

3600

4000

0 5 10 15 20 25 30

Ta = 25ºC VDD=600V ID=27A VGS = 18V/0V

L=250mH

Eon

Eoff

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S4102

lElectrical characteristic curves

Fig.19 Inverse Diode Forward Current

vs. Source - Drain Voltage

Invers

e D

iode

Forw

ard

Curr

ent

: I S

[A

]

Source - Drain Voltage : VSD [V]

Fig.20 Reverse Recovery Time vs.Inverse Diode Forward Current

Inverse Diode Forward Current : IS [A]

Revers

e R

ecovery

Tim

e : t

rr [ns]

0.01

0.1

1

10

100

0 1 2 3 4 5 6 7 8

VGS = 0V Pulsed

Ta = 150ºC Ta = 75ºC Ta = 25ºC

Ta = -25ºC

10

100

1000

1 10 100

Ta = 25ºC di / dt = 1100A / us VR = 600V VGS = 0V Pulsed

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S4102

lMeasurement circuits

Fig.1-1 Switching Time Measurement Circuit Fig.1-2 Switching Waveforms

Fig.2-1 Gate Charge Measurement Circuit Fig.2-2 Gate Charge Waveform

Fig.3-1 Switching Energy Measurement Circuit Fig.3-2 Switching Waveforms

Fig.4-1 Reverse Recovery Time Measurement Circuit Fig.4-2 Reverse Recovery Waveform

D.U.T.

Vsurge Irr

Eon = ID×VDS Eoff = ID×VDS

ID

VDS

Same type device as

D.U.T.

D.U.T.

ID

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Page 12: S4102: SiC Power Devices

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