Resistivity & IP methods - es.lancs.ac.uk
Transcript of Resistivity & IP methods - es.lancs.ac.uk
Resistivity & IP methods
Andrew BinleyLancaster University
International PhD Course in
HYDROGEOPHYSICS
Overview
We have demonstrated links between hydrological and geophysical properties and show the potential value of measuring resistivity and induced polarisation (IP) as a means of determining information about hydrological structures and/or states.
Here we present approaches for measurement of resistivity and IP.
We cover: the basic background to the measurement principle; measurement approaches and limitations; example applications.
Resistivity basic measurement principles
Measurements are usually done at low frequency (DC resistivity).
Four electrodes are used: C+ source current, C- sink currentP+ potential measurement (positive) P- potential measurement (negative)
C+ C-P+ P-
Current is injected between C+ and C-The voltage difference between P+ and P- is measured
The voltage difference is a function of the currentinjected and the resistivity beneath the electrode array
-5 -4 -3 -2 -1 0 1 2 3 4 5
-4
-3
-2
-1
0
)()( rδσ IV −=∇⋅∇
C+
Distance (m)
Elev
atio
n (m
)
The voltage V due to current injection I in the subsurface with electrical conductivity σ (=1/ρ)
satisfies:
If σ is uniform then current injection at the surface leads to: r
IV 12
⋅=π
ρ
C+ C-P+ P-
For a pair of current electrodes (dipole) we can then determine the apparent resistivity given the measured potential difference (dipole) for a given injected current.
For the arrangement below: aRa πρ 2=
Where R is the transfer resistance V(P+)-V(P-)I
a a a
C+ C-P+ P-
The apparent resistivity is the equivalent resistivity if the ground is uniform and is a useful way of expressing measured data (and also for plotting surface data as we will see later)
a a a
aRa πρ 2=
-5 -4 -3 -2 -1 0 1 2 3 4 5-5
-4
-3
-2
-1
0
)()( rδσ IV −=∇⋅∇
Distance (m)
Elev
atio
n (m
)
We can also compute the analytical solution to
C+
Even if the electrode is not on the surface. To do this we make use of an imaginary source above the ground and use superposition (just as in pumping test analysis)
0 0.5 1 1.5 2
Time (s)
+I
-I
0
Time (s)0 0.5 1 1.5 2
0
Volta
ge +V
-V
Curr
ent
Vsp
Vp +Vsp
Current is normally injected as a switched square wave
Why is this ?
C+ C-
P+ P-
A M N B
AB
MNAM NB
GeneralC+ C-
P+ P-aa a
WennerA M N B
C+ C-
P+ P-naa
a
Dipole-dipoleA M NB
C+ C-
P+ P-ana na
SchlumbergerA M N B
Various surface measurement configurations
We can profile the subsurface by moving our array
C+ C-P+ P-C+ C-P+ P-C+ C-P+ P-C+ C-P+ P-C+ C-P+ P-C+ C-P+ P-C+ C-P+ P-C+ C-P+ P-
The depth we are sensitive to will depend on the array configuration and the subsurface properties. For the array above we may assume that the apparent resistivity is at about half the electrode spacing.
Resistivity profiling
The Pulled Array Continuous Electrical Profiling (PACEP) method was developed by the Aarhus hydrogeophysics group as a cost effective method for spatially dense measurement over large areas.
An electrode array is towed across the field behind a small vehicle and measurements with three sets of electrodes with different separations are performed continuously and simultaneously while actively towing the electrode array.
Soundings - often called vertical electrical soundings (VES) – allow us to build up a 1D profile of the subsurface.
The array spread is progressively increased and the depth of sensitivity increases.
1 10 100 1000AB/2
10
100
1000
ρ a (O
hm-m
)
Resistivity soundings
Inverse methods (see later) are then used to determine a 1D resistivity structure that best matches the data.
10 100 1000
ρ (Ohm-m)
50
40
30
20
10
0
Dep
th (m
)1 10 100 1000
AB/2
10
100
1000
ρ a (O
hm-m
)
VES has been widely used in hydrological investigations to determine lithological boundaries.
10 100 1000
ρ (Ohm-m)
50
40
30
20
10
0
Dep
th (m
)
The method has also been used to monitor dynamic processes, e.g. responses to recharges and travel times of pollutants.
The approach is clearly limited if the 1D assumption is not valid.
Distance (m)
Electrode
Surv
eyle
vel
1357
C+P+
P- C- P+ P- C-C+
5 10 15 20 25 30 35 40 45
Developments in multi-electrode instruments has led to widespread use of resistivity imaging.
Here profiles are measured at different electrode separations (i.e. different survey depths).
Resistivity surface imaging
10090807060504030
0 5 10 15 20 25 30 35 40 45
0 5 10 15 20 25 30 35 40 45
10090807060
0 5 10 15 20 25 30 35 40 45-8-6-4-20
Elev
atio
n (m
)
Distance (m)
Electrode
1357
135
Surv
eyle
vel
Surv
eyle
vel
Distance (m)
Distance (m)
100 Ohm-m10 Ohm-m
Apparent resistivity (Ohm-m)
Apparent resistivity (Ohm-m)
10 Ohm-mSynthetic model
Wenner arraypseudosection
Dipole-dipole arraypseudosection
A pseudosection is built up using measured apparent resistivities
0 5 10 15 20 25 30 35 40 45-8-6-4-20
Elev
atio
n(m
)
Distance (m)
Electrode
100 Ohm-m10 Ohm-m10 Ohm-m
Synthetic model
Wenner arraymodel
Dipole-dipole arraymodel
These data may be inverted (see later) to determine a resistivity image that is consistent with the data
0 5 10 15 20 25 30 35 40 45-8-6-4-20
0 5 10 15 20 25 30 35 40 45-8-6-4-20
1009080706050403020
Resistivity (Ohm-m)
Distance (m)
Distance (m)
Elev
atio
n(m
)El
evat
ion
(m)
0 5 10 15 20 25 30 35 40 45
0 5 10 15 20 25 30 35 40 45
10090807060504030
1009080706050
0 5 10 15 20 25 30 35 40 45-8-6-4-20
Elev
atio
n (m
)
Distance (m)
Electrode
1357
135
Surv
eyle
vel
Surv
eyle
vel
Distance (m)
Distance (m)
100 Ohm-m
10 Ohm-m
Apparent resistivity (Ohm-m)
Apparent resistivity (Ohm-m)
Synthetic model
Wenner arraypseudosection
Dipole-dipole arraypseudosection
Note that the pseudosection doesn’t always show a structure that resembles the subsurface.
0 5 10 15 20 25 30 35 40 45-8-6-4-20
Elev
atio
n (m
)
Distance (m)
Electrode
100 Ohm-m
10 Ohm-mSynthetic model
Wenner arraymodel
Dipole-dipole arraymodel
Note that the pseudosection doesn’t always show a structure that resembles the subsurface.
10 10020 40 60 80
0 5 10 15 20 25 30 35 40 45-8-6-4-20
0 5 10 15 20 25 30 35 40 45-8-6-4-20
Resistivity (Ohm-m)
Elev
atio
n (m
)El
evat
ion
(m)
Distance (m)
Distance (m)
Surface resistivity imaging has been used widely to look at subsurface structure and dynamic processes
After Slater and Sandberg (2000)
Surface resistivity imaging has been used widely to look at subsurface structure and dynamic processes
Before pumping
20 minutes after pumping
60 minutes after pumping
100 minutes after pumping
140 minutes after pumping
180 minutes after pumping
240 minutes after pumping
20 minutes of recovery
19 hours of recovery
% change in resistivity-15 15After Barker & Moore (1998)
BEDROCK
GPS
P1 P2A B P3 P4P5P6 P7P8 P9
WATER
SEDIMENTS
Surface resistivity imaging based on continuous surveys have been developed for land and marine investigations
1.7 1.8 1.9 2.0 2.1 2.2 2.3
log10 resistivity in Ω m
0 m
16 m
0 m
155 m
log10 resistivity in Ohm-m
Multiple 2D or true 3D data can be used to show subsurface structure …
East Shefford Farm site
5.0-6.0m
0.2-0.5m
1.2-1.6m
2.1-2.6m
0
-70 Distance (m)
NE
Relative increase in resistivity (%)
SW
-100
0
5.0-6.0m
0.2-0.5m
1.2-1.6m
2.1-2.6m
0
-70
Chalk
Alluvial gravel
Soil
Peat
Chalk
Alluvial gravel
Chalk
Distance (m)
NE
Resistivity (Ωm)
SW
10 30 50 70 90 110 130 150 170 190 210
-100
Variation in Apr ‘05 survey as compared to Nov ‘04
56 60 64 68 72 76 80 84 88 92 96 100 104 108 112 116
0
Nov ‘04 survey
-40 -30 -20 -10 0 10
… and changes over time in 3D
Data collection speed will depend on:
Number of channels (detectors),
Source frequency,
Stacking requirements
Basic (single channel) systems may only be capable of around 400 to 500 measurements per hour. Some multi-channel systems can work at around 2000 measurements per hour or faster.
Resistivity data acquisition issues
To gain better resolution at depth we may use electrodes in boreholes.
These can be in single boreholes, e.g. mise-à-la-masse …
C- P-P+
C+
V
Resistivity single borehole surveys
0.96
0.97
0.98
0.99
1
1.01
1.02
1.03
1.04
WellConductive Anomaly Meters
Contour Interval = 0.005
0 2 4 6 8
Nimmer(2005) used mise-à-la-masse to study tracer migration in fractured basalt. She also used enhanced the survey by using borehole electrodes for potential measurements.
drivecurrentbetweenelectrode
pair
measurevoltagebetweenelectrode
pair
electrode
Electrodes in two (or more) boreholes can also be used to gain maximum resolution – cross-borehole electrical resistivity tomography (ERT)
Resistivity cross-borehole imaging
Stainless steel mesh, copper and lead are common electrode materials.
Low cost systems developed for surface imaging may be used for cross-borehole work but some suffer from:
Single channel (slow),
Poor dynamic range (limited application),
Constant current source (limited control)
Resistivity cross-borehole data acquisition issues
Electrodes need to have contact with the soil/rock and
the medium allowing this contact should resemble
(electrically) the native soil/rock.
Below the water table electrodes may be temporarily installed in open holes or inside slotted plastic cased wells. In such cases inflatable packers may be used to prevent current flow along the borehole conductive fluid
Above the water table electrodes are normallypermanently installed.
Pushed holes in unconsolidated sedimentsminimise electrode effects.
If drilled holes do not collapse backfill is required - typically drill returns or sand but avoid Bentonite.
10090807060504030
0 2 4 6 8
-14
-12
-10
-8
-6
-4
-2
0
0 2 4 6 8
-14
-12
-10
-8
-6
-4
-2
0
100 Ohm-m
10 Ohm-m
Elev
atio
n (m
) Electrode
Distance (m)
Resistivity (Ohm-m)
We can’t build up pseudosections like in surface imaging but can invert data in the same way to get a model that is most consistent with the data
We have to be careful about borehole spacing since we loose sensitivity away from the boreholes
10090807060504030
0 2 4 6 8 10 12 14
-14
-12
-10
-8
-6
-4
-2
0
0 2 4 6 8 10 12 14
-14
-12
-10
-8
-6
-4
-2
0
100 Ohm-m
10 Ohm-m
Elev
atio
n (m
) Electrode
Distance (m)
Resistivity (Ohm-m)
Distance (m)
Elev
atio
n (m
)
0 5 10 15 20 25 30 35 40 45 50
Distance (m)
-15
-10
-5
0E
leva
tion
(m)
15 20 25 30 35
Distance (m)
-15
-10
-5
0
Ele
vatio
n (m
)
15 20 25 30 35
Distance (m)
-15
-10
-5
0
0 5 10 15 20 25 30 35 40 45 50
Distance (m)
-10
-5
0
Ele
vatio
n (m
)
1 2
(a)
(b)
(c) (d)
0 5 10 15 20 25 30 35 40 45 50-15
-10
-5
0
(a)
10 10020 40 60 80Resistivity (Ohm-m)
Distance (m) Distance (m)
Distance (m)
Distance (m)
Resistivity (Ohm-m)El
evat
ion
(m)
Elev
atio
n (m
)El
evat
ion
(m)
In some cases a combination of arrays is more suitable
0 5 10 15 20 25 30
-16
-14
-12
-10
-8
-6
-4
-2
0Borehole D Borehole E
0
1
2
3
Log 1
0R
esis
tivi
ty (Ω
m)
Distance (m)
Peat
Weathered chalk
Soil
Flinty Chalk
River channel
Alluvial gravel
Dep
th (
m)
Example application to study subsurface structure beneath a river channel
Dep
th (m
)
Distance from midpoint (m)
reactive iron
sand
clay backfill
silty clay
basal gravel
shale bedrock
0
2
4
6
8
10
0-1-2 1 2
Cross-borehole imaging of permeable reactive barriers
BH2-1 BH4-3
sandclay backfill
water table?
0.2 0.4 0.6 0.8 1.0Conductivity (S/m)
active electroderedundant electrode
After Slater and Binley (2003)
Cross-borehole imaging of permeable reactive barriers
Start of event B End of event B
End of event DStart of event D
End of event FStart of event F
27-Jul 30-Jul 6-Aug 16-Aug 18-Aug
20-Aug 22-Aug 23-Aug 25-Aug 27-Aug
28-Aug 30-Aug 31-Aug 1-Sep 6-Sep
After Daily, Ramirez and Binley (2004)
Monitoring leakage into the vadose zone at Hanford
Drive currentbetween electrode pair
Measure voltagebetween electrode pair
I
V
Resistivity core and block imaging
We can also apply the same methods for imaging core and blocks (and any shape object)
After Ramirez & Daily (2000)
The methods may be used to look at changes within the block or core due to changing environmental conditions or hydraulic loading
IP measurement principles
0 0.5 1 1.5 2
Time (s)
+I
-I
0
Time (s)0 0.5 1 1.5 2
0
Volta
ge +V
-V
Curr
ent
Vsp
Vp +Vsp
So far we have just looked at DC resistivity
Recall the expected response of the voltage measurement:
In practice, there is a charge up and charge down response.
This forms the basis of time domain induced polarisation measurements
0 0.5 1 1.5 2
Time (s)
+V
-V
0
Vol
tage
t2t1
Vs Vp
Time (s)
Volta
ge
Seigel (1959) defined the apparent chargeability as:
0 0.5 1 1.5 2
Time (s)
+V
-V
0
Vol
tage
t2t1
Vs Vp
Time (s)
Volta
ge
p
sa V
Vm =
Vp is the primary voltage and Vs is the secondary voltage
0 0.5 1 1.5 2
Time (s)
+V
-V
0
Vol
tage
t2t1
Vs Vp
Time (s)
Volta
ge
But Vs is difficult to measure accurately and so an integral measure of chargeability is normally used:
∫−=
2
1
)(1)(
1
12
t
tpa dttV
Vttm (units mV/V)
But Vs is difficult to measure accurately and so an integral measure of chargeability is normally used:
∫−=
2
1
)(1)(
1
12
t
tpa dttV
Vttm (units mV/V)
Note that the measurement is dependent on the chosen time window (and so is never an intrinsic measure).
Also note that the charge up and charge down effect (if strong) can influence the DC resistivity readings.
To measure IP non-polarising potential electrodes (e.g. copper-copper sulfate in a porous pot) are normally used.
Injection currents need to be much higher than normal DC resistivity measurements to ensure good voltage signals.
Also electrical coupling across cables can be a problem and so multi-core cables used for DC resistivity may be problematic.
IP can also be measured in the frequency domain by looking at the change in amplitude and phase lag of an injected and measured signal.
Volta
geCu
rren
t
Phase laq φ
Ip
Vp
Time
Time
The measurement is thus a complex resistivity with magnitude |ρ| = Vp /Ip and phase φ
Volta
geCu
rren
t
Phase laq φ
Ip
Vp
Time
Time
The advantage of the complex resistivity measurement is that it is an intrinsic measure.
Frequency domain instruments are typically more expensive than time domain IP instruments. Few multi-electrode systems are available.
(a)
(b)
(a) SIP Fuchs II base unit and fiber optic cable reels (b) Zonge GDP32 receiver
ρ (Ohm m)
130 135 140 145 150 155 160 165 170 175 180 185 190
Distance along line (m)
-2.5-0.5
Dep
th (m
)
130 135 140 145 150 155 160 165 170 175 180 185 190
Distance along line (m)
-2.5-0.5
Dep
th (m
)
0.1
0.3
0.5
0.7
0.9
1.1
1.3
1.5
1.7
1.9
2.1
2.4
2.7
-5.0
0.0
1.2
2.4
3.6
4.8
6.0
7.2
8.4
M (mV/V)
Low
tide
(07/
24/9
8)
A A
A A
TP1
TP1
Hig
h
tide
mar
k
130 135 140 145 150 155 160 165 170 175 180 185 190
Distance along line (m)
-2.5-0.5
Dep
th (m
)
-0.4
0.1
0.3
0.5
0.7
0.9
1.1
1.3
1.5
1.7
1.9
MN (mS/m)
A A TP1
w=
0.2
mS/
cm
w=
20.4
mS/
cm
w=
0.2
mS/
cm
w=
20.4
mS/
cm
w=
0.2
mS/
cm
w=
20.4
mS/
cm
0
0.5
1 Dep
th (m
)
fine sand
till
Summary Logfor TP1
110100
Direct measure of IP: not influenced by fluid chemistry
Crescent Beach State Park, ME
Resistivity
Relative measure of IP:
After Slater & Lesmes (2001)
Separating lithological variation from fluid chemistry changes:
0 5 10
40
0
5
10
15
20
25
30
35
200
400
600
200
400
600
Resistivity (ohm m)
20 200 2000
61246125Vault area ERT
January 2000
Distance from 6125 (m)
Dep
th (
m)
Gamma (cps) Gamma (cps)
Sand/Gravel
Sand/Silt
Silt/Clay
Sandstone
After Kemna, Binley & Slater (2004)
0 5 10
40
0
5
10
15
20
25
30
35
200
400
600
200
400
600 61246125
Vault area IPJanuary 2000
Distance from 6125 (m)
Dep
th (
m)
Gamma (cps) Gamma (cps)
Sand/Gravel
Sand/Silt
Silt/Clay
Sandstone
-20 -10 0
Phase (mrad)
After Kemna, Binley & Slater (2004)
Summary
DC resistivity and IP can be measured in varied geometrical arrangements.
Pseudosections have limited value as an image of the subsurface but are useful (for surface imaging) as a data check.
The choice of measurement scheme can have an effect on the final image.
IP will be sensitive to electrode material and other factors. Care must be taken in obtaining IP measurements.
Inverse methods can be used to determine images of resistivity and IP (next lecture).