Reliability Reliability of Adhesives used in High Quality Audio Components.
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Reliabili ty Reliability of Adhesives used in High Quality Audio Components
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Transcript of Reliability Reliability of Adhesives used in High Quality Audio Components.
Reliability
Reliability of Adhesives used in High Quality Audio
Components
Background
• Adhesives used to bond two metallic components together.
• Adhesive is Key Process Input (KPI) for the construction of speakers.
• Storage conditions (temperature and humidity) are KPI’s to reliability of adhesive.
Background
• Two Conditions:– Factor 1: Length of Storage
• Bond strength was measured for adhesives stored for 3 days to 82 days.
– Factor 2: Storage Temperature and Humidity
• Bond strength measured for adhesives stored at 4 conditions:
Temp (°C) Temp (°F) RH DescriptionTest 1 27 80.6 50% Warm RoomTest 2 27 80.6 70% Warm Room with Elevated RHTest 3 32 89.6 70% Hot, Somewhat humidTest 4 27 80.6 100% Hot, Extremely Humid
Relative Humidity
Analysis
• Steps of Analysis– Excel– Minitab– Maple– Monte Carlo Analysis
Excel Analysis of Storage Conditions
Storage Conditions
202.87
181.91
272.20
25.807 1
126
1
345
325
378
132
0.00
50.00
100.00
150.00
200.00
250.00
300.00
350.00
400.00
0 1 2 3 4 5
Test
Bo
nd
Str
eng
th (
psi
)
Average
Min
Max
Storage Time Analysis
200100
99.99
90
50
10
1
0.01
Strength (lbs)
Perc
ent
500200
99.99
99
90
50
10
1
0.01
Strength (lbs)
Perc
ent
1000.00100.0010.001.000.100.01
99.99
90
50
10
1
0.01
Strength (lbs)
Perc
ent
500200100
99.99
99
90
50
10
1
0.01
Strength (lbs)
Perc
ent
Weibull0.980
Lognormal0.960
Exponential*
Loglogistic0.960
Correlation Coefficient
Probability Plot for Strength (lbs)LSXY Estimates-Complete Data
Weibull Lognormal
Exponential Loglogistic
350300250200
0.010
0.005
0.000
Strength (lbs)
PD
F
200
99.9
90
50
10
1
0.1
Strength (lbs)
Perc
ent
350300250200
100
50
0
Strength (lbs)
Perc
ent
350300250200
0.10
0.05
0.00
Strength (lbs)R
ate
Correlation 0.988
Shape 7.64223Scale 296.660Mean 278.750StDev 43.1625Median 282.768IQR 57.5818Failure 85Censor 0AD* 0.380
Table of StatisticsProbability Density Function
Survival Function Hazard Function
Distribution Overview Plot for Strength (lbs)LSXY Estimates-Complete Data
Weibull
82807568524917141312111076543
350
300
250
200
150
100
Days
Str
ength
(lb
s)
Boxplot of Strength (lbs)
150100500-50-100
99.9
99
95
90
80706050403020
10
5
1
0.1
RESI1
Perc
ent
Mean 3.343731E-16StDev 35.99N 85AD 0.470P-Value 0.241
Probability Plot of RESI1Normal - 95% CI
Table of MTTF
Standard 95% Normal CI
Distribution Mean Error Lower Upper
Weibull 266.949 0.908659 265.174 268.736
Storage Conditions Capability
4003002001000
LSL
LSL 25Target *USL *Sample Mean 202.87Sample N 23StDev(Within) 121.172StDev(Overall) 109.545
Process Data
Cp *CPL 0.49CPU *Cpk 0.49
Pp *PPL 0.54PPU *Ppk 0.54Cpm *
Overall Capability
Potential (Within) Capability
PPM < LSL 86956.52PPM > USL *PPM Total 86956.52
Observed PerformancePPM < LSL 71064.08PPM > USL *PPM Total 71064.08
Exp. Within PerformancePPM < LSL 52219.35PPM > USL *PPM Total 52219.35
Exp. Overall Performance
WithinOverall
Process Capability of Test 1
5004003002001000-100
LSL
LSL 25Target *USL *Sample Mean 181.913Sample N 23StDev(Within) 131.568StDev(Overall) 104.718
Process Data
Cp *CPL 0.40CPU *Cpk 0.40
Pp *PPL 0.50PPU *Ppk 0.50Cpm *
Overall Capability
Potential (Within) Capability
PPM < LSL 130434.78PPM > USL *PPM Total 130434.78
Observed PerformancePPM < LSL 116506.13PPM > USL *PPM Total 116506.13
Exp. Within PerformancePPM < LSL 67009.79PPM > USL *PPM Total 67009.79
Exp. Overall Performance
WithinOverall
Process Capability of Test 2
40035030025020015010050
LSL
LSL 25Target *USL *Sample Mean 272.2Sample N 20StDev(Within) 66.2094StDev(Overall) 67.3095
Process Data
Cp *CPL 1.24CPU *Cpk 1.24
Pp *PPL 1.22PPU *Ppk 1.22Cpm *
Overall Capability
Potential (Within) Capability
PPM < LSL 0.00PPM > USL *PPM Total 0.00
Observed PerformancePPM < LSL 94.38PPM > USL *PPM Total 94.38
Exp. Within PerformancePPM < LSL 120.05PPM > USL *PPM Total 120.05
Exp. Overall Performance
WithinOverall
Process Capability of Test 3
12080400-40
LSL
LSL 25Target *USL *Sample Mean 25.8Sample N 10StDev(Within) 40.3861StDev(Overall) 41.215
Process Data
Cp *CPL 0.01CPU *Cpk 0.01
Pp *PPL 0.01PPU *Ppk 0.01Cpm *
Overall Capability
Potential (Within) Capability
PPM < LSL 700000.00PPM > USL *PPM Total 700000.00
Observed PerformancePPM < LSL 492097.96PPM > USL *PPM Total 492097.96
Exp. Within PerformancePPM < LSL 492256.86PPM > USL *PPM Total 492256.86
Exp. Overall Performance
WithinOverall
Process Capability of Test 4
Storage Conditions Minitab Analysis
Distribution ID Plot: Test 1
Goodness-of-Fit
Anderson-Darling CorrelationDistribution (adj) CoefficientWeibull 2.057 0.927
Table of MTTF
Standard 95% Normal CIDistribution Mean Error Lower UpperWeibull 223.489 52.3552 141.205 353.721 Distribution ID Plot: Test 2
Goodness-of-Fit
Anderson-Darling CorrelationDistribution (adj) CoefficientWeibull 2.722 0.911
Table of MTTF
Standard 95% Normal CIDistribution Mean Error Lower UpperWeibull 223.331 81.9036 108.838 458.263
Distribution ID Plot: Test 3
Goodness-of-Fit
Anderson-Darling CorrelationDistribution (adj) CoefficientWeibull 1.187 0.958
Table of MTTF
Standard 95% Normal CIDistribution Mean Error Lower UpperWeibull 271.769 16.1156 241.950 305.264
Distribution ID Plot: Test 4
Goodness-of-Fit
Anderson-Darling CorrelationDistribution (adj) CoefficientWeibull 2.043 0.933
Table of MTTF
Standard 95% Normal CIDistribution Mean Error Lower UpperWeibull 20.2886 7.87081 9.48490 43.3979
400300200150100
95
80
50
20
5
2
1
Test 3
Perc
ent
Weibull0.958
Correlation Coefficient
Probability Plot for Test 3LSXY Estimates-Complete Data
Weibull
400300200100
0.006
0.004
0.002
0.000
Test 3
PD
F
200100
90
50
10
1
Test 3
Perc
ent
400300200100
100
50
0
Test 3
Perc
ent
400300200100
0.045
0.030
0.015
0.000
Test 3
Rate
Correlation 0.958
Shape 4.19920Scale 299.000
Mean 271.769StDev 72.9616Median 274.009IQR 100.949Failure 20
Censor 0AD* 1.187
Table of StatisticsProbability Density Function
Survival Function Hazard Function
Distribution Overview Plot for Test 3LSXY Estimates-Complete Data
Weibull
Conclusions
• Storage Conditions showed significant differences in MTTF.
• Storage Time did not show significant differences in MTTF
• Further Weibull analysis in Maple required.
• Equations from Maple will be used to conduct Monte Carlo Analysis.
